A Fluxgate-Based Approach for Ion Beam Current Measurement in ECRIS Beamline: Design and Preliminary Investigations (English)
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- New search for: Baglio, Salvatore
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In:
IEEE Transactions on Instrumentation and Measurement
;
68
, 5
;
1477-1484
;
2019
- Article (Journal) / Electronic Resource
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Title:A Fluxgate-Based Approach for Ion Beam Current Measurement in ECRIS Beamline: Design and Preliminary Investigations
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Contributors:Ando, Bruno ( author ) / Baglio, Salvatore ( author ) / Crispino, Ruben ( author ) / Graziani, Salvatore ( author ) / Marletta, Vincenzo ( author ) / Mazzaglia, Alfio ( author ) / Sinatra, Valentina ( author ) / Mascali, David ( author ) / Torrisi, Giuseppe ( author )
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Published in:IEEE Transactions on Instrumentation and Measurement ; 68, 5 ; 1477-1484
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Publisher:
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Publication date:2019-05-01
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Size:3803465 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 68, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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A Fluxgate-Based Approach for Ion Beam Current Measurement in ECRIS Beamline: Design and Preliminary InvestigationsAndo, Bruno / Baglio, Salvatore / Crispino, Ruben / Graziani, Salvatore / Marletta, Vincenzo / Mazzaglia, Alfio / Sinatra, Valentina / Mascali, David / Torrisi, Giuseppe et al. | 2019
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