Simulation and characterization of AlGaAs/InGaAs/GaAs pHEMT structures with quantum wells for SHF integrated circuits (English)
- New search for: Dudin, A.
- New search for: Kogan, I.
- New search for: Schukov, I.
- New search for: Mironova, M.
- New search for: Yakovlev, G.
- New search for: Frolov, D.
- New search for: Zubkov, V.
- New search for: Glinskii, G.
- New search for: Dudin, A.
- New search for: Kogan, I.
- New search for: Schukov, I.
- New search for: Mironova, M.
- New search for: Yakovlev, G.
- New search for: Frolov, D.
- New search for: Zubkov, V.
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In:
2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMCCompo)
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108-111
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2017
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ISBN:
- Conference paper / Electronic Resource
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Title:Simulation and characterization of AlGaAs/InGaAs/GaAs pHEMT structures with quantum wells for SHF integrated circuits
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Contributors:Dudin, A. ( author ) / Kogan, I. ( author ) / Schukov, I. ( author ) / Mironova, M. ( author ) / Yakovlev, G. ( author ) / Frolov, D. ( author ) / Zubkov, V. ( author ) / Glinskii, G. ( author )
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Published in:
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Publisher:
- New search for: IEEE
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Publication date:2017-07-01
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Size:391270 byte
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ISBN:
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DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Title page| 2017
- 1
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PrefaceShestopalov, Mikhail et al. | 2017
- 3
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Reducing switching noise effects by advanced clock managementKrstic, M. / Fan, X. / Babic, M. / Grass, E. / Bjerregaard, T. / Yakovlev, A. et al. | 2017
- 9
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Identifying EMC-critical devices by monitoring and classifying operating region transitionsDuipmans, Lammert / Milosevic, Dusan / van der Wel, Arnoud / Baltus, Peter et al. | 2017
- 15
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EMI functional vulnerability identification in RF Front-EndsMartorell, Alexandre / Raoult, Jeremy / Marijon, Robin / Chusseau, Laurent et al. | 2017
- 21
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Methodology of modelling of the internal activity of a FPGA for conducted emission prediction purposeGhfiri, C. / Durier, A. / Boyer, A. / Dhia, S. Ben et al. | 2017
- 27
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Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TIDVilla, Paulo / Bezerra, Eduardo / Goerl, Roger / Poehls, Leticia / Vargas, Fabian / Medina, Nilberto / Added, Nemitala / de Aguiar, Vitor / Macchione, Eduardo / Aguirre, Fernando et al. | 2017
- 33
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Digitally assisted EMI-reduction techniques for Class-D amplifiers with digital controlAuer, Mario / Karaca, Timucin et al. | 2017
- 39
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Spread spectrum parameter optimization to suppress certain frequency spectral componentsDeutschmann, Bernd / Auinger, Bernhard / Winkler, Gunter et al. | 2017
- 45
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Analysis of patterned magnetic thin-film noise suppressor for RF IC chipYamaguchi, Masahiro / Endo, Yasushi / Peng Fan, / Jingyan Ma, / Tanaka, Satoshi / Miyazawa, Yasunori / Nagata, Makoto et al. | 2017
- 50
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Shielding effectiveness of noise coupling on Analog-to-digital converter in magnetic field wireless power transfer systemBae, Bumhee / Kim, Sukjin / YoungKun Kwon, / HyungGeun Kim, / HarkByeong Park, / Kong, Sunkyu / Kim, Joungho et al. | 2017
- 54
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A time-continuous bus-feedback LIN transceiver in 0.14 µm high-voltage SOI CMOSDeloge, Matthieu / Oliver, Jaume Tornila / Brekelmans, Hans / Vermeeren, Peter / Bollen, Gert Jan / van der Wel, Arnoud / Kwakernaat, Gerald / Schoof, Adrien et al. | 2017
- 59
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Susceptibility evaluation of CAN transceiver circuits with in-place waveform capturing under RF DPITaniguchi, Kohki / Nagata, Makoto / Tsukioka, Akihiro / Fujimoto, Daisuke / Miura, Noriyuki / Egami, Takao / Akimoto, Rieko / Niinomi, Kenji / Komatsu, Terumitsu / Fukuba, Yoshinori et al. | 2017
- 64
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Improving electro-magnetic susceptibility performances of high side switches: Case of high side of LIN physical layersAbouda, Kamel / Doridant, Adrien / Vrignon, Bertrand / Baptistat, Nicolas / Aribaud, Matthieu et al. | 2017
- 69
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EMI resisting low-EME SENT drivers in 0.18µm CMOSBaran, Burak / Pues, Hugo / Stijnen, Kristof / Dehaene, Wim et al. | 2017
- 73
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Modeling methodology of the conducted emission of a DC-DC converter boardBoyer, A. / Sentis, M. A. Gonzalez / Ghfiri, C. / Durier, A. et al. | 2017
- 79
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Study of the thermal aging effect on the conducted emission of a synchronous buck converterBoyer, A. / Sentis, M. A. Gonzalez / Ghfiri, C. / Durier, A. et al. | 2017
- 85
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Adaptive current source driver for high-frequency boost converterSubotskaya, Volha / Bodano, Emanuele / Deutschmann, Bernd et al. | 2017
- 91
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EMC-oriented design of output stage of synchronous buck converterBlecic, Raul / Bacmaga, Josip / Gillon, Renaud / Nauwelaers, Bart / Baric, Adrijan et al. | 2017
- 97
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Family of micro switches based on silicon carbide for extreme conditions and dutyLuchinin, V. / Afanasjev, A. / Ilyin, V. / Korlyakov, A. / Petrov, A. et al. | 2017
- 100
