An axial‐emission bent beam gauge (English)
- New search for: Suen, C. D.
- New search for: Chen, J. Z.
- New search for: Kuo, Y. H.
- New search for: Suen, C. D.
- New search for: Chen, J. Z.
- New search for: Kuo, Y. H.
In:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
;
8
, 5
;
3888-3889
;
1990
- Article (Journal) / Electronic Resource
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Title:An axial‐emission bent beam gauge
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Additional title:Axial‐emission bent beam gauge
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Contributors:
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Published in:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films ; 8, 5 ; 3888-3889
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Publisher:
- New search for: American Vacuum Society
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Publication date:1990-09-01
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Size:2 pages
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 8, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 3653
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A scanning tunneling microscopy study of the surface morphology of supported gold particlesThomas, P. A. / Lee, W. H. / Masel, R. I. et al. | 1990
- 3657
-
Scanning tunneling microscopy study of initial stages of silicon molecular beam epitaxyHoeven, A. J. / Dijkkamp, D. / Lenssinck, J. M. / van Loenen, E. J. et al. | 1990
- 3662
-
Measurement of the local density of states on a metal surface: Scanning tunneling spectroscopic imaging of Au(111)Everson, M. P. / Jaklevic, R. C. / Shen, Weidian et al. | 1990
- 3666
-
A new Fourier transform infrared reflection‐absorption spectrometer and effective background subtraction methodXu, Zhi / Yates, J. T. et al. | 1990
- 3669
-
X‐ray photoelectron spectroscopy/Ar+ ion profile study of thin oxide layers on InPThurgate, S. M. / Erickson, N. E. et al. | 1990
- 3676
-
Electron diffusion length and escape probability measurements for p‐type GaAs(100) epitaxiesVergara, G. / Gómez, L. J. / Presa, J. / Montojo, M. T. et al. | 1990
- 3682
-
Photoemission investigation of silver/poly(ethylene terephthalate) interfacial chemistry: The effect of oxygen‐plasma treatmentGerenser, L. J. et al. | 1990
- 3692
-
A review of the geometrical fundamentals of reflection high‐energy electron diffraction with application to silicon surfacesMahan, John E. / Geib, Kent M. / Robinson, G. Y. / Long, Robert G. et al. | 1990
- 3701
-
Spontaneous decomposition of dimethyl gold hexafluoroacetylacetonate on ion bombarded surfacesKirch, S. J. / Wagner, A. et al. | 1990
- 3707
-
Intrinsic resputtering—theory and experimentHoffman, D. W. et al. | 1990
- 3713
-
Diagnostic techniques for plasma stability in electron cyclotron resonance plasma processingShufflebotham, P. K. / Thomson, D. J. et al. | 1990
- 3720
-
Ion energetics in electron cyclotron resonance dischargesHolber, W. M. / Forster, J. et al. | 1990
- 3726
-
Molecular dynamics simulations of low‐energy particle bombardment effects during vapor‐phase crystal growth: 10 eV Si atoms incident on Si(001)2×1 surfacesKitabatake, M. / Fons, P. / Greene, J. E. et al. | 1990
- 3736
-
Emission spectroscopy and actinometry in a magnetized low pressure radio frequency dischargeKuypers, A. D. / Koch, A. / Hopman, H. J. et al. | 1990
- 3746
-
Time‐resolved electric probe techniques in radio frequency plasmasRuzic, D. N. / Wilson, Jeffrey L. et al. | 1990
- 3752
-
Experimental study of the response of a liquid metal field ion source to short HV‐extraction pulsesSchwieters, J. / Zehnpfenning, J. F. / Niehuis, E. / Benninghoven, A. et al. | 1990
