Analysis of detector response using 3-D position-sensitive CZT gamma-ray spectrometers (English)
- New search for: Feng Zhang,
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- New search for: Feng Zhang,
- New search for: Zhong He,
- New search for: Xu, D.
In:
IEEE Transactions on Nuclear Science
;
51
, 6
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3098-3104
;
2004
- Article (Journal) / Electronic Resource
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Title:Analysis of detector response using 3-D position-sensitive CZT gamma-ray spectrometers
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Contributors:
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Published in:IEEE Transactions on Nuclear Science ; 51, 6 ; 3098-3104
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Publisher:
- New search for: IEEE
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Publication date:2004-12-01
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Size:445769 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 51, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2973
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Table of contents| 2004
- 2975
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JFET transistors for low-noise applications at low frequencyArnaboldi, C. / Boella, G. / Panzeri, E. / Pessina, G. et al. | 2004
- 2975
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ANALOG AND DIGITAL CIRUITS - JFET Transistors for Low-Noise Applications at Low FrequencyAmaboldi, C. et al. | 2004
- 2983
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BEAMLINE INSTRUMENTATION - Instrumentation of the Very Forward Region of a Linear Collider DetectorAbramowicz, H. et al. | 2004
- 2983
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Instrumentation of the very forward region of a linear collider detectorAbramowicz, H. / Afanaciev, K. / Denisov, S. / Dollan, R. / Drachenberg, D. / Drugakov, V. / Emeliantchik, I. / Erin, S. / Ingbir, R. / Kananov, S. et al. | 2004
- 2990
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BEAMLINE INSTRUMENTATION - Secondary Emission Monitor for Low-Interception Monitoring (SLIM): An Innovative Nondestructive Beam Monitor for the Extraction Lines of a Hadrontherapy CenterBadano, L. et al. | 2004
- 2990
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Secondary emission monitor for low-interception monitoring (SLIM): an innovative nondestructive beam monitor for the extraction lines of a hadrontherapy centerBadano, L. / Ferrando, O. / Klatka, T. / Koziel, M. / Molinari, G. / Pezzetta, M. et al. | 2004
- 2999
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Beam monitors for TESLA based on diamond strip detectorsBol, J. / Berdermann, E. / deBoer, W. / Grigoriev, E. / Hauler, F. / Jungermann, L. et al. | 2004
- 2999
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BEAMLINE INSTRUMENTATION - Beam Monitors for TESLA Based on Diamond Strip DetectorsBol, J. et al. | 2004
- 3006
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BIOMEDICAL APPLICATIONS - Signal Variations in High-Granularity Si Pixel DetectorsTlustos, L. et al. | 2004
- 3006
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Signal variations in high-granularity Si pixel detectorsTlustos, L. / Campbell, M. / Heijne, E. / Llopart, X. et al. | 2004
- 3013
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In vivo dosimetry and seed localization in prostate brachytherapy with permanent implantsRosenfeld, A.B. / Cutajar, D.L. / Lerch, M.L.F. / Takacs, G.J. / Brady, J. / Braddock, T. / Perevertaylo, V.L. / Bucci, J. / Kearsley, J. / Zaider, M. et al. | 2004
- 3013
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BIOMEDICAL APPLICATIONS - In Vivo Dosimetry and Seed Localization in Prostate Brachytherapy With Permanent ImplantsRosenfeld, A.B. et al. | 2004
- 3019
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Analysis of inelastic interactions for therapeutic proton beams using Monte Carlo simulationRosenfeld, A.B. / Wroe, A.J. / Cornelius, I.M. / Reinhard, M. / Alexiev, D. et al. | 2004
- 3019
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BIOMEDICAL APPLICATIONS - Analysis of Inelastic Interactions for Therapeutic Proton Beams Using Monte Carlo SimulationRosenfeld, A.B. et al. | 2004
- 3026
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Scalability tests of R-GMA-based grid job monitoring system for CMS Monte Carlo data productionBonacorsi, D. / Colling, D. / Field, L. / Fisher, S.M. / Grandi, C. / Hobson, P.R. / Kyberd, P. / MacEvoy, B. / Nebrensky, J.J. / Tallini, H. et al. | 2004
- 3026
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COMPUTING, SOFTWARE, AND GRID - Scalability Tests of R-GMA-Based Grid Job Monitoring System for CMS Monte Carlo Data ProductionBonacorsi, D. et al. | 2004
- 3030
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DETECTOR SIMULATION AND RECONSTRUCTION - A Muon Identification and Combined Reconstruction Procedure for the ATLAS Detector at the LHC at CERNLagouri, Th et al. | 2004
- 3030
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A muon identification and combined reconstruction procedure for the ATLAS detector at the LHC at CERNLagouri, T. / Adams, D. / Assamagan, K. / Biglietti, M. / Carlino, G. / Cataldi, G. / Conventi, F. / Farilla, A. / Fisyak, Y. / Goldfarb, S. et al. | 2004
- 3034
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Use of star tracks to determine photocathode anisotropy of PMTs and absolute pointing of the Pierre Auger fluorescence detector telescopesCamin, D.V. / Grassi, V. / Sanchez, F. / Scherini, V. et al. | 2004
- 3034
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EXTENSIVE AIR SHOWERS AND CHERENKOV RADIATION DETECTORS - Use of Star Tracks to Determine Photocathode Anisotropy of PMTs and Absolute Pointing of the Pierre Auger Fluorescence Detector TelescopesCamin, D.V. et al. | 2004
- 3038
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HIGH-DENSITY DETECTOR PROCESSING AND INTERCONNECT - Microwave Techniques for High-Density Electronics Interconnect Bonding and HybridizationBudraa, N. et al. | 2004
- 3038
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Microwave techniques for high-density electronics interconnect bonding and hybridizationBudraa, N. / Ng, B. / Wang, D. / Ahsan, S. / Zhang, Y. / Mai, J. et al. | 2004
- 3043
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Development of the readout system for the K2K SciBar detectorYoshida, M. / Yamamoto, S. / Murakami, T. / Tanaka, M. / Nakaya, T. / Nishikawa, K. / Joo, K.K. / Kim, B.J. / Kim, J.Y. / Kim, S.B. et al. | 2004
- 3043
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HIGH-ENERGY AND NUCLEAR PHYSICS INSTRUMENTATION - Development of the Readout System for the K2K SciBar DetectorYoshida, M. et al. | 2004
