XPS study of passive films generated on AISI 430 ferritic stainless steel implanted with nitrogen and chromium plus nitrogen (English)
- New search for: Abreu, C.M.
- New search for: Abreu, C.M.
- New search for: Cristobal, M.J.
- New search for: Novoa, X.R.
- New search for: Pena, G.
- New search for: Pérez, M.C.
In:
Surface and interface analysis
;
38
, 4
; 851-853
;
2006
-
ISSN:
- Article (Journal) / Print
-
Title:XPS study of passive films generated on AISI 430 ferritic stainless steel implanted with nitrogen and chromium plus nitrogen
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Contributors:
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Published in:Surface and interface analysis ; 38, 4 ; 851-853
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Publisher:
- New search for: Wiley
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Place of publication:Chichester [u.a.]
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Publication date:2006
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ISSN:
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ZDBID:
-
Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 51.00 / 33.68 / 33.68 / 51.00
- Further information on Basic classification
- New search for: 020/3485
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Keywords:
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Source:
Table of contents – Volume 38, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 163
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The Spirit of ECASIAMathieu, H. J. / Seah, M. P. et al. | 2006
- 164
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Anniversary greetings: a retrospective of 20 years of ECASIA conferencesWerner, Helmut W. et al. | 2006
- 165
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Editorial PrefaceWerner, Wolfgang et al. | 2006
- 166
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Acknowledgements| 2006
- 168
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Mechanism of delamination of a polyamide coating modified with an aminosilaneGuichenuy, Marianne / Watts, John F. / Abel, Marie‐Laure / Audenaert, Marc et al. | 2006
- 172
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Study of the interaction of hydrolysed silane solutions with pre‐treated aluminium substratesFranquet, A. / Biesemans, M. / Terryn, H. / Willem, R. / Vereecken, J. et al. | 2006
- 176
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Detection of DNA hybridization by a field‐effect transistor with covalently attached catcher moleculesHan, Y. / Offenhäusser, A. / Ingebrandt, S. et al. | 2006
- 182
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Film formation and characterization of anodic oxides on titanium for biomedical applicationsJaeggi, Christian / Kern, Philippe / Michler, Johann / Patscheider, Joerg / Tharian, Joy / Munnik, Frans et al. | 2006
- 186
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Fibronectin adsorption on Fe–Cr alloy studied by XPSGaltayries, A. / Warocquier‐Clérout, R. / Nagel, M.‐D. / Marcus, P. et al. | 2006
- 191
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Improving the interpretation of ToF‐SIMS measurements on adsorbed proteins using PCABrüning, C. / Hellweg, S. / Dambach, S. / Lipinsky, D. / Arlinghaus, H. F. et al. | 2006
- 194
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Cylindrical and ring‐shaped tubulin assemblies as metallization templates explored by FESEM/EDX and SFMHabicht, Wilhelm / Behrens, Silke / Unger, Eberhard / Dinjus, Eckhard et al. | 2006
- 198
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Simple surface treatments to modify protein adsorption and cell attachment properties within a poly(dimethylsiloxane) micro‐bioreactorBoxshall, Keir / Wu, Min‐Hsien / Cui, Zheng / Cui, Zhangfeng / Watts, John F. / Baker, Mark A. et al. | 2006
- 202
