A bulk current injection test conforming to statistical properties of radiation-induced effects (English)
- New search for: Spadacini, G.
- New search for: Pignari, S.A.
- New search for: Spadacini, G.
- New search for: Pignari, S.A.
In:
IEEE Transactions on Electromagnetic Compatibility
;
46
, 3
;
446-458
;
2004
- Article (Journal) / Electronic Resource
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Title:A bulk current injection test conforming to statistical properties of radiation-induced effects
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Contributors:Spadacini, G. ( author ) / Pignari, S.A. ( author )
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Published in:IEEE Transactions on Electromagnetic Compatibility ; 46, 3 ; 446-458
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Publisher:
- New search for: IEEE
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Publication date:2004-08-01
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Size:553284 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 46, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 314
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Introduction to the special issue on high-power electromagnetics (HPEM) and intentional electromagnetic interference (IEMI)Radasky, W.A. / Baum, C.E. / Wik, M.W. et al. | 2004
- 322
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Classification of intentional electromagnetic environments (IEME)Giri, D.V. / Tesche, F.M. et al. | 2004
- 322
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SPECIAL ISSUE PAPERS - Environments and Test Capabilities - Classification of Intentional Electromagnetic Environments (IEME)Giri, D.V. et al. | 2004
- 329
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Overview of four European high-power microwave narrow-band test facilitiesSabath, F. / Backstrom, M. / Nordstrom, B. / Serafin, D. / Kaiser, A. / Kerr, B.A. / Nitsch, D. et al. | 2004
- 329
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SPECIAL ISSUE PAPERS - Environments and Test Capabilities - Overview of Four European High-Power Microwave Narrow-Band Test FacilitiesSabath, F. et al. | 2004
- 335
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SPECIAL ISSUE PAPERS - Environments and Test Capabilities - Survey of Worldwide High Power Wideband CapabilitiesPrather, W.D. et al. | 2004
- 335
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Survey of worldwide high-power wideband capabilitiesPrather, W.D. / Baum, C.E. / Torres, R.J. / Sabath, F. / Nitsch, D. et al. | 2004
- 345
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SPECIAL ISSUE PAPERS - Coupling to Cables and Systems - New Propagation Models for Electromagnetic Waves Along Uniform and Nonuniform CablesHaase, H. et al. | 2004
- 345
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New propagation models for electromagnetic waves along uniform and nonuniform cablesHaase, H. / Steinmetz, T. / Nitsch, J. et al. | 2004
- 353
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SPECIAL ISSUE PAPERS - Coupling to Cables and Systems - EMEC -- AN EM Simulator Based on TopologyCarlsson, J. et al. | 2004
- 353
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EMEC-an EM simulator based on topologyCarlsson, J. / Karlsson, T. / Unden, G. et al. | 2004
- 359
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SPECIAL ISSUE PAPERS - Coupling to Cables and Systems - Numerical Coupling Models for Complex Systems and ResultsParmantier, J.-P. et al. | 2004
- 359
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Numerical coupling models for complex systems and resultsParmantier, J.-P. et al. | 2004
- 368
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SPECIAL ISSUE PAPERS - IEMI Effects on Equipment, Systems, and Communications - Predicting the Breakdown Behavior of Microcontrollers Under EMP-UWB Impact Using a Statistical AnalysisCamp, M. et al. | 2004
- 368
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Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysisCamp, M. / Gerth, H. / Garbe, H. / Haase, H. et al. | 2004
- 380
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Susceptibility of some electronic equipment to HPEM threatsNitsch, D. / Camp, M. / Sabath, F. / ter Haseborg, J.L. / Garbe, H. et al. | 2004
- 380
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SPECIAL ISSUE PAPERS - IEMI Effects on Equipment, Systems, and Communications - Susceptibility of Some Electronic Equipment to HPEM ThreatsNitsch, D. et al. | 2004
- 390
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Trends in EM susceptibility of IT equipmentHoad, R. / Carter, N.J. / Herke, D. / Watkins, S.P. et al. | 2004