- 3047
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HIGH-ENERGY AND NUCLEAR PHYSICS INSTRUMENTATION - CDF Run IIb Silicon Vertex Detector DAQ UpgradeBehari, S. et al. | 2004
- 3047
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CDF run IIb silicon vertex detector DAQ upgradeBehari, S. / Bacchetta, N. / Bolla, G. / Cardoso, G. / Ciobanu, C.I. / Flaugher, B. / Garcia-Sciveres, M. / Haber, C. / Hara, K. / Harr, R. et al. | 2004
- 3055
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RADIATION DAMAGE EFFECTS - Measurement of Trapping Time Constants in Proton-Irradiated Silicon Pad DetectorsKrasel, O. et al. | 2004
- 3055
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Measurement of trapping time constants in proton-irradiated silicon pad detectorsKrasel, O. / Gossling, C. / Klingenberg, R. / Rajek, S. / Wunstorf, R. et al. | 2004
- 3063
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Radiation damage effects on CMS sensors quality assurance and irradiation testsFurgeri, A.J. / de Boer, W. / Hartmann, F. / Freudenstein, S. / Assouak, S. / Forton, E. et al. | 2004
- 3063
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RADIATION DAMAGE EFFECTS - Radiation Damage Effects on CMS Sensors Quality Assurance and Irradiation TestsFurgeri, A.J. et al. | 2004
- 3069
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A technique for the investigation of deep levels on irradiated silicon based on the Lazarus effectMendes, P.R. / Abreu, M.C. / Eremin, V. / Zheng Li, / Niinikoski, T.O. / Rodrigues, S. / Sousa, P. / Verbitskaya, E. et al. | 2004
- 3069
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RADIATION DAMAGE EFFECTS - A New Technique for the Investigation of Deep Levels on Irradiated Silicon Based on the Lazarus EffectMendes, P.R. et al. | 2004
- 3076
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Fast and compact lead tungstate-based electromagnetic calorimeter for the PANDA detector at GSINovotny, R.W. et al. | 2004
- 3076
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SCINTILLATION DETECTORS - Fast and Compact Lead Tungstate-Based Electromagnetic Calorimeter for the PANDA Detector at GSINovotny, R.W. et al. | 2004
- 3081
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SEMICONDUCTOR DETECTORS - A Medipix2-Based Imaging System for Digital Mammography With Silicon Pixel DetectorsBisogni, M.G. et al. | 2004
- 3081
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A Medipix2-based imaging system for digital mammography with silicon pixel detectorsBisogni, M.G. / Delogu, P. / Fantacci, M.E. / Mettivier, G. / Montesi, M.C. / Novelli, M. / Quattrocchi, M. / Rosso, V. / Russo, P. / Stefanini, A. et al. | 2004
- 3086
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Characterization of HPGe-segmented detectors from noise measurementsPullia, A. / Isocrate, R. / Venturelli, R. / Bazzacco, D. / Bassini, R. / Boiano, C. et al. | 2004
- 3086
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SEMICONDUCTOR DETECTORS - Characterization of HPGe-Segmented Detectors From Noise MeasurementsPullia, A. et al. | 2004
- 3090
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An experimental method to evaluate the dead Layer thickness of X- and gamma-ray semiconductor detectorsDusi, W. / Donati, A. / Landini, G. / Perillo, E. / Raulo, A. / Ventura, G. / Vitulli, S. et al. | 2004
- 3090
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WORKSHOP ON ROOM-TEMPERATURE SEMICONDUCTOR DETECTORS - An Experimental Method to Evaluate the Dead Layer Thickness of X- and Gamma-Ray Semiconductor DetectorsDusi, W. et al. | 2004
- 3094
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WORKSHOP ON ROOM-TEMPERATURE SEMICONDUCTOR DETECTORS - Characterization of High-Resistivity Poly-CdZnTe Thick Films Grown by Thermal Evaporation MethodKim, K.H. et al. | 2004
- 3094
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Characterization of high-resistivity poly-CdZnTe thick films grown by thermal evaporation methodKim, K.H. / Na, Y.H. / Park, Y.J. / Jung, T.R. / Kim, S.U. / Hong, J.K. et al. | 2004
- 3098
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WORKSHOP ON ROOM-TEMPERATURE SEMICONDUCTOR DETECTORS - Analysis of Detector Response Using 3-D Position-Sensitive CZT Gamma-Ray SpectrometersZhang, F. et al. | 2004
- 3098
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Analysis of detector response using 3-D position-sensitive CZT gamma-ray spectrometersFeng Zhang, / Zhong He, / Xu, D. et al. | 2004
- 3105
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WORKSHOP ON ROOM-TEMPERATURE SEMICONDUCTOR DETECTORS - Heavy Metal Doping of CdTe CrystalsSaucedo, E. et al. | 2004
- 3105
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Heavy metal doping of CdTe crystalsSaucedo, E. / Fornaro, L. / Sochinskii, N.V. / Cuna, A. / Corregidor, V. / Granados, D. / Dieguez, E. et al. | 2004
- 3111
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Performance and perspectives of a CdZnTe-based gamma camera for medical imagingVerger, L. / Gentet, M.C. / Gerfault, L. / Guillemaud, R. / Mestais, C. / Monnet, O. / Montemont, G. / Petroz, G. / Rostaing, J.P. / Rustique, J. et al. | 2004
- 3111
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WORKSHOP ON ROOM-TEMPERATURE SEMICONDUCTOR DETECTORS - Performance and Perspectives of a CdZnTe-Based Gamma Camera for Medical ImagingVerger, L. et al. | 2004
- 3118
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Correction to “A Goodness-of-Fit Statistical Toolkit”Cirrone, G.A.P. / Donadio, S. / Guatelli, S. / Mantero, A. / Mascialino, B. / Parlati, S. / Pia, M.G. / Pfeiffer, A. / Ribon, A. / Viarengo, P. et al. | 2004
- 3118
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CORRECTIONS - Correction to "A Goodness-of-Fit Statistical Toolkit"Cirrone, G.A.P. et al. | 2004
- 3119
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Have you visited lately? www.ieee.org| 2004
- 3120
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Nuclear & Plasma Sciences Society| 2004
- 3126
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EDITORIAL - 2004 IEEE Nuclear and Space Radiation Effects Conference Comments by the General ChairmanFleetwood, D. et al. | 2004
- 3126
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2004 IEEE Nuclear and Space Radiation Effects Conference Comments by the General ChairmanFleetwood, D. et al. | 2004
- 3128
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EDITORIAL - 2004 Special NSREC Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE Comments by the Guest EditorCohn, L. et al. | 2004
- 3128
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2004 Special NSREC Issue of the IEEE Transaction on Nuclear Science - Comments by the Guest EditorCohn, L. et al. | 2004
