The Lorentz factor for the Laue technique (English)
National licence
- New search for: Lange, J.
- New search for: Lange, J.
In:
Acta Crystallographica Section A: Foundations of Crystallography (Formerly: Crystal Physics, Diffraction, Theoretical and General Crystallography)
;
51
, Pt 4
;
559-565
;
1995
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ISSN:
- Article (Journal) / Electronic Resource
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Title:The Lorentz factor for the Laue technique
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Contributors:Lange, J. ( author )
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Published in:
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Publisher:
- New search for: International Union of Crystallography
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Publication date:1995-07-01
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Size:7 pages
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 51, Issue Pt 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 445
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On the fast translation functions for molecular replacementNavaza, J. / Vernoslova, E. et al. | 1995
- 450
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A non-uniform reference model for maximum-entropy density reconstructions from diffraction dataZheludev, A. / Papoular, R. J. / Ressouche, E. / Schweizer, J. et al. | 1995
- 456
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The symmetry of interatomic lattice potentials in general crystal structures. 1. Basic theoryBugaev, V. N. / Chepul'skii, R. V. et al. | 1995
- 463
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The symmetry of interatomic lattice potentials in general crystal structures. 2. The cases of f.c.c., b.c.c. and h.c.p. disordered structuresBugaev, V. N. / Chepul'skii, R. V. et al. | 1995
- 473
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Structural classes and space groups of organic homomolecular crystals: new statistical dataBelsky, V. K. / Zorkaya, O. N. / Zorky, P. M. et al. | 1995
- 481
-
Microdiffraction and CBED crystal structure determination of the Si-rich phase in laser-clad Ni alloy FP-5Liu, Y. / Mazumder, J. et al. | 1995
- 489
-
Hexamethylenetetramine: extinction and thermal vibrations from neutron diffraction at six temperaturesKampermann, S. P. / Sabine, T. M. / Craven, B. M. / McMullan, R. K. et al. | 1995
- 498
-
X-ray determination of the dislocation densities in semiconductor crystals using a Bartels five-crystal diffractometerHealey, P. D. / Bao, K. / Gokhale, M. / Ayers, J. E. / Jain, F. C. et al. | 1995
- 504
-
Contrast of HOLZ lines in energy-filtered convergent-beam electron diffraction patterns from siliconLempfuhl, G. / Krahl, D. / Uchida, Y. et al. | 1995
- 514
-
Cation ordering waves in trirutiles. When X-ray crystallography fails?Hansen, S. / Landa-Cánovas, A. / Ståhl, K. / Nilsson, J. et al. | 1995
- 520
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Estimation of the one-phase structure seminvariants in the single isomorphous replacement case: an application of Hauptman's distributionHu, N. H. / Liu, Y. S. et al. | 1995
- 524
-
Magnetic completely transposable twin laws and tensor distinctionLitvin, D. B. / Litvin, S. Y. / Janovec, V. et al. | 1995
- 529
-
On the use of crenel functions for occupationally modulated structuresPetříček, V. / van der Lee, A. / Evain, M. et al. | 1995
- 535
-
TDSIR phasing: direct use of phase-invariant distributions in macromolecular crystallographyLangs, D. A. / Guo, D. Y. / Hauptman, H. A. et al. | 1995
- 542
-
Efficient methods for the linearization and solution of phase-invariant equationsLangs, D. A. / Han, F. et al. | 1995
- 548
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The diffraction of X-rays by close-packed polytypic crystals containing single stacking faults. III. Measurements of diffraction effects caused by stacking faults in plate or film form samplesMichalski, E. / Piecek, W. / Demianiuk, M. et al. | 1995
- 559
-
The Lorentz factor for the Laue techniqueLange, J. et al. | 1995
- 565
-
Statisical descriptions in crystallography. II. Report of a Working Group on Expression of Uncertainty in MeasurementSchwarzenbach, D. / Abrahams, S. C. / Flack, H. D. / Prince, E. / Wilson, A. J. C. et al. | 1995
- 569
-
Dynamical theories of dark-field imaging using diffusely scattered electrons in STEM and TEMWang, Z. L. et al. | 1995
- 586
-
Lattice complexes with at most one comprehensive complexFischer, W. / Koch, E. et al. | 1995
- 587
-
Defective vertices in perfect icosahedral quasicrystalsBaake, M. / Ben-Abraham, S. I. / Joseph, D. / Kramer, P. / Schlottmann, M. et al. | 1995
- 588
-
Right and left in chiral crystalsDunitz, J. D. et al. | 1995
- 589
-
Bloch-wave degeneracies and nonsystematic critical voltage: a method for structure-factor determination. ErratumMatsuhata, H. / Gjønnes, J. et al. | 1995
- 589
-
A study of the structure factors in rutile-type SnO2 by high-energy electron diffraction. ErratumMatsuhata, H. / Gjønnes, J. / Taftø, J. et al. | 1995
- 590
-
Resonant anomalous X-ray scattering - theory and applications edited by G. Matelik, C. J. Sparks and K. FischerKvick, Å. et al. | 1995
- 590
-
Mathematical techniques in crystallography and materials science by E. PrinceGałdecka, E. et al. | 1995
- 592
-
International Tables for Crystallography. Volume A. Corrigenda and Addenda to the Third, Revised Edition| 1995
- 596
-
Sixteenth International Congress of Crystallography, 21-29 August 1993, Beijing, China| 1995