Submicrometer ultrananocrystalline diamond films processed in oxygen and hydrogen plasma and analyzed by UV-vis spectroscopy: Thickness and optical constant results (English)
- New search for: Chen, Gongxiaohui
- New search for: Spentzouris, Linda
- New search for: Kovi, Kiran Kumar
- New search for: Baryshev, Sergey V.
- New search for: Chen, Gongxiaohui
- New search for: Spentzouris, Linda
- New search for: Kovi, Kiran Kumar
- New search for: Baryshev, Sergey V.
In:
Surface Science Spectra
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27
, 2
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19
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2020
- Article (Journal) / Electronic Resource
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Title:Submicrometer ultrananocrystalline diamond films processed in oxygen and hydrogen plasma and analyzed by UV-vis spectroscopy: Thickness and optical constant results
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Contributors:Chen, Gongxiaohui ( author ) / Spentzouris, Linda ( author ) / Kovi, Kiran Kumar ( author ) / Baryshev, Sergey V. ( author )
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Published in:Surface Science Spectra ; 27, 2 ; 19
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Publisher:
- New search for: American Vacuum Society
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Publication date:2020-12-01
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Size:19 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 27, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Bismuth acetate by XPSRodriguez-Pereira, Jhonatan / Rincón-Ortiz, Sergio A. / Ospina, Rogelio et al. | 2020
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MnO2 nanomaterials functionalized with Ag and SnO2: An XPS studyBigiani, Lorenzo / Maccato, Chiara / Barreca, Davide / Gasparotto, Alberto et al. | 2020
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Jahn–Teller distorted Cu1−xNixCr2O4 (x = 0, 0.5, 1) nanoparticlesRubengo, Farai / Prinsloo, Aletta R. E. / Carleschi, Emanuela / Mohanty, Pankaj / Doyle, Bryan P. / Sheppard, Charles J. et al. | 2020
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Mass spectral database for TOF-SIMS of stable isotopes of Sr and ZrZhao, Yue / Yoshida, Takeru / Ohmori, Yuzuka / Miyashita, Yuta / Morita, Masato / Sakamoto, Tetsuo / Kato, Kotaro / Terabayashi, Ryohei / Sonnenschein, Volker / Tomita, Hideki et al. | 2020
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Co(OH)2 powder characterized by x-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS)Cole, Kevin M. / Kirk, Donald W. / Thorpe, Steven J. et al. | 2020
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XPS of the surface chemical environment of CsMAFAPbBrI trication-mixed halide perovskite filmRodriguez-Pereira, Jhonatan / Tirado, Juan / Gualdrón-Reyes, Andrés F. / Jaramillo, Franklin / Ospina, Rogelio et al. | 2020
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1-Bromonaphthalene, by near-ambient pressure XPSDietrich, Paul et al. | 2020
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Ru(0001) and SiO2/Ru(0001): XPS studyKhaniya, Asim / Ezzat, Sameer / Cumston, Quintin / Coffey, Kevin R. / Kaden, William E. et al. | 2020
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XPS characterization of Al2O3/ZnO ultrathin films grown by atomic layer depositionGhods, Amirhossein / Zhou, Chuanle / Ferguson, Ian T. et al. | 2020
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Sildenafil tablet analyzed by XPSRodriguez-Pereira, Jhonatan / Rincón-Ortiz, Sergio A. / Ospina, Rogelio et al. | 2020
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Calcium and fluorine signals in HS-LEIS for CaF2(111) and powder—Quantification of atomic surface concentrations using LiF(001), Ca, and Cu referencesPrůša, Stanislav / Bábík, Pavel / Mach, Jindřich / Strapko, Tomáš / Šikola, Tomáš / Brongersma, Hidde H. et al. | 2020
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Surface Y2O3 layer formed on air exposed Y powder characterized by XPSCole, Kevin M. / Kirk, Donald W. / Thorpe, Steven J. et al. | 2020
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Diphenylsiloxane–dimethylsiloxane copolymer: Optical functions from 191 to 1688 nm (0.735–6.491 eV) by spectroscopic ellipsometryPatel, Dhananjay I. / Shah, Dhruv / Roychowdhury, Tuhin / Wheeler, Joshua I. / Ess, Daniel H. / Hilfiker, James N. / Linford, Matthew R. et al. | 2020
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Y(OH)3 powder characterized by XPSCole, Kevin M. / Kirk, Donald W. / Thorpe, Steven J. et al. | 2020
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Niobium ethoxide analyzed by XPSRincón-Ortiz, Sergio A. / Rodriguez-Pereira, Jhonatan / Ospina, Rogelio et al. | 2020
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Submicrometer ultrananocrystalline diamond films processed in oxygen and hydrogen plasma and analyzed by UV-vis spectroscopy: Thickness and optical constant resultsChen, Gongxiaohui / Spentzouris, Linda / Kovi, Kiran Kumar / Baryshev, Sergey V. et al. | 2020
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Thorium tetrafluoride analyzed by XPSFeng, Xu / Davis, Brenton / Zhang, Jinsuo et al. | 2020
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XPS characterization of Mn2O3 nanomaterials functionalized with Ag and SnO2Wagner, Tobias / Valbusa, Daniele / Bigiani, Lorenzo / Barreca, Davide / Gasparotto, Alberto / Maccato, Chiara et al. | 2020
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Molybdenum diselenide thin films grown by atomic layer deposition: An XPS analysisRodriguez-Pereira, Jhonatan / Zazpe, Raul / Charvot, Jaroslav / Bureš, Filip / Macak, Jan M. et al. | 2020
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X-ray photoelectron spectroscopy data from lightly Pd doped TiO2 anatase nanoparticlesEngelhard, Mark H. / Baer, Donald R. / Chen, Linxiao et al. | 2020