Structural breakdown in high power GaN-on-GaN p-n diode devices stressed to failure (English)
- New search for: Peri, Prudhvi
- New search for: Fu, Kai
- New search for: Fu, Houqiang
- New search for: Zhao, Yuji
- New search for: Smith, David J.
- New search for: Peri, Prudhvi
- New search for: Fu, Kai
- New search for: Fu, Houqiang
- New search for: Zhao, Yuji
- New search for: Smith, David J.
In:
Journal of Vacuum Science & Technology A
;
38
, 6
;
6
;
2020
- Article (Journal) / Electronic Resource
-
Title:Structural breakdown in high power GaN-on-GaN p-n diode devices stressed to failure
-
Contributors:Peri, Prudhvi ( author ) / Fu, Kai ( author ) / Fu, Houqiang ( author ) / Zhao, Yuji ( author ) / Smith, David J. ( author )
-
Published in:Journal of Vacuum Science & Technology A ; 38, 6 ; 6
-
Publisher:
- New search for: American Vacuum Society
-
Publication date:2020-12-01
-
Size:6 pages
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Keywords:
-
Source:
Table of contents – Volume 38, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
-
Carbon content control of silicon oxycarbide film with methane containing plasmaSong, Seokhwi / Park, Suhyeon / Jung, Chanwon / Park, Hyunwoo / Kim, Youngjoon / Jeon, Hyeongtag et al. | 2020
-
Resolving self-limiting growth in silicon nitride plasma enhanced atomic layer deposition with tris-dimethylamino silane precursorMuneshwar, Triratna / Cadien, Ken et al. | 2020
-
Deep GaN through-substrate via etching using Cl2/BCl3 inductively coupled plasmaOkamoto, Naoya / Takahashi, Atsushi / Minoura, Yuichi / Kumazaki, Yusuke / Ozaki, Shiro / Ohki, Toshihiro / Hara, Naoki / Watanabe, Keiji et al. | 2020
-
Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensitiesEngelhard, Mark H. / Baer, Donald R. / Herrera-Gomez, Alberto / Sherwood, Peter M. A. et al. | 2020
-
Enhancing nanostructured nickel-rich lithium-ion battery cathodes via surface stabilizationLim, Jin-Myoung / Luu, Norman S. / Park, Kyu-Young / Tan, Mark T. Z. / Kim, Sungkyu / Downing, Julia R. / He, Kai / Dravid, Vinayak P. / Hersam, Mark C. et al. | 2020
-
Topology of conductive clusters in sputtered high-quality VO2 thin films on the brink of percolation threshold during insulator-to-metal and metal-to-insulator transitionsKoughia, Cyril / Gunes, Ozan / Zhang, Chunzi / Wen, Shi-Jie / Wong, Rick / Yang, Qiaoqin / Kasap, Safa O. et al. | 2020
-
Interfacial modulation on single-crystalline aluminum films grown on GaAs by ErAs insertionZhang, Kedong / Pan, Rui / Xia, Shunji / Zhang, Wangwei / Chang, Menglin / Ding, Yuanfeng / Li, Chen / Deng, Yu / Lu, Hong / Chen, Yan-Feng et al. | 2020
-
Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literatureMajor, George H. / Avval, Tahereh G. / Moeini, Behnam / Pinto, Gabriele / Shah, Dhruv / Jain, Varun / Carver, Victoria / Skinner, William / Gengenbach, Thomas R. / Easton, Christopher D. et al. | 2020
-
Extreme-ultraviolet-induced carbon growth at contaminant pressures between 10−10 and 10−6 mbar: Experiment and modelHill, Shannon B. / Tarrio, Charles / Berg, Robert F. / Lucatorto, Thomas B. et al. | 2020
-
Introductory guide to the application of XPS to epitaxial films and heterostructuresChambers, Scott A. / Wang, Le / Baer, Donald R. et al. | 2020
-
Mechanism of SiN etching rate fluctuation in atomic layer etchinga)Hirata, Akiko / Fukasawa, Masanaga / Kugimiya, Katsuhisa / Nagaoka, Kojiro / Karahashi, Kazuhiro / Hamaguchi, Satoshi / Iwamoto, Hayato et al. | 2020
-
