Recrystallization behavior of silicon implanted with iron (English)
National licence
- New search for: de Souza, J. P.
- New search for: Amaral, L.
- New search for: Fichtner, P. F. P.
- New search for: de Souza, J. P.
- New search for: Amaral, L.
- New search for: Fichtner, P. F. P.
In:
Journal of Applied Physics
;
71
, 11
;
5423-5426
;
1992
- Article (Journal) / Electronic Resource
-
Title:Recrystallization behavior of silicon implanted with iron
-
Contributors:
-
Published in:Journal of Applied Physics ; 71, 11 ; 5423-5426
-
Publisher:
- New search for: American Institute of Physics
-
Publication date:1992-06-01
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Source:
Table of contents – Volume 71, Issue 11
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 5303
-
Representation of tails of periodic and infinite‐range signals: Towards a treatment for truncationVermeulen, A. C. / Delhez, R. / de Keijser, Th. H. / Mittemeijer, E. J. et al. | 1992
- 5310
-
Instabilities in annealed proton exchange waveguides in lithium tantalateMatthews, Paul J. / Mickelson, Alan R. et al. | 1992
- 5318
-
Propagation of several waves in a nonlinear medium displaying an optical activity: Application to four‐wave mixing in Bi12(Ge;Si)O20 crystalsSylla, M. / Nguyen, P. X. / Rouede, D. / Rivoire, G. et al. | 1992
- 5323
-
AlGaAs diode laser blue shift resulting from fast neutron irradiationCamparo, J. C. / Delcamp, S. B. / Frueholz, R. P. et al. | 1992
- 5332
-
Effect of optical activity on higher‐order self‐diffraction in absorptive photorefractive medium: Transmission geometry for two‐wave mixingRoy, Amitava / Singh, Kehar et al. | 1992
- 5338
-
Magnetic field enhanced performance of a copper hollow anode cathode laserZhang, Z. / Perry, N. D. / Tobin, R. C. et al. | 1992
- 5344
-
Longitudinal mode stability difference in Se‐ and Si‐doped AlGaAs lasersSugiura, H. / Noma, A. / Yuri, M. / Hirose, M. / Kume, M. / Ohta, I. / Kazumura, M. et al. | 1992
- 5347
-
Gain measurements of high‐pressure ultraviolet‐preionized self‐sustained discharge pumped atomic xenon laserKomatsu, Katsuhiko / Kannari, Fumihiko / Obara, Minoru et al. | 1992
- 5353
-
Anisotropic thermal conductivity in chemical vapor deposition diamondGraebner, J. E. / Jin, S. / Kammlott, G. W. / Bacon, B. / Seibles, L. / Banholzer, W. et al. | 1992
- 5357
-
Two‐dimensional inverse heat conduction problem of estimating the time‐varying strength of a line heat sourceNeto, A. J. Silva / O¨zis¸ik, M. N. et al. | 1992
- 5363
-
Longitudinal electron diffusion coefficients in gases: Noble gasesPack, J. L. / Voshall, R. E. / Phelps, A. V. / Kline, L. E. et al. | 1992
- 5372
-
Mass spectroscopic study of CH3 radicals produced in a hollow cathode discharge cellSanz, M. M. / Abad, L. / Herrero, V. J. / Tanarro, I. et al. | 1992
- 5376
-
Frequency up‐conversion of a high‐power microwave pulse propagating in a self‐generated plasmaKuo, S. P. / Ren, A. et al. | 1992
- 5381
-
Resonator amplification of microwave emission from a relativistic beam‐plasma systemBenford, Gregory / Baranga, A. Ben‐Amar et al. | 1992
- 5386
-
The formation and annealing of dislocation damage from high‐dose self‐ion implantation of aluminumVardiman, R. G. et al. | 1992
- 5391
-
