Development of a new technique for DNA single base pair mismatch analysis (English)
- New search for: Cibuzar, G.
- New search for: Fisher, M.
- New search for: Williamson, F.
- New search for: Blumenfeld, M.
- New search for: Suntharalingam, P.
- New search for: Grenz, J.R.
- New search for: Van ness, G.
- New search for: Kyoug Joon Kim,
- New search for: Bar-Cohen, A.
- New search for: Eccleston, E.
- New search for: Cibuzar, G.
- New search for: Fisher, M.
- New search for: Williamson, F.
- New search for: Blumenfeld, M.
- New search for: Suntharalingam, P.
- New search for: Grenz, J.R.
- New search for: Van ness, G.
- New search for: Kyoug Joon Kim,
- New search for: Bar-Cohen, A.
- New search for: Eccleston, E.
In:
Proceedings of the 15th Biennial University/Government/ Industry Microelectronics Symposium (Cat. No.03CH37488)
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184-194
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2003
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ISBN:
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ISSN:
- Conference paper / Electronic Resource
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Title:Development of a new technique for DNA single base pair mismatch analysis
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Contributors:Cibuzar, G. ( author ) / Fisher, M. ( author ) / Williamson, F. ( author ) / Blumenfeld, M. ( author ) / Suntharalingam, P. ( author ) / Grenz, J.R. ( author ) / Van ness, G. ( author ) / Kyoug Joon Kim, ( author ) / Bar-Cohen, A. ( author ) / Eccleston, E. ( author )
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Published in:
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Publisher:
- New search for: IEEE
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Publication date:2003-01-01
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Size:685596 byte
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ISBN:
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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1.1 Sustaining the Silicon Revolution: Challenges and OpportunitiesKing, T. J. / IEEE et al. | 2003
- 2
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Sustaining the Si revolution: challenges and opportunitiesTsu Jae King, et al. | 2003
- 23
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1.2 Mutual Dependence, Mutual Success: Collaboration Benefits AllAppleton, S. / IEEE et al. | 2003
- 23
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Mutual dependence, mutual success: collaboration benefits allAppleton, S.R. et al. | 2003
- 24
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1.3 It's the Little Things That MatterCraig, L. / IEEE et al. | 2003
- 24
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It's the little things that matterCraig, L. et al. | 2003
- 26
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The MESA institute-a university partnership program for microsystemsStinnett, R. et al. | 2003
- 26
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2.1 The MESA Institute - A University Partnership Program for MicrosystemsStinnett, R. / IEEE et al. | 2003
- 28
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WIMS comprehensive education programMcAfee, L.C. et al. | 2003
- 28
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2.2 WIMS Comprehensive Education ProgramMcAfee, L. C. / IEEE et al. | 2003
- 33
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2.3 Building Academic, Research, and Commercialization Programs in Micro and Nano Science and Engineering at the University of UtahHarvey, I. R. / Miller, M. S. / Blair, S. / Gale, B. K. / Ameel, T. / Ring, T. / IEEE et al. | 2003
- 33
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Building academic, research, and commercialization programs in micro and nano science and engineering at the University of UtahHarvey, I.R. / Miller, M.S. / Blair, S. / Ameel, T. / Gale, B.K. / Ring, T. et al. | 2003
- 36
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2.4 Laboratory Facilities of the Microsystems Technology Laboratories (MTL) at Massachusetts Institute of TechnologyDiadiuk, V. / IEEE et al. | 2003
- 36
