Hot-carrier-injection resilient RF power amplifier using adaptive bias (English)
- New search for: Pazos, S.M.
- New search for: Aguirre, F.L.
- New search for: Palumbo, F.
- New search for: Silveira, F.
- New search for: Pazos, S.M.
- New search for: Aguirre, F.L.
- New search for: Palumbo, F.
- New search for: Silveira, F.
In:
Microelectronics and Reliability
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114
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2020
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Hot-carrier-injection resilient RF power amplifier using adaptive bias
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Contributors:Pazos, S.M. ( author ) / Aguirre, F.L. ( author ) / Palumbo, F. ( author ) / Silveira, F. ( author )
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Published in:
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Publisher:
- New search for: Elsevier Ltd
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Publication date:2020-07-28
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 114
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Field emission induced-damage in the actuation paths of MEMS capacitive structuresTheocharis, J. / Koutsoureli, M. / Gardelis, S. / Konstantinidis, G. / Papaioannou, G. et al. | 2020
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A study of material stoichiometry on charging properties of SiNx films for potential application in RF MEMS capacitive switchesKoutsoureli, M. / Birmpiliotis, D. / Papaioannou, G. et al. | 2020
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Fault diagnosis of cracks in crystalline silicon photovoltaic modules through I-V curveMa, Mingyao / Zhang, Zhixiang / Xie, Zhen / Yun, Ping / Zhang, Xing / Li, Fei et al. | 2020
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A method to improve the reliability of three-level inverter based on equivalent input disturbance and repetitive control combinationsYang, Guoliang / Yin, Jinze / Huang, Zhiying / Zhang, Yuna et al. | 2020
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Analysis of drain current transient stability of AlGaN/GaN HEMT stressed under HTOL & HTRB, by random telegraph noise and low frequency noise characterizationsTartarin, J.G. / Lazar, O. / Rumeau, A. / Franc, B. / Bary, L. / Lambert, B. et al. | 2020
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Robustness of pressure sensors with piezoresistive nanogauges up to 522 °CKoumela, A. / Brunet-Manquat, P. / Joët, L. / Berthelot, A. / Rey, P. et al. | 2020
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Reliability test for subsea power semiconductorsGuillon, David / Scherrer, Barbara / Dugal, Franc / Lendenmann, Heinz / Oppliger, Jean-Marc et al. | 2020
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Optimal sampling for accelerated testing in 14 nm FinFET ring oscillatorsHsu, Shu-Han / Huang, Ying-Yuan / Wu, Yi-Da / Yang, Kexin / Lin, Li-Hsiang / Milor, Linda et al. | 2020
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Impact of modulation strategies on the lifetime estimation of impedance source inverter in wind power systemFan, Peng / Huang, Shoudao / Luo, Derong et al. | 2020
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0.5 μm GaN RF power bar technology space evaluationVan de Casteele, J. / Stuhldreier, H. / Bouw, D. / Gourdon, C. / Raoult, M. / Durand, E. / Van Den Berghe, S. / Hollmer, M. / Grunwald, M. / Lambert, B. et al. | 2020
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Single-event induced failure mode of PWM in DC/DC converterGao, J. / Li, C. / Li, B. / Zhao, F. / Li, J. / Zhang, G. / Wang, C. / Zeng, C. / Cui, S. / Wu, Q. et al. | 2020
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Interface characterization of CuCu ball bonds by a fast shear fatigue methodCzerny, B. / Khatibi, G. et al. | 2020
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Influence of temperature and humidity on power cycling capability of power modulesWuest, Felix / Wittler, Olaf / Schneider-Ramelow, Martin et al. | 2020
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On the use of soft gamma radiation to characterize the pre-breakdown carrier multiplication in SiC power MOSFETs and its correlation to the TCR failure rate as measured by neutron irradiationCiappa, Mauro / Pocaterra, Marco et al. | 2020
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Multimodal fault-tolerant control for single-phase cascaded off-grid PV-storage system with PV failure using hybrid modulationLiu, Zhao / Lu, Yiyan / Kong, Jianshou / Gong, Jian / Wang, Shuzheng et al. | 2020
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Capacitive micromachined ultrasonic transducers leak detection by dye penetrant testNowodzinski, A. / Ndjoye-Kogou, O. / Mourier, V. / Nonglaton, G. / Bouchu, D. / Fain, B. / Giroud, S. et al. | 2020
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Comparative evaluation of reliability assessment methods of power modules in motor drive inverterChoi, U.M. / Vernica, I. / Zhou, D. / Blaabjerg, F. et al. | 2020