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Theory of optoelectronic oscillators based on serially coupled multiple micro-ring resonatorsVitko, V.V. / Nikitin, A.A. / Drozdovskii, A.V. / Ustinov, A.B. / Kalinikos, B.A. et al. | 2017
- 104
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Logic gates based on multiferroic microwave interferometersUstinova, I. A. / Nikitin, A. A. / Ustinov, A. B. / Kalinikos, B. A. / Lahderanta, E. et al. | 2017
- 108
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Simulation and characterization of AlGaAs/InGaAs/GaAs pHEMT structures with quantum wells for SHF integrated circuitsDudin, A. / Kogan, I. / Schukov, I. / Mironova, M. / Yakovlev, G. / Frolov, D. / Zubkov, V. / Glinskii, G. et al. | 2017
- 112
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Detection methods of intense areas and identification of the reasons of HEMT transistors failurePermiakov, Nikita V. / Evseenkov, Anton S. / Tarasov, Sergey A. / Solomonov, Alexander V. / Moshnikov, Vyacheslav A. / Lamkin, Ivan A. et al. | 2017
- 115
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Simulation of electric field distribution in GaN HEMTs for the onset of structure degradationTikhomirov, Vladimir G. / Gudkov, Aleksandr / Petrov, Victor / Agasieva, Svetlana / Zybin, Andrei / Yankevich, Viktor / Evseenkov, Anton et al. | 2017
- 119
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Time-domain measurements using near field scanning method for fast transient current reconstructionVrignon, Bertrand / Abouda, Kamel / Doridant, Adrien / Baptistat, Nicolas et al. | 2017
- 125
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Radiated suceptibility investigation of electronic board from near field scan methodLacrampe, Nicolas / Serpaud, Sebastien / Boyer, Alexandre / Tran, Sereirath et al. | 2017
- 131
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Impact of NFSI on the clock circuit of a Gigabit Ethernet SwitchZouaoui, Massiva / Sicard, Etienne / Braquet, Henri / Rudelou, Ghislain / Marsy, Emmanuel / Jacquemod, Gilles et al. | 2017
- 136
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Influence of ESD on an integrated shift register in operationUngru, Thomas / Wilkening, Wolfgang / Negra, Renato et al. | 2017
- 141
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Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuitsLambrecht, Niels / De Zutter, Daniel / Vande Ginste, Dries / Pues, Hugo et al. | 2017
- 146
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Characterization of a 1-pin stress ESD testing method for the analysis of nanosecond-range charging effectsZur Nieden, Friedrich / Zeitlhoefler, Lena / Esmark, Kai / Gaertner, Reinhold et al. | 2017
- 152
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Equivalent circuit model with nonlinear characteristics of zener diode extracted from SPICE model for ESD simulationMatsushima, Tohlu / Aoki, Mayumi / Hisakado, Takashi / Wada, Osami et al. | 2017
- 156
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Conducted emissions in a 40 nm CMOS test chip: The role of the ESD protectionsRotigni, Mario / Merlo, Mauro / Cordoni, Martina / Colombo, Paolo / Liberali, Valentino et al. | 2017
- 162
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Measurements of EMI susceptibility of precision voltage referencesRichelli, A. / Colalongo, L. / Toninelli, L. / Rusu, I. / Redoute, J.-M. et al. | 2017
- 168
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Disruption of a RF front-end subject to an out-of-band signalPayet, Pierre / Raoult, Jeremy / Chusseau, Laurent et al. | 2017
- 172
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Proposal for combined conducted and radiated emission modelling for Integrated CircuitSerpaud, S. / Ghfiri, C. / Boyer, A. / Durier, A et al. | 2017
- 178
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Enhancement of the DPI method for IC immunity characterizationLavarda, Andrea / Deutschmann, Bernd / Haerle, Dieter et al. | 2017
- 184
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The method of determination the level of low-frequency interference induced by ferromagnetic component on the PCBPetrischev, Oleg / Pilinsky, Volodymyr / Chupakhin, Alexander et al. | 2017
- 190
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Numerical analysis of conformal shields for chip and package shieldingPark, Hyun Ho / Keonyoung Seo, / Kwon, Young-Kun / Park, Hark-Byeong et al. | 2017
- 193
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Impact of DSOI back-gate biasing on circuit conducted emissionLi, B. / Gao, J. / Han, Z. / Luo, J. / Wu, J. / Zhu, W. et al. | 2017
- 197
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DPI immunity of bandgap in Si and SOI technologiesWu, J. / Zhang, H. / Wang, H. / Zheng, L. / Ma, H. / Li, B. et al. | 2017
- 200
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An experimental investigation of four-port IC-StriplineMandic, Tvrtko / Gillon, Renaud / Baric, Adrijan et al. | 2017
- 206
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Design of an EMC test board for analog-to-digital convertersFuchs, Michael et al. | 2017
- 212
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Efficiency improvement means for operation of linear photodetector controller based on CCD lineBurnasheva, S. / Grin, S. / Kustov, T. et al. | 2017
- 217
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Application-specific near field EMI estimation on time-sharing operating systemYuan, Shih-Yi / Chen, Jia-Wei / Dong, Jian-Li / Su, Chia-Hung et al. | 2017
- 221
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Method of calculating random electromagnetic pulse penetration through the conducting structuresGoncharov, V. D. / Sorokin, K. S. / Yashkardin, R. V. / Fiskin, E. M. et al. | 2017
- 224
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Modified Kron's TAN modeling of 3D multilayer PCBXu, Z. / Liu, Y. / Ravelo, B. / Maurice, O. et al. | 2017
- 230
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EM field solver modelling of floating EUT module boards in automotive EMC test setupsMiropolsky, Sergey / Jahn, Stefan / Klotz, Frank et al. | 2017
- 236
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Contents| 2017
- 239
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Author index| 2017