- 3129
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List of Reviewers| 2004
- 3131
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AWARDS - 2004 IEEE Nuclear and Space Radiation Effects Conference Awards Chairman's CommentsBeutler, D.E. et al. | 2004
- 3131
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2004 IEEE Nuclear and Space Radiation Effects Conference Awards Chairman's CommentsBeutler, D.E. et al. | 2004
- 3133
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Outstanding Conference Paper Award 2004 IEEE Nuclear and Space Radiation Effects Conference| 2004
- 3133
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AWARDS - Outstanding Conference Paper Award 2004 IEEE Nuclear and Space Radiation Effects Conference| 2004
- 3135
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In MemoriamGarrett, H. et al. | 2004
- 3135
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IN MEMORIAM - Arthur Robb FredericksonGarrett, H. et al. | 2004
- 3137
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IN MEMORIAM - Klaus KerrisPlatteter, D. et al. | 2004
- 3139
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IN MEMORIAM - Steve Lutjens and Raymond DensonCoakley, R. et al. | 2004
- 3141
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IN MEMORIAM - Jean-Marie PalauPalau, M.-C. et al. | 2004
- 3143
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Charge Trapping and Annealing in High-k Gate DielectricsFelix, J.A. et al. | 2004
- 3143
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Charge trapping and annealing in high-/spl kappa/ gate dielectricsFelix, J.A. / Shaneyfelt, M.R. / Fleetwood, D.M. / Schwank, J.R. / Dodd, P.E. / Gusev, E.P. / Fleming, R.M. / D'Emic, C. et al. | 2004
- 3150
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Drain Current Decrease in MOSFETs After Heavy Ion IrradiationCester, A. et al. | 2004
- 3150
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Drain current decrease in MOSFETs after heavy ion irradiationCester, A. / Gerardin, S. / Paccagnella, A. / Schwank, J.R. / Vizkelethy, G. / Candelori, A. / Ghidini, G. et al. | 2004
- 3158
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Effects of hydrogen motion on interface trap formation and annealingRashkeev, S.N. / Fleetwood, D.M. / Schrimpf, R.D. / Pantelides, S.T. et al. | 2004
- 3158
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Effects of Hydrogen Motion on Interface Trap Formation and AnnealingRashkeev, S.N. et al. | 2004
- 3166
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Nonuniform Total-Dose-Induced Charge Distribution in Shallow-Trench Isolation OxidesTurowski, M. et al. | 2004
- 3166
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Nonuniform total-dose-induced charge distribution in shallow-trench isolation oxidesTurowski, M. / Raman, A. / Schrimpf, R.D. et al. | 2004
- 3172
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Annealing Behavior of Linear Bipolar Devices With Enhanced Low-Dose-Rate SensitivityShaneyfelt, M.R. et al. | 2004
- 3172
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Annealing behavior of linear bipolar devices with enhanced low-dose-rate sensitivityShaneyfelt, M.R. / Schwank, J.R. / Fleetwood, D.M. / Pease, R.L. / Felix, J.A. / Dodd, P.E. / Maher, M.C. et al. | 2004
- 3178
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Radiation-Induced Base Current Broadening Mechanisms in Gated Bipolar DevicesChen, X.J. et al. | 2004
- 3178
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Radiation-induced base current broadening mechanisms in gated bipolar devicesChen, X.J. / Barnaby, H.J. / Pease, R.L. / Schrimpf, R.D. / Platteter, D.G. / Dunham, G. et al. | 2004
- 3186
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Electron Irradiation Effects on Nanocrystal Quantum Dots Used in Bio-Sensing ApplicationsLeon, R. et al. | 2004
- 3186
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Electron irradiation effects on nanocrystal quantum dots used in bio-sensing applicationsLeon, R. / Nadeau, J. / Evans, K. / Paskova, T. / Monemar, B. et al. | 2004
- 3193
-
Displacement damage-induced catastrophic second breakdown in silicon carbide Schottky power diodesScheick, L. / Selva, L. / Becker, H. et al. | 2004
- 3193
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Displacement Damage-Induced Catastrophic Second Breakdown in Silicon Carbide Schottky Power DiodesScheick, L. et al. | 2004
- 3201
-
Limits to the application of NIEL for damage correlationMessenger, S.R. / Burke, E.A. / Summers, G.P. / Walters, R.J. et al. | 2004
- 3201
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Limits to the Application of NIEL for Damage CorrelationMessenger, S.R. et al. | 2004
- 3207
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Alpha particle nonionizing energy loss (NIEL)Insoo Jun, / Xapsos, M.A. / Burke, E.A. et al. | 2004
- 3207
-
SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Alpha Particle Nonionizing Energy Loss (NIEL)Jun, I. et al. | 2004
- 3211
-
Spatial distribution of electron-hole pairs induced by electrons and protons in SiO2Murat, M. / Akkerman, A. / Barak, J. et al. | 2004
- 3211
-
Spatial distribution of electron-hole pairs induced by electrons and protons in SiO/sub 2/Murat, M. / Akkerman, A. / Barak, J. et al. | 2004
- 3211
-
SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Spatial Distribution of Electron-Hole Pairs Induced by Electrons and Protons in SiO2Murat, M. et al. | 2004
- 3219
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Effect of thermal annealing on radiation-induced degradation of bipolar technologies when the dose rate is switched from high to lowDucret, S. / Saigne, F. / Boch, J. / Schrimpf, R.D. / Fleetwood, D.M. / Vaille, J.R. / Dusseau, L. / David, J.P. / Ecoffet, R. et al. | 2004
- 3219
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Effect of Thermal Annealing on Radiation-Induced Degradation of Bipolar Technologies When the Dose Rate Is Switched From High to LowDucret, S. et al. | 2004
- 3225
-
SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Total Dose Effects on Bipolar Integrated Circuits: Characterization of the Saturation RegionBoch, J. et al. | 2004
- 3225
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Total dose effects on bipolar integrated circuits: characterization of the saturation regionBoch, J. / Saigne, F. / Ducret, S. / Schrimpf, R.D. / Fleetwood, D.M. / Iacconi, P. / Dusseau, L. et al. | 2004
- 3231
-
SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Charge Trapping in Irradiated SOI Wafers Measured by Second Harmonic GenerationJun, B. et al. | 2004
- 3231
