Sub-A0mV Sigma Vru Igzo nFETs in 300mm Fab (English)
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- New search for: Mitard, J.
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- New search for: Rassoul, N.
- New search for: Dekkers, H. F. W.
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- New search for: Belmonte, A.
- New search for: Delhougne, R.
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In:
Thin Film Transistors 15 (TFT 15)
; 205-218
;
2020
-
ISBN:
- Conference paper / Print
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Title:Sub-A0mV Sigma Vru Igzo nFETs in 300mm Fab
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Contributors:Mitard, J. ( author ) / Kljucar, L. ( author ) / Rassoul, N. ( author ) / Dekkers, H. F. W. ( author ) / Setten, M. van ( author ) / Chasin, A. ( author ) / Pourtois, G. ( author ) / Belmonte, A. ( author ) / Delhougne, R. ( author ) / Donadio, G. L. ( author )
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Conference:Pacific Rim Meeting on Electrochemical and Solid State Science ; 15. ; 2020 ; Online
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Published in:Thin Film Transistors 15 (TFT 15) ; 205-218
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Publisher:
- New search for: ECS, the Electrochemical Society
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Place of publication:Pennington, NJ, USA
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Publication date:2020
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ISBN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
- New search for: 53.51
- Further information on Basic classification
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Classification:
BKL: 53.51 Bauelemente der Elektronik -
Source:
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 3
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Hot Carrier Phenomena in Oxide Thin-Film TransistorsTanaka, J. / Fujii, M. N. / Miyanaga, R. / Takahashi, T. / Uraoka, Y. / Takechi, K. / Tanabe, H. et al. | 2020
- 13
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Characteristics and Applications of CAAC-IGZO FET with Gate Length of 13nmSuzuki, A. / Yuichi, Y. / Mizukami, S. / Tsuda, K. / Ito, M. / Ohshima, K. / Matsumoto, N. / Yakubo, Y. / Miyata, S. / Okuno, N. et al. | 2020
- 29
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Highly Reliable Metal Oxide Thin Film Transistors for Flexible DevicesUraoka, Y. / Corsino, D. / Bermundo, J. P. / Fujii, M. N. / Uenuma, M. et al. | 2020
- 39
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UV and Gate Stress Induced Defects in Amorphous Indium Gallium Zinc Oxide Thin Film Transistors and Self-RepairJiang, J. / Kuo, Y. et al. | 2020
- 47
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Device Scalability of InGaZnO TFTs for Next-Generation DisplaysOh, S. / Kim, S. H. / Kim, M. / Yu, S. M. / Choi, Y. / Park, J. S. / Lim, J. H. et al. | 2020
- 55
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TCAD Simulation of a 3D NAND Memory Utilizing In-Ga-Zn-Oxide: "3D OS NAND" with 4 V Drive, High Endurance and DensityKunitake, H. / Kimura, H. / Tsuda, K. / Godo, H. / Murakawa, T. / Sawai, H. / Baba, H. / Sasagawa, S. / lkeda, T. / Yamazaki, S. et al. | 2020
- 69
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Highly Stable Self-Aligned Top-Gate Indium Gallium Zinc Oxide Thin-Film Transistors for High-Resolution OLED TV and Mobile DisplaysKim, J. B. / Tsai, Y. C. / Lim, R. / Wang, Z. / Hao, M. / Wang, S. W. / Park, J. W. / Zhao, L. / Bender, M. / Yim, D. K. et al. | 2020
- 81
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Interpretation of Donor Activation in Boron and Argon Implanted Self-Aligned Bottom-Gate IGZO TFTsKabir, M. S. / Chowdhury, R. R. / Manley, R. G. / Hirschman, K. D. et al. | 2020
- 89
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Low-Temperature Processed Metal-Semiconductor Field-Effect Transistor with In- Ga-Zn-O Channel Deposited by Ar+O2+H2 SputteringMagari, Y. / Furuta, M. et al. | 2020
- 97
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Improved Copper Electrode Integration for Thin Film Electronics on GlassKim, H. / Zhu, B. / Huang, M. H. / Vaddi, R. / Manley, R. G. et al. | 2020
- 109
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Effect of Glass Substrate on the Film Properties of Poly Silicon by Excimer Laser AnnealingZhu, B. / Vaddi, R. / Huang, M. H. / Kim, H. / Manley, R. G. et al. | 2020
- 117
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Influence of Glass Surface Modification on Thin Film Copper ElectrodesHuang, M. H. / Shi, Y. / Zhu, B. / Vaddi, R. / Kim, H. / Manley, R. G. et al. | 2020
- 131
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Edge-Directed LTPS Via Flash Lamp Annealing Using a Cr Adhesion Layer for Improved WettabilityPackard, G. / Rosenfeld, A. / Hum, M. / Manley, R. G. / Hirschman, K. D. et al. | 2020
- 141
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Flash Lamp Annealed LTPS TFTs with ITO Bottom-Gate StructuresPackard, G. / Rosenfeld, A. / Manley, R. G. / Hirschman, K. D. et al. | 2020
- 151
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Photoconductive Solution Processed ZnO Quasi-superlattice FilmsBuckley, D. / Inguva, S. / McNulty, D. / Zubialevich, V. Z. / Parbrook, P. / Gity, F. / Hurley, P. K. / O'Dwyer, C. et al. | 2020
- 161
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Percolation Carbon Nanotube Thin Film TransistorsShur, M. / Park, J. / Zhang, Y. / Liu, X. / Yiterdal, T. et al. | 2020
- 173
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Optimizing Material Systems for All-Inkjet-Printed Organic Thin-Film TransistorsJiang, C. / Nathan, A. et al. | 2020
- 185
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Display and LSI Applications of Oxide Semiconductor LSIs (OS LSIs) Using Crystalline In-Ga-Zn Oxide (IGZO): Applications Related to Coronavirus COVID-19 PandemicOnuki, T. / Okamoto, Y. / Aoki, T. / Matsuzaki, T. / Kozuma, M. / Kunitake, H. / Motoyoshi, R. / Kimura, H. / Yamane, Y. / Sasagawa, S. et al. | 2020
- 205
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Sub-A0mV Sigma Vru Igzo nFETs in 300mm FabMitard, J. / Kljucar, L. / Rassoul, N. / Dekkers, H. F. W. / Setten, M. van / Chasin, A. / Pourtois, G. / Belmonte, A. / Delhougne, R. / Donadio, G. L. et al. | 2020
- 219
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Hafnia Ferroelectric Device for Semiconductor, Sensor, and Display ApplicationsJeon, S. et al. | 2020
- 225
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P3HT:ZnS Based Photovoltaic Devices with Enhanced Performance Assisted by Oxidised Carbon NanotubesWei, C. / Bishop, M. T. / Wang, Y. / Gao, F. / Wang, C. / Chen, G. Z. et al. | 2020