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Laboratory facilities of the microsystems technology laboratories (MTL) at Massachusetts Institute of TechnologyDiadiuk, V. et al. | 2003
- 41
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2.5 Workforce Development: A Professional Training System Integrating High Technology Industry and AcademiaHoff, A. / Gilbert, R. / Persson, E. / Gurmen, N. / IEEE et al. | 2003
- 41
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Workforce development: a professional training system integrating high technology industry and academiaHoff, A.M. / Gilbert, R. / Persson, E. / Gurmen, N. et al. | 2003
- 46
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Coral-software to help operate and manage advanced university laboratoriesMurray, B. / Lin, I. / Lohman, T. / Bell, M. / Shott, J. et al. | 2003
- 46
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3A.1 Coral-Software to Help Operate and Manage Advanced University LaboratoriesMurray, B. / Bell, M. / Shott, J. / Lin, I. / Lohman, T. / IEEE et al. | 2003
- 50
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Surface preparation solutions for sub-90 nm IC technologyBaiya, E.G. / Rosato, J.J. / Yalamanchili, M.R. et al. | 2003
- 50
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3A.2 Surface Preparation Solutions for Sub-90nm IC TechnologyBaiya, E. G. / Rosato, J. J. / Yalamanchili, M. R. / IEEE et al. | 2003
- 54
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Characterization of the effect of TiN oxidation on via resistanceKrishna Gunturu, / Haskett, T. / Corsetti, T. / Engle, M. / Prasad, J. et al. | 2003
- 54
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3A.3 Characterization of the Effect of TiN Oxidation on Via ResistanceGunturu, K. / Haskett, T. / Corsetti, T. / Engle, M. / Prasad, J. / IEEE et al. | 2003
- 57
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3A.4 SU-8 as an Electron Beam Lithography ResistWilliamson, F. / Shields, E. A. / IEEE et al. | 2003
- 57
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SU-8 as an electron beam lithography resistWilliamson, F. / Shields, E.A. et al. | 2003
- 61
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Resist process characterization and optimization for ArF lithographyManu, C.K. et al. | 2003
- 61
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3A.5 Resist Process Characterization and Optimization for ArF LithographyManu, C. / IEEE et al. | 2003
- 66
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3B.1 Mixed Signal Design in the Microelectronics CurriculumBaker, R. J. / IEEE et al. | 2003
- 66
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Mixed-signal design in the microelectronics curriculumBaker, R.J. et al. | 2003
- 70
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3B.2 A Low Power, Low Datarate Integrated 433 MHz RF Transceiver in CMOSChristensen, C. / IEEE et al. | 2003
- 70
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A low power, low datarate integrated 433 MHz wireless transceiver in CMOSChristensen, C.L. et al. | 2003
- 74
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3B.3 System Approach for Low 1/f Noise, High IP2 Dynamic Range CMOS Mixer DesignPetrov, A. R. / IEEE et al. | 2003
- 74
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System approach for low 1/f noise, high IP2 dynamic range CMOS mixer designPetrov, A.R. et al. | 2003
- 78
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Quick start crystal oscillator circuitBlanchard, S.A. et al. | 2003
- 78
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3B.4 Quick Start Crystal Oscillator CircuitBlanchard, S. / IEEE et al. | 2003
- 82
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Clock and data recovery circuits with fast acquisition and low jitterRuiyuan Zhang, / La Rue, G.S. et al. | 2003
- 82
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3B.5 Clock and Data Recovery Circuits with Fast Acquisition and Low JitterZhang, R. / La Rue, G. / IEEE et al. | 2003
- 88
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A laboratory information management system (LIMS) for an academic microchip fabrication facilityHendricks, R.W. / Learn, M.R. et al. | 2003
- 88
