Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors (English)
- New search for: Wu, Xiaomei
- New search for: Ke, Xiaoxing
- New search for: Sui, Manling
- New search for: Wu, Xiaomei
- New search for: Ke, Xiaoxing
- New search for: Sui, Manling
In:
Journal of Semiconductors
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43
, 4
;
2022
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors
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Contributors:
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Published in:Journal of Semiconductors ; 43, 4
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Publisher:
- New search for: Chinese Institute of Electronics
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Publication date:2022-04-01
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Size:15 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 43, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Frontier applications of perovskites beyond photovoltaicsMei, Luyao / Mu, Haoran / Zhu, Lu / Lin, Shenghuang / Zhang, Lixiu / Ding, Liming et al. | 2022
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In-situ monitoring of dynamic behavior of catalyst materials and reaction intermediates in semiconductor catalytic processesFang, Zhen / Liu, Yao / Song, Chengyi / Tao, Peng / Shang, Wen / Deng, Tao / Zeng, Xiaoqin / Wu, Jianbo et al. | 2022
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In-situ/operando characterization techniques for organic semiconductors and devicesJiang, Sai / Dai, Qinyong / Guo, Jianhang / Li, Yun et al. | 2022
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Stabilizing α-phase FAPbI3 solar cellsWang, Yaxin / Zhang, Xin / Shi, Zejiao / Zhang, Lixiu / Yu, Anran / Zhan, Yiqiang / Ding, Liming et al. | 2022
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DASP: Defect and Dopant ab-initio Simulation PackageHuang, Menglin / Zheng, Zhengneng / Dai, Zhenxing / Guo, Xinjing / Wang, Shanshan / Jiang, Lilai / Wei, Jinchen / Chen, Shiyou et al. | 2022
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Janus VXY monolayers with tunable large Berry curvatureLiu, Wenrong / Li, Xinyang / Zhang, Changwen / Yan, Shishen et al. | 2022
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Study of structure-property relationship of semiconductor nanomaterials by off-axis electron holographyLi, Luying / Cheng, Yongfa / Liu, Zunyu / Yan, Shuwen / Li, Li / Wang, Jianbo / Zhang, Lei / Gao, Yihua et al. | 2022
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Comprehensive,in operando, and correlative investigation of defects and their impact on device performanceZhang, Yong / Smith, David J. et al. | 2022
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Preface to the Special Topic on In-Situ and in-operando Characterization of Semiconductor Materials and DevicesKe, Xiaoxing / Zhang, Yong et al. | 2022
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Inorganic electron-transport materials in perovskite solar cellsXie, Lin / Zhang, Lixiu / Hua, Yong / Ding, Liming et al. | 2022
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Structural evolution of low-dimensional metal oxide semiconductors under external stressZhao, Peili / Li, Lei / Chen, Guoxujia / Guan, Xiaoxi / Zhang, Ying / Meng, Weiwei / Zhao, Ligong / Li, Kaixuan / Jiang, Renhui / Jia, Shuangfeng et al. | 2022
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Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductorsWu, Xiaomei / Ke, Xiaoxing / Sui, Manling et al. | 2022