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Degradation mechanisms in high power InGaN semiconductor lasers investigated by electrical, optical, spectral and C-DLTS measurementsPiva, F. / De Santi, C. / Buffolo, M. / Taffarel, M. / Meneghesso, G. / Zanoni, E. / Meneghini, M. et al. | 2020
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New definition of critical energy for SiC MOSFET robustness under short circuit operations: The repetitive critical energyChen, C. / Nguyen, T.A. / Labrousse, D. / Lefebvre, S. / Buttay, C. / Morel, H. et al. | 2020
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An active thermal management strategy for switched reluctance drive system with minimizing current sampling delayYang, Qingqing / Ma, Mingyao / Yang, Shuying / Zhang, Xing et al. | 2020
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Shoot-through protection for an inverter consisting of the next-generation IGBTs with gate impedance reductionHasegawa, K. / Abe, S. / Tsukuda, M. / Omura, I. / Ninomiya, T. et al. | 2020
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Gate threshold voltage instability and on-resistance degradation under reverse current conduction stress on E-mode GaN-HEMTsNakayama, T. / Mannen, T. / Nakajima, A. / Isobe, T. et al. | 2020
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Analysis of the aging mechanism occurring at the bond-wire contact of IGBT power devices during power cyclingDornic, N. / Ibrahim, A. / Khatir, Z. / Degrenne, N. / Mollov, S. / Ingrosso, D. et al. | 2020
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Impact of stray-inductance imbalance on short-circuit capability of multi-chip SiC power modulesChou, K. / Isobe, T. / Mannen, T. et al. | 2020
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A novel accelerated life-test method under thermal cyclic loadings for electronic devices considering multiple failure mechanismsLi, Yaqiu / Pan, Guangze / Li, Qian / Wang, Chunhui / Hu, Xianghong et al. | 2020
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Investigation of multiple short-circuits characteristics and reliability in SiC power devices used for a start-up method of power convertersMannen, Tomoyuki / Isobe, Takanori / Wada, Keiji et al. | 2020
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Ultrasonic monitoring performance degradation of lithium ion batteryKim, Jae-Yeon / Jo, Jang-Hun / Byeon, Jai-Won et al. | 2020
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Microstructure evolutions upon Ni(Pt) silicidation and the different responses to the metal etchQin, Wentao / Iyer, Dorai / Steinwall, Jim / Chang, George / Watkins, Robert / Casteel, Carroll / Morgan, Jim / Thomason, Mike et al. | 2020
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Packaging reliability estimation of high-power device modules by utilizing silver sintering technologyLee, Chang-Chun / Kuo, Kuo-Shu / Wang, Chi-Wei / Chang, Jing-Yao / Han, Wei-Kuo / Chang, Tao-Chih et al. | 2020
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Role of the AlGaN barrier on the long-term gate reliability of power HEMTs with p-GaN gateTallarico, A.N. / Posthuma, N.E. / Bakeroot, B. / Decoutere, S. / Sangiorgi, E. / Fiegna, C. et al. | 2020
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A study of hopping transport during discharging in SiNx films for MEMS capacitive switchesBirmpiliotis, D. / Koutsoureli, M. / Stavrinidis, G. / Konstantinidis, G. / Papaioannou, G. et al. | 2020
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An error detecting scheme with input offset regulation for enhancing reliability of ultralow-voltage SRAMYang, Pan / Ye, Xiaocan / Zhao, Yongxin / Zhang, Wei / Huang, Shoumou / Huang, Yang / Wang, Yujie et al. | 2020
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Mode identification for reliability improvement of MMCFan, X.F. / Qiu, D.Y. / Zhang, B. / Chen, Y.F. / Huang, R.H. / Cao, W.Y. / Xu, S.K. / Fu, C. / Rao, H. / Li, L.C. et al. | 2020
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Effects of solder degradation on the die temperature measurement via internal gate resistanceKawahara, C. / Brandelero, J. / Pichon, P. / Mollov, S. et al. | 2020
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An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation processLv, Chunlin / Liu, Jinjun / Zhang, Yan / Lei, Wanjun / Cao, Rui et al. | 2020
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On the replacement of water as coupling medium in scanning acoustic microscopy analysis of sensitive electronics componentsHertl, M. / Mialhe, F. / Richard, I. et al. | 2020
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Investigation of the mechanical properties of corroded sintered silver layers by using NanoindentationKolbinger, E. / Kuttler, S. / Wagner, S. / Schneider-Ramelow, M. et al. | 2020
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Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applicationsAguiar, Y.Q. / Wrobel, F. / Autran, J.-L. / Leroux, P. / Saigné, F. / Pouget, V. / Touboul, A.D. et al. | 2020