Precursor selection in hybrid molecular beam epitaxy of alkaline-earth stannatesPrakash, Abhinav / Wang, Tianqi / Choudhary, Rashmi / Haugstad, Greg / Gladfelter, Wayne L. / Jalan, Bharat et al. | 2020
-
Atomic layer deposition of ruthenium using an ABC-type process: Role of oxygen exposure during nucleationChopra, Sonali N. / Vos, Martijn F. J. / Verheijen, Marcel A. / Ekerdt, John G. / Kessels, Wilhelmus M. M. / Mackus, Adriaan J. M. et al. | 2020
-
Effect of N2/H2 plasma on the growth of InN thin films on sapphire by hollow-cathode plasma-assisted atomic layer depositionAlevli, Mustafa / Gungor, Nese et al. | 2020
-
Selective ALD of SiN using SiI4 and NH3: The effect of temperature, plasma treatment, and oxide underlayerWang, Han / Hendrix, Bryan C. / Baum, Thomas H. et al. | 2020
-
Structural breakdown in high power GaN-on-GaN p-n diode devices stressed to failurePeri, Prudhvi / Fu, Kai / Fu, Houqiang / Zhao, Yuji / Smith, David J. et al. | 2020
-
XPS group array analysis of a combinatorial Ni-Ti-Co thin film libraryCounsell, Jonathan D. P. / Al Hasan, Naila M. / Walton, Edward / Gao, Tieren / Hou, Huilong / Takeuchi, Ichiro et al. | 2020
-
Practical guide for curve fitting in x-ray photoelectron spectroscopyMajor, George H. / Fairley, Neal / Sherwood, Peter M. A. / Linford, Matthew R. / Terry, Jeff / Fernandez, Vincent / Artyushkova, Kateryna et al. | 2020
-
Ultrahigh purity conditions for nitride growth with low oxygen content by plasma-enhanced atomic layer depositionRayner, Gilbert B. / O’Toole, Noel / Shallenberger, Jeffrey / Johs, Blaine et al. | 2020
-
Synthesis of large-area MoS2 films by plasma-enhanced chemical film conversion of solution-processed ammonium tetrathiomolybdateBhattacharya, Souvik / Liu, Tianqi / Ye, Zhipeng / He, Rui / Mohan Sankaran, R. et al. | 2020
-
Al Kα XPS reference spectra of polyethylene for all instrument geometriesShard, Alexander G. / Reed, Benjamen P. et al. | 2020
-
Chemical passivation of the perovskite layer and its real-time effect on the device performance in back-contact perovskite solar cellsJumabekov, Askhat N. et al. | 2020
-
On the response of gamma irradiation on atomic layer deposition-grown β-Ga2O3 films and Au-β-Ga2O3-Au deep ultraviolet solar-blind photodetectorsHuang, Chun-Ying / Lin, Guan-Yu / Liu, Yen-Yang / Chang, Fu-Yuan / Lin, Pei-Te / Hsu, Feng-Hsuan / Peng, Yu-Hsiang / Huang, Zi-Ling / Lin, Tai-Yuan / Gong, Jyh-Rong et al. | 2020
-
Area-selective atomic layer deposition enabled by competitive adsorptionSuh, Taewon / Yang, Yan / Sohn, Hae Won / DiStasio, Robert A. / Engstrom, James R. et al. | 2020
-
Glow discharge-optical emission spectroscopy for in situ analysis of surfaces in plasmasArora, Priyanka / Cho, Junghyun / Cervantes, Rafael / Donnelly, Vincent M. et al. | 2020
-
Structure and behavior of ZrO2-graphene-ZrO2 stacksKahro, Tauno / Castán, Helena / Dueñas, Salvador / Merisalu, Joonas / Kozlova, Jekaterina / Jõgiaas, Taivo / Piirsoo, Helle-Mai / Kasikov, Aarne / Ritslaid, Peeter / Mändar, Hugo et al. | 2020
-
Interface-induced ferromagnetism in μ-Fe2O3/β-Ga2O3 superlatticesHettiaratchy, Elline C. / Jamison, John S. / Wang, Binbin / Bagués, Núria / Guest, Rachel A. / McComb, David W. / Myers, Roberto C. et al. | 2020
-
Opto-electrical characterization of quaternary sputtered copper indium gallium selenide nanorods via glancing angle depositionBrozak, Matthew / Badraddin, Emad / Karabacak, Tansel / Walsh, Thomas et al. | 2020
-
