Improvement of tribological properties by ion implantation (English)
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In:
THIN SOLID FILMS
;
317
, 1-2
;
471-476
;
1998
-
ISSN:
- Article (Journal) / Print
-
Title:Improvement of tribological properties by ion implantation
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Contributors:
-
Published in:THIN SOLID FILMS ; 317, 1-2 ; 471-476
-
Publisher:
- New search for: ELSEVIER SEQUOIA SA
-
Publication date:1998-01-01
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Size:6 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
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Language:English
- New search for: 530.4275
- Further information on Dewey Decimal Classification
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Classification:
DDC: 530.4275 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 317, Issue 1-2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Modelling of thin films via a semiempirical methodBozzolo, G. / Ferrante, J. et al. | 1998
- 6
-
Molecular mechanics simulation of the diamond nucleation and growth on silicon (001) and (111) surfacesZhang, R. Q. / Wang, W. L. / Estevea, J. / Bertran, E. et al. | 1998
- 10
-
Defects and energy accommodation in epitaxial sputter deposited Mo/W superlattices studied by molecular dynamicsCarlberg, M. H. / Chirita, V. / Munger, E. P. et al. | 1998
- 14
-
Anisotropic growth of Au and Ag on (001) WTe~2 and -MoTe~2 surfaces between 350 and 700 KHla, S. W. / Marinkovic, V. / Prodan, A. et al. | 1998
- 17
-
Surface roughness of strain-relaxed Si~1~-~xGe~x layers grown by two-step growth methodIwano, H. / Yoshikawa, K. / Zaima, S. / Yasuda, Y. et al. | 1998
- 21
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In situ observation of microstructural changes of embedded silver particlesHeilmann, A. / Werner, J. et al. | 1998
- 27
-
Fundamental structure forming phenomena of polycrystalline films and the structure zone modelsBarna, P. B. / Adamik, M. et al. | 1998
- 34
-
Investigation of the kinetics of crystallisation of Al/a-Ge bilayer by electrical conductivity measurementKovacs, I. / Harmat, P. / Sulyok, A. / Radnoczi, G. et al. | 1998
- 39
-
Morphological analysis of discontinuous and semicontinuous metal filmsHrach, R. / Novak, S. / Novotny, D. / Pavlik, J. et al. | 1998
- 43
-
Surface melting of aluminumCastillo Alvarado, F. d. / Rutkowski, J. H. / Urbaniak-Kucharczyk, A. / Wojtczak, L. et al. | 1998
- 48
-
Effects of atomic hydrogen on growth behavior of Si films by Si~2H~6-source molecular beam epitaxyYasuda, Y. / Matsuyama, T. / Sato, K. / Kondo, M. / Ikeda, H. / Zaima, S. et al. | 1998
- 52
-
Growth and characterization of AlAs~ySb~1~-~y and InAs~ySb~1~-~y thin films on GaAs and InAs substratesNemeth, S. / Grietens, B. / Borghs, G. et al. | 1998
- 55
-
Study of Ni-Al interface formationArranz, A. / Palacio, C. et al. | 1998
- 59
-
Atomic force microscope study of the early stages of NiO deposition on graphite and micaMorant, C. / Soriano, L. / Trigo, J. F. / Sanz, J. M. et al. | 1998
- 64
-
Columnar structures in polycrystalline thin films developed by competitive growthAdamik, M. / Barna, P. B. / Tomov, I. et al. | 1998
- 69
-
Fractal behaviour of the surface of in situ heat treated metal-InP contactsMojzes, I. / Kovacs, B. / Schuszter, M. / Kun, I. / Mate, L. / Dobos, L. / David, L. et al. | 1998
- 72
-
TEM study of Ag~2Se developed by the reaction of polycrystalline silver films and seleniumSafran, G. / Geszti, O. / Radnoczi, G. / Barna, P. B. et al. | 1998
- 77
-
