Effect of Offset Mismatch in Time-Interleaved ADC Circuits on OFDM-BER Performance (English)
- New search for: Huynh, Vo-Trung-Dung
- Further information on Huynh, Vo-Trung-Dung:
- https://orcid.org/0000-0002-9678-8335
- New search for: Noels, Nele
- New search for: Steendam, Heidi
- New search for: Huynh, Vo-Trung-Dung
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- New search for: Noels, Nele
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In:
IEEE Transactions on Circuits and Systems I: Regular Papers
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64
, 8
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2195-2206
;
2017
- Article (Journal) / Electronic Resource
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Title:Effect of Offset Mismatch in Time-Interleaved ADC Circuits on OFDM-BER Performance
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Contributors:
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Published in:IEEE Transactions on Circuits and Systems I: Regular Papers ; 64, 8 ; 2195-2206
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Publisher:
- New search for: IEEE
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Publication date:2017-08-01
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Size:2404922 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 64, Issue 8
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Effect of Offset Mismatch in Time-Interleaved ADC Circuits on OFDM-BER PerformanceHuynh, Vo-Trung-Dung / Noels, Nele / Steendam, Heidi et al. | 2017
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- C1
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Table of contents| 2017
- C2
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IEEE Transactions on Circuits and Systems—I:Regular Papers publication information| 2017
- C3
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IEEE Circuits and Systems Society Information| 2017