The last byte - Test strategies and marriage partners (English)
- New search for: Ambler, T.
- New search for: Ambler, T.
In:
IEEE Design & Test of Computers
;
18
, 5
;
128
;
2001
- Article (Journal) / Electronic Resource
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Title:The last byte - Test strategies and marriage partners
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Contributors:Ambler, T. ( author )
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Published in:IEEE Design & Test of Computers ; 18, 5 ; 128
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Publisher:
- New search for: IEEE
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Publication date:2001-09-01
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Size:42439 byte
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 18, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Departments - EIC Message| 2001
- 5
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Departments - News| 2001
- 7
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Features - Guest Editors' Introduction: Application-Specific System-on-a-Chip MultiprocessorsWolf, Wayne et al. | 2001
- 7
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Guest editors' introduction: application-specific system-ona-chip multiprocessorsWolf, W. / Jerraya, A.A. et al. | 2001
- 8
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Colif: A design representation for application-specific multiprocessor SOCsCesario, W.O. / Nicolescu, G. / Gauthier, L. / Lyonnard, D. / Jerraya, A.A. et al. | 2001
- 8
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Features - Colif: A Design Representation for Application-Specific Multiprocessor SOCsCesário, Wander O. et al. | 2001
- 21
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Viper: A multiprocessor SOC for advanced set-top box and digital TV systemsDutta, S. / Jensen, R. / Rieckmann, A. et al. | 2001
- 21
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Features - Viper: A Multiprocessor SOC for Advanced Set-Top Box and Digital TV SystemsDutta, Santanu et al. | 2001
- 32
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Automating the design of SOCs using coresBergamaschi, R.A. / Bhattacharya, S. / Wagner, R. / Fellenz, C. / Muhlada, M. / White, F. / Daveau, J.-M. / Lee, W.R. et al. | 2001
- 32
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Features - Automating the Design of SOCs Using CoresBergamaschi, Reinaldo A. et al. | 2001
- 46
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Features - Energy-Aware Runtime Scheduling for Embedded-Multiprocessor SOCsYang, Peng et al. | 2001
- 46
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Energy-aware runtime scheduling for embedded-multiprocessor SOCsPeng Yang, / Chung Wong, / Marchal, P. / Catthoor, F. / Desmet, D. / Verkest, D. / Lauwereins, R. et al. | 2001
- 59
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Special ITC Section - Guest Editors' Introduction: Test Trade-Offs Take Center Stage at ITCAmbler, Tony et al. | 2001
- 59
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Guest editors' introduction: test trade-offs take center stage at ITCAmbler, T. / Wheater, D. et al. | 2001
- 60
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Very low cost testers: Opportunities and challengesBedsole, J. / Raina, R. / Crouch, A. / Abadir, M.S. et al. | 2001
- 60
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Special ITC Section - Very Low Cost Testers: Opportunities and ChallengesBedsole, Jay et al. | 2001
- 70
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Economics of built-in self-testUngar, L.Y. / Ambler, T. et al. | 2001
- 70
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Special ITC Section - Economics of Built-in Self-TestUngar, Louis Y. et al. | 2001
- 80
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Test resource partitioning for SOCsChandra, A. / Chakrabarty, K. et al. | 2001
- 80
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Special ITC Section - Test Resource Partitioning for SOCsChandra, Anshuman et al. | 2001
- 92
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Special ITC Section - Online and Offline BIST in IP-Core DesignBenso, Alfredo et al. | 2001
- 92
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Online and offline BIST in IP-core designBenso, A. / Chinsano, S. / Di Natale, G. / Prinetto, P. / Bodoni, M.L. et al. | 2001
- 100
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Special Feature - Making Java Work for Microcontroller ApplicationsIto, Sérgio Akira et al. | 2001
- 100
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Making Java work for microcontroller applicationsIto, S.A. / Carro, L. / Jacobi, R.P. et al. | 2001
- 112
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Design closure with cell-based synthesisCarpenter, C. / McLellan, P. / Murgai, R. / Nikolic, B.B. / Sohail, F. / Sapatnekar, S. / Roy, K. et al. | 2001
- 112
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Departments - Roundtable| 2001
- 120
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Technology continuous educationSegura, J. et al. | 2001
- 120
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Departments - Conference Reports| 2001
- 121
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Departments - Panel Summaries| 2001
- 122
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Departments - Standards| 2001
- 122
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VHDL standardsAshenden, P.J. et al. | 2001
- 124
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Departments - New Products| 2001
- 125
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Departments - DATC Newsletter| 2001
- 126
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Departments - TTTC Newsletter| 2001
- 128
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Departments - The Last Byte| 2001
- 128
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The last byte - Test strategies and marriage partnersAmbler, T. et al. | 2001