Advances in High-Resolution Transmission Electron Microscopy (English)
- New search for: Phillipp, F.
- New search for: Phillipp, F.
- New search for: Kinoshita, C.
In:
New Direction in Transmission Electron Microscopy and Quantitative Analysis of Materials
9
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888-902
;
1998
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ISSN:
- Article (Journal) / Print
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Title:Advances in High-Resolution Transmission Electron Microscopy
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Contributors:Phillipp, F. ( author ) / Kinoshita, C.
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Published in:New Direction in Transmission Electron Microscopy and Quantitative Analysis of Materials , 9 ; 888-902MATERIALS TRANSACTIONS- JIM ; 39, 9 ; 888-902
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Publisher:
- New search for: JAPAN INSTITUTE OF METALS
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Publication date:1998-01-01
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Size:15 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 620.11
- Further information on Dewey Decimal Classification
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Classification:
DDC: 620.11 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 39, Issue 9
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 873
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Energy-Filtering Imaging and DiffractionReimer, L. et al. | 1998
- 883
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Applications of EFTEM Elemental Mapping with High Spatial Resolution to the Nanocavity and Modulated StructureGao, M. / Duan, X. F. et al. | 1998
- 888
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Advances in High-Resolution Transmission Electron MicroscopyPhillipp, F. et al. | 1998
- 903
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Quantitative Analysis of HREM Images of -AlB~1~2 with a High-Voltage Transmission Electron Microscope and the Imaging PlateTaniyama, A. / Shindo, D. et al. | 1998
- 903
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Quantitative analysis of HREM images of alpha-AlB12 with a high-voltage transmission electron microscope and the imaging plateTaniyama, A. / Shindo, D. et al. | 1998
- 909
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Application of Imaging Plates to High-Resolution High-Voltage Electron MicroscopyCantoni, M. / Horiuchi, S. et al. | 1998
- 914
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Interpretation of High Resolution Transmission Electron Microscope Images of Short Range Ordered Ni~4MoHata, S. / Shindo, D. / Kuwano, N. / Matsumura, S. / Oki, K. et al. | 1998
- 920
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Incommensurate Modulated Structure of "Pb"-1223 Determined by Combining High Resolution Electron Microscopy and Electron DiffractionLiu, J. / Li, F. H. / Wan, Z. H. / Fan, H. F. / Wu, X. J. / Tamura, T. / Tanabe, K. et al. | 1998
- 927
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Recent Development in Quantitative Electron Diffraction for Crystallography of MaterialsTomokiyo, Y. / Matsumura, S. et al. | 1998
- 938
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Quantitative Convergent Beam Electron DiffractionZuo, J. M. et al. | 1998
- 948
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Quantitative X-ray Microanalysis in Analytical Electron MicroscopyHorita, Z. et al. | 1998
- 959
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In-situ Experiment with High Voltage Electron MicroscopeMori, H. et al. | 1998
- 967
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Burgers Vector of Crack Tip Dislocations in Magnesium Oxide CrystalsHigashida, K. / Okazaki, S. / Morikawa, T. / Onodera, R. et al. | 1998
- 975
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Microstructural and Crystallographic Characterization of Multiphase Al~6~2Ti~1~0V~2~8 AlloyChang, W.-S. / Muddle, B. C. et al. | 1998
- 982
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Identification of Metastable Phases in Strip-cast and Spray-cast Al-Fe-V-Si AlloysHyang Jin Koh / Woo Jin Park / Kim, N. J. et al. | 1998
- 989
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Convergent Beam Dark Field Imaging Technique with Its Application to Observation of Multiphase MaterialsYamamoto, A. / Tsubakino, H. et al. | 1998
- 995
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Effect of Repeated Thermal Cycling on the Formation of Retained Austenite in 18%Ni 350 Grade Maraging SteelFarooque, M. / Ayub, H. / Ul Haq, A. / Khan, A. Q. et al. | 1998