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Surface characterization of the Gram‐positive bacteria Bacillus subtilis‐an XPS studyLeone, Laura / Loring, John / Sjöberg, Staffan / Persson, Per / Shchukarev, Andrei et al. | 2006
- 206
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X‐ray photoelectron spectroscopy surface quantification of sulfided CoMoP catalysts. Relation between activity and promoted sites. Part II: Influence of the sulfidation temperatureGandubert, A. D. / Legens, C. / Guillaume, D. / Payen, E. et al. | 2006
- 210
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Electrochemically pretreated Bi2Pt2−yIryO7 pyrochlores—an X‐ray photoelectron spectroscopy studyFoelske, A. / Steiger, B. / Beck, N. K. / Kötz, R. / Scherer, G. G. / Wokaun, A. et al. | 2006
- 215
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XPS study of supported gold catalysts: the role of Au0 and Au+δ species as active sitesCasaletto, M. P. / Longo, A. / Martorana, A. / Prestianni, A. / Venezia, A. M. et al. | 2006
- 215
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XPS study of supported gold catalysts: the role of Au0 and Au+d species as active sitesCasaletto, M. P. / Longo, A. / Martorana, A. / Prestianni, A. / Venezia, A. M. et al. | 2006
- 215
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XPS study of supported gold catalysts: the role of Au0 and Au+[delta] species as active sitesCasaletto, M.P. et al. | 2006
- 219
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Application of surface ionization to determine rate constant and activation energy of dissociation reactions of nitrogen base polyatomic molecules on W oxidesRakhmanov, G. / Rasulev, U. Kh. / Saidumarov, I. et al. | 2006
- 224
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An XPS study of the reduction process of CuO–ZnO–Al2O3 catalysts obtained from hydroxycarbonate precursorsMoretti, G. / Ferraris, G. / Fierro, G. / Lo Jacono, M. et al. | 2006
- 229
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Surface basicity of ceria‐supported lanthana. Influence of the calcination temperatureBernal, S. / Blanco, G. / El Amarti, A. / Cifredo, G. / Fitian, L. / Galtayries, A. / Martín, J. / Pintado, J. M. et al. | 2006
- 234
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Influence of the metal nature (Ni, Cu, Mg) on the surface acid–base properties of mixed oxides elaborated from LDHDussault, L. / Dupin, J. C. / Martinez, H. / Dumitriu, E. / Auroux, A. / Guimon, C. et al. | 2006
- 238
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Probing the electronic structure of NiX, (X = B, S, P) catalysts with XPSDiplas, S. / Jørgensen, S. / Taftø, J. / Tønnessen, T. / Knutsen, T. / Lehrmann, J. / Våland, T. / Abel, M.‐L. / Watts, J. F. et al. | 2006
- 243
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Corrosion behaviour of AlN and TiAlN coatings on ironMarco, J. F. / Agudelo, A. C. / Gancedo, J. R. / Auger, M. A. / Sánchez, O. / Albella, J. M. et al. | 2006
- 248
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PECVD coatings: analysis of the interface with the metallic substrateAngelini, E. / Grassini, S. / Rosalbino, F. / Fracassi, F. / Laera, S. / Palumbo, F. et al. | 2006
- 252
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Comparative study of the corrosion behavior of zinc coatings deposited on low carbon steel substratesPistofidis, N. / Vourlias, G. / Chaliampalias, D. / Pavlidou, E. / Stergioudis, G. / Polychroniadis, E. K. et al. | 2006
- 255
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Effect of simulated marine atmosphere on tin plasma‐sprayed coatingsVourlias, G. / Pistofidis, N. / Chaliampalias, D. / Pavlidou, E. / Stergioudis, G. / Polychroniadis, E. K. / Tsipas, D. et al. | 2006
- 259
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Effect of surface preparation on the evolution of the passive films formed on AISI 304LAbreu, C. M. / Cristóbal, M. J. / Losada, R. / Nóvoa, X. R. / Pena, G. / Pérez, M. C. et al. | 2006
