Blind deconvolution of time-of-flight mass spectra from atom probe tomography (English)
- New search for: Johnson, L.J.S.
- New search for: Thuvander, M.
- New search for: Stiller, K.
- New search for: Odén, M.
- New search for: Hultman, L.
- New search for: Johnson, L.J.S.
- New search for: Thuvander, M.
- New search for: Stiller, K.
- New search for: Odén, M.
- New search for: Hultman, L.
In:
Ultramicroscopy
;
132
;
60-64
;
2013
-
ISSN:
- Article (Journal) / Electronic Resource
-
Title:Blind deconvolution of time-of-flight mass spectra from atom probe tomography
-
Contributors:Johnson, L.J.S. ( author ) / Thuvander, M. ( author ) / Stiller, K. ( author ) / Odén, M. ( author ) / Hultman, L. ( author )
-
Published in:Ultramicroscopy ; 132 ; 60-64
-
Publisher:
- New search for: Elsevier B.V.
-
Publication date:2013-01-01
-
Size:5 pages
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Keywords:
-
Source:
Table of contents – Volume 132
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
PrefaceThompson, Gregory B. / Weaver, Mark L. / Martens, Richard et al. | 2013
- 3
-
In commemoration of Prof. Dr.-Ing. Johannes Mitterauer (1936–2012)Dr. Wanderka, Nelia / Prof. Dr. Kruse, Norbert et al. | 2013
- 4
-
Commemoration II for IFES 2012Kreuzer, Hans-Jürgen et al. | 2013
- 4
-
Commemoration II for IFES 2012:In Memoriam: Prof. Dr. Gert Ehrlich (1926–2012)Kreuzer, H. J. et al. | 2013
- 5
-
On the interaction of an ultra-fast laser with a nanometric tip by laser assisted atom probe tomography: A reviewVella, A. et al. | 2013
- 19
-
Reconstructing atom probe data: A reviewVurpillot, Francois / Gault, Baptiste / Geiser, Brian P. / Larson, D.J. et al. | 2013
- 31
-
Effect of Mg or Ag addition on the evaporation field of AlAruga, Yasuhiro / Nako, Hidenori / Tsuneishi, Hidemasa / Hasegawa, Yuki / Tao, Hiroaki / Ichihara, Chikara / Serizawa, Ai et al. | 2012
- 36
-
Tunable field emission characteristics of ZnO nanowires coated with varied thickness of lanthanum boride thin filmsZhao, C.X. / Li, Y.F. / Chen, Jun / Deng, S.Z. / Xu, N.S. et al. | 2012
- 41
-
Dielectric effect on electric fields in the vicinity of the metal–vacuum–dielectric junctionChung, M.S. / Mayer, A. / Miskovsky, N.M. / Weiss, B.L. / Cutler, P.H. et al. | 2012
- 48
-
Information extraction from FN plots of tungsten microemittersMussa, Khalil O. / Mousa, Marwan S. / Fischer, Andreas et al. | 2013
- 54
-
Field evaporation of oxides: A theoretical studyKarahka, Markus / Kreuzer, H.J. et al. | 2012
- 60
-
Blind deconvolution of time-of-flight mass spectra from atom probe tomographyJohnson, L.J.S. / Thuvander, M. / Stiller, K. / Odén, M. / Hultman, L. et al. | 2013
- 65
-
3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomographyKambham, Ajay Kumar / Kumar, Arul / Gilbert, Matthieu / Vandervorst, Wilfried et al. | 2013
- 70
-
Optimal laser positioning for laser-assisted atom probe tomographyKoelling, S. / Innocenti, N. / Bogdanowicz, J. / Vandervorst, W. et al. | 2013
- 75
-
