Nano-Beam Diffraction and Convergent Beam Electron Diffraction (English)
- New search for: K.S. Wong, Terence
- New search for: K.S. Wong, Terence
In:
Semiconductor Strain Metrology: Principles and Applications
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1
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2012
- Article/Chapter (Book) / Electronic Resource
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Title:Nano-Beam Diffraction and Convergent Beam Electron Diffraction
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Contributors:K.S. Wong, Terence ( author )
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Published in:
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Publisher:
- New search for: Bentham Science Publishers Ltd.
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Publication date:2012
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ISBN:
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Type of media:Article/Chapter (Book)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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PART 1: INTRODUCTIONK.S. Wong, Terence et al. | 2012
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Introduction to Strain Metrology for SemiconductorsK.S. Wong, Terence et al. | 2012
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Strain, Stress and Semiconductor PropertiesK.S. Wong, Terence et al. | 2012
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PART 2: OPTICAL STRAIN METROLOGYK.S. Wong, Terence et al. | 2012
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Variable Angle Spectroscopic EllipsometryK.S. Wong, Terence et al. | 2012
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Photoreflectance MethodK.S. Wong, Terence et al. | 2012
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Micro-Raman SpectroscopyK.S. Wong, Terence et al. | 2012
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PART 3: ELECTRON BEAM STRAIN METROLOGYK.S. Wong, Terence et al. | 2012
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Cathodoluminescence MethodK.S. Wong, Terence et al. | 2012
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Nano-Beam Diffraction and Convergent Beam Electron DiffractionK.S. Wong, Terence et al. | 2012
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Dark-Field Electron Holographic Moire MethodK.S. Wong, Terence et al. | 2012
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PART 4: EMERGING STRAIN METROLOGYK.S. Wong, Terence et al. | 2012
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Tip-Enhanced Raman SpectroscopyK.S. Wong, Terence et al. | 2012
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Atomic Force Microscopy Digital Image Correlation MethodK.S. Wong, Terence et al. | 2012
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Synchrotron X-ray Micro/Nanodiffraction MethodsK.S. Wong, Terence et al. | 2012
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Conclusion and OutlookK.S. Wong, Terence et al. | 2012
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Appendix 1K.S. Wong, Terence et al. | 2012
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IndexK.S. Wong, Terence et al. | 2012