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Charge trapping in irradiated SOI wafers measured by second harmonic generationBongim Jun, / Schrimpf, R.D. / Fleetwood, D.M. / White, Y.V. / Pasternak, R. / Rashkeev, S.N. / Brunier, F. / Bresson, N. / Fouillat, M. / Cristoloveanu, S. et al. | 2004
- 3238
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Charge trapping and low frequency noise in SOI buried oxidesXiong, H.D. / Jun, B. / Fleetwood, D.M. / Schrimpf, R.D. / Schwank, J.R. et al. | 2004
- 3238
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - Charge Trapping and Low Frequency Noise in SOI Buried OxidesXiong, H.D. et al. | 2004
- 3243
-
SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - The Effects of Radiation on 1-f Noise in Complementary (npn + pnp) SiGe HBTsZhao, E. et al. | 2004
- 3243
-
The effects of radiation on 1/f noise in complementary (npn+pnp) SiGe HBTsEnhai Zhao, / Sutton, A.K. / Haugerud, B.M. / Cressler, J.D. / Marshall, P.W. / Reed, R.A. / El-Kareh, B. / Balster, S. / Yasuda, H. et al. | 2004
- 3250
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SESSION A - BASIC MECHANISMS OF RADIATION EFFECTS - NIEL Calculations for High-Energy Heavy IonsXapsos, M.A. et al. | 2004
- 3250
-
NIEL calculations for high-energy heavy ionsXapsos, M.A. / Burke, E.A. / Badavi, F.F. / Townsend, L.W. / Wilson, J.W. / Jun, I. et al. | 2004
- 3255
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Charge Enhancement Effect in NMOS Bulk Transistors Induced by Heavy Ion Irradiation -- Comparison With SOIFerlet-Cavrois, V. et al. | 2004
- 3255
-
Charge enhancement effect in NMOS bulk transistors induced by heavy ion Irradiation-comparison with SOIFerlet-Cavrois, V. / Vizkelethy, G. / Paillet, P. / Torres, A. / Schwank, J.R. / Shaneyfelt, M.R. / Baggio, J. / de Pontcharra, Jd.P. / Tosti, L. et al. | 2004
- 3263
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New experimental findings for single-event gate rupture in MOS capacitors and linear devicesLum, G.K. / Boruta, N. / Baker, J.M. / Robinette, L. / Shaneyfelt, M.R. / Schwank, J.R. / Dodd, P.E. / Felix, J.A. et al. | 2004
- 3263
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - New Experimental Findings for Single-Event Gate Rupture in MOS Capacitors and Linear DevicesLum, G.K. et al. | 2004
- 3270
-
Angular dependence of multiple-bit upsets induced by protons in a 16 mbit DRAMBuchner, S. / Campbell, A. / Reed, R. / Fodness, B. / Kuboyama, S. et al. | 2004
- 3270
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Angular Dependence of Multiple-Bit Upsets Induced by Protons in a 16 Mbit DRAMBuchner, S. et al. | 2004
- 3278
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Production and Propagation of Single-Event Transients in High-Speed Digital Logic ICsDodd, P.E. et al. | 2004
- 3278
-
Production and propagation of single-event transients in high-speed digital logic ICsDodd, P.E. / Shaneyfelt, M.R. / Felix, J.A. / Schwank, J.R. et al. | 2004
- 3285
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Single Event Transient Pulsewidths in Digital MicrocircuitsGadlage, M.J. et al. | 2004
- 3285
-
Single event transient pulse widths in digital microcircuitsGadlage, M.J. / Schrimpf, R.D. / Benedetto, J.M. / Eaton, P.H. / Mavis, D.G. / Sibley, M. / Avery, K. / Turflinger, T.L. et al. | 2004
- 3291
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Methodology to Compute Neutron-Induced Alphas Contribution on the SEU Cross Section in Sensitive RAMsWrobel, F. et al. | 2004
- 3291
-
Methodology to compute neutron-Induced Alphas contribution on the SEU Cross section in sensitive RAMsWrobel, F. / Palau, J.-M. / Iacconi, P. / Palau, M.-C. / Sagnes, B. / Saigne, F. et al. | 2004
- 3298
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Three-Dimensional Simulation of Heavy-Ion Induced Charge Collection in SiGe HBTs on SOIVaradharajaperumal, M. et al. | 2004
- 3298
-
Three-dimensional Simulation of heavy-ion induced charge collection in SiGe HBTs on SOIVaradharajaperumal, M. / Guofu Niu, / Cressler, J.D. / Reed, R.A. / Marshall, P.W. et al. | 2004
- 3304
-
Transient conductive path induced by a Single ion in 10 nm SiO/sub 2/ LayersCellere, G. / Paccagnella, A. / Visconti, A. / Bonanomi, M. / Candelori, A. et al. | 2004
- 3304
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Transient Conductive Path Induced by a Single Ion in 10 nm SiO2 LayersCellere, G. et al. | 2004
- 3312
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Spatial and Temporal Characteristics of Energy Deposition by Protons and Alpha Particles in SiliconKobayashi, A.S. et al. | 2004
- 3312
-
Spatial and temporal characteristics of energy deposition by protons and alpha particles in siliconKobayashi, A.S. / Sternberg, A.L. / Massengill, L.W. / Schrimpf, R.D. / Weller, R.A. et al. | 2004
- 3318
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Phonon Production and Nonequilibrium Transport From Ion StrikesWalker, D.G. et al. | 2004
- 3318
-
Phonon production and Nonequilibrium Transport from ion strikesWalker, D.G. / Weller, R.A. et al. | 2004
- 3324
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Transient Response of III-V Field-Effect Transistors to Heavy-Ion IrradiationMcMorrow, D. et al. | 2004
- 3324
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Transient response of III-V field-effect transistors to heavy-ion irradiationMcMorrow, D. / Boos, J.B. / Knudson, A.R. / Lotshaw, W.T. / Doe Park, / Melinger, J.S. / Bennett, B.R. / Torres, A. / Ferlet-Cavrois, V. / Sauvestre, J.-E. et al. | 2004
- 3332
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Single-Event Burnout of Super-Junction Power MOSFETsIkeda, N. et al. | 2004
- 3332
-
Single-event burnout of Super-junction power MOSFETsIkeda, N. / Kuboyama, S. / Matsuda, S. et al. | 2004
- 3336
-
Improved model for single-event burnout mechanismKuboyama, S. / Ikeda, N. / Hirao, T. / Matsuda, S. et al. | 2004
- 3336
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Improved Model for Single-Event Burnout MechanismKuboyama, S. et al. | 2004
- 3342
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - SEMM-2: A Modeling System for Single Event Upset AnalysisTang, H.H.K. et al. | 2004
- 3342
-
SEMM-2: a modeling system for single event upset analysisTang, H.H.K. / Cannon, E.H. et al. | 2004
- 3349
-
Analysis of body-tie effects on SEU resistance of advanced FD-SOI SRAMs through mixed-mode 3-D SimulationsHirose, K. / Saito, H. / Fukuda, S. / Kuroda, Y. / Ishii, S. / Takahashi, D. / Yamamoto, K. et al. | 2004
- 3349
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Analysis of Body-Tie Effects on SEU Resistance of Advanced FD-SOI SRAMs Through Mixed-Mode 3-D SimulationsHirose, K. et al. | 2004
- 3354
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Simulation-Based Analysis of SEU Effects in SRAM-Based FPGAsViolante, M. et al. | 2004