Coupling atom probe tomography and photoluminescence spectroscopy: Exploratory results and perspectivesRigutti, Lorenzo / Vella, Angela / Vurpillot, François / Gaillard, Aurore / Sevelin-Radiguet, Nicolas / Houard, Jonathan / Hideur, Ammar / Martel, Gilles / Jacopin, Gwénolé / Luna Bugallo, Andrés De et al. | 2013
- 81
-
Reduction of multiple hits in atom probe tomographyThuvander, Mattias / Kvist, Anders / Johnson, Lars J.S. / Weidow, Jonathan / Andrén, Hans-Olof et al. | 2012
- 86
-
Defect analysis by statistical fitting to 3D atomicmapsBalogh, Zoltán / Oberdorfer, Christian / Chellali, Mohammed Reda / Stender, Patrick / Nowak, Susann / Schmitz, Guido et al. | 2013
- 92
-
Spatial decomposition of molecular ions within 3D atom probe reconstructionsBreen, Andrew / Moody, Michael P. / Gault, Baptiste / Ceguerra, Anna V. / Xie, Kelvin Y. / Du, Sichao / Ringer, Simon P. et al. | 2013
- 100
-
Applying computational geometry techniques for advanced feature analysis in atom probe dataFelfer, Peter / Ceguerra, Anna / Ringer, Simon / Cairney, Julie et al. | 2013
- 107
-
Electrostatic simulations of a local electrode atom probe: The dependence of tomographic reconstruction parameters on specimen and microscope geometryLoi, Shyeh Tjing / Gault, Baptiste / Ringer, Simon P. / Larson, David J. / Geiser, Brian P. et al. | 2012
- 114
-
Point process statistics in atom probe tomographyPhilippe, T. / Duguay, S. / Grancher, G. / Blavette, D. et al. | 2012
- 121
-
Data mining for isotope discrimination in atom probe tomographyBroderick, Scott R. / Bryden, Aaron / Suram, Santosh K. / Rajan, Krishna et al. | 2013
- 129
-
Interactive visualization of APT data at full fidelityBryden, Aaron / Broderick, Scott / Suram, Santosh K. / Kaluskar, Kaustubh / LeSar, Richard / Rajan, Krishna et al. | 2012
- 136
-
Calibration of reconstruction parameters in atom probe tomography using a single crystallographic orientationSuram, Santosh K. / Rajan, Krishna et al. | 2013
- 143
-
Mapping energetics of atom probe evaporation events through first principles calculationsPeralta, Joaquín / Broderick, Scott R. / Rajan, Krishna et al. | 2013
- 152
-
A model to predict image formation in Atom probeTomographyVurpillot, F. / Gaillard, A. / Da Costa, G. / Deconihout, B. et al. | 2012
- 158
-
New atom probe approaches to studying segregation in nanocrystalline materialsSamudrala, S.K. / Felfer, P.J. / Araullo-Peters, V.J. / Cao, Y. / Liao, X.Z. / Cairney, J.M. et al. | 2013
- 164
-
Nano-analysis of grain boundary and triple junction transport in nanocrystalline Ni/CuReda Chellali, Mohammed / Balogh, Zoltan / Schmitz, Guido et al. | 2013
- 171
-
Atomic insight into Ge1−xSnx using atom probe tomographyKumar, Arul / Komalan, Manu P. / Lenka, Haraprasanna / Kambham, Ajay Kumar / Gilbert, Matthieu / Gencarelli, Federica / Vincent, Benjamin / Vandervorst, Wilfried et al. | 2013
- 179
-
Analysis of implanted silicon dopant profilesProsa, T.J. / Olson, D. / Geiser, B. / Larson, D.J. / Henry, K. / Steel, E. et al. | 2012
- 186
-
Quantitative dopant distributions in GaAs nanowires using atom probe tomographyDu, Sichao / Burgess, Timothy / Gault, Baptiste / Gao, Qiang / Bao, Peite / Li, Li / Cui, Xiangyuan / Kong Yeoh, Wai / Liu, Hongwei / Yao, Lan et al. | 2013