- 3758
-
Improved automated lens design for LMI sourcesSzep, J. / Szilagyi, M. et al. | 1990
- 3758
-
Improved automated lens design for liquid metal ion sourcesSzép, J. / Szilagyi, M. et al. | 1990
- 3763
-
Chemical vapor deposition of SiC layers from a gas mixture of CH3SiCl3+H2(+Ar), and effects of the linear velocity and Ar additionMotojima, Seiji / Hasegawa, Mitsutaka et al. | 1990
- 3769
-
Growth of TaC thin films by reactive direct current magnetron sputtering: Composition and structureHåkansson, G. / Petrov, I. / Sundgren, J.‐E. et al. | 1990
- 3779
-
(100) and (111) Ni films epitaxially grown on Cu by the metal–metal epitaxy on silicon technique near room temperaturesChang, Chin‐An et al. | 1990
- 3785
-
The deposition of diamond films by filament techniquesJansen, F. / Machonkin, M. A. / Kuhman, D. E. et al. | 1990
- 3791
-
A model for simultaneous reactive sputtering, etching, and chemical vapor depositionKoss, V. A. / Vossen, J. L. et al. | 1990
- 3796
-
Ta as a barrier for the Cu/PtSi, Cu/Si, and Al/PtSi structuresChang, Chin‐An et al. | 1990
- 3803
-
Temperature‐dependent formation of interface states and Schottky barriers at metal/molecular‐beam epitaxy GaAs(100) junctionsChang, S. / Shaw, J. L. / Viturro, R. E. / Brillson, L. J. / Kirchner, P. D. / Woodall, J. M. et al. | 1990
- 3809
-
Stress state of chromium nitride films deposited by reactive direct current planar magnetron sputteringFabis, P. M. / Cooke, R. A. / McDonough, S. et al. | 1990
- 3819
-
The influence of microstructure on stress state of sputter deposited chromium nitride filmsFabis, P. M. / Cooke, R. A. / McDonough, S. et al. | 1990
- 3827
-
Interaction of copper with a vapor deposited polyimide filmMack, R. G. / Grossman, E. / Unertl, W. N. et al. | 1990
- 3833
-
In situ simultaneous radio frequency discharge power measurementsGodyak, V. A. / Piejak, R. B. et al. | 1990
- 3838
-
Metrological characteristics of a group of quadrupole partial pressure analyzersLieszkovszky, L. / Filippelli, A. R. / Tilford, C. R. et al. | 1990
- 3855
-
Outgassing mechanism after the current decaying phase in disruptive and normal discharges in a tokamakOgiwara, N. / Maeno, M. et al. | 1990
- 3864
-
Room temperature pumping characteristics for gas mixtures of a Zr–Al nonevaporable getterBenvenuti, C. / Francia, F. et al. | 1990
- 3870
-
A new design for the disk‐type molecular pumpTu, J. Y. / Zhu, Y. / Wang, X. Z. et al. | 1990
- 3874
-
A rapid method for the evaluation of small catalyst samplesMoggridge, Geoffrey D. / Badyal, Jas Pal S. / Lambert, Richard M. et al. | 1990
- 3876
-
The National Institute of Standards and Technology Molecular Measuring Machine Project: Metrology and precision engineering designTeague, E. Clayton et al. | 1990
- 3878
-
A novel sample preparation technique for ion and electron beam analysis of the fiber‐matrix interphase in polymeric compositesKalantar, J. / Drzal, L. T. / Hook, K. J. et al. | 1990
- 3881
-
High velocity carbon dioxide snow for cleaning vacuum system surfacesLayden, L. / Wadlow, D. et al. | 1990
- 3883
-
A compact flange‐mounted electron beam sourceJonker, B. T. et al. | 1990
- 3886
-
A novel scheme for mounting insulator samples in ultrahigh vacuumBruns, J. C. / Stair, P. C. / Haidle, Rudy et al. | 1990
- 3888
-
An axial‐emission bent beam gaugeSuen, C. D. / Chen, J. Z. / Kuo, Y. H. et al. | 1990
- 3890
-
Very‐low outgassing rate, separable, aluminum‐flanged, hot‐cathode ion source for a residual gas analyzerWatanabe, Fumio et al. | 1990
- 3892
-
Erratum: Auger and x‐ray absorption studies of solid molecular oxygen [J. Vac. Sci. Technol. A 8, 2591 (1990)]Chen, J. / Lin, C. L. / Qiu, S. L. / Strongin, Myron / den Boer, M. L. et al. | 1990