Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations (English)
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In:
IEEE Transactions on Nuclear Science
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65
, 1
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262-268
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2018
- Article (Journal) / Electronic Resource
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Title:Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo Simulations
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Contributors:Kohler, P. ( author ) / Pouget, V. ( author ) / Wrobel, F. ( author ) / Saigne, F. ( author ) / Wang, P. X. ( author ) / Vassal, M.-C. ( author )
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Published in:IEEE Transactions on Nuclear Science ; 65, 1 ; 262-268
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Publisher:
- New search for: IEEE
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Publication date:2018-01-01
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Size:1829335 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 65, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Table of contents| 2018
- 6
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Editorial Conference Comments by the General ChairFerlet-Cavrois, Veronique et al. | 2018
- 9
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Special NSREC 2017 Issue of the IEEE Transactions on Nuclear Science Comments by the EditorsFleetwood, Dan / Brown, Dennis / Girard, Sylvain / Gerardin, Simone / Esqueda, Ivan Sanchez / Robinson, William / Moss, Steven et al. | 2018
- 10
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NSREC 2017 Special Issue of the IEEE Transactions on Nuclear Science List of Reviewers| 2018
- 12
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2017 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the ChairmanLeray, Jean-Luc et al. | 2018
- 14
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Outstanding Conference Paper Award: 2017 IEEE Nuclear and Space Radiation Effects Conference| 2018
- 18
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In Memoriam| 2018
- 19
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Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash MemoryChen, Dakai / Wilcox, Edward / Ladbury, Raymond L. / Seidleck, Christina / Kim, Hak / Phan, Anthony / LaBel, Kenneth A. et al. | 2018
- 27
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Electron Irradiation of Samsung 8-Gb NAND Flash MemoryIrom, Farokh / Edmonds, Larry D. / Allen, Gregory R. / Kim, Wousik / Vartanian, Sergeh et al. | 2018
- 34
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Proton-Induced Displacement Damage and Total-Ionizing-Dose Effects on Silicon-Based MEMS ResonatorsGong, Huiqi / Liao, Wenjun / Zhang, En Xia / Sternberg, Andrew L. / McCurdy, Michael W. / Davidson, Jim L. / Reed, Robert A. / Fleetwood, Daniel M. / Schrimpf, Ronald D. / Shuvra, Pranoy Deb et al. | 2018
- 39
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Investigations on the Geometry Effects and Bias Configuration on the TID Response of nMOS SOI Tri-Gate Nanowire Field-Effect TransistorsRiffaud, J. / Gaillardin, M. / Marcandella, C. / Martinez, M. / Paillet, P. / Duhamel, O. / Lagutere, T. / Raine, M. / Richard, N. / Andrieu, F. et al. | 2018
- 46
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Total-Ionizing-Dose Responses of GaN-Based HEMTs With Different Channel Thicknesses and MOSHEMTs With Epitaxial MgCaO as Gate DielectricBhuiyan, Maruf A. / Zhou, Hong / Chang, Sung-Jae / Lou, Xiabing / Gong, Xian / Jiang, Rong / Gong, Huiqi / Zhang, En Xia / Won, Chul-Ho / Lim, Jong-Won et al. | 2018
- 53
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TID Effects in Reconfigurable MOSFETs Using 2-D Semiconductor WSe2Dhakras, Prathamesh / Agnihotri, Pratik / Bakhru, Hassaram / Hughes, Harold L. / Lee, Ji Ung et al. | 2018
- 58