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Gate drive circuit for current balancing of parallel-connected SiC-JFETs under avalanche modeTakamori, Taro / Wada, Keiji / Saito, Wataru / Nishizawa, Shin-ichi et al. | 2020
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Wear-out failure of an IGBT module in motor drives due to uneven thermal impedance of power semiconductor devicesVernica, I. / Choi, U.M. / Wang, H. / Blaabjerg, F. et al. | 2020
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FEM-aided damage model calibration method for experimental resultsFogsgaard, M.B. / Iannuzzo, F. et al. | 2020
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A time-domain stability analysis method for LLC resonant converter based on Floquet theoryLi, Hong / Zou, Ying / Jiang, Xiaheng / Liu, Chen et al. | 2020
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Circuit design using Schmitt Trigger to reliability improvementZimpeck, A.L. / Meinhardt, C. / Artola, L. / Hubert, G. / Kastensmidt, F.L. / Reis, R.A.L. et al. | 2020
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Assessing multi-output Gaussian process regression for modeling of non-monotonic degradation trends of light emitting diodes in storageLim, S.L.H. / Duong, P.L.T. / Park, H. / Singh, P. / Tan, C.M. / Raghavan, N. et al. | 2020
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Reliability in the era of electrification in aviation: A systems approachEmmanouil, K. et al. | 2020
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Accumulative total ionizing dose (TID) and transient dose rate (TDR) effects on planar and vertical ferroelectric tunneling-field-effect-transistors (TFET)Yan, Gangping / Xu, Gaobo / Bi, Jinshun / Tian, Guoliang / Xu, Qiuxia / Yin, Huaxiang / Li, Yongliang et al. | 2020
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A high-efficiency threshold voltage distribution test method based on the reliability of 3D NAND flash memoryWei, Debao / Chen, Xiaoyu / Feng, Hua / Qiao, Liyan / Peng, Xiyuan et al. | 2020
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Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETsYamasue, K. / Cho, Y. et al. | 2020
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Multiple failure mode identification of SiC planar MOSFETs in short-circuit operationWang, Bixuan / Liu, Jingcun / Li, Wanping / Zhang, Guogang / Geng, Yingsan / Wang, Jianhua et al. | 2020
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CSME: A novel cycle-sensing margin enhancement scheme for high yield STT-MRAMCai, H. / Liu, M. / Zhou, Y. / Liu, B. / Naviner, L.A.B. et al. | 2020
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Reliability study of PCB-embedded power dies using solderless pressed metal foamBensebaa, S. / Berkani, M. / Lefebvre, S. / Petit, M. / Schmitt, N. / Zhang, S. et al. | 2020
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Fretting wear reliability assessment methodology of gold-plated electrical connectors considering manufacture parameters distributionLing, S. / Xu, L. / Li, D. / Zhai, G. et al. | 2020
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Vibration-induced dynamic characteristics modeling of electrical contact resistance for connectorsXu, L. / Ling, S. / Li, D. / Zhai, G. et al. | 2020
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Gate leakage current sensing for in situ temperature monitoring of p-GaN gate HEMTsBorghese, A. / Riccio, M. / Longobardi, G. / Maresca, L. / Breglio, G. / Irace, A. et al. | 2020
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Single-pulse observation of photoemission during avalanche breakdown in insulated gate bipolar transistorEndo, Koichi / Chinone, Norimichi / Nakamura, Tomonori / Matsumoto, Toru / Nakamae, Koji et al. | 2020
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Reliability of H-terminated diamond MESFETs in high power dissipation operating conditionDe Santi, C. / Pavanello, L. / Nardo, A. / Verona, C. / Verona Rinati, G. / Meneghesso, G. / Zanoni, E. / Meneghini, M. et al. | 2020
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Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluationSchvittz, R.B. / Aguiar, Y.Q. / Wrobel, F. / Autran, J.-L. / Rosa, L.S. Jr / Butzen, P.F. et al. | 2020
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Analysis of cyclic spontaneous switchings in GaN & SiC cascodes by snappy turn-off currentsGunaydin, Yasin / Jahdi, Saeed / Alatise, Olayiwola / Ortiz-Gonzalez, Jose Angel / Aithal, Avinash / Yuan, Xibo / Mellor, Phil et al. | 2020
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A non-invasive SiC MOSFET Junction temperature estimation method based on the transient light Emission from the intrinsic body diodeSusinni, G. / Rizzo, S.A. / Iannuzzo, F. / Raciti, A. et al. | 2020
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Physical mechanisms for gate damage induced by heavy ions in SiC power MOSFETBusatto, G. / Di Pasquale, A. / Marciano, D. / Palazzo, S. / Sanseverino, A. / Velardi, F. et al. | 2020
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Asynchronous early output majority voter and a relative-timed asynchronous TMR implementationBalasubramanian, Padmanabhan / Maskell, Douglas L. / Mastorakis, Nikos E. et al. | 2020