- 3354
-
Simulation-based analysis of SEU effects in SRAM-based FPGAsViolante, M. / Sterpone, L. / Ceschia, M. / Bortolato, D. / Bernardi, P. / Reorda, M.S. / Paccagnella, A. et al. | 2004
- 3360
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Single Event Transients Characterization in SOI CMOS ComparatorsZhao, B. et al. | 2004
- 3360
-
Single event transients characterization in SOI CMOS comparatorsBing Zhao, / Leuciuc, A. et al. | 2004
- 3365
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Single Event Transient Pulsewidth Measurements Using a Variable Temporal Latch TechniqueEaton, P. et al. | 2004
- 3365
-
Single event transient pulsewidth measurements using a variable temporal latch techniqueEaton, P. / Benedetto, J. / Mavis, D. / Avery, K. / Sibley, M. / Gadlage, M. / Turflinger, T. et al. | 2004
- 3369
-
SESSION B - SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - Assessment of Neutron- and Proton-Induced Nuclear Interaction and Ionization Models in Geant4 for Simulating Single Event EffectsTruscott, P. et al. | 2004
- 3369
-
Assessment of neutron- and proton-induced nuclear interaction and ionization models in Geant4 for Simulating single event effectsTruscott, P. / Lei, F. / Dyer, C.S. / Frydland, A. / Clucas, S. / Trousse, B. / Hunter, K. / Comber, C. / Chugg, A. / Moutrie, M. et al. | 2004
- 3375
-
SESSION C - SPACE RADIATION ENVIRONMENTS - Specification of the Radiation Belt Slot Region: Comparison of the NASA AE8 Model With TSX5-CEASE DataBrautigam, D.H. et al. | 2004
- 3375
-
Specification of the radiation belt slot region: comparison of the NASA AE8 model with TSX5/CEASE dataBrautigam, D.H. / Ray, K.P. / Ginet, G.P. / Madden, D. et al. | 2004
- 3381
-
Energy-deposition events measured by the CRRES PHA experimentMcNulty, P.J. / Kinnison, J.D. / Maurer, R.H. / Roth, D.R. / Reed, R.A. / Abdel-Kader, W.G. et al. | 2004
- 3381
-
SESSION C - SPACE RADIATION ENVIRONMENTS - Energy-Deposition Events Measured by the CRRES PHA ExperimentMcNulty, P.J. et al. | 2004
- 3388
-
SESSION C - SPACE RADIATION ENVIRONMENTS - Observation of the Solar Particle Events of October and November 2003 From CREDO and MPTBDyer, C.S. et al. | 2004
- 3388
-
Observation of the solar particle events of October and November 2003 from CREDO and MPTBDyer, C.S. / Hunter, K. / Clucas, S. / Campbell, A. et al. | 2004
- 3394
-
SESSION C - SPACE RADIATION ENVIRONMENTS - Model for Solar Proton Risk AssessmentXapsos, M.A. et al. | 2004
- 3394
-
Model for solar proton risk assessmentXapsos, M.A. / Stauffer, C. / Gee, G.B. / Barth, J.L. / Stassinopoulos, E.G. / McGuire, R.E. et al. | 2004
- 3399
-
Survey of DSCS-III B-7 differential surface chargingKrause, L.H. / Cooke, D.L. / Enloe, C.L. / Font, G.I. / McHarg, M.G. / Putz, V. / Ray, K.P. / Toth, M.J. et al. | 2004
- 3399
-
SESSION C - SPACE RADIATION ENVIRONMENTS - Survey of DSCS-III B-7 Differential Surface ChargingKrause, L.Habash et al. | 2004
- 3408
-
Update on the use of Geant4 for the Simulation of low-energy protons scattering off X-ray Mirrors at grazing incidence anglesLei, F. / Nartallo, R. / Nieminen, P. / Daly, E. / Evans, H. / Truscott, P. et al. | 2004
- 3408
-
SESSION C - SPACE RADIATION ENVIRONMENTS - Update on the Use of Geant4 for the Simulation of Low-Energy Protons Scattering Off X-Ray Mirrors at Grazing Incidence AnglesLei, F. et al. | 2004
- 3413
-
Particle effects on the ISGRI Instrument On-board the INTEGRAL SatelliteClaret, A. / Limousin, O. / Lugiez, F. / Laurent, P. / Renaud, M. et al. | 2004
- 3413
-
SESSION C - SPACE RADIATION ENVIRONMENTS - Particle Effects on the ISGRI Instrument On-Board the INTEGRAL SatelliteClaret, A. et al. | 2004
- 3420
-
SESSION D - TERRESTRIAL RADIATION ENVIRONMENTS AND EFFECTS - Analysis of Proton-Neutron SEU Sensitivity of Commercial SRAMs -- Application to the Terrestrial Environment Test MethodBaggio, J. et al. | 2004
- 3420
-
Analysis of proton/neutron SEU sensitivity of commercial SRAMs-application to the terrestrial environment test methodBaggio, J. / Ferlet-Cavrois, V. / Duarte, H. / Flament, O. et al. | 2004
- 3427
-
SESSION D - TERRESTRIAL RADIATION ENVIRONMENTS AND EFFECTS - Measurement of the Flux and Energy Spectrum of Cosmic-Ray Induced Neutrons on the GroundGordon, M.S. et al. | 2004
- 3427
-
Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the groundGordon, M.S. / Goldhagen, P. / Rodbell, K.P. / Zabel, T.H. / Tang, H.H.K. / Clem, J.M. / Bailey, P. et al. | 2004
- 3435
-
Neutron-induced SEU in bulk SRAMs in terrestrial environment: Simulations and experimentsLambert, D. / Baggio, J. / Ferlet-Cavrois, V. / Flament, O. / Saigne, F. / Sagnes, B. / Buard, N. / Carriere, T. et al. | 2004
- 3435
-
SESSION D - TERRESTRIAL RADIATION ENVIRONMENTS AND EFFECTS - Neutron-Induced SEU in Bulk SRAMs in Terrestrial Environment: Simulations and ExperimentsLambert, D. et al. | 2004
- 3442
-
SESSION D - TERRESTRIAL RADIATION ENVIRONMENTS AND EFFECTS - An Atmospheric Radiation Model Based on Response Matrices Generated by Detailed Monte Carlo Simulations of Cosmic Ray InteractionsLei, F. et al. | 2004
- 3442
-
An atmospheric radiation model based on response matrices generated by detailed Monte Carlo Simulations of cosmic ray interactionsLei, F. / Clucas, S. / Dyer, C. / Truscott, P. et al. | 2004
- 3452
-
A neutron spectrometer for avionic environment investigationsHubert, G. / Trochet, P. / Riant, O. / Heinz, P. / Gaillard, R. et al. | 2004
- 3452
-
SESSION D - TERRESTRIAL RADIATION ENVIRONMENTS AND EFFECTS - A Neutron Spectrometer for Avionic Environment InvestigationsHubert, G. et al. | 2004
- 3457
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - A Comparative Study of Heavy-Ion and Proton-Induced Bit-Error Sensitivity and Complex Burst-Error Modes in Commercially Available High-Speed SiGe BiCMOSMarshall, P. et al. | 2004
- 3457
-
A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOSMarshall, P. / Carts, M. / Campbell, A. / Ladbury, R. / Reed, R. / Marshall, C. / Currie, S. / McMorrow, D. / Buchner, S. / Seidleck, C. et al. | 2004
- 3464
-
Single-event destructive failure in a bipolar ASICRickey, P. / Stapor, W.J. / McDonald, P.T. / Abare, W. / Gonyea, R. et al. | 2004
- 3464
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single-Event Destructive Failure in a Bipolar ASICRickey, P. et al. | 2004
- 3469
-
Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs)Swift, G.M. / Rezgui, S. / George, J. / Carmichael, C. / Napier, M. / Maksymowicz, J. / Moore, J. / Lesea, A. / Koga, R. / Wrobel, T.F. et al. | 2004
- 3469
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Dynamic Testing of Xilinx Virtex-II Field Programmable Gate Array (FPGA) Input-Output Blocks (IOBs)Swift, G.M. et al. | 2004
- 3475