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Dose-Rate Effects on the Total-Ionizing-Dose Response of Piezoresistive Micromachined CantileversArutt, Charles N. / Liao, Wenjun / Gong, Huiqi / Shuvra, Pranoy Deb / Lin, Ji-Tzuoh / Alles, Michael L. / Alphenaar, Bruce W. / Davidson, Jim L. / Walsh, Kevin M. / McNamara, Shamus et al. | 2018
- 64
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Investigation of TID and Dynamic Burn-In-Induced $V_{{T}}$ Shift on RTG4 Flash-Based FPGARezzak, Nadia / Wang, Jih-Jong / Traas, Michael / Zerrouki, Amal / Bakker, Gregory / Xue, Fengliang / Cai, Alex / Hawley, Frank / McCollum, John / Hamdy, Esmat et al. | 2018
- 71
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Atypical Effect of Displacement Damage on LM124 Bipolar Integrated CircuitsBorel, T. / Roig, F. / Michez, A. / Azais, B. / Danzeca, S. / Roche, N. J.-H. / Bezerra, F. / Calvel, P. / Dusseau, L. et al. | 2018
- 78
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Total-Ionizing-Dose Response of Nb2O5-Based MIM Diodes for Neuromorphic Computing ApplicationsJiang, Rong / Zhang, En Xia / Zhao, Simeng E. / Fleetwood, Daniel M. / Schrimpf, Ronald D. / Reed, Robert A. / Alles, Michael L. / Shank, Joshua C. / Tellekamp, M. Brooks / Doolittle, William A. et al. | 2018
- 84
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Total-Ionizing Dose Effects on Charge Transfer Efficiency and Image Lag in Pinned Photodiode CMOS Image SensorsRizzolo, Serena / Goiffon, Vincent / Estribeau, Magali / Paillet, Philippe / Marcandella, Claude / Durnez, Clementine / Magnan, Pierre et al. | 2018
- 92
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Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image SensorsDurnez, Clementine / Goiffon, Vincent / Virmontois, Cedric / Rizzolo, Serena / Le Roch, Alexandre / Magnan, Pierre / Paillet, Philippe / Marcandella, Claude / Rubaldo, Laurent et al. | 2018
- 101
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Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote HandlingGoiffon, Vincent / Rizzolo, Serena / Corbiere, Franck / Rolando, Sebastien / Bounasser, Said / Sergent, Marius / Chabane, Aziouz / Marcelot, Olivier / Estribeau, Magali / Magnan, Pierre et al. | 2018
- 111
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Steady-State Radiation-Induced Effects on the Performances of BOTDA and BOTDR Optical Fiber SensorsMorana, A. / Planes, I. / Girard, S. / Cangialosi, C. / Delepine-Lesoille, S. / Marin, E. / Boukenter, A. / Ouerdane, Y. et al. | 2018
- 119
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Single-Event Transients in Readout Circuitries at Low Temperature Down to 50 KAl Youssef, A. / Artola, L. / Ducret, S. / Hubert, G. / Buiron, R. / Poivey, C. / Perrier, F. / Parola, S. et al. | 2018
- 126
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Radiation-Induced Attenuation in Single-Mode Phosphosilicate Optical Fibers for Radiation DetectionDi Francesca, D. / Li Vecchi, G. / Girard, S. / Alessi, A. / Reghioua, I. / Boukenter, A. / Ouerdane, Y. / Kadi, Y. / Brugger, M. et al. | 2018
- 132
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Vulnerability and Hardening Studies of Optical and Illumination Systems at MGy Dose LevelsAllanche, T. / Paillet, P. / Goiffon, V. / Muller, C. / Van Uffelen, M. / Mont-Casellas, L. / Duhamel, O. / Marcandella, C. / Rizzolo, S. / Magnan, P. et al. | 2018
- 141
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Potential Limitations on Integrated Silicon Photonic Waveguides Operating in a Heavy Ion EnvironmentGoley, Patrick S. / Fleetwood, Zachary E. / Cressler, John D. et al. | 2018
- 149
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Coverglass Radiation-Induced Multijunction Solar Cell Current-Limiting EffectsMessenger, Scott R. / Kruer, Mark A. et al. | 2018
- 156
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Radiation-Induced Charge Trapping and Low-Frequency Noise of Graphene TransistorsWang, P. / Perini, C. / O'Hara, A. / Tuttle, B. R. / Zhang, E. X. / Gong, H. / Dong, L. / Liang, C. / Jiang, R. / Liao, W. et al. | 2018