- 193
-
Effect of external stress on the Fe–Cr phase separation in 15-5 PH and Fe–15Cr–5Ni alloysDanoix, F. / Lacaze, J. / Gibert, A. / Mangelinck, D. / Hoummada, K. / Andrieu, E. et al. | 2013
- 199
-
Influence of experimental parameters on the composition of precipitates in metallic alloysGasnier, Virgile / Gault, Baptiste / Nako, Hidenori / Aruga, Yasuhiro / Sha, Gang / Ringer, Simon P. et al. | 2013
- 205
-
Atomic engineering of platinum alloy surfacesLi, Tong / Bagot, P.A.J. / Marquis, E.A. / Edman Tsang, S.C. / Smith, G.D.W. et al. | 2012
- 212
-
Phase separation in equiatomic AlCoCrFeNi high-entropy alloyManzoni, A. / Daoud, H. / Völkl, R. / Glatzel, U. / Wanderka, N. et al. | 2012
- 216
-
Sr–Al–Si co-segregated regions in eutectic Si phase of Sr-modified Al–10Si alloyTimpel, M. / Wanderka, N. / Schlesiger, R. / Yamamoto, T. / Isheim, D. / Schmitz, G. / Matsumura, S. / Banhart, J. et al. | 2012
- 222
-
Correlative multi-scale characterization of a fine grained Nd–Fe–B sintered magnetSasaki, T.T. / Ohkubo, T. / Hono, K. / Une, Y. / Sagawa, M. et al. | 2013
- 227
-
Statistical analysis of composition fluctuations and short-range order in stoichiometric Ni–Cr–Mo alloysVerma, A. / Wanderka, N. / Singh, J.B. / Kumar, B. / Banhart, J. et al. | 2013
- 233
-
Atomic scale investigation of redistribution of alloying elements in pearlitic steel wires upon cold-drawing and annealingLi, Y.J. / Choi, P. / Goto, S. / Borchers, C. / Raabe, D. / Kirchheim, R. et al. | 2012
- 239
-
Understanding the detection of carbon in austenitic high-Mn steel using atom probe tomographyMarceau, R.K.W. / Choi, P. / Raabe, D. et al. | 2013
- 248
-
Combined nano-SIMS/AFM/EBSD analysis and atom probe tomography, of carbon distribution in austenite/ε-martensite high-Mn steelsSeol, Jae-Bok / Lee, B.-H / Choi, P. / Lee, S.-G. / Park, C.-G. et al. | 2013
- 258
-
Quantitative methods for the APT analysis of thermally aged RPV steelsStyman, Paul D. / Hyde, Jonathan M. / Wilford, Keith / Smith, George D.W. et al. | 2012
- 265
-
Atom probe tomography investigation of lath boundary segregation and precipitation in a maraging stainless steelThuvander, Mattias / Andersson, Marcus / Stiller, Krystyna et al. | 2012
- 271
-
Defining clusters in APT reconstructions of ODS steelsWilliams, Ceri A. / Haley, Daniel / Marquis, Emmanuelle A. / Smith, George D.W. / Moody, Michael P. et al. | 2012
- 279
-
Atom probe tomography of thermally grown oxide scale on FeCrAlLiu, Fang / Stiller, Krystyna et al. | 2013
- 285
-
Hydrogen analysis in APT: Methods to control adsorption and dissociation of H2Sundell, G. / Thuvander, M. / Andrén, H.-O. et al. | 2013
- 290
-
Phase transformation in SiOx/SiO2 multilayers for optoelectronics and microelectronics applicationsRoussel, M. / Talbot, E. / Pratibha Nalini, R. / Gourbilleau, F. / Pareige, P. et al. | 2012
- 295
-
Atom probe tomography analysis of WC powderWeidow, Jonathan et al. | 2013
- IFC
-
IFC (Editorial Board)| 2013
- vii
-
Contents| 2013