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4A.1 A Laboratory Information Management System (LIMS) for an Academic Microchip Fabrication FacilityHendricks, R. W. / Learn, M. R. / IEEE et al. | 2003
- 94
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High resolution metal lift-off characterizationSutton, A.K. / Steen, S. et al. | 2003
- 94
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4A.2 High Resolution Metal Lift-Off CharacterizationSutton, A. K. / Steen, S. / IEEE et al. | 2003
- 99
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Manufacturing reliable unlanded vias without CVD barrier layersNelson, M.M. / Prasad, J. / Williams, B.N. / Ross, K.A. / Florence, D. et al. | 2003
- 99
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4A.3 Manufacturing Reliable Unlanded Vias Without CVD Barrier LayersNelson, M. / Prasad, J. / Williams, B. / Ross, K. / Florence, D. / IEEE et al. | 2003
- 103
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4A.4 A Novel Clustering and Declustering Algorithm for Fuzzy Classification of Wafer DefectsEl Doker, T. A. / Scott, D. R. / IEEE et al. | 2003
- 103
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A novel clustering and declustering algorithm for fuzzy classification of wafer defectsEl Doker, T.A. / Scott, D.R. et al. | 2003
- 107
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4A.5 Experimental Investigation of the Mechanism for CMP Micro-Scratch FormationAytes, S. / Mortensen, K. / Naughton, J. / Armstrong, J. / Russell, C. / Ross, K. / Giraud, J. / Hooper, D. / Alexander, H. / Corsetti, T. et al. | 2003
- 107
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Experimental investigation of the mechanism for CMP micro-scratch formationAytes, S.D. / Armstrong, J.S. / Mortensen, K.A. / Russell, C.W. / Ross, K.A. / Giraud, J.E. / Hooper, D.H. / Alexander, H.M. / Corsetti, T.A. / Nelson, M.M. et al. | 2003
- 112
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4B.1 Micropower, Low-Noise, SOI CMOS Preamplifiers for Deep Space MissionsBinkley, D. M. / Ihme, D. H. / Blalock, B. J. / Mojarradi, M. M. / IEEE et al. | 2003
- 112
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Micropower, low-noise, SOI CMOS preamplifiers for deep space missionsBinkley, D.M. / Ihme, D.H. / Hopper, C.E. / Blalock, B.J. / Mojarradi, M.M. et al. | 2003
- 116
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4B.2 A 435MHz High-Gain Low-Power LNA in 0.35um SOI CMOSHuang, D. / Zencir, E. / Dogan, N. / Arvas, E. / IEEE et al. | 2003
- 116
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A 435 MHz high-gain low-power LNA in 0.35 /spl mu/m SOI CMOSHuang, D. / Zencir, E. / Dogan, N.S. / Arvas, E. et al. | 2003
- 120
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High voltage bandgap reference design using SOI technologySukumar, V. / Subramanium, S. / Pan, D. / Buck, K. / Hess, H. / Li, H.W. / Cox, D. / Mojarradi, M.M. et al. | 2003
- 120
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4B.3 High Voltage Bandgap Reference Design Using Microwave SOI TechnologySukumar, V. / Pan, D. / Cox, D. / Hess, H. L. / Li, H. W. / Buck, K. / Subramanium, S. / Mojarradi, M. M. / IEEE et al. | 2003
- 124
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4B.4 Development of Robust Analog Electronics at the University of Tennessee for NASA/JPL Extreme Environment ApplicationsTerry, S. C. / Blalock, B. J. / Jackson, J. R. / Chen, S. / Mojarradi, M. M. / Kolawa, E. A. / IEEE et al. | 2003
- 124
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Development of robust analog electronics at the University of Tennessee for NASA/JPL extreme environment applicationsTerry, S.C. / Blalock, B.J. / Jackson, J.R. / Suheng Chen, / Mojarradi, M.M. / Kolawa, E.A. et al. | 2003
- 128
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A low voltage to high voltage level shifter circuit for MEMS applicationPan, D. / Li, H.W. / Wilamowski, B.M. et al. | 2003
- 134
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Training at a University Research Center: the interface between users and facilitiesZhiping Zhou, et al. | 2003
- 134
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5.1 Training at a University Research Center: The interface between users and facilitiesZhou, Z. / IEEE et al. | 2003