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Monitoring of parameter stability of SiC MOSFETs in real application testsSievers, M. / Findenig, B. / Glavanovics, M. / Aichinger, T. / Deutschmann, B. et al. | 2020
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Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopyHirota, J. / Yamasue, K. / Cho, Y. et al. | 2020
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Effects of alloying elements in high reliability copper wire bond material for high temperature applicationsEto, M. / Araki, N. / Yamada, T. / Klengel, R. / Klengel, S. / Petzold, M. / Sugiyama, M. / Fujimoto, S. et al. | 2020
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OFF-state trapping phenomena in GaN HEMTs: Interplay between gate trapping, acceptor ionization and positive charge redistributionCanato, E. / Meneghini, M. / De Santi, C. / Masin, F. / Stockman, A. / Moens, P. / Zanoni, E. / Meneghesso, G. et al. | 2020
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Gold wire bond study for automotive applicationPapadopoulos, C. / Villiger, T. / Steiner, S. / Prinz, J. / Morabito, C. / Cammarata, M. / Rodriguez, A. / Kwon, J. / Geilenkeuser, R. / Breuer, D. et al. | 2020
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Smart soiling sensor for PV modulesSimonazzi, M. / Chiorboli, G. / Cova, P. / Menozzi, R. / Santoro, D. / Sapienza, S. / Sciancalepore, C. / Sozzi, G. / Delmonte, N. et al. | 2020
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Lithium-ion battery performance degradation evaluation in dynamic operating conditions based on a digital twin modelQu, X. / Song, Y. / Liu, D. / Cui, X. / Peng, Y. et al. | 2020
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AC stress reliability study on a novel vertical MOS transistor for non-volatile memory technologyLocati, J. / Della Marca, V. / Rivero, C. / Fornara, P. / Regnier, A. / Niel, S. / Coulié, K. et al. | 2020
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Effect of thermal and vibrational combined ageing on QFN terminal pads solder reliabilityArabi, F. / Gracia, A. / Delétage, J.-Y. / Frémont, H. et al. | 2020
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Modeling and fault diagnosis of multi-phase winding inter-turn short circuit for five-phase PMSM based on improved trust regionYang, J.W. / Dai, Z.Y. / Zhang, Z. et al. | 2020
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Conducted EMI mitigation in transformerless PV inverters based on intrinsic MOSFET parametersKraiem, S. / Hamouda, M. / Slama, J. Ben Hadj et al. | 2020
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Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitorsMay, Nicholas / Favata, Joseph / Ahmadi, Bahar / Tavousi, Pouya / Shahbazmohamadi, Sina et al. | 2020
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A lifetime assessment and prediction method for large area solder jointsLederer, M. / Kotas, A. Betzwar / Khatibi, G. et al. | 2020
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Hot-Carrier degradation in P- and N-channel EDMOS for smart power applicationLi, Shuang / Bravaix, Alain / Kussener, Edith / Ney, David / Federspiel, Xavier / Cacho, Florian et al. | 2020
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Gate-damage accumulation and off-line recovery in SiC power MOSFETs with soft short-circuit failure modeCastellazzi, A. / Richardeau, F. / Borghese, A. / Boige, F. / Fayyaz, A. / Irace, A. / Guibaud, G. / Chazal, V. et al. | 2020
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A rapid life-prediction approach for solder joints based on modified Engelmaier fatigue modelPan, Yuxiong / Zhou, Guifa / Wang, Xu / Kuang, Fen et al. | 2020
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Extraction of wearout model parameters using on-line test of an SRAMHsu, Shu-Han / Huang, Ying-Yuan / Wu, Yi-Da / Yang, Kexin / Lin, Li-Hsiang / Milor, Linda et al. | 2020
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Reliability-driven pin assignment optimization to improve in-orbit soft-error rateAguiar, Y.Q. / Wrobel, F. / Autran, J.-L. / Leroux, P. / Saigné, F. / Pouget, V. / Touboul, A.D. et al. | 2020
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GaN-based high-periodicity multiple quantum well solar cells: Degradation under optical and electrical stressCaria, A. / De Santi, C. / Zamperetti, F. / Huang, X. / Fu, H. / Chen, H. / Zhao, Y. / Neviani, A. / Meneghesso, G. / Zanoni, E. et al. | 2020
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A time-domain stability analysis method for paralleled LLC resonant converter system based on Floquet theoryLi, Hong / Jiang, Xiaheng / Zou, Ying / Liu, Chen et al. | 2020
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Health monitoring of mechanically fatigued flexible lithium ion battery by electrochemical impedance spectroscopyKim, Jae-Yeon / Kim, Jin-Yeong / Kim, Mu-Kyeong / Byeon, Jai-Won et al. | 2020