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Proton-Induced Upset in SOI CMOS SRAMSLiu, S.T. et al. | 2004
- 3475
-
Proton-induced upset in SOI CMOS SRAMSLiu, S.T. / Liu, H.Y. / Anthony, D. / Heikkila, W. / Hughes, H. / Campbell, A. / Petersen, E.L. / McMarr, P.J. et al. | 2004
- 3480
-
Heavy ion-induced digital single-event transients in deep submicron ProcessesBenedetto, J. / Eaton, P. / Avery, K. / Mavis, D. / Gadlage, M. / Turflinger, T. / Dodd, P.E. / Vizkelethyd, G. et al. | 2004
- 3480
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Heavy Ion-Induced Digital Single-Event Transients in Deep Submicron ProcessesBenedetto, J. et al. | 2004
- 3486
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Use of Light-Ion-Induced SEU in Devices Under Reduced Bias to Evaluate Their SEU Cross SectionBarak, J. et al. | 2004
- 3486
-
Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross sectionBarak, J. / Haran, A. / Adler, E. / Azoulay, M. / Levinson, J. / Zentner, A. / David, D. / Fischer, B.E. / Heiss, M. / Betel, D. et al. | 2004
- 3494
-
Extensions of the FOM Method-proton SEL and atmospheric neutron SEUNormand, E. et al. | 2004
- 3494
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Extensions of the FOM Method -- Proton SEL and Atmospheric Neutron SEUNormand, E. et al. | 2004
- 3505
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Frequency Dependence of Single-Event Upset in Advanced Commercial PowerPC MicroprocessorsIrom, F. et al. | 2004
- 3505
-
Frequency dependence of single-event upset in advanced commercial PowerPC microprocessorsIrom, F. / Farmanesh, F.F. et al. | 2004
- 3510
-
Software detection mechanisms providing full coverage against single bit-flip faultsNicolescu, B. / Savaria, Y. / Velazco, R. et al. | 2004
- 3510
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Software Detection Mechanisms Providing Full Coverage Against Single Bit-Flip FaultsNicolescu, B. et al. | 2004
- 3519
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Analysis of Single-Event Effects in Continuous-Time Delta-Sigma ModulatorsLeuciuc, A. et al. | 2004
- 3519
-
Analysis of single-event effects in continuous-time Delta-Sigma ModulatorsLeuciuc, A. / Bing Zhao, / Yi Tian, / Jinhu Sun, et al. | 2004
- 3525
-
Alpha-particle SEU performance of SRAM with triple wellPuchner, H. / Radaelli, D. / Chatila, A. et al. | 2004
- 3525
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Alpha-Particle SEU Performance of SRAM With Triple WellPuchner, H. et al. | 2004
- 3529
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Investigation of Millisecond-Long Analog Single-Event Transients in the LM6144 Op AmpBoulghassoul, Y. et al. | 2004
- 3529
-
Investigation of millisecond-long analog single-event transients in the LM6144 op ampBoulghassoul, Y. / Buchner, S. / McMorrow, D. / Pouget, V. / Massengill, L.W. / Fouillat, P. / Holman, W.T. / Poivey, C. / Howard, J.W. / Savage, M. et al. | 2004
- 3537
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Frequency-Domain Analysis of Analog Single-Event Transients (ASETs) Based on Energy Spectral DensityKauppila, A.V. et al. | 2004
- 3537
-
Frequency-domain analysis of analog single-event transients (ASETs) based on energy spectral densityKauppila, A.V. / Massengill, L.W. / Holman, W.T. / Vaughn, G.L. / Kauppila, J.S. et al. | 2004
- 3546
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - A Comprehensive Analog Single-Event Transient Analysis MethodologySavage, M.W. et al. | 2004
- 3546
-
A comprehensive analog single-event transient analysis methodologySavage, M.W. / Titus, J.L. / Turflinger, T.L. / Pease, R.L. / Poivey, C. et al. | 2004
- 3553
-
Demonstration of single-event effects induced by through-wafer two-photon absorptionMcMorrow, D. / Buchner, S. / Lotshaw, W.T. / Melinger, J.S. / Maher, M. / Savage, M.W. et al. | 2004
- 3553
-
SESSION E - SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Demonstration of Single-Event Effects Induced by Through-Wafer Two-Photon AbsorptionMcMorrow, D. et al. | 2004
- 3558
-
SESSION F - RADIATION EFFECTS IN PHOTONICS - Proton Damage in LEDs With Wavelengths Above the Silicon Wavelength CutoffBecker, H.N. et al. | 2004
- 3558
-
Proton damage in LEDs with wavelengths above the silicon wavelength cutoffBecker, H.N. / Johnston, A.H. et al. | 2004
- 3564
-
SESSION F - RADIATION EFFECTS IN PHOTONICS - Radiation Degradation Mechanisms in Laser DiodesJohnston, A.H. et al. | 2004
- 3564
-
Radiation degradation mechanisms in laser diodesJohnston, A.H. / Miyahira, T.F. et al. | 2004
- 3572
-
SESSION F - RADIATION EFFECTS IN PHOTONICS - Dark Current Degradation of Near Infrared Avalanche Photodiodes From Proton IrradiationBecker, H.N. et al. | 2004
- 3572
-
Dark current degradation of near infrared avalanche photodiodes from proton irradiationBecker, H.N. / Johnston, A.H. et al. | 2004
- 3579
-
SESSION F - RADIATION EFFECTS IN PHOTONICS - Analyses of Images of Neutron Interactions and Single Particle Displacement Damage in CCD ArraysChugg, A.M. et al. | 2004
- 3579
-
Analyses of images of neutron interactions and single particle displacement damage in CCD arraysChugg, A.M. / Jones, R. / Moutrie, M.J. / Truscott, P.R. et al. | 2004
- 3585
-
Proton radiation damage at low temperature in GaAs and GaN light-emitting diodesKhanna, S.M. / Estan, D. / Houdayer, A. / Liu, H.C. / Dudek, R. et al. | 2004
- 3585
-
SESSION F - RADIATION EFFECTS IN PHOTONICS - Proton Radiation Damage at Low Temperature in GaAs and GaN Light-Emitting DiodesKhanna, S.M. et al. | 2004
- 3595
-
Design considerations for optical systems in ionizing and nonionizing radiation environmentsKalavagunta, A. / Schrimpf, R. / Neifeld, M. et al. | 2004
- 3595
-
SESSION F - RADIATION EFFECTS IN PHOTONICS - Design Considerations for Optical Systems in Ionizing and Nonionizing Radiation EnvironmentsKalavagunta, A. et al. | 2004
- 3603
-
SESSION G - HARDNESS BY DESIGN - Single Event Simulation Methodology for Analog-Mixed Signal Design HardeningKauppila, J.S. et al. | 2004
- 3603
-
Single event Simulation methodology for analog/mixed signal design hardeningKauppila, J.S. / Massengill, L.W. / Holman, W.T. / Kauppila, A.V. / Sanathanamurthy, S. et al. | 2004
- 3609
-
SESSION G - HARDNESS BY DESIGN - SET Tolerant CMOS ComparatorMikkola, E. et al. | 2004
- 3609
-
SET tolerant CMOS comparatorMikkola, E. / Vermeire, B. / Barnaby, H.J. / Parks, H.G. / Borhani, K. et al. | 2004
- 3615
-
Reliability enhancement in high-performance MOSFETs by annular transistor designMayer, D.C. / Lacoe, R.C. / King, E.E. / Osborn, J.V. et al. | 2004
- 3615
-
SESSION G - HARDNESS BY DESIGN - Reliability Enhancement in High-Performance MOSFETs by Annular Transistor DesignMayer, D.C. et al. | 2004
- 3621
-
SESSION G - HARDNESS BY DESIGN - SEE in a 0.15 mm Fully Depleted CMOS-SOI Commercial ProcessMakihara, A. et al. | 2004