Calorimetric measurements of the thermal relaxation in nanocrystalline platinumTscho¨pe, A. / Birringer, R. / Gleiter, H. et al. | 1992
- 5395
-
Bonding properties of glow‐discharge polycrystalline and amorphous Si‐C films studied by x‐ray diffraction and x‐ray photoelectron spectroscopyTakeshita, T. / Kurata, Y. / Hasegawa, S. et al. | 1992
- 5401
-
Scanning tunneling microscope‐promoted growth of nanometer‐scale, uniform gold stripes on reconstructed Au(111) surfacesWang, Zhouhang / Moskovits, Martin et al. | 1992
- 5410
-
Molecular‐dynamics simulations of bulk and surface damage production in low‐energy Cu→Cu bombardmentKaretta, Frank / Urbassek, Herbert M. et al. | 1992
- 5410
-
Molecular-dynamics simulations of bulk and surface damage production in low-energy Cu tends to Cu bombardementKaretta, F. / Urbassek, H.M. et al. | 1992
- 5419
-
Thermally stimulated current of Si‐ion‐implanted GaAsLee, Y. H. / Kang, T. W. / Kim, T. W. et al. | 1992
- 5423
-
Recrystallization behavior of silicon implanted with ironde Souza, J. P. / Amaral, L. / Fichtner, P. F. P. et al. | 1992
- 5427
-
Structure and crystallization of low‐pressure chemical vapor deposited silicon films using Si2H6 gasHong, C. H. / Park, C. Y. / Kim, H.‐J. et al. | 1992
- 5433
-
Tantalum as a diffusion barrier between copper and silicon: Failure mechanism and effect of nitrogen additionsHolloway, Karen / Fryer, Peter M. / Cabral, Cyril / Harper, J. M. E. / Bailey, P. J. / Kelleher, K. H. et al. | 1992
- 5445
-
A real time study of the growth of microcrystalline silicon on transparent conducting oxide substratesFang, M. / Drevillon, B. et al. | 1992
- 5450
-
Study of the initial formation of silicon carbide by reaction of tetraethyl silane with siliconBermudez, V. M. et al. | 1992
- 5460
-
Effects of amorphous titanium silicide on subsequently formed crystalline compound prepared by two‐step thermal processNam, H. G. / Chung, I. / Bene, R. W. et al. | 1992
- 5465
-
Investigation of the photorefractive effect in Bi2TeO5Foldvari, I. / Liu, Huimin / Powell, Richard C. / Peter, A. et al. | 1992
- 5474
-
Phosphorus diffusion into silicon from a spin‐on source using rapid thermal processingHartiti, B. / Slaoui, A. / Muller, J. C. / Stuck, R. / Siffert, P. et al. | 1992
- 5474
-
Phosphorous diffusion into silicon from a spin-on source using rapid thermal processingHartiti, B. / Slaoui, A. / Muller, J.C. / Stuck, R. / Siffert, P. et al. | 1992
- 5479
-
Investigations of the electrical propterties of electrodeposited CuInSe2 thin filmsGuillen, C. / Herrero, J. et al. | 1992
- 5479
-
Investigations of the electrical properties of electrodeposited CuInSe2 thin filmsGuille´n, C. / Herrero, J. et al. | 1992
- 5484
-
Saturation of the surface field with external bias for metalorganic chemical vapor deposition epilayer GaAs/GaAs as determined by electroreflection spectroscopyPoras, Henry / Goldsmith, George J. / Pan, Noren et al. | 1992
- 5489
-
Progress towards spin‐polarized scanning tunneling microscopyShvets, I. V. / Wiesendanger, R. / Bu¨rgler, D. / Tarrach, G. / Gu¨ntherodt, H.‐J. / Coey, J. M. D. et al. | 1992
- 5500
-
Hysteresis of the work function of Co(0001) surface resulting from an allotropic transformationSaito, S. / Takeda, K. / Soumura, T. / Ohki, M. / Tani, T. / Maeda, T. et al. | 1992