- 164
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Influence of LDD Spacers and H+ Transport on the Total-Ionizing-Dose Response of 65-nm MOSFETs Irradiated to Ultrahigh DosesFaccio, Federico / Borghello, Giulio / Lerario, Edoardo / Fleetwood, Daniel M. / Schrimpf, Ronald D. / Gong, Huiqi / Zhang, En Xia / Wang, P. / Michelis, Stefano / Gerardin, Simone et al. | 2018
- 175
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Capacitance–Frequency Estimates of Border-Trap Densities in Multifin MOS CapacitorsZhao, Simeng E. / Jiang, Rong / Zhang, En Xia / Liao, Wenjun / Liang, Chundong / Fleetwood, Daniel M. / Schrimpf, Ronald D. / Reed, Robert A. / Linten, Dimitri / Mitard, Jerome et al. | 2018
- 184
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Understanding the Implications of a LINAC’s Microstructure on Devices and Photocurrent ModelsMcLain, Michael L. / McDonald, J. Kyle / Hembree, Charles E. / Sheridan, Timothy J. / Weingartner, Thomas A. / Dodd, Paul E. / Shaneyfelt, Marty R. / Hartman, Fred / Black, Dolores A. et al. | 2018
- 192
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In Situ Synaptic Programming of CBRAM in an Ionizing Radiation EnvironmentTaggart, J. L. / Chen, W. / Gonzalez-Velo, Y. / Barnaby, H. J. / Holbert, K. / Kozicki, M. N. et al. | 2018
- 200
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Total Ionization Dose Effects on Charge-Trapping Memory With Al2O3/HfO2/Al2O3 Trilayer StructureBi, J. S. / Xu, Y. N. / Xu, G. B. / Wang, H. B. / Chen, L. / Liu, M. et al. | 2018
- 206
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Stochastic Gain Degradation in III–V Heterojunction Bipolar Transistors Due to Single Particle Displacement DamageVizkelethy, Gyorgy / Bielejec, Edward S. / Aguirre, B. A. et al. | 2018
- 211
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Multiple-Cell Upsets Induced by Single High-Energy ElectronsGadlage, Matthew J. / Roach, Austin H. / Duncan, Adam R. / Williams, Aaron M. / Bossev, Dobrin P. / Kay, Matthew J. et al. | 2018
- 217
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Single-Event Latch-Up: Increased Sensitivity From Planar to FinFETKarp, James / Hart, Michael J. / Maillard, Pierre / Hellings, Geert / Linten, Dimitri et al. | 2018
- 223
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Angular Effects on Single-Event Mechanisms in Bulk FinFET TechnologiesNsengiyumva, Patrick / Massengill, Lloyd W. / Kauppila, Jeffrey S. / Maharrey, Jeffrey A. / Harrington, Rachel C. / Haeffner, Timothy D. / Ball, Dennis R. / Alles, Michael L. / Bhuva, Bharat L. / Holman, W. Timothy et al. | 2018
- 231
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Single-Event Upset Mitigation in a Complementary SiGe HBT BiCMOS TechnologyLourenco, Nelson E. / Ildefonso, Adrian / Tzintzarov, George N. / Fleetwood, Zachary E. / Motoki, Keisuke / Paki, Pauline / Kaynak, Mehmet / Cressler, John D. et al. | 2018
- 239
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Utilizing SiGe HBT Power Detectors for Sensing Single-Event Transients in RF CircuitsIldefonso, Adrian / Coen, Christopher T. / Fleetwood, Zachary E. / Tzintzarov, George N. / Wachter, Mason T. / Khachatrian, Ani / Mcmorrow, Dale / Warner, Jeffrey H. / Paki, Pauline / Cressler, John D. et al. | 2018
- 249
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Transmission Line Pulse Test Method for Estimating SEB Performance of $n$ -Channel Lateral DMOS Power TransistorsHamlyn, M. / Hower, P. L. / Warren, K. / Baumann, R. C. et al. | 2018
- 256
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Single-Event Burnout of SiC Junction Barrier Schottky Diode High-Voltage Power DevicesWitulski, A. F. / Arslanbekov, R. / Raman, A. / Schrimpf, R. D. / Sternberg, A. L. / Galloway, K. F. / Javanainen, A. / Grider, D. / Lichtenwalner, D. J. / Hull, B. et al. | 2018
- 262
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Analysis of Single-Event Effects in DDR3 and DDR3L SDRAMs Using Laser Testing and Monte-Carlo SimulationsKohler, P. / Pouget, V. / Wrobel, F. / Saigne, F. / Wang, P. X. / Vassal, M.-C. et al. | 2018