- 138
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Semiconductor Process and Device Modeling: a graduate course/undergraduate elective in microelectronic engineering at RITHirschman, K.D. / Hebding, J. / Saxer, R. / Tabakman, K. et al. | 2003
- 138
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5.2 Semiconductor Process and Device Modeling: A Graduate Course/Undergraduate Elective in Microelectonic Engineering at RITHirschman, K. D. / Hebding, J. / Saxer, R. / Tabakman, K. / IEEE et al. | 2003
- 147
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Use of the Myers-Briggs type indicator in an undergraduate microelectronics coursePearson, R.E. / Bell, A.J. / Croley, J.R. et al. | 2003
- 147
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5.3 Use of the Myers-Briggs Type Indicator in an Undergraduate Microelectronics CoursePearson, R. E. / Bell, A. J. / Croley, J. R. / IEEE et al. | 2003
- 151
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5.4 A Lecture and Hands-On Laboratory Course: Introduction to Micromachining and MEMSJudy, J. W. / Motta, P. S. / IEEE et al. | 2003
- 151
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A lecture and hands-on laboratory course: introduction to micromachining and MEMSJudy, J.W. / Motta, P.S. et al. | 2003
- 157
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5.5 Hands-On MEMSFrechette, L. / Modi, V. / Miller, F. / Farmer, K. R. / IEEE et al. | 2003
- 157
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Hands-on MEMSFrechette, L. / Modi, V. / Miller, F. / Farmer, K.R. et al. | 2003
- 162
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6.1 Past and Current Status of Microelectronics Education for UndergraduatesFuller, L. / IEEE et al. | 2003
- 162
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Past and current status of microelectronics education for undergraduatesFuller, L. et al. | 2003
- 166
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6.2 Challenges and Opportunities for Universities to Support Future Technology Developments in the Semiconductor Industry: Staying on Moore's LawPrasad, J. / IEEE et al. | 2003
- 166
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Challenges and opportunities for the universities to support future technology developments in the semiconductor industry: staying on the Moore's LawPrasad, J. et al. | 2003
- 170
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Testing of metal gate PMOS digital integrated circuitsFuller, L.F. / Hoomkwap, K. / Shakya, S. / Yenrudee, S. et al. | 2003
- 170
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6.3 Testing of Metal Gate PMOS Digital Integrated CircuitsFuller, L. / Hoomkwap, K. / Shakya, S. / Yenrudee, S. / IEEE et al. | 2003
- 174
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Optimization of contact interface resistance for CMOS circuitsZhiping Zhou, / Brown, D.K. / Woods, E.V. / Sutton, A.K. / Patel, B.C. / George, L.O. et al. | 2003
- 174
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6.4 Optimization of Contact Interface Resistance for CMOS CircuitsSutton, A. K. / Patel, B. C. / Brown, D. K. / George, L. O. / Zhou, Z. / Woods, E. V. / IEEE et al. | 2003
- 179
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6.5 The High School Technology Initiative: A novel approach to encourage students to follow science and technology career pathsHoff, A. M. / Gilbert, R. / Roe, E. / Barger, M. / Lesiecki, M. / IEEE et al. | 2003
- 179
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The high school technology initiative: a novel approach to encourage students to follow science and technology career pathsHoff, A. / Barger, M. / Gilbert, R. / Roe, E. / Lesiecki, M. et al. | 2003
- 184
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7A.1 Development of a New Technique for DNA Single Base Pair Mismatch AnalysisCibuzar, G. / Fisher, M. / Williamson, F. / Blumenfeld, M. / Suntharalingam, P. / Grenz, J. R. / Van Ness, B. G. / Kim, K. J. / Bar-Cohen, A. / Eccleston, E. et al. | 2003
- 184