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Simplified hybrid reliability simulation approach of a VSC DC grid with integration of an improved DC current flow controllerWang, Puyu / Wang, Song / Zhang, Xiao-Ping / Zhao, Xin / Xiang, Zhengrong / Guo, Chunyi et al. | 2020
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Reliability analysis of excitation control modes of a synchronous condenser during grid-integration at the speed-falling stageWang, Puyu / Yuan, Tao / Mou, Qingwen / Gu, Wei / Xiang, Zhengrong / Liu, Zhao / Guo, Chunyi et al. | 2020
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Damage based PoF model of solder joints under temperature cycling and electric coupling conditionYuan, Jiaxin / Zhang, Sujuan / Wan, Bo / Fu, Guicui / Jiang, Maogong et al. | 2020
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Row hammer avoidance analysis of DDR3 SDRAMVersen, M. / Ernst, W. et al. | 2020
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Reliability prediction of FinFET FPGAs by MTOLBender, E. / Bernstein, J.B. / Bensoussan, A. et al. | 2020
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Novel failure traces beyond the barrier on the floating deviceLee, Gwang Wook / Shim, Sunnu / Cho, Wookhyun / Kim, Wonse / Lee, Kisoo / Kim, Jaehyun / Cho, Seongjun / Won, Seokjun / Koo, Bonyoung et al. | 2020
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Ageing of glass passivated TRIAC devices under thermal and electrical stressBuvat, Y. / Bouyssou, E. / Morillon, B. / Gautier, G. et al. | 2020
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A novel BIST for monitoring aging/temperature by self-triggered scheme to improve the reliability of STT-MRAMZhou, Y. / Cai, H. / Zhang, M. / Naviner, L.A.B. / Yang, J. et al. | 2020
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Evaluating the soft error sensitivity of a GPU-based SoC for matrix multiplicationLeón, Germán / Badía, José M. / Belloch, Jose A. / Lindoso, Almudena / Entrena, Luis et al. | 2020
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Heavy ion and proton induced single event upsets in 3D SRAMHe, Z. / Cai, C. / Liu, T.Q. / Ye, B. / Mo, L.H. / Liu, J. et al. | 2020
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Analysis of the successive breakdown statistics of multilayer Al2O3/HfO2 gate stacks using the time-dependent clustering modelMuñoz-Gorriz, J. / Gonzalez, M.B. / Campabadal, F. / Suñé, J. / Miranda, E. et al. | 2020
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Influence of CdTe solar cell properties on stability at high temperaturesBertoncello, Matteo / Casulli, Fabio / Barbato, Marco / Artegiani, Elisa / Romeo, Alessandro / Trivellin, Nicola / Zanoni, Enrico / Meneghini, Matteo / Meneghesso, Gaudenzio et al. | 2020
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Investigation of the current collapse behaviour in GaN power HEMTs with highly adjustable pulse and measurement conceptGoller, M. / Thim, M.A. / Song, J. / Kowalsky, J. / Franke, J. / Lutz, J. et al. | 2020
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On the analysis of radiation-induced failures in the AXI interconnect moduleDe Sio, C. / Azimi, S. / Sterpone, L. et al. | 2020
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Reliability-oriented optimization of aluminum electrolytic capacitor considering uncertain mission profileNiu, Hao / Wang, Shujuan / Ye, Xuerong et al. | 2020
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UIS performance and ruggedness of stand-alone and cascode SiC JFETsAgbo, S.N. / Ortiz Gonzalez, J. / Wu, R. / Jahdi, S. / Alatise, O. et al. | 2020
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Conducted EMI susceptibility analysis of a COTS processor as function of agingBenfica, Juliano / Vargas, Fabian / Soares, Matheus Fay / Schramm, Dorian et al. | 2020
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Analysis of counterfeit electronicsMura, G. / Murru, R. / Martines, G. et al. | 2020
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Investigation of critical parameters in power supplies components failure due to electric pulseCuros, L. / Dubois, T. / Mejecaze, G. / Puybaret, F. / Plano, B. / Vinassa, J.-M. et al. | 2020
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Editorial Board| 2020
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Challenges to overcome breakdown limitations in lateral β-Ga2O3 MOSFET devicesTetzner, Kornelius / Hilt, Oliver / Popp, Andreas / Bin Anooz, Saud / Würfl, Joachim et al. | 2020
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Modeling and analysis of the catastrophic failure and degradation dataKim, Seung-Hyun / Sung, Si-Il et al. | 2020
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Evaluation based on performance and failure of PV system in 10 years field-aged 1 MW PV power plantOh, Wonwook / Choi, Hoonjoo / Seo, Kun Won / Kim, Daesung / Kim, So-Yeon / Lee, Hae-Seok / Hwang, Heon / Kim, Donghwan et al. | 2020
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Effects of anisotropy on the reliability of TSV microstructureFan, Zhengwei / Chen, Xun / Liu, Yao / Jiang, Yu / Zhang, Yun-an et al. | 2020