- 390
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SPECIAL ISSUE PAPERS - IEMI Effects on Equipment, Systems, and Communications - Trends in EM Susceptibility of IT EquipmentHoad, R. et al. | 2004
- 396
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SPECIAL ISSUE PAPERS - IEMI Effects on Equipment, Systems, and Communications - Susceptibility of Electronic Systems to High-Power Microwaves: Summary of Test ExperienceBäckström, M.G. et al. | 2004
- 396
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Susceptibility of electronic systems to high-power microwaves: summary of test experienceBackstrom, M.G. / Lovstrand, K.G. et al. | 2004
- 404
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Conducted IEMI threats for commercial buildingsParfenov, Y.V. / Zdoukhov, L.N. / Radasky, W.A. / Ianoz, M. et al. | 2004
- 404
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SPECIAL ISSUE PAPERS - IEMI Effects on Equipment, Systems, and Communications - Conducted IEMI Threats for Commercial BuildingsParfenov, Y.V. et al. | 2004
- 412
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Hardware invariant protocol disruptive interference for 100BaseTX Ethernet communicationsJeffrey, I. / Gilmore, C. / Siemens, G. / LoVetri, J. et al. | 2004
- 412
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SPECIAL ISSUE PAPERS - IEMI Effects on Equipment, Systems, and Communications - Hardware Invariant Protocol Disruptive Interference for 100BaseTX Ethernet CommunicationsJeffrey, I. et al. | 2004
- 423
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SPECIAL ISSUE PAPERS - Protection, Measurements, and Standards - Linear and Nonlinear Filters Suppressing UWB PulsesWeber, T. et al. | 2004
- 423
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Linear and nonlinear filters suppressing UWB pulsesWeber, T. / Krzikalla, R. / ter Haseborg, J.L. et al. | 2004
- 431
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SPECIAL ISSUE PAPERS - Protection, Measurements, and Standards - Measurement Techniques for Conducted HPEM SignalsWeber, T. et al. | 2004
- 431
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Measurement techniques for conducted HPEM signalsWeber, T. / ter Haseborg, J.L. et al. | 2004
- 439
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Development of high-power electromagnetic (HPEM) standardsWik, M.W. / Radasky, W.A. et al. | 2004
- 439
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SPECIAL ISSUE PAPERS - Protection, Measurements, and Standards - Development of High-Power Electromagnetic (HPEM) StandardsWik, M.W. et al. | 2004
- 446
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A bulk current injection test conforming to statistical properties of radiation-induced effectsSpadacini, G. / Pignari, S.A. et al. | 2004
- 459
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A proposed new definition and measurement of the shielding effect of equipment enclosuresMarvin, A.C. / Dawson, J.F. / Ward, S. / Dawson, L. / Clegg, J. / Weissenfeld, A. et al. | 2004
- 469
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Convergence of the reverberation chambers to the equilibrium analyzed with the finite-difference time-domain algorithmMoglie, F. et al. | 2004
- 477
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Complex-valued transmission-line parameters and their relation to the radiation resistanceNitsch, J.B. / Tkachenko, S.V. et al. | 2004
- 488
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Transient analysis of a cable with low-conducting layers by a finite-difference time-domain methodBaba, Y. / Tanabe, N. / Nagaoka, N. / Ametam, A. et al. | 2004
- 488
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SHORT PAPERS - Transient Analysis of a Cable With Low-Conducting Layers by a Finite-Difference Time-Domain MethodBaba, Y. et al. | 2004
- 493
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Modification of engineering return-stroke models to include dispersion effectsChunshan Yang, / Bihua Zhou, / Lihua Shi, / Cheng Gao, et al. | 2004
- 493
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SHORT PAPERS - Modification of Engineering Return-Stroke Models to Include Dispersion EffectsYang, C. et al. | 2004
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Table of contents| 2004
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IEEE Transactions on Electromagnetic Compatibility publication information| 2004
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IEEE Transactions on Electromagnetic Compatibility information for authors| 2004