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Development of a new technique for DNA single base pair mismatch analysisCibuzar, G. / Fisher, M. / Williamson, F. / Blumenfeld, M. / Suntharalingam, P. / Grenz, J.R. / Van ness, G. / Kyoug Joon Kim, / Bar-Cohen, A. / Eccleston, E. et al. | 2003
- 195
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7A.2 Bridging the Gap between Classical and Quantum Transport in Nanoscale MOSFETs: Schrodinger Equation Monte Carlo-2DRegister, L. F. / Chen, W. / Banerjee, S. K. / IEEE et al. | 2003
- 195
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Bridging the gap between classical and quantum transport in nanoscale MOSFETs: Schrodinger equation Monte Carlo-2DRegister, L.F. / Chen, W. / Banerjee, S.K. et al. | 2003
- 200
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An interdigitated electrode detector for the identification of a single specific DNA molecule fragmentFuller, L.F. / Vega, R. / Manley, R. / Vee Chee Hwang, / Jaeger, D. / Pham, A. / Wescott, N. / Connolly, M. et al. | 2003
- 200
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7A.3 An Interdigitated Electrode Detector for the Identification of a Single Specific DNA Molecule FragmentFuller, L. / Vega, R. / Manley, R. / Hwang, V. C. / Jansen, D. / Pham, A. / Wescott, N. / Connelly, M. / IEEE et al. | 2003
- 203
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7A.4 Modeling the Effects of Quantum Exchange in Nanoscale Spaced Double-Quantum-Well SystemsRodriguez, J. R. / Diaz-Velez, J. C. / Hanna, C. B. / IEEE et al. | 2003
- 203
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Modeling the effects of quantum exchange in nanoscale-spaced double-quantum-well systemsRodriguez, J.R. / Diaz-Velez, J.C. / Hanna, C.B. et al. | 2003
- 207
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7A.5 Enhanced Fluorescence Biosensing Using an Array of Metallic NanoaperturesLiu, Y. / Blair, S. / IEEE et al. | 2003
- 207
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Enhanced fluorescence biosensing using an array of metallic nanoaperturesYongdong Liu, / Blair, S. et al. | 2003
- 214
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An overview of Double-Gate MOSFETsNeudeck, G.W. et al. | 2003
- 214
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7B.1 An Overview of Double-Gate MOSFETsNeudeck, G. / IEEE et al. | 2003
- 218
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7B.2 A Simulated Annealing Approach for Automatic Extraction of Device and Material Parameters of MOS with SiO2/High-K Gate StacksLi, F. / Register, L. F. / Banerjee, S. K. / Mudanai, S. P. / Fan, Y.-Y. / Zhao, W. / IEEE et al. | 2003
- 218
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A simulated annealing approach for automatic extraction of device and material parameters of MOS with SiO/sub 2//high-K gate stacksFei Li, / Mudanai, S.P. / Yang-Yu Fan, / Wei Zhao, / Register, L.F. / Banerjee, S.K. et al. | 2003
- 222
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Quest for the ultimate sub-50 nm CMOS transistor structureRambhatla, A. / Hackler, D.R. / Parke, S.A. et al. | 2003
- 222
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7B.3 Quest for the Ultimate Sub-50nm CMOS Transistor StructureParke, A. R. S. A. / Hackler, D. R. / IEEE et al. | 2003
- 226
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7B.4 Gate Controlled Punch Through TransistorLi, X. / Pan, H. / Wilamowski, B. M. / IEEE et al. | 2003
- 226
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Gate-controlled punch through transistorXiangli Li, / Huadian Pan, / Wilamowski, B.M. et al. | 2003
- 230
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Enhanced hot-carrier induced degradation in pMOSFETs stressed under high gate voltageChen, J.F. / Chih-Pin Tsao, / Ong, T.-C. et al. | 2003
- 230
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7B.5 Enhanced Hot-Carrier Induced Degradation in pMOSFETs Stressed Under High Gate VoltageChen, J. F. / Tsao, C.-P. / Ong, T.-C. / IEEE et al. | 2003
- 236
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Neural network modeling of the resistance of metallized vias formed by laser ablation in polymer dielectricsSetia, R. / May, G.S. et al. | 2003
- 236