AES and EELS study of aluminium oxide thin filmsKapsa, R. / Stara, I. / Zeze, D. / Gruzza, B. / Matolin, V. et al. | 1998
- 81
-
Simulation of epitaxial growth of CeO~2 on YSZ(100) and SrTiO~3 on MgO(100) for YBa~2Cu~3O~7~-~x depositionAguiar, R. / Sanchez, F. / Ferrater, C. / Aguilo, M. / Varela, M. et al. | 1998
- 85
-
Particle contamination formation and detection in magnetron sputtering processesSelwyn, G. S. / Weiss, C. A. / Sequeda, F. / Huang, C. et al. | 1998
- 93
-
Preparation of TiN~x thin films using r.f.-d.c. coupled magnetron sputtering in Ar-N~2 gas plasmaTanaka, T. / Kawabata, K. et al. | 1998
- 96
-
Preparation and structure of AlW thin filmsRadic, N. / Tonejc, A. / Milun, M. / Pervan, P. / Ivkov, J. / Stubicar, M. et al. | 1998
- 100
-
AlN thin films prepared by ion beam induced chemical vapour depositionSanchez-Lopez, J. C. / Contreras, L. / Fernandez, A. / Gonzalez-Elipe, A. R. / Martin, J. M. / Vacher, B. et al. | 1998
- 105
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Preparation of Hg~1~-~xCd~xTe (0.1x0.5) epitaxial layers by two-stage evaporation-condensation-diffusion methodSavitsky, V. G. / Storchun, O. P et al. | 1998
- 108
-
Study of material emission in ArF and KrF excimer laser ablation of yttria stabilized zirconia single crystalsSanchez, F. / Aguiar, R. / Serra, P. / Varela, M. / Morenza, J. L. et al. | 1998
- 112
-
Influence of the substrate temperature on silicon-carbon thin films deposited from SiH~4 and C~2H~4 by excimer lamp-CVDRedondas, X. / Gonzalez, P. / Leon, B. / Perez-Amor, M. et al. | 1998
- 116
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Deposition of low temperature Si-based insulators by the electron cyclotron resonance plasma methodGarcia, S. / Martin, J. M. / Martil, I. / Fernandez, M. / Gonzalez-Diaz, G. et al. | 1998
- 120
-
Optical emission spectroscopy of rf glow discharges of methane-silane mixturesAndujar, J. L. / Pascual, E. / Viera, G. / Bertran, E. et al. | 1998
- 124
-
Deposition and characterization of multilayered TiN/ZrN coatingsTavares, C. J. / Rebouta, L. / Almeida, B. / Bessa e Sousa, J. / Da Silva, M. F. / Soares, J. C. et al. | 1998
- 129
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Spectroscopic characterization of thin solid films of 1,3 bis(3- chlorobenzylimido perylene) propaneRodriguez-Llorente, S. / Aroca, R. / Duff, J. / De Saja, J. A et al. | 1998
- 133
-
Optical constants of thin films by means of a pointwise constrained optimization approachChambouleyron, I. / Martinez, J. M. / Moretti, A. C. / Mulato, M. et al. | 1998
- 137
-
Formation and evaluation of CeN thin filmsXiao, S. / Takai, O. et al. | 1998
- 140
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Undoped and doped crystalline silicon films obtained by Nd-YAG laserFerreira, I. / Carvalho, J. / Martins, R. et al. | 1998
- 144
-
Investigation of the amorphous to microcrystalline phase transition of thin film silicon produced by PECVDMartins, R. / Macarico, A. / Ferreira, I. / Nunes, R. / Bicho, A. / Fortunato, E. et al. | 1998
- 149
-
Characterization of SiO~xN~y films deposited from SiCI~4 by remote plasma-enhanced chemical vapor depositionSanchez, O. / Aguilar, M. A. / Falcony, C. / Martinez-Duart, J. M. / Hernandez Velez, M. et al. | 1998
- 153
-
Thermal stability of nonstoichiometric silicon nitride films made by reactive dc magnetron sputter depositionLobl, H. P. / Huppertz, M. et al. | 1998
- 157
-
Electrical properties of ITO films prepared by tin ion implantation in In~2O~3 filmSawada, M. / Higuchi, M. et al. | 1998
- 161
-