Plasmonic nitriding of graphene on a graphite substrate via gold nanoparticles and NH3/Ar plasmaKitajima, Takeshi / Miyake, Machiko / Katoh, Ryo / Nakano, Toshiki et al. | 2020
-
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethyleneReed, Benjamen P. / Cant, David J. H. / Spencer, Steve J. / Carmona-Carmona, Abraham Jorge / Bushell, Adam / Herrera-Gómez, Alberto / Kurokawa, Akira / Thissen, Andreas / Thomas, Andrew G. / Britton, Andrew J. et al. | 2020
-
Heteroepitaxial growth of β-Ga2O3 films on SiC via molecular beam epitaxyNepal, Neeraj / Katzer, D. Scott / Downey, Brian P. / Wheeler, Virginia D. / Nyakiti, Luke O. / Storm, David F. / Hardy, Matthew T. / Freitas, Jaime A. / Jin, Eric N. / Vaca, Diego et al. | 2020
-
Modified atomic layer deposition of MoS2 thin filmsZeng, Li / Richey, Nathaniel E. / Palm, David W. / Oh, Il-Kwon / Shi, Jingwei / Maclsaac, Callisto / Jaramillo, Thomas / Bent, Stacey F. et al. | 2020
-
tert-butoxides as precursors for atomic layer deposition of alkali metal containing thin filmsSønsteby, Henrik H. / Bratvold, Jon E. / Killi, Veronica A.-L. K. / Choudhury, Devika / Elam, Jeffrey W. / Fjellvåg, Helmer / Nilsen, Ola et al. | 2020
-
Preface for the Special Topic Collection Commemorating the Career of John CoburnKay, Eric / Graves, David B. / Aydil, Eray S. et al. | 2020
-
Synthesis of edge-enriched WS2 on high surface area WS2 framework by atomic layer deposition for electrocatalytic hydrogen evolution reactionBalasubramanyam, Shashank / Bloodgood, Matthew A. / Zhang, Yue / Verheijen, Marcel A. / Kessels, Wilhelmus M. M. / Hofmann, Jan P. / Bol, Ageeth A. et al. | 2020
-
First-principles study of phonon thermal transport in II–VI group graphenelike materialsLiu, Jianye / Zhao, Yinchang / Wang, Weiqiang / Zhong, Qi / Dai, Zhenhong / Meng, Sheng et al. | 2020
-
Cyclic approach for silicon nitride spacer etching in fin field-effect transistors and stacked nanowire devicesPollet, Olivier / Ah-Leung, Vincent / Barnola, Sebastien / Posseme, Nicolas et al. | 2020
-
Modeling of an atmospheric pressure plasma-liquid anodic interface: Solvated electrons and silver reductionZheng, Yashuang / Wang, Lijun / Bruggeman, Peter et al. | 2020
-
Introduction to x-ray photoelectron spectroscopyStevie, Fred A. / Donley, Carrie L. et al. | 2020
-
Effect of evaporation behavior of zinc tin phosphide alloys on the composition, structure, and photoconductive properties of their thin filmsSivakumar, P. / Peranantham, P. / Siva Kumar, V. V. / Asokan, K. / Jeyachandran, Y. L. et al. | 2020
-
Controlled thin-film deposition of α or β Ga2O3 by ion-beam sputteringBecker, Martin / Benz, Sebastian L. / Chen, Limei / Polity, Angelika / Klar, Peter J. / Chatterjee, Sangam et al. | 2020
-
Thin-film encapsulation of Al2O3 multidensity layer structure prepared by spatial atomic layer depositionPark, Hyunwoo / Shin, Seokyoon / Choi, Hyeongsu / Lee, Namgue / Choi, Yeongtae / Kim, Keunsik / Jeon, Hyeongtag et al. | 2020
-
First-principles theoretical analysis and electron energy loss spectroscopy of vacancy defects in bulk and nonpolar () surface of GaNNayak, Sanjay / Naik, Mit H. / Jain, Manish / Waghmare, Umesh V. / Shivaprasad, Sonnada M. et al. | 2020
-
Photoluminescence, thermoluminescence, and cathodoluminescence of optimized cubic Gd2O3:Bi phosphor powderAbdelrehman, Mogahid H. M. / Kroon, Robin E. / Yousif, Abdelrhman / Seed Ahmed, Hassan A. A. / Swart, Hendrik C. et al. | 2020
-