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8A.1 Neural Network Modeling of the Resistance of Metallized Vias formed by Laser Ablation in Polymer DielectricsSetia, R. / May, G. S. / IEEE et al. | 2003
- 241
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Flip-chip-in-a-package solder joint reliability simulationGroothuis, S.K. / Jiang, T. / Yong Du, et al. | 2003
- 241
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8A.2 Flip-Chip-In-a-Package Solder Joint Reliability SimulationJiang, S. G. T. / Du, Y. / IEEE et al. | 2003
- 245
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8A.3 Determination and Optimization of Film Adhesive Cure in Board-On-Chip Packaged SemiconductorsRumps, J. / Bradbury, C. / Fosbinder, B. / IEEE et al. | 2003
- 245
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Determination and optimization of film adhesive cure in board-on-chip packaged semiconductorsRumps, J. / Bradbury, C. / Fosbinder, B. et al. | 2003
- 246
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Application for WLP at positive working photosensitive polybenzoxazoleHirano, T. / Yamamoto, K. / Imamura, K. et al. | 2003
- 246
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8A.4 Application for WLP at Positive Working Photosensitive PolybenzoxazoleYamamoto, T. H. K. / Imamura, K. / IEEE et al. | 2003
- 250
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Printable die attach adhesives for substrate-on-chip packagingBecker, K. / Timmy Lin, et al. | 2003
- 250
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8A.5 Printable Die Attach Adhesives for High Speed DRAM PackagingBecker, K. / Lin, T. / IEEE et al. | 2003
- 258
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8B.1 New highly reliable IC bonding film and its developmentYokomizo, K. O. O. / Tabuchi, Y. / Ganatra, C. P. / IEEE et al. | 2003
- 258
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New high reliability IC bonding film and its developmentGanatra, C.P. / Ohashi, K. / Tabuchi, Y. / Yokomizo, O. / Nakamura, S. et al. | 2003
- 263
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Gate dielectric degradation effects on nMOS devices using a noise model approachLawrence, C.E. / Cheek, B.J. / Lawrence, T.E. / Kumar, S. / Haggag, A. / Baker, R.J. / Knowlton, W.B. et al. | 2003
- 263
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8B.2 Gate Dielectric Degradation Effects on nMOS Devices Using a Noise Model ApproachLawrence, C. E. / Cheek, B. J. / Lawrence, T. E. / Baker, J. / Moll, A. J. / Knowlton, W. B. / Kumar, S. / Haggag, A. / IEEE et al. | 2003
- 267
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Integration of BaTiO/sub 3/ferroelectric thin films with GaAs for functional devicesMurphy, T.E. / Ding-Yuan Chen, / Phillips, J.D. et al. | 2003
- 267
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8B.3 Integration of BaTiO3 Ferroelectric Thin Films with GaAs for Functional DevicesMurphy, T. / Chen, D. / Phillips, J. / IEEE et al. | 2003
- 271
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Modeling and design of polythiophene gate electrode ChemFETs for environmental pollutant sensingVamsi Krishna, T. / Jessing, J.R. / Russell, D.D. / Scaggs, J. / Warner, L.R. / Hartman, J.A. et al. | 2003
- 271
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8B.4 Modeling and Design of Polythiophene Gate Electrode ChemFETs for Environmental Pollutant SensingKrishna, T. V. / Russell, D. / Hartman, J. / Jessing, J. / IEEE et al. | 2003
- 275
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8B.5 Challenges in Integration of Resonant Interband Tunnel Devices with CMOSSudirgo, S. / Curanovic, B. / Rommel, S. L. / Hirschman, K. D. / Kurinec, S. K. / Jin, N. / Rice, A. / Berger, P. R. / Thompson, P. E. / IEEE et al. | 2003
- 275
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Challenges in integration of Resonant Interband Tunnel Devices with CMOSSudirgo, S. / Curanovic, B. / Rommel, S.L. / Hirschman, K.D. / Kurinec, S.K. / Niu Jin, / Rice, A.T. / Berger, P.R. / Thompson, P.E. et al. | 2003
- 280
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A planner 6.3 nm thin-body SOI MOSFET using tunnel epitaxy and nitrided gate oxidesAhmed, S.S. / Neudeck, G.W. / Denton, J.P. / Stidham, M.E. et al. | 2003
- 280