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IGBT aging monitoring and remaining lifetime prediction based on long short-term memory (LSTM) networksLi, Wanping / Wang, Bixuan / Liu, Jingcun / Zhang, Guogang / Wang, Jianhua et al. | 2020
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Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learningChen, J. / Lange, T. / Andjelkovic, M. / Simevski, A. / Krstic, M. et al. | 2020
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Solving Time-dependent reliability-based design optimization by adaptive differential evolution algorithm and time-dependent polynomial chaos expansions (ADE-T-PCE)Ye, Xuerong / Chen, Hao / Kuang, Qiankun / Wang, Yue / Niu, Hao / Li, Wenwen / Yuan, Ruiming / Zhai, Guofu et al. | 2020
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Life-cycle reliability design optimization of high-power DC electromagnetic devices based on time-dependent non-probabilistic convex model processYe, Xuerong / Chen, Hao / Sun, Qisen / Chen, Cen / Niu, Hao / Zhai, Guofu / Li, Wenwen / Yuan, Ruiming et al. | 2020
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Analog and mixed-signal circuits simulation for product level EMMI analysisMelis, Tommaso / Simeu, Emmanuel / Auvray, Etienne / Armagnat, Paul et al. | 2020
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Wire-bond contact degradation modeling for remaining useful lifetime prognosis of IGBT power modulesNazar, M. / Ibrahim, A. / Khatir, Z. / Degrenne, N. / Al-Masry, Z. et al. | 2020
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Effects of gamma radiation on suspended silicon nanogauges bridge used for MEMS transductionJanioud, P. / Poulain, C. / Koumela, A. / Armani, J.M. / Dupret, A. / Rey, P. / Berthelot, A. / Jourdan, G. / Morfouli, P. et al. | 2020
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Exploration of gate trench module for vertical GaN devicesRuzzarin, M. / Geens, K. / Borga, M. / Liang, H. / You, S. / Bakeroot, B. / Decoutere, S. / De Santi, C. / Neviani, A. / Meneghini, M. et al. | 2020
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Mitigating single event upset of FPGA for the onboard bus control of satelliteCui, Xiuhai / Liu, Liansheng et al. | 2020
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CFD modeling of additive manufacturing liquid cold plates for more reliable power press-pack assembliesCova, P. / Santoro, D. / Spaggiari, D. / Portesine, F. / Vaccaro, F. / Delmonte, N. et al. | 2020
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Single event upset for monolithic 3-D integrated 6T SRAM based on a 22 nm FD-SOI technology: Effects of channel size and temperatureZhang, Junjun / Liu, Fanyu / Li, Bo / Li, Binhong / Huang, Yang / Yang, Can / Wang, Guoqing / Wang, Rongwei / Luo, Jiajun / Han, Zhengsheng et al. | 2020
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FBGA solder ball defect effect on DDR4 data signal rise time and ISI measured by loading the data line with a capacitorWaqar, Muhammad / Baeg, Sanghyeon / Bak, Geunyong / Kwon, Junhyeong / Lee, Kiseok / Jeon, Sang Hoon et al. | 2020
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Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testingAuchlin, Maxime / Marozau, Ivan / Bayat, Dara Z. / Marchand, Laurent / Gass, Volker / Sereda, Olha et al. | 2020
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Thermal behaviour evolution of an IGBT module after aging measured by thermoreflectanceMetayrek, Y. / Kociniewski, T. / Khatir, Z. et al. | 2020
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Experimental setup to monitor non-destructive single events triggered by ionizing radiation in power devicesPocaterra, Marco / Ciappa, Mauro et al. | 2020
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Mission profile-oriented configuration of PV panels for lifetime and cost-efficiency of PV invertersWang, Dingyi / Wang, Haoran / Zhang, Xing et al. | 2020
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Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory devicesXi, K. / Bi, J.S. / Xu, Y.N. / Li, Y.D. / Zhang, Z.G. / Liu, M. et al. | 2020
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Effect of cell size reduction on the threshold voltage of UMOSFETsBaba, Yoshiro / Omura, Ichiro et al. | 2020
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A power transfer model-based method for lithium-ion battery discharge time prediction of electric rotatory-wing UAVTang, D.Y. / Gong, M.T. / Yu, J.S. / Li, X. et al. | 2020
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Reliability analysis in GeTe and GeSbTe based phase-change memory 4 kb arrays targeting storage class memory applicationsLama, G. / Bourgeois, G. / Bernard, M. / Castellani, N. / Sandrini, J. / Nolot, E. / Garrione, J. / Cyrille, M.C. / Navarro, G. / Nowak, E. et al. | 2020
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Comparisons of SnO2 gas sensor degradation under elevated storage and working conditionsSun, Yongquan / Guo, Jiaying / Qi, Jia / Liu, Bo / Yu, Tianhua et al. | 2020
-