- 269
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Failure Analysis of Heavy Ion-Irradiated Schottky DiodesCasey, Megan C. / Lauenstein, Jean-Marie / Weachock, Ronald J. / Wilcox, Edward P. / Hua, Lang M. / Campola, Michael J. / Topper, Alyson D. / Ladbury, Raymond L. / LaBel, Kenneth A. et al. | 2018
- 280
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Dynamic SEU Sensitivity of Designs on Two 28-nm SRAM-Based FPGA ArchitecturesKeller, Andrew M. / Whiting, Timothy A. / Sawyer, Kenneth B. / Wirthlin, Michael J. et al. | 2018
- 288
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On the Reliability of Linear Regression and Pattern Recognition Feedforward Artificial Neural Networks in FPGAsLibano, F. / Rech, P. / Tambara, L. / Tonfat, J. / Kastensmidt, F. et al. | 2018
- 296
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Scaling Effects on Single-Event Transients in InGaAs FinFETsGong, Huiqi / Ni, Kai / Zhang, En Xia / Sternberg, Andrew L. / Kozub, John A. / Ryder, Kaitlyn L. / Keller, Ryan F. / Ryder, Landen D. / Weiss, Sharon M. / Weller, Robert A. et al. | 2018
- 304
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An Empirical Model for Predicting SE Cross Section for Combinational Logic Circuits in Advanced TechnologiesJiang, H. / Zhang, H. / Kauppila, J. S. / Massengill, L. W. / Bhuva, B. L. et al. | 2018
- 311
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Time-Domain Modeling of All-Digital PLLs to Single-Event Upset PerturbationsChen, Y. P. / Massengill, L. W. / Sternberg, A. L. / Zhang, E. X. / Kauppila, J. S. / Yao, M. / Amort, A. L. / Bhuva, B. L. / Holman, W. T. / Loveless, T. D. et al. | 2018
- 318
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Effects of Heavy-Ion Irradiation on Vertical 3-D NAND Flash MemoriesBagatin, M. / Gerardin, S. / Paccagnella, A. / Beltrami, S. / Camerlenghi, E. / Bertuccio, M. / Costantino, A. / zadeh, A. / Ferlet-Cavrois, V. / Santin, G. et al. | 2018
- 326
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The Impact of Charge Collection Volume and Parasitic Capacitance on SEUs in SOI- and Bulk-FinFET D Flip-FlopsBall, D. R. / Alles, M. L. / Kauppila, J. S. / Harrington, R. C. / Maharrey, J. A. / Nsengiyumva, P. / Haeffner, T. D. / Rowe, J. D. / Sternberg, A. L. / Zhang, E. X. et al. | 2018
- 331
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Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI DevicesMalherbe, Victor / Gasiot, Gilles / Thery, Thomas / Autran, Jean-Luc / Roche, Philippe et al. | 2018
- 339
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Estimation of the Single-Event Upset Sensitivity of Advanced SOI SRAMsRaine, M. / Gaillardin, M. / Lagutere, T. / Duhamel, O. / Paillet, P. et al. | 2018
- 346
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Laser Visualization of the Development of Long Line-Type Mutli-Cell Upsets in Back-Biased SOI SRAMsItsuji, Hiroaki / Kobayashi, Daisuke / Kawasaki, Osamu / Matsuura, Daisuke / Narita, Takanori / Kato, Masahiro / Ishii, Shigeru / Masukawa, Kazunori / Hirose, Kazuyuki et al. | 2018
- 354
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DAMSEL—Dynamic and Applicative Measurement of Single Events in LogicGlorieux, Maximilien / Evans, Adrian / Alexandrescu, Dan / Boatella-Polo, Cesar / Sanchez, Kevin / Ferlet-Cavrois, Veronique et al. | 2018
- 362
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Impact of Single-Event Transient Duration and Electrical Delay at Reduced Supply Voltages on SET Mitigation TechniquesMaharrey, J. A. / Kauppila, J. S. / Harrington, R. C. / Nsengiyumva, P. / Ball, D. R. / Haeffner, T. D. / Zhang, E. X. / Bhuva, B. L. / Holman, W. T. / Massengill, L. W. et al. | 2018
- 369
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Correlation of the Spatial Variation of Single-Event Transient Sensitivity With Thermoreflectance Thermography in ${\text {Al}}_{x} {\text {Ga}}_{1-x}$ N/GaN HEMTsKhachatrian, A. / Roche, N. J.-H. / Ruppalt, L. B. / Champlain, J. G. / Buchner, S. / Koehler, A. D. / Anderson, T. J. / Hobart, K. D. / Warner, J. H. / Mcmorrow, D. et al. | 2018