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9.1 A Planar 6.3nm Thin-body SOI MOSFET Using Tunnel Epitaxy and Nitrided Gate OxidesAhmed, S. S. / Neudeck, G. W. / Denton, J. P. / Stidham, M. / IEEE et al. | 2003
- 284
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Threshold voltage control for deep sub-micrometer fully depleted SOI MOSFETXiangli Li, / Parke, S.A. / Wilamowski, B.M. et al. | 2003
- 284
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9.2 Threshold Voltage Control for Deep Sub-micron Fully Depleted SOI MOSFETLi, X. / Wilamowski, B. M. / Parke, S. A. / IEEE et al. | 2003
- 288
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9.3 Three-Dimensional Simulation of Body Contact Structures in PD SOI MOSFETsDaghighi, A. / Osman, M. A. / IEEE et al. | 2003
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Three-dimensional simulation of body contact structures in PD SOI MOSFETsDaghighi, A. / Osman, M.A. et al. | 2003
- 292
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9.4 Optimizing Dynamic-Threshold DTMOS Device Performance in an SOI Embedded DRAMBurke, F. / Kim, C. S. / Rambhatla, A. / Zhao, Y. / Parke, S. A. / Zahurak, J. / IEEE et al. | 2003
- 292
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Optimizing dynamic-threshold DTMOS device performance in an SOI embedded DRAM technologyBurke, F. / Kim, C.S. / Rambhatla, A. / Zhao, Y. / Zahurak, J. / Parke, S. et al. | 2003
- 295
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9.5 A Method to Overcome Self-Heating Effects in SOI MOSFETsCole, B. / Parke, S. A. / IEEE et al. | 2003
- 295
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A method to overcome self-heating effects in SOI MOSFETsCole, B. / Parke, S. et al. | 2003
- 300
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Integrated microtransducers and microelectronics for environmental monitoringMartin, S.M. / Strong, T.D. / Gebara, F.H. / Kraver, K.L. / Keeler, G.J. / Brown, R.B. et al. | 2003
- 300
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10.1 Integrated Microsensors and Microelectronics for Environmental MonitoringMartin, S. M. / Strong, T. D. / Gebara, F. H. / Keeler, G. H. / Brown, R. B. / Kraver, K. L. / IEEE et al. | 2003
- 304
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10.2 Fabrication of a Silicon Micro-scalpel with a Nanometer Cutting EdgeNeudeck, G. W. / Denton, J. P. / Stidham, M. / IEEE et al. | 2003
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Fabrication of a silicon micro-scalpel with a nanometer cutting edgeNeudeck, G.W. / Denton, J.P. / Stidham, M.E. et al. | 2003
- 308
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10.3 Piezoelectric Polyimide Tactile SensorAtkinson, G. M. / Pearson, R. E. / Ounaies, Z. / Midkiff, J. A. / Harrison, J. S. / Park, C. / IEEE et al. | 2003
- 308
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Piezoelectric polyimide tactile sensorsAtkinson, G.M. / Pearson, R.E. / Ounaies, Z. / Park, C. / Harrison, J.S. / Midkiff, J.A. et al. | 2003
- 312
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Theoretical and experimental study of fluid behavior of a peristaltic micropumpSangkwon Na, / Ridgeway, S. / Li Cao, et al. | 2003
- 312
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10.4 Theory and Experiment Study of Fluid Behavior of a Peristaltic MicropumpNa, S. / Ridgeway, S. / Cao, L. / IEEE et al. | 2003
- 317
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10.5 Bulk Micromachined Pressure SensorFuller, L. / Sudirgo, S. / IEEE et al. | 2003
- 317
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Bulk micromachined pressure sensorFuller, L.F. / Sudirgo, S. et al. | 2003
- 321
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10.6 Thermal Sensor Microfabrication and Related Undergraduate Research ProjectsLawrence, D. J. / Hearn, S. L. / Taylor, G. R. / IEEE et al. | 2003
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Thermal sensor microfabrication and related undergraduate research projectsLawrence, D.J. / Hearn, S.L. / Taylor, G.R. et al. | 2003
- 326
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Fabrication of a PMOS Transistor at NGEE ANN POLYTECHNIC's IC fabrication facilityPhilip, M. et al. | 2003
- 328