Non thermally-activated transients and buffer traps in GaN transistors with p-type gate: A new method for extracting the activation energyNardo, A. / Meneghini, M. / Barbato, A. / De Santi, C. / Meneghesso, G. / Zanoni, E. / Sicre, S. / Sayadi, L. / Prechtl, G. / Curatola, G. et al. | 2020
-
Thermo-mechanical assessment of silver sintering for attaching power components in embedded PCBArabi, F. / Youssef, T. / Coudert, M. / Coquery, G. / Alayli, N. / Martineau, D. / Belnoue, O. et al. | 2020
-
Impact of the sensing current density on PN-junction based temperature estimation methods for Si and SiC power devicesHoffmann, Felix / Rugen, Sarah / Silber, Dieter / Kaminski, Nando et al. | 2020
-
Online junction temperature estimation using integrated NTC thermistor in IGBT modules for PMSM drivesMa, Mingyao / Yan, Xuesong / Guo, Weisheng / Yang, Shuying / Cai, Guoqing / Chen, Wenjie et al. | 2020
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Barrier properties of Cu/TiW/ITO electrode for Si heterojunction solar cell under low temperature thermal agingJeong, Jae-Seong / Shin, Eun-Gu et al. | 2020
-
Combined experimental and numerical approach for investigating the mechanical degradation of the interface between thin film metallization and Si-substrate after temperature cycling testZhao, D. / Letz, S. / Yu, Z. / Schletz, A. / März, M. et al. | 2020
-
Non-destructive automatic die-level defect detection of counterfeit microelectronics using machine visionAhmadi, B. / Heredia, R. / Shahbazmohamadi, S. / Shahbazi, Z. et al. | 2020
-
Peculiar failure mechanisms in GaN power transistorsVanzi, M. / Mura, G. et al. | 2020
-
Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online applicationMaures, M. / Capitaine, A. / Delétage, J.-Y. / Vinassa, J.-M. / Briat, O. et al. | 2020
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Study of moisture transport in silicone gel for IGBT modulesZhang, K. / Schlottig, G. / Mengotti, E. / Quittard, O. / Iannuzzo, F. et al. | 2020
-
Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysisDu, H. / Letz, S. / Baker, N. / Goetz, T. / Iannuzzo, F. / Schletz, A. et al. | 2020
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Editorial of 31st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2020)Papaioannou, George et al. | 2020
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Heavy ion track straggling effect in single event effect numerical simulation of 3D stacked devicesLiu, T.Q. / Li, D.Q. / Cai, C. / Zhao, P.X. / Shen, C. / Liu, J. / Yang, G.W. et al. | 2020
-
FPGA-based reliability testing and analysis for 3D NAND flash memoryWei, Debao / Piao, Zhelong / Feng, Hua / Qiao, Liyan / Peng, Xiyuan et al. | 2020
-
Failure-analysis method of soldering interfaces in light-emitting diode packages based on time-domain transient thermal responseMa, Byongjin / Jung, Taehee / Choi, Sungsoon / Lee, Kwanhun et al. | 2020
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Separation of electron and hole trapping components of PBTI in SiON nMOS transistorsWaltl, Michael / Stampfer, Bernhard / Rzepa, Gerhard / Kaczer, Ben / Grasser, Tibor et al. | 2020
-
Analysis of trap states in AlGaN/GaN self-switching diodes via impedance measurementsPérez-Martín, E. / Vaquero, D. / Sánchez-Martín, H. / Gaquière, C. / Raposo, V.J. / González, T. / Mateos, J. / Iñiguez-de-la-Torre, I. et al. | 2020
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Hot-carrier-injection resilient RF power amplifier using adaptive biasPazos, S.M. / Aguirre, F.L. / Palumbo, F. / Silveira, F. et al. | 2020
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A method to extract lumped thermal networks of capacitors for reliability oriented designDelmonte, N. / Cabezuelo, D. / Kortabarria, I. / Santoro, D. / Toscani, A. / Cova, P. et al. | 2020
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New power module concept in PCB-embedded technology with silver sintering die attachTablati, A. / Alayli, N. / Youssef, T. / Belnoue, O. / Theolier, L. / Woirgard, E. et al. | 2020
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A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemesWang, Zhian / Li, Binhong / Wu, Jianfei / Zhao, Wenxin / Li, Bo / Liu, Hainan / Guan, Chongjie / Feng, Shiwei / Luo, Jiajun / Ye, Tianchun et al. | 2020
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Effect of integrated anneal optimizations of electroplated Cu thin films interconnectsWahab, Y.A. / Johan, M.R. / Hamizi, N.A. / Akbarzadeh, O. / Chowdhury, Z.Z. / Sagadevan, S. et al. | 2020
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Parameters sensitivity analysis of silicon carbide buck converters to extract features for condition monitoringLoghmani Moghaddam Toussi, A. / Bahman, A.S. / Iannuzzo, F. / Blaabjerg, F. et al. | 2020
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Reliable endpoint technique on Si trenching for backside circuit editTanaka, Hideo / Tsao, Chun-Cheng et al. | 2020
-
Experimental results on diodes and BIMOS ESD devices in 28 nm FD-SOI under TLP & TID radiationGaly, Ph. / Soto, F. / Bourgeat, J. / Jacquier, B. / Kilchytska, V. / Flandre, D. et al. | 2020
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Reliability limitations from crystal defects in thick GaN epitaxial layersChristou, Aris et al. | 2020
