Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors (English)
- New search for: Hastas, N.A.
- New search for: Arpatzanis, N.
- New search for: Dimitriadis, C.A.
- New search for: Brochet, J.
- New search for: Templier, F.
- New search for: Kamarinos, G.
- New search for: Hastas, N.A.
- New search for: Arpatzanis, N.
- New search for: Dimitriadis, C.A.
- New search for: Brochet, J.
- New search for: Templier, F.
- New search for: Kamarinos, G.
In:
Microelectronics and Reliability
;
51
, 3
;
556-559
;
2010
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors
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Contributors:Hastas, N.A. ( author ) / Arpatzanis, N. ( author ) / Dimitriadis, C.A. ( author ) / Brochet, J. ( author ) / Templier, F. ( author ) / Kamarinos, G. ( author )
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Published in:Microelectronics and Reliability ; 51, 3 ; 556-559
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Publisher:
- New search for: Elsevier Ltd
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Publication date:2010-09-29
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Size:4 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 51, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 517
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Reliability challenges in 3D IC packaging technologyTu, K.N. et al. | 2010
- 524
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The effect of a post processing thermal anneal on pre-existing and stress induced electrically active defects in ultra-thin SiON dielectric layersO’Connor, Robert / Hughes, Greg et al. | 2010
- 529
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LDMOSFET with drain potential suppression for 100V Power IC technologyHolland, P. / Elwin, M. / Anteney, I. / Ellis, J. / Armstrong, L. / Birchby, G. / Igic, P. et al. | 2010
- 536
-
Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristicObreja, V.V.N. / Codreanu, C. / Poenar, D. / Buiu, O. et al. | 2010
- 543
-
Compact modeling of short-channel effects in symmetric and asymmetric 3-T/4-T double gate MOSFETsMohammadi, Saeed / Afzali-Kusha, Ali et al. | 2010
- 550
-
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effectsDjeffal, F. / Bentrcia, T. / Abdi, M.A. / Bendib, T. et al. | 2010
- 556
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Hysteresis effect in bottom-gate polymorphous silicon thin-film transistorsHastas, N.A. / Arpatzanis, N. / Dimitriadis, C.A. / Brochet, J. / Templier, F. / Kamarinos, G. et al. | 2010
- 560
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RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussionsMilovanović, Vladimir / van der Toorn, Ramses / Pijper, Ralf et al. | 2010
- 566
-
Molybdenum and low-temperature annealing of a silicon power P–i–N diodeVobecký, J. / Komarnitskyy, V. / Záhlava, V. et al. | 2010
- 572
-
Characteristics of the intrinsic defects in unintentionally doped 4H–SiC after thermal annealingCheng, Ping / Zhang, Yu-ming / Zhang, Yi-men et al. | 2010
- 576
-
Current transport mechanisms and trap state investigations in (Ni/Au)–AlN/GaN Schottky barrier diodesArslan, Engin / Bütün, Serkan / Şafak, Yasemin / Çakmak, Hüseyin / Yu, Hongbo / Özbay, Ekmel et al. | 2010
- 581
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On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructuresTekeli, Z. / Gökçen, M. / Altındal, Ş. / Özçelik, S. / Özbay, E. et al. | 2010
- 587
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Device linearity and intermodulation distortion comparison of dual material gate and conventional AlGaN/GaN high electron mobility transistorKumar, Sona P. / Agrawal, Anju / Chaujar, Rishu / Gupta, R.S. / Gupta, Mridula et al. | 2010
- 597
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Influence of P3HT:PCBM blend preparation on the active layer morphology and cell degradationBalderrama, V.S. / Estrada, M. / Cerdeira, A. / Soto-Cruz, B.S. / Marsal, L.F. / Pallares, J. / Nolasco, J.C. / Iñiguez, B. / Palomares, E. / Albero, J. et al. | 2010
- 602
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A self-test and dynamics characterization circuit for MEMS electrostatic actuatorsFernández, Daniel / Madrenas, Jordi / Cosp, Jordi et al. | 2010
- 610
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Analyses of electromagnetic vibration-based generators fabricated with LTCC multilayer and silver spring-inducerLu, W.L. / Hwang, Y.M. / Pan, C.T. / Shen, S.C. et al. | 2010
- 621
-
Acoustic emission for detecting deterioration of capacitors under agingSmulko, Janusz / Józwiak, Kazimierz / Olesz, Marek / Hasse, Lech et al. | 2010
- 628
-
Cyclic endurance reliability of stretchable electronic substratesBossuyt, F. / Guenther, J. / Löher, T. / Seckel, M. / Sterken, T. / de Vries, J. et al. | 2010
- 636
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Effect of Cr additions on interfacial reaction between the Sn–Zn–Bi solder and Cu/electroplated Ni substratesBi, Jinglin / Hu, Anmin / Hu, Jing / Luo, Tingbi / Li, Ming / Mao, Dali et al. | 2010
- 642
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Determination of residual strains of the EMC in PBGA during manufacturing and IR solder reflow processesTsai, M.Y. / Ting, C.W. / Huang, C.Y. / Lai, Yi-Shao et al. | 2010
- 649
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High-cycle fatigue life prediction for Pb-free BGA under random vibration loadingYu, Da / Al-Yafawi, Abdullah / Nguyen, Tung T. / Park, Seungbae / Chung, Soonwan et al. | 2010
- 657
-
The influence of solder composition on the impact strength of lead-free solder ball grid array jointsTsukamoto, H. / Nishimura, T. / Suenaga, S. / McDonald, S.D. / Sweatman, K.W. / Nogita, K. et al. | 2010
- 668
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Simulation and experimental analysis of large area substrate overmolding with epoxy molding compoundsSchreier-Alt, Thomas / Rehme, Frank / Ansorge, Frank / Reichl, Herbert et al. | 2010
- 676
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ACF particle distribution in COG processYen, Yee-Wen / Lee, Chun-Yu et al. | 2010
- 685
-
Thermal fracture toughness measurement for underfill during temperature changePark, Soojae / Feger, Claudius et al. | 2010
- 692
-
Switch-level emulation of strength-base soft error detectionSedaghat, Reza / Javaheri, Reza / Kalkat, Prabhleen K. / Chikhe, Jalal Mohammad et al. | 2010
- 703
-
Mitigation of permanent faults in adaptive equalizersReviriego, P. / Liu, S. / Maestro, J.A. et al. | 2010
- 711
-
Orthogonal fault-tolerant systolic arrays for matrix multiplicationMilovanović, I.Ž. / Milovanović, E.I. / Stojčev, M.K. / Bekakos, M.P. et al. | 2010
- IFC
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Inside front cover - Editorial board| 2011