Physical and chemical vapor deposition methods applied to all-inorganic metal halide perovskitesBonomi, Sara / Malavasi, Lorenzo et al. | 2020
-
Magnetron sputteringRossnagel, Stephen M. et al. | 2020
-
Theoretical study of the adsorption of Lewis acids on MoS2 in relation to atomic layer deposition of Al2O3Bermudez, Victor M. et al. | 2020
-
Errata: “Review of electrical contacts to phase change materials and an unexpected trend between metal work function and contact resistance to germanium telluride” [J. Vac. Sci. Technol. A 38, 050805 (2020)]”Cooley, Kayla A. / Aldosari, Haila M. / Yang, Kezhou / Mohney, Suzanne E. et al. | 2020
-
Review on recent progress in patterning phase change materialsShen, Meihua / Lill, Thorsten / Altieri, Nick / Hoang, John / Chiou, Steven / Sims, Jim / McKerrow, Andrew / Dylewicz, Rafal / Chen, Ernest / Razavi, Hamid et al. | 2020
-
Low-cost spectrum analyzer for trouble shooting noise sources in scanning probe microscopyMcQuillan, Nicholas M. / Larson, Amanda M. / Sykes, E. Charles H. et al. | 2020
-
Preface to special collection: 30 years of the Nellie Yeoh Whetten Award—celebrating the women of the AVSWalker, Amy V. et al. | 2020
-
Ultrasonic atomization of titanium isopropoxide at room temperature for TiO2 atomic layer depositionJang, Moon-Hyung / Lei, Yu et al. | 2020
-
Effect of a low pressure low temperature hydrogen plasma on the work function of europiumCristofaro, Sofia / Friedl, Roland / Fantz, Ursel et al. | 2020
-
The chemistry and energetics of the interface between metal halide perovskite and atomic layer deposited metal oxidesBracesco, Andrea E. A. / Burgess, Claire H. / Todinova, Anna / Zardetto, Valerio / Koushik, Dibyashree / Kessels, Wilhelmus M. M (Erwin) / Dogan, Ilker / Weijtens, Christ H. L. / Veenstra, Sjoerd / Andriessen, Ronn et al. | 2020
-
Oblique angle initiated chemical vapor deposition for patterning film growthWelchert, Nicholas A. / Cheng, Christine / Karandikar, Prathamesh / Gupta, Malancha et al. | 2020
-
Raman scattering study of nanoscale Mo/Si and Mo/Be periodic multilayer structuresKumar, Niranjan / Volodin, Vladimir A. / Smertin, Ruslan M. / Yunin, Pavel A. / Polkovnoikov, Vladimir N. / Panda, Kalpataru / Nechay, Andrey N. / Chkhalo, Nikolay I. et al. | 2020
-
Raman scattering, emission, and deep defect evolution in ZnO:In thin filmsTorchynska, Tetyana / El Filali, Brahim / Jaramillo Gomez, Juan Antonio / Polupan, Georgiy / Ramírez García, Jorge Luis / Shcherbyna, Lyudmyla et al. | 2020
-
Design and implementation of floating field ring edge termination on vertical geometry β-Ga2O3 rectifiersSharma, Ribhu / Xian, Minghan / Law, Mark E. / Tadjer, Marko / Ren, Fan / Pearton, Stephen J. et al. | 2020
-
Energy-dense Li metal anodes enabled by thin film electrolytesIoanniti, Marina Maria / Hu, Fei / Tenhaeff, Wyatt E. et al. | 2020
-
Achieving near-zero temperature coefficient of resistivity in atomic layer deposition TiSixN films through composition tuningFeit, Corbin / Chugh, Srishti / Dhamdhere, Ajit R. / Kim, Hae Young / Dabas, Shaurya / Rathi, Somilkumar J. / Mukherjee, Niloy / Banerjee, Parag et al. | 2020
-
Sample handling, preparation and mounting for XPS and other surface analytical techniquesStevie, Fred A. / Garcia, Roberto / Shallenberger, Jeffrey / Newman, John G. / Donley, Carrie L. et al. | 2020
-
Effect of duty cycle on the thermochromic properties of VO2 thin-film fabricated by high power impulse magnetron sputteringJuan, Pi-Chun / Lin, Kuei-Chih / Lin, Cheng-Li / Lin, Wei-Fan et al. | 2020