- 263
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Visualization of early stages of corrosion processes by a chemographic methodYelizarov, M. A. et al. | 2006
- 267
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Nitrogen depth profiling in thin oxynitride layers on siliconBudrevich, A. / Gladkikh, A. / Kaganer, E. / Sokolovsky, M. et al. | 2006
- 272
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Investigation of the (sub)surface of commercially pure rolled aluminium alloys by means of total reflectance, r.f. GDOES, SEM/EDX and FIB/TEM analysisBuytaert, G. / Terryn, H. / Van Gils, S. / Kernig, B. / Grzemba, B. / Mertens, M. et al. | 2006
- 277
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In‐depth composition study of zirconia‐coated steel sheet by XPSLópez, R. / Romero, R. / Martín, F. / Ramos‐Barrado, J. R. / Leinen, D. et al. | 2006
- 282
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Surface analyses and depth profiles of oxide scales formed on alloy surfaceHorita, Teruhisa / Xiong, Yueping / Kishimoto, Haruo / Yamaji, Katsuhiko / Sakai, Natsuko / Brito, Manuel E. / Yokokawa, Harumi et al. | 2006
- 287
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Metal clustering during depth profiling of thin filmsKarpuzov, D. / He, A. / Xu, S. et al. | 2006
- 292
-
Pulsed r.f.‐glow‐discharge time‐of‐flight mass spectrometry for fast surface and interface analysis of conductive and non‐conductive materialsHohl, M. / Kanzari, A. / Michler, J. / Nelis, T. / Fuhrer, K. / Gonin, M. et al. | 2006
- 296
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Combined AES and TOF‐SIMS analysis of a thermally treated Ag/Ti/Al metallization systemScheithauer, U. / Treichler, R. et al. | 2006
- 300
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Ripple structures developed on graphite layers during ion‐sputteringKovač, J. / Zalar, A. / Praček, B. et al. | 2006
- 305
-
ToF‐SIMS analysis of organic impurities in UPWKobayashi, Junji / Owari, Masanori et al. | 2006
- 309
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Detection and analysis of nitrogen‐containing pesticides in environment by surface‐ionization methodsKhasanov, U. / Rasulev, U. Kh. / Usmanov, D. T. / Iskhakova, S. S. et al. | 2006
- 313
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Shell layers of Ostrea edulis as an environmental indicator of TBT pollution: the contribution of surface techniquesMedaković, Davorin / Traverso, Pierluigi / Bottino, Carlo / Popović, Stanko et al. | 2006
- 317
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A novel sample pretreatment method using supercritical fluids for the analysis of atmospheric environmental samples by means of time‐of‐flight secondary ion mass spectrometrySakamoto, Tetsuo / Yamamoto, Azusa / Owari, Masanori / Nihei, Yoshimasa et al. | 2006
- 322
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Plasma functionalization, surface characterization and protein retention of multiple‐sized polymer beadsManso, M. / Rodriguez, A. / Paul, A. / Barrero, J. / Rossi, F. et al. | 2006
- 326
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Grafting of bifunctional fluorinated polyether molecules on metallic surfaces: application to the protection of electrical contactsNoël, S. / Lécaudé, N. / Alamarguy, D. et al. | 2006
- 330
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In situ electrochemical lithium intercalation into amorphous oxide thin filmsHaake, U. / Lützenkirchen‐Hecht, D. / Frahm, R. et al. | 2006
- 335
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RBS and AFM study of Ag and Au diffusion into PET foils influenced by plasma treatmentMacková, Anna / Švorčík, Václav / Strýhal, Zdeněk / Pavlík, Jaroslav et al. | 2006
- 339
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Surface cleaning of a commercially pure Ti, Ti6Al4V and Ti3Al8V6Cr4Zr4Mo alloys by linear heatingDhlamini, M. S. / Swart, H. C. / Terblans, J. J. / Terblanche, C. J. et al. | 2006