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Fabrication of an MOS Capacitor structure at NGEE ANN POLYTECHNIC's IC fabrication facilityPhilip, M. et al. | 2003
- 330
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A device to demonstrate the Haynes-Shockley ExperimentPhilip, M. et al. | 2003
- 332
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Teaching vacuum technology using spreadsheet calculationsPearson, R.E. / Atkinson, G.M. et al. | 2003
- 336
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Source/drain optimization of the dynamic-threshold DTMOS device in a 0.15 /spl mu/m SOI embedded DRAM technologyBurke, F. / Rambhatla, A. / Zahurak, J. / Parke, S. et al. | 2003
- 338
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Optimization of Bosch etch process for through wafer interconnectsKenoyer, L. / Oxford, R. / Moll, A. et al. | 2003
- 340
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A low-voltage low-power 1.5 GHz CMOS LNA designZhangfa Liu, / Parke, S. et al. | 2003
- 342
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Low-latency multiple clock domain interfacing without alteration of local clocksSmith, S.F. / Frenzel, J.F. et al. | 2003
- 344
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The design of low noise amplifier based on BSIM3v3 modelChang-Sun Kim, / Parke, S. et al. | 2003
- 346
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A benzene selective electrodeWarner, L.R. / Russell, D.D. / Scaggs, J. et al. | 2003
- 352
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Temperature fluctuations and 1/f noise in electron devicesForbes, L. / Wang, X.Y. / Zhang, C.W. et al. | 2003
- 356
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Simulation of timing jitter in ring oscillatorsZhang, C.W. / Forbes, L. et al. | 2003
- 360
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An overview of algorithms in GnucapDavis, A.T. et al. | 2003
- 362
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Flexible PV technology development program at IIT BombayDuttagupta, S.P. et al. | 2003
- 364
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Automated testing and parameter extraction of solar cells fabricated from 6-8 inch large test wafersGuvench, M.G. / Gurcan, C. / Denis, A.M. / MacDonald, D. et al. | 2003
- 366
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Rectangular polysilicon diaphragms: fabrication and characterizationWoods, E.V. / Zhiping Zhou, et al. | 2003
- 368
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High performance direct digital frequency synthesizersZhihe Zhou, / Betowski, D. / Xuan Li, / La Rue, G. / Beiu, V. et al. | 2003
- 370
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Overview of fully depleted silicon-on-insulator (SOI) technologyTran, P.T. et al. | 2003
- 372
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Interfacial fracture mechanics: chip-level interconnect reliabilityGroothuis, S.K. / Guotao Wang, / Ho, P.S. et al. | 2003
- 374
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Optimized pattern fill process for improved CMP uniformity and interconnect capacitanceNelson, M.M. et al. | 2003
- 376
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An electronic wafer traveler system for an academic microchip fabrication facilitySheikh, A. / Sheetz, S.D. / Hendricks, R.W. et al. | 2003
- 381
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In-situ depth monitoring of the deep reactive ion etch processImura, Y. / Li, B.X. / Farmer, K.R. et al. | 2003
- 384
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Reactive ion etching in an academic integrated circuit fabrication laboratoryJellish, S. / Hendricks, R.W. et al. | 2003
- 389
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Top-edge profile control for SU-8 structural photoresistLee, S.J. / Shi, W. / Maciel, P. / Cha, S.W. et al. | 2003
- 391
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A fabrication laboratory course based on GaAs MESFETsRoenker, K.P. / Flenniken, R. / Kosel, P.B. et al. | 2003
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Proceedings of the 15th Biennial University/Government/ Industry Microelectronics Symposium (Cat. No.03CH37488)| 2003