Numerically robust tetrahedron-based tomographic forward and backward projectors on parallel architectures (English)
- New search for: Biguri, Ander
- New search for: Towsyfyan, Hossein
- New search for: Boardman, Richard
- New search for: Blumensath, Thomas
- New search for: Biguri, Ander
- New search for: Towsyfyan, Hossein
- New search for: Boardman, Richard
- New search for: Blumensath, Thomas
In:
Ultramicroscopy
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214
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2020
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Numerically robust tetrahedron-based tomographic forward and backward projectors on parallel architectures
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Contributors:Biguri, Ander ( author ) / Towsyfyan, Hossein ( author ) / Boardman, Richard ( author ) / Blumensath, Thomas ( author )
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Published in:Ultramicroscopy ; 214
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Publisher:
- New search for: Elsevier B.V.
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Publication date:2020-05-02
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 214
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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High-quality reconstruction of coherent modulation imaging using weak cascade modulatorsHe, Zhenfei / Wang, Bingyang / Bai, Jiaming / Barbastathis, George / Zhang, Fucai et al. | 2020
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The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precisionPadgett, Elliot / Holtz, Megan E. / Cueva, Paul / Shao, Yu-Tsun / Langenberg, Eric / Schlom, Darrell G. / Muller, David A. et al. | 2020
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Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)Gholinia, Ali / Curd, Matthew E. / Bousser, Etienne / Taylor, Kevin / Hosman, Thijs / Coyle, Steven / Shearer, Michael Hassel / Hunt, John / Withers, Philip J. et al. | 2020
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Achieving diffraction-limited resolution in soft-X-ray Fourier-transform holographyGeilhufe, Jan / Pfau, Bastian / Günther, Christian M. / Schneider, Michael / Eisebitt, Stefan et al. | 2020
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Using erenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescenceStöger-Pollach, Michael / Löffler, Stefan / Maurer, Niklas / Bukvišová, Kristýna et al. | 2020
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Numerically robust tetrahedron-based tomographic forward and backward projectors on parallel architecturesBiguri, Ander / Towsyfyan, Hossein / Boardman, Richard / Blumensath, Thomas et al. | 2020
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Combining high temperature sample preparation and in-situ magnetic fields in XPEEMMandziak, Anna / Figuera, Juan de la / Prieto, Jose Emilio / Prat, Jordi / Foerster, Michael / Aballe, Lucía et al. | 2020
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Editorial Board| 2020
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Conductivity models for electron energy loss spectroscopy of graphene in a scanning transmission electron microscope with high energy resolutionLyon, Keenan / Mowbray, Duncan J. / Miskovic, Zoran L. et al. | 2020
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Observer Design for Topography Estimation in Atomic Force Microscopy Using Neural and Fuzzy NetworksRafiee Javazm, Mohammad / Nejat Pishkenari, Hossein et al. | 2020