- 343
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Investigation of improved adhesion between Cu film and polyimide by the PSII‐EIAMAD techniqueLee, Yeonhee / Hong, Ju Hi / Chun, Hyejin / Han, Seunghee et al. | 2006
- 348
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Changes in austenitic steel surface induced by thermal and implantation treatments studied by Mössbauer spectroscopyJirásková, Yvonna / Schneeweiss, Oldřich / Blawert, Carsten et al. | 2006
- 348
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Changes in austenitic steel surface induced by thermal and implantation treatments studied by Mossbauer spectroscopyJiraskova, Y. / Schneeweiss, O. / Blawert, C. et al. | 2006
- 352
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Characterization of F+‐irradiated graphite surfaces using photon‐stimulated desorption spectroscopySekiguchi, Tetsuhiro / Baba, Yuji / Shimoyama, Iwao / Nath, Krishna G. et al. | 2006
- 357
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Recovering the past from surfaces and interfaces: experimental and cultural issuesPaparazzo, E. et al. | 2006
- 364
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A multi‐analytical investigation on medieval pottery from Caltagirone (Sicily, Italy)Casaletto, M. P. / Chiozzini, G. / De Caro, T. / Ingo, G. M. et al. | 2006
- 369
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An application of ToF‐SIMS to fine papersStarlinger, Sandra / Eitzinger, Bernhard et al. | 2006
- 375
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Work‐function imaging of oriented copper grains by photoemissionRenault, O. / Brochier, R. / Roule, A. / Haumesser, P.‐H. / Krömker, B. / Funnemann, D. et al. | 2006
- 378
-
Metastable impact electron emission microscopy: principles and applicationsLilienkamp, G. / Suchorski, Y. et al. | 2006
- 383
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Applications of scanning thermal microscopy in the analysis of the geometry of patterned structuresKlapetek, Petr / Ohlídal, Ivan / Buršík, Jiří et al. | 2006
- 388
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Transmission‐function correction for XPS spectrum imagingWalton, John / Fairley, Neal et al. | 2006
- 392
-
Structural, chemical and magnetic characterization of iron nitride thin filmsPrieto, P. / Palomares, F. J. / Gonzalez, J. M. / Pérez‐Casero, R. / Sanz, J. M. et al. | 2006
- 396
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XPS depth profiling of oxide scales of stainless steels formed in high‐temperature aqueous conditionsIgnatova, V. A. / Van Dyck, St / Grötzschel, R. / Möller, W. et al. | 2006
- 401
-
Influence of phosphorus enrichment at grain boundaries on energy of intergranular fracture in Fe–Si–P alloysJanovec, J. / Pokluda, J. / Jenko, M. / Lejček, P. / Vlach, B. / Horníková, J. et al. | 2006
- 406
-
XPS and SIMS study of aluminium native oxide modifications induced by Q‐switched Nd:YAG laser treatmentBarnier, V. / Heintz, O. / Roberts, D. E. / Oltra, R. / Costil, S. et al. | 2006
- 410
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Investigation of passive films grown on biocompatible Ti‐50Zr and Ti‐13Zr‐13Nb alloys by XPSOliveira, N. T. C. / Biaggio, S. R. / Nascente, P. A. P. / Rocha‐Filho, R. C. / Bocchi, N. et al. | 2006
- 413
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Influence of enamel ageing on mechanical properties and phase composition of the steel–enamel systemBarcova, K. / Zboril, R. / Mashlan, M. / Jiraskova, Y. / Filip, J. / Lunacek, J. / Hrabovska, K. et al. | 2006
- 417
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XPS characterization of anodic oxides grown on biocompatible Ti–50Zr alloy in different acid electrolytesFerreira, E. A. / Oliveira, N. T. C. / Biaggio, S. R. / Nascente, P. A. P. / Rocha‐Filho, R. C. / Bocchi, N. et al. | 2006