Characterization of indium-tin oxide films by means of ion-implanted nuclear probesMetzner, H. / Habenicht, S. / Hahn, Th. / Uhrmacher, M. / Lieb, K.-P. / Borchert, D. / Job, R. / Fahrner, W. R. et al. | 1998
- 165
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Evaluation of adhesion strength of Ti films on Si(100) by the internal stress methodKinbara, A. / Kusano, E. / Kamiya, T. / Kondo, I. / Takenaka, O. et al. | 1998
- 169
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A model for stress in thin layers induced by misfitting particlesAn origin for growth stressKamminga, J.-D. / De Keijser, Th. H. / Delhez, R. / Mittemeijer, E. J. et al. | 1998
- 173
-
AES, AFM and TEM studies of NiCr thin films for capacitive humidity sensorsBelic, L. I. / Pozun, K. / Remskar, M. et al. | 1998
- 178
-
Modelling conduction in asymmetrical discontinuous metal thin filmsMorris, J. E. / Wu, F. et al. | 1998
- 183
-
RHEED study of Nb thin film growth on -Al~2O~3 (0001) substrateMasek, K. / Matolin, V. et al. | 1998
- 189
-
Electromigration in gold thin filmsAguilar, M. / Oliva, A. I. / Quintana, P. / Pe�a, J. L. et al. | 1998
- 193
-
Ellipsometrical studies on the Au/Si(111) systemMummler, K. / Wissmann, P. et al. | 1998
- 198
-
Large structure and elastic properties of thin alloyed gold filmsBeghi, M. G. / Bottani, C. E. / Guzman, L. / Lafford, T. / Laidani, N. / Ossi, P. M. / Tanner, B. K. et al. | 1998
- 202
-
Electrical property on copper thin film with chromium under-layerNakai, H. / Fudaba, K. / Shinzawa, K. / Hashimoto, M. et al. | 1998
- 206
-
The changes of short range ordering in amorphous silicon-carbon alloys by thermal annealingGracin, D. / Radic, N. / Ivanda, M. / Andreic, Z. / Pracek, B. et al. | 1998
- 210
-
Spectroellipsometry and electron spectroscopy of porous Si thin films on p^+ substratesRobert, Ch. / Bideux, L. / Gruzza, B. / Cadoret, M. / Lohner, T. / Fried, M. / Vazsonyi, E. / Gergely, G. et al. | 1998
- 214
-
Oxidation processes in hydrogenated amorphous silicon nitride films deposited by ArF laser-induced CVD at low temperaturesBanerji, N. / Serra, J. / Gonzalez, P. / Chiussi, S. / Parada, E. / Leon, B. / Perez-Amor, M. et al. | 1998
- 219
-
Structural and electrical characterisations of rapid thermal annealed thin silicon oxide films on siliconChan, Y. M. / Choo, C. K. / Choi, W. K. et al. | 1998
- 223
-
Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectraGonzalez-Leal, J. M. / Marquez, E. / Bernal-Oliva, A. M. / Ruiz-Perez, J. J. / Jimenez-Garay, R. et al. | 1998
- 228
-
Structure and photoinduced changes in As-S-Te bulk glasses and amorphous layersVlcek, Mir. / Nejezchleb, K. / Wagner, T. / Frumar, M. / Vlcek, Mil. / Vidourek, A. / Ewen, P. J. S. et al. | 1998
- 232
-
Study by transmission electron microscopy and electron diffraction of thin polyethylene filmsPopescu-Pogrion, N. / Tirnovan, M. et al. | 1998
- 235
-
Mirror electron microscopy investigations of thin polyethylene films subjected to high voltageGodehardt, R. / Heydenreich, J. / Popescu-Pogrion, N. / Tirnovan, M. et al. | 1998
- 237
-
High-resolution secondary ion mass spectrometry depth profiling of superconducting thin filmsMontgomery, N. J. / MacManus-Driscoll, J. L. / McPhail, D. S. / Chater, R. J. / Moeckly, B. / Char, K. et al. | 1998
- 241
-
Yttria-stabilized zirconia obtained by MOCVD: applicationsGarcia, G. / Figueras, A. / Casado, J. / Llibre, J. / Mokchah, M. / Petot-Ervas, G. / Calderer, J. et al. | 1998
- 245
-
Modulated differential scanning calorimetry experiments on film and bulk (As~0~.~3~3S~0~.~6~7)~1~0~0~-~xY~x, (Y=Te or I) glassesWagner, T. / Kasap, S. O. / Vlcek, M. et al. | 1998
- 249
-