- 3621
-
SEE in a 0.15 /spl mu/m fully depleted CMOS/SOI commercial ProcessMakihara, A. / Yamaguchi, T. / Tsuchiya, Y. / Arimitsu, T. / Asai, H. / Iide, Y. / Shindou, H. / Kuboyama, S. / Matsuda, S. et al. | 2004
- 3626
-
SESSION G - HARDNESS BY DESIGN - Edge Triggered Pulse Latch Design With Delayed Latching Edge for Radiation Hardened ApplicationWang, W. et al. | 2004
- 3626
-
Edge triggered pulse latch design with delayed latching edge for radiation hardened applicationWeizhong Wang, / Haiyan Gong, et al. | 2004
- 3631
-
Diamond PCD for Reactor active dosimetry applicationsGriffin, P.J. / Luker, S.M. / King, D.B. / DePriest, K.R. / Hohlfelder, R.J. / Suo-Anttila, A.J. et al. | 2004
- 3631
-
SESSION H - DOSIMETRY AND FACILITIES - Diamond PCD for Reactor Active Dosimetry ApplicationsGriffin, P.J. et al. | 2004
- 3638
-
Quality control of intensity modulated radiation therapy with optically stimulated luminescent filmsIdri, K. / Santoro, L. / Charpiot, E. / Herault, J. / Costa, A. / Ailleres, N. / Delard, R. / Vaille, J.R. / Fesquet, J. / Dusseau, L. et al. | 2004
- 3638
-
SESSION H - DOSIMETRY AND FACILITIES - Quality Control of Intensity Modulated Radiation Therapy With Optically Stimulated Luminescent FilmsIdri, K. et al. | 2004
- 3642
-
Conception of an integrated sensor for the radiation monitoring of the CMS experiment at the large hadron colliderRavotti, F. / Glaser, M. / Moll, M. / Idri, K. / Vaille, J.R. / Prevost, H. / Dusseau, L. et al. | 2004
- 3642
-
SESSION H - DOSIMETRY AND FACILITIES - Conception of an Integrated Sensor for the Radiation Monitoring of the CMS Experiment at the Large Hadron ColliderRavotti, F. et al. | 2004
- 3649
-
SESSION H - DOSIMETRY AND FACILITIES - Measurement of Device Parameters Using Image Recovery Techniques in Large-Scale IC DevicesScheick, L. et al. | 2004
- 3649
-
Measurement of device parameters using image recovery techniques in large-scale IC devicesScheick, L. / Edmonds, L. et al. | 2004
- 3658
-
Benchmark experiments for space Reactor neutron shielding of mission electronicsWilliams, J.G. / Insoo Jun, / Sallee, W.W. / Cherng, M. et al. | 2004
- 3658
-
SESSION H - DOSIMETRY AND FACILITIES - Benchmark Experiments for Space Reactor Neutron Shielding of Mission ElectronicsWilliams, J.G. et al. | 2004
- 3664
-
Performance of the high-energy single-event effects test Facility (SEETF) at Michigan State university's national Superconducting Cyclotron laboratory (NSCL)Ladbury, R. / Reed, R.A. / Marshall, P. / LaBel, K.A. / Anantaraman, R. / Fox, R. / Sanderson, D.P. / Stolz, A. / Yurkon, J. / Zeller, A.F. et al. | 2004
- 3664
-
SESSION H - DOSIMETRY AND FACILITIES - Performance of the High-Energy Single-Event Effects Test Facility (SEETF) at Michigan State University's National Superconducting Cyclotron Laboratory (NSCL)Ladbury, R. et al. | 2004
- 3669
-
A screened Coulomb scattering module for displacement damage computations in Geant4Weller, R.A. / Mendenhall, M.H. / Fleetwood, D.M. et al. | 2004
- 3669
-
SESSION H - DOSIMETRY AND FACILITIES - A Screened Coulomb Scattering Module for Displacement Damage Computations in Geant4Weller, R.A. et al. | 2004
- 3679
-
The effects of neutron irradiation on gamma sensitivity of linear integrated circuitsGorelick, J.L. / Ladbury, R. / Kanchawa, L. et al. | 2004
- 3679
-
SESSION I - HARDNESS ASSURANCE - The Effects of Neutron Irradiation on Gamma Sensitivity of Linear Integrated CircuitsGorelick, J.L. et al. | 2004
- 3686
-
Using surface charge analysis to characterize the radiation response of Si/SiO2 structuresStacey, J.W. / Schrimpf, R.D. / Fleetwood, D.M. / Holmes, K.C. et al. | 2004
- 3686
-
SESSION I - HARDNESS ASSURANCE - Using Surface Charge Analysis to Characterize the Radiation Response of Si-SiO2 StructuresStacey, J.W. et al. | 2004
- 3686
-
Using surface charge analysis to characterize the radiation response of Si/SiO/sub 2/ structuresStacey, J.W. / Schrimpf, R.D. / Fleetwood, D.M. / Holmes, K.C. et al. | 2004
- 3692
-
SESSION I - HARDNESS ASSURANCE - Issues for Single-Event Proton Testing of SRAMsSchwank, J.R. et al. | 2004
- 3692
-
Issues for single-event proton testing of SRAMsSchwank, J.R. / Dodd, P.E. / Shaneyfelt, M.R. / Felix, J.A. / Hash, G.L. / Ferlet-Cavrois, V. / Paillet, P. / Baggio, J. / Tangyunyong, P. / Blackmore, E. et al. | 2004
- 3701
-
SESSION I - HARDNESS ASSURANCE - Broadening of the Variance of the Number of Upsets in a Read-Cycle by MBUsChugg, A.M. et al. | 2004
- 3701
-
Broadening of the variance of the number of upsets in a read-cycle by MBUsChugg, A.M. / Moutrie, M.J. / Jones, R. et al. | 2004
- 3708
-
Effects of beam spot size on the correlation between laser and heavy ion SEU testingMiller, F. / Buard, N. / Carriere, T. / Dufayel, R. / Gaillard, R. / Poirot, P. / Palau, J.-M. / Sagnes, B. / Fouillat, P. et al. | 2004
- 3708
-
SESSION I - HARDNESS ASSURANCE - Effects of Beam Spot Size on the Correlation Between Laser and Heavy Ion SEU TestingMiller, F. et al. | 2004
- 3716
-
Pulsed-laser testing methodology for single event transients in linear devicesBuchner, S. / Howard, J. / Poivey, C. / McMorrow, D. / Pease, R. et al. | 2004
- 3716
-
SESSION I - HARDNESS ASSURANCE - Pulsed-Laser Testing Methodology for Single Event Transients in Linear DevicesBuchner, S. et al. | 2004
- 3723
-
Assessment of gated sweep technique for total dose and dose rate analysis in bipolar oxidesMinson, E. / Sanchez, I. / Barnaby, H.J. / Pease, R.L. / Platteter, D.G. / Dunham, G. et al. | 2004
- 3723
-
SESSION I - HARDNESS ASSURANCE - Assessment of Gated Sweep Technique for Total Dose and Dose Rate Analysis in Bipolar OxidesMinson, E. et al. | 2004
- 3730
-
Proton, neutron, and gamma degradation of optocouplersGorelick, J.L. / Ladbury, R. et al. | 2004
- 3730
-
SESSION I - HARDNESS ASSURANCE - Proton, Neutron, and Gamma Degradation of OptocouplersGorelick, J.L. et al. | 2004
- 3736
-
Proton tolerance of fourth-generation 350 GHz UHV/CVD SiGe HBTsSutton, A.K. / Haugerud, B.M. / Yuan Lu, / Wei-Min Lance Kuo, / Cressler, J.D. / Marshall, P.W. / Reed, R.A. / Jae-Sung Rieh, / Freeman, G. / Ahlgren, D. et al. | 2004
- 3736
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Proton Tolerance of Fourth-Generation 350 GHz UHV-CVD SiGe-HBTsSutton, K. et al. | 2004
- 3743
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Proton Tolerance of Advanced SiGe HBTs Fabricated on Different Substrate MaterialsComeau, J.P. et al. | 2004
- 3743
-
Proton tolerance of advanced SiGe HBTs fabricated on different substrate materialsComeau, J.P. / Sutton, A.K. / Haugerud, B.M. / Cressler, J.D. / Wei-Min Lance Kuo, / Marshall, P.W. / Reed, R.A. / Karroy, A. / Van Art, R. et al. | 2004
- 3748
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Proton Radiation Effects in 4H-SiC Diodes and MOS CapacitorsLuo, Z. et al. | 2004
