Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation (English)
- New search for: Borkar, Shekhar
- New search for: Borkar, Shekhar
In:
IEEE micro
;
25
, 6
; 10-17
;
2005
-
ISSN:
- Article (Journal) / Print
-
Title:Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation
-
Contributors:Borkar, Shekhar ( author )
-
Published in:IEEE micro ; 25, 6 ; 10-17
-
Publisher:
- New search for: IEEE
-
Place of publication:New York, NY [u.a.]
-
Publication date:2005
-
ISSN:
-
ZDBID:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 53.55 / 54.26 / 54.52
- Further information on Basic classification
- New search for: 770/3155
-
Keywords:
-
Classification:
-
Source:
Table of contents – Volume 25, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
-
Table of contents| 2005
- 4
-
Masthead| 2005
- 5
-
Editor in Chief's Message - Designing microprocessors with robust functionality and performance| 2005
- 5
-
Designing microprocessors with robust functionality and performanceBose, P. et al. | 2005
- 6
-
Wireless access and electrical markets: Becoming similar?Greenstein, S. et al. | 2005
- 6
-
Micro Economics - Wireless access and electrical markets: Becoming similar?| 2005
- 8
-
Guest Editor's Introduction: Reliability-Aware MicroarchitectureAdve, S.V. / Sanda, P. et al. | 2005
- 10
-
Designing reliable systems from unreliable components: the challenges of transistor variability and degradationBorkar, S. et al. | 2005
- 17
-
Computer Society Information| 2005
- 18
-
Recent advances and new avenues in hardware-level reliability supportIyer, R.K. / Nakka, N.M. / Kalbarczyk, Z.T. / Mitra, S. et al. | 2005
- 30
-
An experimental study of soft errors in microprocessorsSaggese, G.P. / Wang, N.J. / Kalbarczyk, Z.T. / Patel, S.J. / Iyer, R.K. et al. | 2005
- 40
-
Improved thermal management with reliability bankingLu, Z. / Lach, J. / Stan, M.R. / Skadron, K. et al. | 2005
- 51
-
TRUSS: a reliable, scalable server architectureGold, B.T. / Kim, J. / Smolens, J.C. / Chung, E.S. / Liaskovitis, V. / Nurvitadhi, E. / Falsafi, B. / Hoe, J.C. / Nowatzyk, A.G. et al. | 2005
- 60
-
Power-efficient error tolerance in chip multiprocessorsRashid, M.W. / Tan, E.J. / Huang, M.C. / Albonesi, D.H. et al. | 2005
- 71
-
Cell processor low-power design methodologyStasiak, D. / Chaudhry, R. / Cox, D. / Posluszny, S. / Warnock, J. / Weitzel, S. / Wendel, D. / Wang, M. et al. | 2005
- 79
-
Micro Innovations - Writing the claims for a patent| 2005
- 79
-
Writing the claims for a patentEmma, P. et al. | 2005
- 82
-
Year-end cleanupMateosian, R. et al. | 2005
- 82
-
Micro Review - Year-end cleanup| 2005
- 85
-
Transnational electronic systems and patent infringementStern, R.H. et al. | 2005
- 85
-
Micro Law - Transnational electronic systems and patent infringement| 2005
- 90
-
2006 IEEE Computer Society Professional Membership/Subscription Application| 2005
- 92
-
IEEE Micro 2005 Annual Index, Vol. 25| 2005
- c1
-
[Front cover]| 2005