- 376
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On-Chip Relative Single-Event Transient/Single- Event Upset Susceptibility Test Circuit for Integrated Circuits Working in Real TimeHao, Peipei / Chen, Shuming / Wu, Zhenyu / Chi, Yaqing et al. | 2018
- 382
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Evidence of Pulse Quenching in AND and OR Gates by Experimental Probing of Full Single-Event Transient WaveformsMitrovic, Mladen / Hofbauer, Michael / Schneider-Hornstein, Kerstin / Goll, Bernhard / Voss, Kay-Obbe / Zimmermann, Horst et al. | 2018
- 391
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p-n-p-Based RF Switches for the Mitigation of Single-Event Transients in a Complementary SiGe BiCMOS PlatformSong, Ickhyun / Cho, Moon-Kyu / Fleetwood, Zachary E. / Gong, Yunyi / Pavlidis, Spyridon / Buchner, Stephen P. / McMorrow, Dale / Paki, Pauline / Kaynak, Mehmet / Cressler, John. D. et al. | 2018
- 399
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SiGe HBT Profiles With Enhanced Inverse-Mode Operation and Their Impact on Single-Event TransientsFleetwood, Zachary E. / Ildefonso, Adrian / Tzintzarov, George N. / Wier, Brian / Raghunathan, Uppili / Cho, Moon-Kyu / Song, Ickhyun / Wachter, Mason T. / Nergui, Delgermaa / Khachatrian, Ani et al. | 2018
- 407
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A 2.56-GHz SEU Radiation Hard $LC$ -Tank VCO for High-Speed Communication Links in 65-nm CMOS TechnologyPrinzie, Jeffrey / Christiansen, Jorgen / Moreira, Paulo / Steyaert, Michiel / Leroux, Paul et al. | 2018
- 413
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Frequency Dependence of Heavy-Ion-Induced Single-Event Responses of Flip-Flops in a 16-nm Bulk FinFET TechnologyZhang, H. / Jiang, H. / Bhuva, B. L. / Kauppila, J. S. / Holman, W. T. / Massengill, L. W. et al. | 2018
- 418
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nMOS Transistor Location Adjustment for N-Hit Single-Event Transient Mitigation in 65-nm CMOS Bulk TechnologyWu, Zhenyu / Chen, Shuming et al. | 2018
- 426
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An Electrostatic Discharge Protection Circuit Technique for the Mitigation of Single-Event Transients in SiGe BiCMOS TechnologyCho, Moon-Kyu / Song, Ickhyun / Pavlidis, Spyridon / Fleetwood, Zachary E. / Buchner, Stephen P. / McMorrow, Dale / Paki, Pauline / Cressler, John D. et al. | 2018
- 432
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Extreme Atmospheric Radiation Environments and Single Event EffectsDyer, Clive / Hands, Alex / Ryden, Keith / Lei, Fan et al. | 2018
- 439
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The Compact Environmental Anomaly Sensor Risk Reduction: A Pathfinder for Operational Energetic Charged Particle SensorsLindstrom, Chadwick D. / Aarestad, James / Ballenthin, John O. / Barton, David A. / Coombs, Joseph M. / Ignazio, John / Johnston, W. Robert / Kratochvil, Scott / Love, Jeff / McIntire, David et al. | 2018
- 448
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LHC and HL-LHC: Present and Future Radiation Environment in the High-Luminosity Collision Points and RHA ImplicationsGarcia Alia, Ruben / Brugger, Markus / Cerutti, Francesco / Danzeca, Salvatore / Ferrari, Alfredo / Gilardoni, Simone / Kadi, Yacine / Kastriotou, Maria / Lechner, Anton / Martinella, Corinna et al. | 2018
- 457
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Incorporating Radiation Effects Into AE9/AP9O'Brien, T. P. / Kwan, B. P. et al. | 2018
- 462
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Changes in AE9/AP9-IRENE Version 1.5O'Brien, T. P. / Johnston, W. R. / Huston, S. L. / Roth, C. J. / Guild, T. B. / Su, Y.-J. / Quinn, R. A. et al. | 2018
- 467