Epitaxial metal/insulator superlattices of Ti-Ag/MgO grown on MgO(001) substratesKado, T. et al. | 1998
- 255
-
Elastic behaviour of Si/Ge superlattices determined by Brillouin light scatteringDe Bernabe, A. / Jimenez, R. / Garcia-Hernandez, M. / Prieto, C. et al. | 1998
- 259
-
Multilayer coatings by continuous detonation system spray techniqueFagoaga, I. / Viviente, J. L. / Gavin, P. / Bronte, J. M. / Garcia, J. / Tagle, J. A. et al. | 1998
- 266
-
Growth and microstructure of sputtered Ag/Cu multilayersCzigany, Zs. / Kovacs, I. / Radnoczi, G. et al. | 1998
- 270
-
Relaxation mechanism of InGaAs single and graded layers grown on (111)B GaAsRojas, T. C. / Molina, S. I. / Sacedon, A. / Valtue�a, F. / Calleja, E. / Garcia, R. et al. | 1998
- 274
-
Investigation of ion beam mixing effects in Ta/Pd bilayers deposited on SiBibic, N. / Milosavljevic, M. / Perusko, D. / Jeynes, C. et al. | 1998
- 278
-
Microstructural modification in Co/Cu multilayers prepared by low energy ion-assisted depositionTelling, N. D. / Crapper, M. D. / Lovett, D. R. / Guilfoyle, S. J. / Tang, C. C. / Petty, M. et al. | 1998
- 282
-
Preparation of a new tetragonal copper oxynitride phase by reactive magnetron sputteringVon Richthofen, A. / Domnick, R. / Cremer, R. / Neuschutz, D. et al. | 1998
- 285
-
Magnetic vortices and pinning in thin films and superlatticesMartin, J. I. / Velez, M. / Gonzalez, E. M. / Vicent, J. L. et al. | 1998
- 290
-
Control of crystallographic and magnetic texture in dc-magnetron sputtered Co-Cr on flexible pet substrateTe Lintelo, H. / Lippens, P. et al. | 1998
- 294
-
Preparation and characterisation of finemet amorphous magnetic thin films with enhanced Cu contentPaszti, Z. / Szabo, I. / Kisdi-Koszo, E. / Peto, G. / Horvath, Z. E. / Zsoldos, E. / Guczi, L. et al. | 1998
- 298
-
Magnetic domain structure of Co/Ni(110)Zhang, H. M. / Li, Y. et al. | 1998
- 303
-
Magnetostriction in a single-crystal TbFe~2 filmCiria, M. / Arnaudas, J. I. / Dufour, C. / Oderno, V. / Dumesnil, K. / Del Moral, A. et al. | 1998
- 306
-
Magnetic and electrical transport properties of Fe/Zr and Fe/Ti multilayersStobiecki, T. / Czapkiewicz, M. / Kopcewicz, M. / Zuberek, R. / Castano, F. J. et al. | 1998
- 310
-
Growth, structure, and magnetism of W and Fe/W thin films on Al~2O~3Li, Y. / Polaczyk, C. / Riegel, D. et al. | 1998
- 314
-
X-ray Magnetic Circular Dichroism study of vanadium in thin films (V/Ag(100) and V/Fe(100)) and alloys (Fe~0~.~8~2V~0~.~1~8/Au(111))Finazzia / Bencok, P. / Hricovini, K. / Yubero, F. / Chevrier, F. / Kolb, E. / Krill, G. / Vesely, M. / Chappert, C. / Renard, J.-P. et al. | 1998
- 318
-
New transparent conducting ZnO-In~2O~3-SnO~2 thin films prepared by magnetron sputteringMinami, T. / Kakumu, T. / Shimokawa, K. / Takata, S. et al. | 1998
- 322
-
Optical properties of zinc oxynitride thin filmsFutsuhara, M. / Yoshioka, K. / Takai, O. et al. | 1998
- 326
-
Preparation of transparent conducting Zn~2In~2O~5 films by d.c. magnetron sputteringMinami, T. / Kakumu, T. / Takeda, Y. / Takata, S. et al. | 1998
- 330
-
Quantum confinement effects on Cd~1~-~xNi~xTe sputtered filmsAlvarez-Fregoso, O. / Zelaya-Angel, O. / Mendoza-Alvarez, J. G. et al. | 1998
- 336
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Thin cathodoluminescent films deposited by sol-gel processMeznar, L. Z. / Pracek, B. / Orel, B. / Bukovec, P. et al. | 1998
- 340
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Oxygen ECR stream etching of dichromated gelatin filmsVillalvilla, J. M. / Crespo, J. / Quintana, J. A. / Santos, C. / Valles-Abarca, J. A. et al. | 1998
- 343
