Calculation of the performance of magnetic lenses with limited machining precision (English)
- New search for: Sháněl, O.
- New search for: Zlámal, J.
- New search for: Oral, M.
- New search for: Sháněl, O.
- New search for: Zlámal, J.
- New search for: Oral, M.
In:
Ultramicroscopy
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137
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1-6
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2013
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Calculation of the performance of magnetic lenses with limited machining precision
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Contributors:
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Published in:Ultramicroscopy ; 137 ; 1-6
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Publisher:
- New search for: Elsevier B.V.
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Publication date:2013-10-08
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Size:6 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 137
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Calculation of the performance of magnetic lenses with limited machining precisionSháněl, O. / Zlámal, J. / Oral, M. et al. | 2013
- 7
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Advanced split-illumination electron holography without Fresnel fringesTanigaki, Toshiaki / Aizawa, Shinji / Park, Hyun Soon / Matsuda, Tsuyoshi / Harada, Ken / Shindo, Daisuke et al. | 2013
- 12
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Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopyMartinez, G.T. / Rosenauer, A. / De Backer, A. / Verbeeck, J. / Van Aert, S. et al. | 2013
- 20
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A cylindrical specimen holder for electron cryo-tomographyPalmer, Colin M. / Löwe, Jan et al. | 2013
- 30
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Immobilizing live Escherichia coli for AFM studies of surface dynamicsLonergan, N.E. / Britt, L.D. / Sullivan, C.J. et al. | 2013
- 40
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An automated method of quantifying ferrite microstructures using electron backscatter diffraction (EBSD) dataShrestha, Sachin L. / Breen, Andrew J. / Trimby, Patrick / Proust, Gwénaëlle / Ringer, Simon P. / Cairney, Julie M. et al. | 2013
- 48
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Height drift correction in non-raster atomic force microscopyMeyer, Travis R. / Ziegler, Dominik / Brune, Christoph / Chen, Alex / Farnham, Rodrigo / Huynh, Nen / Chang, Jen-Mei / Bertozzi, Andrea L. / Ashby, Paul D. et al. | 2013
- 55
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In-situ observation of equilibrium transitions in Ni films; agglomeration and impurity effectsThron, Andrew M. / Greene, Peter / Liu, Kai / van Benthem, Klaus et al. | 2013
- 66
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Control of the higher eigenmodes of a microcantilever: Applications in atomic force microscopyKarvinen, K.S. / Moheimani, S.O.R. et al. | 2013
- 72
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Writing is magical, mysterious, aggressive, dangerous, not to be trifled withHawkes, Peter et al. | 2013
- IFC
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IFC (Editorial Board)| 2014