- 422
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Application of ultra low energy (ULE) SIMS to emerging diamond technologiesGuzmán de la Mata, B. / Dowsett, M. G. / Tajani, A. / Schwitters, M. et al. | 2006
- 426
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Interfacial reactions between In–48Sn solder and electroless nickel/immersion gold substrate during reflow processKoo, Ja‐Myeong / Yoon, Jeong‐Won / Jung, Seung‐Boo et al. | 2006
- 429
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Curing and electrical conductivity of conductive glues for die attach in microelectronicsScandurra, A. / Cavallaro, A. / Pignataro, S. / Tiziani, R. / Gobbato, L. / Cognetti, C. et al. | 2006
- 433
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The peculiarities of electronic structure of Si nanocrystals formed in SiO2 and Al2O3 matrix with and without P dopingKovalev, Anatoly / Wainstein, Dmitry / Tetelbaum, David / Mikhailov, Alexey et al. | 2006
- 437
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Angle‐resolved XPS study of thin oxides after wet cleaning on Si0.8 Ge0.2 substratesMartinez, E. / Abbadie, A. / Renault, O. / Cayrefourcq, I. / Quiais‐Marthon, S. et al. | 2006
- 440
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Characteristic analysis of electroless Ni plating layer for electronic packagingKim, Dae‐Gon / Kim, Jong‐Woong / Yoon, Jeong‐Won / Lee, Won‐Bae / Jung, Seung‐Boo et al. | 2006
- 444
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Investigation of the interface manipulation in SiC(100) on Si(100) with isovalent impuritiesPezoldt, J. / Morales, F. M. / Zgheib, Ch. / Förster, Ch. / Stauden, Th. / Ecke, G. / Wang, Ch. / Masri, P. et al. | 2006
- 448
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Auger analysis and simulation of electronic states for Ge33As12Se55p‐Si heterojunctionShchurova, T. N. / Savchenko, N. D. / Kondrat, A. B. / Opachko, I. I. et al. | 2006
- 452
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Growth of TiO2 nanocrystals in the presence of alkylpyridinium salts: the interplay between hydrophobic and hydrophilic interactionsArdizzone, S. / Bianchi, C. L. / Cappelletti, G. et al. | 2006
- 458
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Photoluminescence of cerium–europium co‐doped SiO2 phosphor prepared by a sol–gel processNtwaeaborwa, O. M. / Swart, H. C. / Kroon, R. E. / Holloway, P. H. / Botha, J. R. et al. | 2006
- 462
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Influence of the matrix on the chemical surface bonds of ZnS and CdS nanoclusters obtained by chemical synthesisMirenghi, Luciana / Antolini, Francesco / Tapfer, Leander et al. | 2006
- 469
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Noble gas clusters in carbon nanoporesKrainyukova, Nina V. et al. | 2006
- 473
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Characteristics of silica‐coated TiO2 and its UV absorption for sunscreen cosmetic applicationsJaroenworaluck, A. / Sunsaneeyametha, W. / Kosachan, N. / Stevens, R. et al. | 2006
- 478
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Immobilization of GOD and HRP enzymes on nanostructured substratesCurulli, A. / Cusmà, A. / Kaciulis, S. / Padeletti, G. / Pandolfi, L. / Valentini, F. / Viticoli, M. et al. | 2006
- 482
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Fe3C nanopowder synthesized by laser pyrolysis and its annealing behaviourDavid, B. / Schneeweiss, O. / Pizúrová, N. / Klementová, M. / Bezdička, P. / Alexandrescu, R. / Dumitrache, F. / Morjan, I. et al. | 2006
- 486
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Modeling the XPS Si 2p core‐level intensities of silicon nanocrystals for determination of oxide shell thicknessRenault, O. / Marlier, R. / Barrett, N. T. / Martinez, E. / Baron, T. / Gely, M. / De Salvo, B. et al. | 2006
- 489