- 3748
-
Proton radiation effects in 4H-SiC diodes and MOS capacitorsZhiyun Luo, / Tianbing Chen, / Ahyi, A.C. / Sutton, A.K. / Haugerud, B.M. / Cressler, J.D. / Sheridan, D.C. / Williams, J.R. / Marshall, P.W. / Reed, R.A. et al. | 2004
- 3753
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - A Model for TID Effects on Floating Gate Memory CellsCellere, G. et al. | 2004
- 3753
-
A model for TID effects on floating Gate Memory cellsCellere, G. / Paccagnella, A. / Visconti, A. / Bonanomi, M. / Caprara, P. / Lora, S. et al. | 2004
- 3759
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Total Ionizing Dose Effects on Flash-based Field Programmable Gate ArrayWang, J.J. et al. | 2004
- 3759
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Total ionizing dose effects on flash-based field programmable gate arrayWang, J.J. / Samiee, S. / Chen, H.-S. / Huang, C.-K. / Cheung, M. / Borillo, J. / Sun, S.-N. / Cronquist, B. / McCollum, J. et al. | 2004
- 3767
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Total dose effects on double gate fully depleted SOI MOSFETsBongim Jun, / Xiong, H.D. / Sternberg, A.L. / Cirba, C.R. / Dakai Chen, / Schrimpf, R.D. / Fleetwood, D.M. / Schwank, J.R. / Cristoloveanu, S. et al. | 2004
- 3767
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SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Total Dose Effects on Double Gate Fully Depleted SOI MOSFETsJun, B. et al. | 2004
- 3773
-
Characterization of enhanced low dose rate sensitivity (ELDRS) effects using Gated Lateral PNP transistor structuresPease, R.L. / Platteter, D.G. / Dunham, G.W. / Seiler, J.E. / Barnaby, H.J. / Schrimpf, R.D. / Shaneyfelt, M.R. / Maher, M.C. / Nowlin, R.N. et al. | 2004
- 3773
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SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Characterization of Enhanced Low Dose Rate Sensitivity (ELDRS) Effects Using Gated Lateral PNP Transistor StructuresPease, R.L. et al. | 2004
- 3781
-
Proton radiation response of monolithic Millimeter-wave transceiver building blocks implemented in 200 GHz SiGe technologyWei-Min Lance Kuo, / Yuan Lu, / Floyd, B.A. / Haugerud, B.M. / Sutton, A.K. / Krithivasan, R. / Cressler, J.D. / Gaucher, B.P. / Marshall, P.W. / Reed, R.A. et al. | 2004
- 3781
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SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Proton Radiation Response of Monolithic Millimeter-Wave Transceiver Building Blocks Implemented in 200 GHz SiGe TechnologyKuo, W.-M.L. et al. | 2004
- 3788
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Noise performance of 0.35-/spl mu/m SOI CMOS devices and micropower preamplifier following 63-MeV, 1-mrad (Si) proton irradiationBinkley, D.M. / Hopper, C.E. / Cressler, J.D. / Mojarradi, M.M. / Blalock, B.J. et al. | 2004
- 3788
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Noise Performance of 0.35-mm SOI CMOS Devices and Micropower Preamplifier Following 63-MeV, 1-Mrad (Si) Proton IrradiationBinkley, D.M. et al. | 2004
- 3795
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Impact of 7.5-MeV Proton Irradiation on Front-Back Gate Coupling Effect in Ultra Thin Gate Oxide FD-SOI n-MOSFETsHayama, K. et al. | 2004
- 3795
-
Impact of 7.5-MeV proton irradiation on front-back gate coupling effect in ultra thin gate oxide FD-SOI n-MOSFETsHayama, K. / Takakura, K. / Ohyama, H. / Rafi, J.M. / Mercha, A. / Simoen, E. / Claeys, C. / Kokkoris, M. et al. | 2004
- 3801
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Proton Irradiation Effects on GAN-Based High Electron-Mobility Transistors With Si-Doped AlxGa1-xN and Thick GaN Cap LayersKarmarkar, A.P. et al. | 2004
- 3801
-
Proton irradiation effects on GaN-based high electron-mobility transistors with Si-doped Al/sub x/Ga/sub 1-x/N and thick GaN cap LayersKarmarkar, A.P. / Bongim Jun, / Fleetwood, D.M. / Schrimpf, R.D. / Weller, R.A. / White, B.D. / Brillson, L.J. / Mishra, U.K. et al. | 2004
- 3807
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - The Effects of Proton Irradiation on the Performance of mm-Wave Transmission Lines Implemented in SiGe TechnologyAndrews, J. et al. | 2004
- 3807
-
The effects of proton irradiation on the performance of mm-wave transmission lines implemented in SiGe technologyAndrews, J. / Morton, M. / Jongsoo Lee, / Papapolymerou, J. / Cressler, J.D. / Sutton, A.K. / Haugerud, B.M. / Marshall, P.W. / Reed, R.A. / Daehyung Cho, et al. | 2004
- 3811
-
Sense amplifier based RADHARD flip flop designWeizhong Wang, / Haiyan Gong, et al. | 2004
- 3811
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Sense Amplifier Based RADHARD Flip Flop DesignWang, W. et al. | 2004
- 3816
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Total Dose Effects in a Linear Voltage RegulatorAdell, P.C. et al. | 2004
- 3816
-
Total dose effects in a linear Voltage regulatorAdell, P.C. / Schrimpf, R.D. / Holman, W.T. / Todd, J.L. / Caveriviere, S. / Cizmarik, R.R. / Galloway, K.F. et al. | 2004
- 3822
-
High total dose tolerance of prototype silicon nanocrystal non-volatile memory cellsPetkov, M.P. / Bell, L.D. / Atwater, H.A. et al. | 2004
- 3822
-
SESSION J - RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - High Total Dose Tolerance of Prototype Silicon Nanocrystal Non-Volatile Memory CellsPetkov, M.P. et al. | 2004
- 3827
-
2004 NSREC Conference Author Index| 2004
- 3827
-
Conference Author Index| 2004
- 3830
-
Leading the field since 1884| 2004
- 3832
-
Quality without compromise| 2004
- 3833
-
A fast low-noise charged-particle CVD diamond detectorFrais-Kolbl, H. / Griesmayer, E. / Kagan, H. / Pernegger, H. et al. | 2004
- 3838
-
Low-energy protons scanning of intentionally partially damaged silicon MESA radiation detectorsHoudayer, A. / Lebel, C. / Leroy, C. / Linhart, V. / Mares, J.J. / Pospisil, S. / Sopko, B. et al. | 2004
- 3845
-
Noise analysis of an Si-drift detector system with time-variant shapingHansen, K. / Reckleben, C. et al. | 2004
- 3853
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2004 Index| 2004
- c1
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[Front cover]| 2004
- c2
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IEEE Transactions on Nuclear Science publication information| 2004
- c3
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IEEE Transactions on Nuclear Science Information for authors| 2004
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SELECTED PAPERS FROM THE 2004 IEEE NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC'04)| 2004
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2003 IEEE NUCLEAR SCIENCE SYMPOSIUM, ROOM-TEMPERATURE SEMICONDUCTOR DETECTOR WORKSHOP, AND SYMPOSIUM ON NUCLEAR POWER SYSTEMS (2003 NSS-RTSD-SNPS)| 2004