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Faults and reliability analysis of negative resistance converter traction power systemYang, Xiaofeng / Gu, Jingda / Zheng, Trillion Q. / Zhao, Zhijun et al. | 2020
-
Surge current capability of ultra-wide-bandgap Ga2O3 Schottky diodesButtay, Cyril / Wong, Hiu-Yung / Wang, Boyan / Xiao, Ming / Dimarino, Christina / Zhang, Yuhao et al. | 2020
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Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distributionWei, Debao / Feng, Hua / Chen, Xiaoyu / Qiao, Liyan / Peng, Xiyuan et al. | 2020
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Impact of crystalline orientation of lead-free solder joints on thermomechanical response and reliability of ball grid array componentsBen Romdhane, E. / Guédon-Gracia, A. / Pin, S. / Roumanille, P. / Frémont, H. et al. | 2020
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A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effectsModolo, Nicola / Meneghini, Matteo / Barbato, Alessandro / Nardo, Arianna / De Santi, Carlo / Meneghesso, Gaudenzio / Zanoni, Enrico / Sicre, Sebastien / Prechtl, Gerhard / Curatola, Gilberto et al. | 2020
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Magnetic field imaging and light induced capacitance alteration for failure analysis of Cu-TSV interconnectsDe Wolf, Ingrid / Jacobs, Kristof J.P. / Orozco, Antonio et al. | 2020
-
Coupled simulations for lifetime prediction of board level packages encapsulated by thermoset injection moulding based on the Coffin-Manson relationKulkarni, R. / Soltani, M. / Krafft, S. / Groezinger, T. / Zimmermann, A. et al. | 2020
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System-level reliability assessment for a direct-drive PMSG based wind turbine with multiple convertersYe, Shuaichen / Zhou, Dao / Blaabjerg, Frede et al. | 2020
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Combined experimental-FEM investigation of electrical ruggedness in double-sided cooled power modulesScognamillo, Ciro / Catalano, Antonio Pio / Lasserre, Philippe / Duchesne, Cyrille / d'Alessandro, Vincenzo / Castellazzi, Alberto et al. | 2020
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Degradation mechanism of 0.15 μm AlGaN/GaN HEMTs: effects of hot electronsGao, Z. / Rampazzo, F. / Meneghini, M. / De Santi, C. / Chiocchetta, F. / Marcon, D. / Meneghesso, G. / Zanoni, E. et al. | 2020
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Using of bond-wire resistance as aging indicator of semiconductor power modulesIbrahim, A. / Khatir, Z. / Ousten, J.P. / Lallemand, R. / Degrenne, N. / Mollov, S. / Ingrosso, D. et al. | 2020
-
An investigation of FinFET single-event latch-up characteristic and mitigation methodLi, Dongqing / Liu, Tianqi / Wu, Zhenyu / Cai, Chang / Zhao, Peixiong / He, Ze / Liu, Jie et al. | 2020
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Improving GPU register file reliability with a comprehensive ISA extensionGonçalves, M.M. / Condia, J.E. Rodriguez / Reorda, M. Sonza / Sterpone, L. / Azambuja, J.R. et al. | 2020
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Modular dynamic pulse stress test system for discrete high power semiconductorsPatmanidis, K. / Glavanovics, M. / Georgakas, A. / Muetze, A. et al. | 2020
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SMART manufacturing through predictive FAOberai, Ankush / Kamoji, Rupa et al. | 2020
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Design of E-mode GaN HEMTs by the Polarization Super Junction (PSJ) technologySharbati, Samaneh / Ebel, Thomas / Franke, Wulf-Toke et al. | 2020
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A fault tolerant switched reluctance motor drive for electric vehicles under multi-switches open-fault conditionsYang, Qingqing / Wang, Rui / Ma, Mingyao / Yang, Shuying / Zhang, Xing et al. | 2020
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A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula functionPan, Guangze / Li, Yaqiu / Li, Xiaobing / Luo, Qin / Wang, Chunhui / Hu, Xianghong et al. | 2020
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A 3-D thermal network model for the temperature monitoring of thermal grease as interface materialZhang, Xiaotong / Wang, Shihang / Xin, Lei / Wu, Kangning / Yu, Xiaoling / Wang, Xiaolin / Li, Jianying et al. | 2020
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Accelerated aging test for gate-oxide degradation in SiC MOSFETs for condition monitoringHayashi, Shin-Ichiro / Wada, Keiji et al. | 2020
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A method to determine critical circuit blocks for electromigration based on temperature analysisNunes, R.O. / Ramirez, J.L. / de Orio, R.L. et al. | 2020
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Study of temperature dependence of breakdown voltage and AC TDDB reliability for thick insulator film deposited by plasma processOhguro, T. / Yagi, Y. / Kimura, K. / Kashiura, Y. / Morioka, J. / Matsuda, M. / Yoshida, K. / Takahashi, M. / Ishiguro, A. / Yamada, M. et al. | 2020