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Optical properties of thin iron oxide films on steelGoossens, V. / Wielant, J. / Van Gils, S. / Finsy, R. / Terryn, H. et al. | 2006
- 494
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X‐ray photoelectron spectroscopy study of energy‐band alignments of Lu2O3 on GePerego, M. / Seguini, G. / Scarel, G. / Fanciulli, M. et al. | 2006
- 498
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An AES study of the initial stages of oxidation of ceriumJiangrong, Yang / Xiaolin, Wang / Chunli, Jiang / Hong, Xiao / Lei, Lu et al. | 2006
- 502
-
Temperature dependence of band alignments in ultrathin Hf–Al–O and Al2O3 films on p‐Si (100)Jin, H. / Oh, S. K. / Kang, H. J. / Lee, Y. S. / Cho, M. H. et al. | 2006
- 506
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Influence of Cr on initial thermal oxidation and its kinetics on Si (001) surfacesShimizu, H. / Sato, T. et al. | 2006
- 510
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First stages of growth of cerium oxide deposited on alumina and reduced titania surfacesMansilla, C. / Yubero, F. / Zier, M. / Reiche, R. / Oswald, S. / Holgado, J. P. / Espinós, J. P. / González‐Elipe, A. R. et al. | 2006
- 514
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TEM and XANES investigations and optical properties of SnO nanolayersDomashevskaya, E. P. / Chuvenkova, O. A. / Kashkarov, V. M. / Kushev, S. B. / Ryabtsev, S. V. / Turishchev, S. Yu. / Yurakov, Yu. A. et al. | 2006
- 518
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Oxidation of PbSnTe solid solutions and of PbSn alloysBerchenko, N. N. / Nikiforov, A. Yu. / Fadeyev, S. V. et al. | 2006
- 522
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Radio frequency (r.f.) plasma‐deposited polymer films: influence of external plasma parameters as viewed by comprehensive in‐situ surface chemical analysis by XAS, XPS and ToF‐SIMSUnger, W. E. S. / Swaraj, S. / Oran, U. / Lippitz, A. et al. | 2006
- 526
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XPS and contact angle study of N2 and O2 plasma‐modified PTFE, PVDF and PVF surfacesVandencasteele, Nicolas / Merche, Delphine / Reniers, François et al. | 2006
- 531
-
XPS and RBS characterizations of electrosynthesized polypyrrole films doped with a heteropolyanion, SiMo12O404−Debiemme‐Chouvy, Catherine / Bernard, Marie‐Claude / Cachet, Hubert / Deslouis, Claude et al. | 2006
- 535
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Interactions of reactive polypyrrole‐coated polystyrene latex particles with gold nanoparticles and silanized glassYip, Yann / Benabderrahmane, Sihem / Zhicai, Ma / Bousalem, Smain / Mangeney, Claire / Chehimi, Mohamed M. et al. | 2006
- 539
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Microstructure of kaolin spheres produced by a gel‐casting process with a biopolymer additiveChumnanklang, Rung‐Arun / Jaroenworaluck, Angkhana / Panyathanmaporn, Thammarat / Supothina, Sitthisuntorn et al. | 2006
- 544
-
Observation of the hydrogen peak in the spectra of electrons backscattered from polyethyleneVarga, D. / Tőkési, K. / Berényi, Z. / Tóth, J. / Kövér, L. et al. | 2006
- 548
-
DNA immobilization using biocompatible diblock phosphorylcholine copolymersZhao, Xiubo / Zhang, Zhuoqi / Pan, Fang / Ma, Yinghua / Armes, Steve P. / Lewis, Andrew L. / Lu, Jian R. et al. | 2006
- 552
-
Electron microscopy of g-irradiated polyethyleneBercia, R. et al. | 2006
- 552
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Electron microscopy of γ‐irradiated polyethyleneBercia, R. / Tirnovan, M. / Bercia, C. / Popescu‐Pogrion, N. et al. | 2006
- 557
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Surface and interface analysis of complex polymeric paint formulationsHinder, Steven J. / Watts, John F. / Lowe, Chris et al. | 2006
- 561
-
Surface characteristics of 2‐(diethylamino) ethyl methacrylate–2‐(dimethylamino) ethyl methacrylate diblock copolymer determined by inverse gas chromatographyTopaloğlu Yazıcı, D. / Aşkın, A. / Bütün, V. et al. | 2006
