Bayesian prediction for the range based on a two-parameter exponential distribution with a random sample size (English)
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In:
Microelectronics and Reliability
;
33
, 5
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623-632
;
1992
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Bayesian prediction for the range based on a two-parameter exponential distribution with a random sample size
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Contributors:Salem, S.A. ( author ) / El-Glad, F.A. ( author )
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Published in:Microelectronics and Reliability ; 33, 5 ; 623-632
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Publisher:
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Publication date:1992-01-11
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Size:10 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 33, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 623
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Bayesian prediction for the range based on a two-parameter exponential distribution with a random sample sizeSalem, S.A. / El-Glad, F.A. et al. | 1992
- 633
-
Linear dependency check in built-in testYang, Chyan et al. | 1992
- 637
-
Reliability analysis of a three-unit system in a changing environmentSong, Shibin / Deng, Yonglu et al. | 1991
- 641
-
A survey of program management software (for PC compatibles) for quality professionalsAnjard, R.P. sr et al. | 1991
- 649
-
Breakdown properties of thin oxides in irradiated MOS capacitorsBrozek, T. / Pešić, B. / Jakubowski, A. / Stojadinović, N. et al. | 1991
- 659
-
Modern trends in ASIC: Mixing technologiesWild, Andreas et al. | 1991
- 663
-
On some models of general repairFinkelstein, M.S. et al. | 1992
- 667
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Tolerance limits for system reliabilitySharma, K.K. / Krishna, Hare et al. | 1991
- 671
-
On a new density functionAbdel-Ghaly, Abdullah A. / Attia, Ahmed F. et al. | 1992
- 681
-
A transient solution of the state-dependent queue: M/M/1/N with balking and reflecting barrierAbou-El-Ata, M.O. / Al-Seedy, R.O. / Kotb, K.A.M. et al. | 1992
- 689
-
Analysis of quality parameters in the electronic industry to determine the optimum quality levelSultan, Torky I. et al. | 1991
- 697
-
Bounds on reliability of a k-out-of-n systemLai, C.D. et al. | 1991
- 705
-
Reliability study of a two-unit cold standby redundant system with repair of two phasesMohamoud, M.A.W. / Mohie El-Din, M.M. / Moshref, M.E. et al. | 1991
- 719
-
Hierarchical confidence bounds for the exponential failure modelPapadopoulos, Alex S. et al. | 1991
- 729
-
Shock models and testing for the renewal mean remaining life classesAbouammoh, A.M. / Ahmed, A.N. / Barry, A.M. et al. | 1991
- 741
-
Experiment design and graphical analysis for checking acceleration modelsLuvalle, M.J. et al. | 1991
- 765
-
Reliability Engineering Handbook. Volume 2 . Software Reliability Modelling . Ceramics in Substitutive and Reconstructive Surgery . Electronic Ceramics . Error-free Software Know-how and Know-why of Program Correctness| 1993
- 765
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Reliability engineering handbook volume 2Dr. Popentiu, Florin et al. | 1993
- 766
-
Software reliability modellingDr. Popentiu, Florin et al. | 1993
- 767
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Ceramics in substitutive and reconstructive surgeryProf. Andronescu, Ecaterina et al. | 1993
- 768
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Electronic ceramicsProf. Andronescu, Ecaterina et al. | 1993
- 770
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Error-free software know-how and know-why of program correctness| 1993