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Diffraction gratings in dry developed dichromated gelatin filmsQuintana, J. A. / Boj, P. G. / Crespo, J. / Valles-Abarca, J. A. / Villalvilla, J. M. et al. | 1998
- 347
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Deposition of silicon oxinitride films from hexamethyldisilizane (HMDS) by PECVDGonzalez-Luna, R. / Rodrigo, M. T. / Jimenez, C. / Martinez-Duart, J. M. et al. | 1998
- 351
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Corrosion of TiN, (TiAl)N and CrN hard coatings produced by magnetron sputteringCunha, L. / Andritschky, M. / Rebouta, L. / Silva, R. et al. | 1998
- 356
-
Field emission from amorphous diamond films prepared by filtered arc depositionWang, X. / Zhao, J. P. / Chen, Z. Y. / Yang, S. Q. / Shi, T. S. / Liu, X. H. et al. | 1998
- 359
-
a-C(:H) and a-CN~x(:H) films deposited by magnetron sputtering and PACVDNobili, L. / Cavallotti, P. L. / Coccia Lecis, G. / De Ponti, G. / Lenardi, C. et al. | 1998
- 363
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Calcium phosphate coatings grown at different substrate temperatures by pulsed ArF-laser depositionMayor, B. / Arias, J. / Chiussi, S. / Garcia, F. / Pou, J. / Leon Fong, B. / Perez-Amor, M. et al. | 1998
- 367
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XPS/UPS studies of conducting polymers: exchange doping of dye molecules into polymer matrixKato, H. / Takemura, S. / Nakajima, Y. et al. | 1998
- 371
-
Improvement of Ta filament for diamond CVDTsutsumoto, T. et al. | 1998
- 376
-
Deposition time influence on cubic boron nitride thin films by tuned rf magnetron sputteringGimeno, S. / Mu�oz, J. C. / Lousa, A. et al. | 1998
- 380
-
Deposition of carbon nitride thin films by arc ion platingTakai, O. / Taki, Y. / Kitagawa, T. et al. | 1998
- 384
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Structure, composition and tribological properties of carbon nitride filmsCzyzniewski, A. / Precht, W. / Pancielejko, M. / Myslinski, P. / Walkowiak, W. et al. | 1998
- 388
-
Hydrocarbon films inhibit oxygen permeation through plastic packaging materialMoser, E. M. / Urech, R. / Hack, E. / Kunzli, H. / Muller, E. et al. | 1998
- 393
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Deposition of hydroxyapatite thin films by excimer laser ablationFernandez-Pradas, J. M. / Sardin, G. / Cleries, L. / Serra, P. / Ferrater, C. / Morenza, J. L. et al. | 1998
- 397
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Characterization of diamond-like carbon by Raman spectroscopy, XPS and optical constantsMossner, C. / Grant, P. / Tran, H. / Clarke, G. / Lockwood, D. J. / Labbe, H. J. / Mason, B. / Sproule, I. et al. | 1998
- 402
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Diamond-like nanocomposite coatings for low-wear and low-friction applications in humid environmentsNeerinck, D. / Persoone, P. / Sercu, M. / Goel, A. / Venkatraman, C. / Kester, D. / Halter, C. / Swab, P. / Bray, D. et al. | 1998
- 405
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Chemical instability of the target surface during DC-magnetron sputtering of ITO-coatingsLippens, P. / Segers, A. / Haemers, J. / De Gryse, R. et al. | 1998
- 409
-
A comparison of the DC conduction properties in evaporated cadmium selenide thin films using gold and aluminium electrodesOduor, A. O. / Gould, R. D. et al. | 1998
- 413
-
Transparent and conducting ZnO(:Al) films deposited by simultaneous RF- and DC-excitation of a magnetronEllmer, K. / Cebulla, R. / Wendt, R. et al. | 1998
- 417
-