- 5504
-
A simplified and improved model of ideal and almost ideal silicon p‐n junctions: The role of oxygenPellegrini, Bruno et al. | 1992
- 5517
-
Miniband Bloch conduction in semiconductor superlatticesLei, X. L. / da Cunha Lima, I. C. et al. | 1992
- 5523
-
Analysis of dark current‐voltage characteristics of Al/chlorophyll a/Ag sandwich cellsOueriagli, A. / Kassi, H. / Hotchandani, S. / Leblanc, R. M. et al. | 1992
- 5531
-
Investigation of (111) strained layers: Growth, photoluminescence, and internal electric fieldsHarshman, P. J. / Wang, S. et al. | 1992
- 5539
-
Properties of NiFe-N films prepared rf sputtering in nitrogen-argon gas mixturesShih, K.K. / Re, M.E. / Takamori, T. / Dove, D.B. et al. | 1992
- 5539
-
Properties of NiFe‐N films prepared by rf sputtering in nitrogen‐argon gas mixturesShih, K. K. / Re, M. E. / Takamori, T. / Dove, D. B. et al. | 1992
- 5543
-
In situ monitoring and Hall measurements of GaN grown with GaN buffer layersNakamura, S. / Mukai, T. / Senoh, M. et al. | 1992
- 5543
-
In situ monitoring and Hall measurement of GaN grown with GaN buffer layersNakamura, S. / Makai, T. / Senoh, M. et al. | 1992
- 5550
-
Calculations of the microwave conductivity of high‐Tc superconducting thin films from power transmission measurementsWu, P. H. / Min, Qian et al. | 1992
- 5554
-
Probing of high Tc sample texturing with a potentiometric ringKrause, Thomas W. / Nkum, R. K. / Datars, W. R. / Gridin, Vladimir V. et al. | 1992
- 5560
-
Epitaxial growth of YBa2Cu3O7−x thin films on Si(100) with zirconia buffers of varying crystalline quality and structureLubig, A. / Buchal, Ch. / Schubert, J. / Copetti, C. / Guggi, D. / Jia, C. L. / Stritzker, B. et al. | 1992
- 5565
-
A theoretical analysis of the thickness dependence of the localization effect on the normal‐state resistivities in high‐Tc Y1Ba2Cu3O7−δ thin filmsTyan, J. H. / Lue, J. T. et al. | 1992
- 5569
-
Abnormal J(Ind c) changes against temperature of the Bi(1.6)Pb(0.4)Sr(2)Cu(3)O(x)Yoshitake Nishi / Kazuo Nozaki / Shinichi Ichimura et al. | 1992
- 5569
-
Abnormal Jc changes against temperature of the Bi1.6Pb0.4Sr2Ca2Cu3OxNishi, Yoshitake / Nozaki, Kazuo / Ichimura, Shinichi et al. | 1992
- 5572
-
Low‐resistivity epitaxial YBa2Cu3O7 thin films with improved microstructure and reduced microwave lossesPoppe, U. / Klein, N. / Da¨hne, U. / Soltner, H. / Jia, C. L. / Kabius, B. / Urban, K. / Lubig, A. / Schmidt, K. / Hensen, S. et al. | 1992
- 5579
-
Energy barriers for thermal reversal of interacting single domain particlesChen, Wenjie / Zhang, Shufeng / Bertram, H. Neal et al. | 1992
- 5585
-
Magnetic properties of ternary Co‐B‐C melt spun alloys amorphized over an extended concentration rangePont, M. / Puzniak, R. / Rao, K. V. / Inoue, A. et al. | 1992
- 5591
-
Glassy polarization in the ferroelectric tungsten bronze (Ba,Sr)Nb2O6Bhalla, A. S. / Guo, R. / Cross, L. E. / Burns, G. / Dacol, F. H. / Neurgaonkar, R. R. et al. | 1992
- 5596
-
Densification induced dielectric properties change in amorphous BaTiO3 thin filmsLi, P. / McDonald, J. F. / Lu, T.‐M. et al. | 1992
- 5601
-
Optical properties of epitaxial CoSi2/Si and CoSi2 particles in Si from 0.062 to 2.76 eVWu, Z.‐C. / Arakawa, E. T. / Jimenez, J. R. / Schowalter, L. J. et al. | 1992