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Thin Silicon Microdosimeter Utilizing 3-D MEMS Fabrication Technology: Charge Collection Study and Its Application in Mixed Radiation FieldsTran, Linh T. / Chartier, Lachlan / Prokopovich, Dale A. / Bolst, David / Povoli, Marco / Summanwar, Anand / Kok, Angela / Pogossov, Alex / Petasecca, Marco / Guatelli, Susanna et al. | 2018
- 473
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Total-Ionizing-Dose Effects on a Graphene X-Ray Detector Laser-Scribed From Graphene OxideDeng, Ning-qin / Liao, Wen-jun / Hu, Jing / Wang, Peng / Xu, Meng-Xuan / Zhang, Hai-Nan / Wang, Pan / Liang, Chun-dong / Tian, He / Chen, Liang et al. | 2018
- 478
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Application of a Focused, Pulsed X-ray Beam for Total Ionizing Dose Testing of Bipolar Linear Integrated CircuitsLalumondiere, Stephen D. / Dillingham, Erik C. / Scofield, Adam C. / Bonsall, Jeremy P. / Karuza, Petras / Brewe, Dale L. / Schrimpf, Ronald D. / Sternberg, Andrew L. / Wells, Nathan P. / Cardoza, David M. et al. | 2018
- 486
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Exploiting Parallelism and Heterogeneity in a Radiation Effects Test Vehicle for Efficient Single-Event Characterization of Nanoscale CircuitsKauppila, J. S. / Maharrey, J. A. / Harrington, R. C. / Haeffner, T. D. / Nsengiyumva, P. / Ball, D. R. / Sternberg, A. L. / Zhang, E. X. / Bhuva, B. L. / Massengill, L. W. et al. | 2018
- 495
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Correlation of a Bipolar-Transistor-Based Neutron Displacement Damage Sensor Methodology With Proton IrradiationsTonigan, Andrew M. / Arutt, Charles N. / Parma, Edward J. / Griffin, Patrick J. / Fleetwood, Daniel M. / Schrimpf, Ronald D. et al. | 2018
- 502
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Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-AreaWang, Peng / Sternberg, Andrew L. / Kozub, John A. / Zhang, En Xia / Dodds, Nathaniel A. / Jordan, Scott L. / Fleetwood, Daniel M. / Reed, Robert A. / Schrimpf, Ronald D. et al. | 2018
- 510
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Conference author index| 2018
- 514
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Fully Digital and White Rabbit-Synchronized Low-Level RF System for LIPAcde la Morena, C. / Weber, M. / Regidor, D. / Mendez, P. / Kirpitchev, I. / Molla, J. / Ibarra, A. / Mendez, M. / Rat, B. / Ramirez, J. G. et al. | 2018
- 523
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Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell UpsetsKobayashi, Daisuke / Hirose, Kazuyuki / Ito, Taichi / Kakehashi, Yuya / Kawasaki, Osamu / Makino, Takahiro / Ohshima, Takeshi / Matsuura, Daisuke / Narita, Takanori / Kato, Masahiro et al. | 2018
- 533
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Irradiation Testing of Piezoelectric (Aluminum Nitride, Zinc Oxide, and Bismuth Titanate) and Magnetostrictive Sensors (Remendur and Galfenol)Reinhardt, B. / Daw, J. / Tittmann, B. R. et al. | 2018
- 539
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A Technique for Characterizing Ionization and Displacement Defects in NPN Transistors Induced by 1-MeV Electron IrradiationLi, Xingji / Yang, Jianqun / Liu, Chaoming et al. | 2018
- 545
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Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on ChipYang, Weitao / Du, Xuecheng / He, Chaohui / Shi, Shuting / Cai, Li / Hui, Ning / Guo, Gang / Huang, Chengliang et al. | 2018
- 550
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Ionizing Radiation Effects on the Noise of 65 nm CMOS Transistors for Pixel Sensor Readout at Extreme Total Dose LevelsRe, Valerio / Gaioni, Luigi / Manghisoni, Massimo / Ratti, Lodovico / Riceputi, Elisa / Traversi, Gianluca et al. | 2018
- 558
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D–T Neutron and 60Co-Gamma Irradiation Effects on HPSI 4H-SiC PhotoconductorsRaja, P. Vigneshwara / Murty, N. V. L. Narasimha et al. | 2018
- 566
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A Radiation-Hardened and ESD-Optimized Wireline Driver With Wide Terminal Common-Mode Voltage RangeXiang, Xun / Gao, Xingguo / Liu, Fan / Li, Mingdong / Huang, Shalin / Chen, Xuewen / Zhou, Xichuan / Hu, Shengdong / Lin, Zhi / Bermak, Amine et al. | 2018