Amorphous alloy formation and thickness dependent growth of Gd-silicides in solid phase thin film reactionMolnar, G. L. / Peto, G. / Zsoldos, E. / Khanh, N. Q. / Horvath, Z. E. et al. | 1998
- 421
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Thin films applied to integrated optical position-sensitive detectorsFortunato, E. / Soares, F. / Lavareda, G. / Martins, R. et al. | 1998
- 425
-
PbSe photodetector arrays for IR sensorsMu�oz, A. / Melendez, J. / Torquemada, M. C. / Rodrigo, M. T. / Cebrian, J. / De Castro, A. J. / Meneses, J. / Ugarte, M. / Lopez, F. / Vergara, G. et al. | 1998
- 429
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Electrical characterization of a thin film tin oxide sensor array for VOCs detectionGutierrez, J. / Getino, J. / Horrillo, M. C. / Ares, L. / Robla, J. I. / Garcia, C. / Sayago, I. et al. | 1998
- 432
-
The effects of oxygen doping and annealing on the surface and bulk electrical conductivity in planar copper phthalocyanine thin films for gas-sensing applicationsZhou, Q. / Gould, R. D. et al. | 1998
- 436
-
A study of the response rate to nitrogen dioxide exposure in metal phthalocyanine thin film sensorsZhou, Q. / Gould, R. D. et al. | 1998
- 440
-
Ion-plated discontinuous thin film strain gaugesBroitman, E. / Zimmerman, R. et al. | 1998
- 443
-
Influences of dopants on the electronic structure of SnO~2 thin filmsCao, X. / Cao, L. / Yao, W. / Ye, X. et al. | 1998
- 446
-
New effective medium approach to optical response in non-random arraysRadchik, A. V. / Moses, P. / Skryabin, I. L. / Smith, G. B. et al. | 1998
- 449
-
New development in superhard coatings: the superhard nanocrystalline-amorphous compositesVeprek, S. et al. | 1998
- 455
-
Recent progress in the measurement of the thermal properties of hard coatingsMartinsons, C. / Heuret, M. et al. | 1998
- 458
-
Phase transformation in sputtered Ti-SS alloy film during plasma nitridingMusil, J. / Jezek, V. / Benda, M. / Vlcek, J. et al. | 1998
- 463
-
Microstructural modification of TiN deposited by magnetron ion plating: Influence of magnetic field configurationZlatanovic, M. / Popovic, N. / Bogdanov, Z. / Belosevac, R. / Kunosic, A. / Goncic, B. et al. | 1998
- 468
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Synthesis of iron-tungsten alloy on mild steel by laser surface alloyingIsshiki, Y. / Mizumoto, K. / Hashimoto, M. et al. | 1998
- 471
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Improvement of tribological properties by ion implantationO�ate, J. I. / Alonso, F. / Garcia, A. et al. | 1998
- 477
-
Depth-profiling via X-Ray photoemission and Auger spectroscopies of N^+ implanted tungsten carbides grown on the Ti-6Al-4V alloyLaidani, N. / Dorigoni, C. / Miotello, A. / Calliari, L. / Scarel, G. / Sancrotti, M. et al. | 1998
- 481
-
Tribological properties of calcium fluoride-based solid lubricant coatings at high temperaturesPauleau, Y. / Juliet, P. / Gras, R. et al. | 1998
- 486
-
Influence of plasma nitriding on mechanical and tribological properties of steel with subsequent PVD surface treatmentsSkoric, B. / Kakas, D. / Gredic, T. et al. | 1998
- 490
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IBAD SIN~x coating: preparation and tribological propertiesCerny, F. / Suchanek, J. / Hnatowicz, V. et al. | 1998
- 493
-
Electrochemical modifications at the nanometer scale on Si(100) surfaces with scanning tunnelling microscopyAbadal, G. / Perez-Murano, F. / Barniol, N. / Aymerich, X. et al. | 1998
- 497
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The gas-phase condensation method for the preparation of quantum-sized ZnS nanoparticlesSanchez-Lopez, J. C. / Fernandez, A. et al. | 1998