- 5606
-
Positron annihilation studies in the field induced depletion regions of metal‐oxide‐semiconductor structuresAsoka‐Kumar, P. / Leung, T. C. / Lynn, K. G. / Nielsen, B. / Forcier, M. P. / Weinberg, Z. A. / Rubloff, G. W. et al. | 1992
- 5610
-
Comparison of band structure claculations and photoluminescence experiments on HgTe/CdTe superlattices grown by molecular beam epitaxyKraus, M.M. / Regnet, M.M. / Becker, C.R. / Bicknell-Tassius, R.N. / Landwehr, G. et al. | 1992
- 5610
-
Comparison of band structure calculations and photoluminescence experiments on HgTe/CdTe superlattices grown by molecular beam epitaxyKraus, M. M. / Regnet, M. M. / Becker, C. R. / Bicknell‐Tassius, R. N. / Landwehr, G. et al. | 1992
- 5614
-
Luminescence characteristics of the (GaP)n(GaAs)n/GaAs atomic layer short‐period superlatticesTakanohashi, Tsugunori / Ozeki, Masashi et al. | 1992
- 5619
-
Nonequilibrium luminescence at the E0+Δ0 gap in GaAs with Si‐δ dopingMestres, N. / Cerdeira, F. / Meseguer, F. / Ruiz, A. / Silveira, J. P. / Briones, F. / Ploog, K. et al. | 1992
- 5619
-
Nonequilibrium luminescence at the Epsilon(0) + Delta(0) gap in GaAs with Si-delta dopingMestres, N. / Cerdeira, F. / Meseguer, F. / Ruiz, A. / Silveira, J.P. / Briones, F. / Ploog, K. et al. | 1992
- 5623
-
Low energy carbon ion bombardment on indium phosphide and its implications for alkane‐based reactive ion etchingMeharg, P. F. A. / Ogryzlo, E. A. / Bello, I. / Lau, W. M. et al. | 1992
- 5629
-
Investigation by laser‐induced fluorescence of surface vaporization during the pulsed CO2 laser irradiation of a titanium sample in an ambient gasHermann, J. / Boulmer‐Leborgne, C. / Dubreuil, B. / Mihailescu, I. N. et al. | 1992
- 5635
-
Films and junctions of cadmium zinc tellurideChu, T. L. / Chu, S. S. / Ferekides, C. / Britt, J. et al. | 1992
- 5641
-
Differences in physical properties of hydrogenated and fluorinated amorphous silicon carbide prepared by reactive sputteringDemichelis, F. / Pirri, C. F. / Tresso, E. / Stapinski, T. et al. | 1992
- 5646
-
Morphology of hydrofluoric acid and ammonium fluoride‐treated silicon surfaces studied by surface infrared spectroscopyNiwano, M. / Takeda, Y. / Ishibashi, Y. / Kurita, K. / Miyamoto, N. et al. | 1992
- 5650
-
Atomic disorder induced by mechanical milling in the Nb3Au intermetallic compoundDi, L. M. / Bakker, H. et al. | 1992
- 5654
-
Effects of plasma and/or 193 nm excimer‐laser irradiation in chemical‐vapor deposition of boron films from B2H6+HeKomatsu, Shojiro / Kasamatsu, Mitsuo / Yamada, Kawakatsu / Moriyoshi, Yusuke et al. | 1992
- 5665
-
Influences of a high excitation frequency (70 MHz) in the glow discharge technique on the process plasma and the properties of hydrogenated amorphous siliconFinger, F. / Kroll, U. / Viret, V. / Shah, A. / Beyer, W. / Tang, X. ‐M. / Weber, J. / Howling, A. / Hollenstein, Ch. et al. | 1992
- 5675
-
Pulsed laser deposition of diamond‐like carbon filmsPappas, David L. / Saenger, Katherine L. / Bruley, John / Krakow, William / Cuomo, Jerome J. / Gu, Tieer / Collins, Robert W. et al. | 1992
- 5685
-
Analysis of the guidance of electromagnetic waves by a deformed planar waveguide with parabolic cylindrical boundariesChoudhury, P. K. / Khastgir, P. / Ojha, S. P. / Singh, L. K. et al. | 1992