- 573
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Electrical Transport Degradation of Chemically Doped Electronic-Type-Separated Single-Wall Carbon Nanotubes From Radiation-Induced DefectsPuchades, Ivan / Rossi, Jamie E. / Cox, Nathanael D. / Bucossi, Andrew R. / Soule, Karen J. / Cress, Cory D. / Landi, Brian J. et al. | 2018
- 579
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Proton Irradiation Effects on AlGaN/GaN HEMTs With Different Isolation MethodsKim, Dong-Seok / Lee, Jun-Hyeok / Yeo, Sunmog / Lee, Jung-Hee et al. | 2018
- 583
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TID Effects on a Data Acquisition System With Design Diversity RedundancyGonzalez Aguilera, Carlos Julio / Vaz, Rafael G. / Oliveira, Matheus B. / Leorato, Vicente W. / Goncalez, Odair L. / Balen, Tiago R. et al. | 2018
- 591
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Development of a Novel Single-Channel, 24 cm2, SiPM-Based, Cryogenic PhotodetectorD'Incecco, Marco / Galbiati, Cristiano / Giovanetti, Graham K. / Korga, George / Li, Xinran / Mandarano, Andrea / Razeto, Alessandro / Sablone, Davide / Savarese, Claudio et al. | 2018
- 597
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Performance of Pad Front-End Board for Small-Strip Thin Gap Chamber With Cosmic Ray MuonsLi, Feng / Liu, Shengquan / Hu, Kun / Wang, Xu / Lu, Houbing / Wang, Xinxin / Yang, Hang / Geng, Tianru / Miao, Peng / Jin, Ge et al. | 2018
- 604
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Study of the Performance of an Optically Readout Triple-GEMMarafini, Michela / Patera, Vincenzo / Pinci, Davide / Sarti, Alessio / Sciubba, Adalberto / Torchia, Natalia Maria et al. | 2018
- 609
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A High-Performance CLYC(Ce)-PVT Composite for Neutron and Gamma DetectionLam, Stephanie / Fiala, John / Hackett, Maria / Motakef, Shariar et al. | 2018
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Intrinsic Resolution of Compton Electrons in CeBr3 Scintillator Using Compact CCTRanga, V. / Rawat, S. / Sharma, Snigdha / Prasad, Mukesh / Panwar, S. / Kalyani, / Dhibar, M. / Gourishetty, Anil Kumar et al. | 2018
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A Practical Truncation Correction Method for Digital Breast TomosynthesisWu, Shuyu / Chen, Zijia / Ma, Jianhui / Qin, Genggeng / Li, Bin / Qi, Hongliang / Zhou, Linghong / Xu, Yuan et al. | 2018
- 630
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A Study of the Fast Neutron Response of a Single-Crystal Diamond Detector at High TemperaturesKumar, Amit / Topkar, Anita et al. | 2018
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Dynamic Compression of the Signal in a Charge Sensitive Amplifier: Experimental ResultsManghisoni, Massimo / Comotti, Daniele / Gaioni, Luigi / Ratti, Lodovico / Re, Valerio et al. | 2018
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High-Resolution Gamma-Ray Spectroscopy With a SiPM-Based Detection Module for 1” and 2” LaBr3:Ce ReadoutCozzi, Giulia / Busca, Paolo / Carminati, Marco / Fiorini, Carlo / Montagnani, Giovanni L. / Acerbi, Fabio / Gola, Alberto / Paternoster, Giovanni / Piemonte, Claudio / Regazzoni, Veronica et al. | 2018
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Fixed-Latency Gigabit Serial Links in a Xilinx FPGA for the Upgrade of the Muon Spectrometer at the ATLAS ExperimentWang, Jinhong / Hu, Xueye / Pinkham, Reid / Hou, Suen / Schwarz, Thomas / Zhu, Junjie / Chapman, J. W. / Zhou, Bing et al. | 2018
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Front Cover| 2018
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IEEE Transactions on Nuclear Science publication information| 2018
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IEEE Transactions on Nuclear Science information for authors| 2018
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Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2018