Reliability performance of 25 Gbit s−1 850 nm vertical-cavity surface-emitting lasers (English)
National licence
- New search for: Karachinsky, L Ya
- New search for: Blokhin, S A
- New search for: Novikov, I I
- New search for: Maleev, N A
- New search for: Kuzmenkov, A G
- New search for: Bobrov, M A
- New search for: Lott, J A
- New search for: Ledentsov, N N
- New search for: Shchukin, V A
- New search for: Kropp, J-R
- New search for: Bimberg, D
- New search for: Karachinsky, L Ya
- New search for: Blokhin, S A
- New search for: Novikov, I I
- New search for: Maleev, N A
- New search for: Kuzmenkov, A G
- New search for: Bobrov, M A
- New search for: Lott, J A
- New search for: Ledentsov, N N
- New search for: Shchukin, V A
- New search for: Kropp, J-R
- New search for: Bimberg, D
In:
Semiconductor Science and Technology
;
28
, 6
;
2013
- Article (Journal) / Electronic Resource
-
Title:Reliability performance of 25 Gbit s−1 850 nm vertical-cavity surface-emitting lasers
-
Contributors:Karachinsky, L Ya ( author ) / Blokhin, S A ( author ) / Novikov, I I ( author ) / Maleev, N A ( author ) / Kuzmenkov, A G ( author ) / Bobrov, M A ( author ) / Lott, J A ( author ) / Ledentsov, N N ( author ) / Shchukin, V A ( author ) / Kropp, J-R ( author )
-
Published in:
-
Publisher:
- New search for: IOP Publishing
-
Publication date:2013-06-01
-
Size:8 pages
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Keywords:
-
Source:
Table of contents – Volume 28, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
-
Catalyst and processing effects on metal-assisted chemical etching for the production of highly porous GaNGeng, Xuewen / Duan, Barrett K / Grismer, Dane A / Zhao, Liancheng / Bohn, Paul W et al. | 2013
-
Wafer-scale processing technology for monolithically integrated GaSb thermophotovoltaic device array on semi-insulating GaAs substrateKim, Jung Min / Dutta, Partha S / Brown, Eric / Borrego, Jose M / Greiff, Paul et al. | 2013
-
Study of band-structure, optical properties and native defects in AIBIIIO2 (AI = Cu or Ag, BIII = Al, Ga or In) delafossitesKumar, Mukesh / Zhao, Hanyue / Persson, Clas et al. | 2013
-
Optical and electrical properties of sputter-deposited ZnMgAlO UV-range transparent conducting filmsPark, Jang-Ho / Lim, Jin-Bum / Lee, Byung-Teak et al. | 2013
-
Simultaneous two-color lasing in a single CdSSe heterostructure nanosheetFan, F / Liu, Z / Yin, L / Nichols, P L / Ning, H / Turkdogan, S / Ning, C Z et al. | 2013
-
[h h l]Orientation dependence of optoelectronic properties in InAsN/GaSb quantum well laser diodes with W and M designAhmed, A Ben / Ridene, S / Debbichi, M / Saïd, M / Bouchriha, H et al. | 2013
-
Transport of bismuth atoms during liquid phase epitaxial growth of InSbBi and GaSbBiSamajdar, D P / Dhar, S et al. | 2013
-
Effects of reduction temperature on the optoelectronic properties of diodes based on n-type Si and reduced graphene oxide doped with a conductive polymerZeng, Jian-Jhou / Ruan, Cheng-He / Lin, Jian-Huang / Lin, Yow-Jon et al. | 2013
-
Sidewall mobility and series resistance in a multichannel tri-gate MOSFETPark, S J / Jeon, D-Y / Montès, L / Barraud, S / Kim, G-T / Ghibaudo, G et al. | 2013
-
Reliability performance of 25 Gbit s−1 850 nm vertical-cavity surface-emitting lasersKarachinsky, L Ya / Blokhin, S A / Novikov, I I / Maleev, N A / Kuzmenkov, A G / Bobrov, M A / Lott, J A / Ledentsov, N N / Shchukin, V A / Kropp, J-R et al. | 2013
-
Composition and luminescence studies of InGaN epilayers grown at different hydrogen flow ratesTaylor, E / Fang, F / Oehler, F / Edwards, P R / Kappers, M J / Lorenz, K / Alves, E / McAleese, C / Humphreys, C J / Martin, R W et al. | 2013
-
Optical fingerprints of Y2 ordering in III–V ternary semiconductor alloysChen, Dongguo / Ravindra, N M et al. | 2013
-
Monolithic integrated SAW filter based on AlN for high-frequency applicationsKaletta, Udo Ch / Santos, Paulo V / Wolansky, Dirk / Scheit, Alexander / Fraschke, Mirko / Wipf, Christian / Zaumseil, Peter / Wenger, Christian et al. | 2013