- 5689
-
A vectorial finite element formulation for electromagnetic wave propagation in helical systemsIgarashi, H. / Honma, T. et al. | 1992
- 5694
-
Interactions between implanted Mg and base p‐type dopant (Be,Zn,C) in heterojunction bipolar transistor devicesAmarger, V. / Dubon‐Chevallier, C. / Gao, Y. / Descouts, B. et al. | 1992
- 5699
-
A simple technique for simultaneous fabrication of p(+)/n diodes and ohmic contacts in n-type InPBaber, N. / Scheffler, H. / Ullrich, H. / Wolf, T. / Bimberg, D. et al. | 1992
- 5699
-
A simple technique for simultaneous fabrication of p+/n diodes and ohmic contacts on n‐type InPBaber, N. / Scheffler, H. / Ullrich, H. / Wolf, T. / Bimberg, D. et al. | 1992
- 5703
-
A model for the Fe‐related emission at 3057 cm−1 in GaAsPressel, K. / Bohnert, G. / Ru¨ckert, G. / Do¨rnen, A. / Thonke, K. et al. | 1992
- 5706
-
Auger generation suppression in narrow‐gap semiconductors using the magnetoconcentration effectDjuric´, Zoran / Jaksˇic´, Zoran / Vujanic´, Aleksandar / Piotrowski, J. et al. | 1992
- 5709
-
Mössbauer-Fresnel zone plateMooney, T.M. / Alp, E.E. / Yun, W.B. et al. | 1992
- 5709
-
Mo¨ssbauer–Fresnel zone plateMooney, T. M. / Alp, E. E. / Yun, W. B. et al. | 1992
- 5712
-
Efficient pulsed microwave excitation of a high‐pressure excimer dischargeRousseau, V. / Pasquiers, S. / Boisse‐Laporte, C. / Calle`de, G. / Leprince, P. / Marec, J. / Puech, V. et al. | 1992
- 5715
-
Dirsordering of AlGaAs/GaAs quantum well structures using low dose oxygen implantationWeiss, B.L. / Bradley, I.V. / Whitehead, N.J. / Roberts, J.S. et al. | 1992
- 5715
-
Disordering of AlGaAs/GaAs quantum well structures using low dose oxygen implantationWeiss, B. L. / Bradley, I. V. / Whitehead, N. J. / Roberts, J. S. et al. | 1992
- 5718
-
Pulsed laser deposition of stoichiometric LiNbO3 thin films by using O2 and Ar gas mixtures as ambientsOgale, S. B. / Nawathey‐Dikshit, Rashmi / Dikshit, S. J. / Kanetkar, S. M. et al. | 1992
- 5721
-
The effects of pressure on the nucleation rate of an undercooled liquidLee, Chun P. / Wang, Taylor G. et al. | 1992
- 5724
-
Substrate bias effects on diamond synthesis in a magnetoactive microwave plasmaChang, J. J. / Mantei, T. D. et al. | 1992
- 5727
-
Comments on the steady state photocarrier grating technique to measure diffusion lengthsPrabhu, S. / Narasimhan, K. L. / Sharma, D. K. et al. | 1992
- 5728
-
Reply to ‘‘Comments on the steady state photocarrier grating technique to measure diffusion lengths’’Weiser, K. et al. | 1992
- 5729
-
Comment on ‘‘Rectification in heavily doped p‐type GaAs/AlAs heterojunctions’’ [J. Appl. Phys. 70, 1081 (1991)]Zeeb, E. / Ebeling, K. J. et al. | 1992
- 5730
-
Erratum: ‘‘Magnetic properties of high‐density Mn‐Zn ferrites’’ [J. Appl. Phys. 69, 5349 (1991)]Pannaparayil, T. / Marande, R. / Komarneni, S. et al. | 1992
- 5731
-
Erratum: Subdomain zinc ferrite particles: Synthesis and characterization [J. Appl. Phys. 67, 5509 (1990)]Pannaparayil, T. / Komarneni, S. / Marande, R. / Zadarko, M. et al. | 1992
- R23
-
Quantitative emission microscopyKo¨lzer, J. / Boit, C. / Dallmann, A. / Deboy, G. / Otto, J. / Weinmann, D. et al. | 1992