- 565
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Growth of polymer brushes by atom transfer radical polymerization on glassy carbon modified by electro‐grafted initiators based on aryl diazonium saltsMatrab, T. / Chehimi, M. M. / Pinson, J. / Slomkowski, S. / Basinska, T. et al. | 2006
- 569
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Intrinsic and extrinsic excitations in deep core photoelectron spectra of solid GeKövér, L. / Novák, M. / Egri, S. / Cserny, I. / Berényi, Z. / Tóth, J. / Varga, D. / Drube, W. / Yubero, F. / Tougaard, S. et al. | 2006
- 574
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Study of X‐ray absorption near‐edge structure with a photoemission electron microscopeZhang, Zengming / Ding, Zejun / Yoshikawa, Hideki / Shimizu, Ryuichi et al. | 2006
- 579
-
Interfacial reaction during MOCVD growth revealed by in situ ARXPSBrevet, A. / Chassagnon, R. / Imhoff, L. / Marco de Lucas, M. C. / Domenichini, B. / Bourgeois, S. et al. | 2006
- 583
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Excitations of bulk and surface plasmons in solids and nanostructuresGervasoni, Juana L. et al. | 2006
- 587
-
Tip shape reconstruction of the probes for shear‐force and near‐field microscopesChuklanov, A. P. / Bukharaev, A. A. et al. | 2006
- 590
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Angle‐resolved XPS: a critical evaluation for various applicationsOswald, S. / Zier, M. / Reiche, R. / Wetzig, K. et al. | 2006
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Angle-resolved XPS: a critical evaluation for various applications. Dedicated to Prof. Dr. Dr. h.c. Hartmut Fueß on the occasion of his 65th birthdayOswald, S. et al. | 2006
- 595
-
Measuring the energy of the graphite p + [sigma] plasmon peakFilippi, M. et al. | 2006
- 595
-
Measuring the energy of the graphite π + σ plasmon peakFilippi, M. / Calliari, L. et al. | 2006
- 595
-
Measuring the energy of the graphite p + plasmon peakFilippi, M. / Calliari, L. et al. | 2006
- 599
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Post‐chromatographic TOF‐SIMS identification of diterpenesOriňák, Andrej / Oriňáková, Renáta / Arlinghaus, Heinrich F. / Vering, Guido / Hellweg, Sebastian et al. | 2006
- 604
-
Quantification and IMFP determination of multilayer Langmuir–Blodgett films by AFM and XPS measurementsSato, Masahide / Tsukamoto, Naoto / Shiratori, Tsubasa / Furusawa, Takeshi / Suzuki, Noboru / Tougaard, Sven et al. | 2006
- 610
-
Electron irradiated sodium–potassium–aluminium silicate glass surfaces investigated by XPSLesiak, B. / Zemek, J. / Gedeon, O. / Jóźwik, A. et al. | 2006
- 615
-
Angular‐resolved elastic peak electron spectroscopy: experiment and Monte Carlo calculationsZemek, J. / Jiricek, P. / Werner, W. S. M. / Lesiak, B. / Jablonski, A. et al. | 2006
- 620
-
Discrimination between gprime-Fe4N and ?-Fe2-3N iron nitride compounds using PCA of Auger electron spectraVandendael, I. / Sloof, W. G. / Steenhaut, O. / Hubin, A. / Vereecken, J. et al. | 2006
- 620
-
Discrimination between γ′‐Fe4N and ε‐Fe2–3N iron nitride compounds using PCA of Auger electron spectraVandendael, I. / Sloof, W. G. / Steenhaut, O. / Hubin, A. / Vereecken, J. et al. | 2006
- 620
-
Discrimination between g'-Fe4N and -Fe2-3N iron nitride compounds using PCA of Auger electron spectraVandendael, I. et al. | 2006
- 624
-
Experimental determination of the inelastic mean free path (IMFP) of electrons in selected oxide films applying surface excitation correctionGurban, S. / Gergely, G. / Toth, J. / Varga, D. / Jablonski, A. / Menyhard, M. et al. | 2006
- 628
-
Measurement of the differential electron surface and volume excitation probability in Cu, CuO and Cu2OWerner, W. S. M. / Zemek, J. / Jiricek, P. et al. | 2006
- 632
-
Effective energy loss function of silver derived from reflection electron energy loss spectraZhang, Z. M. / Ding, Z. J. / Li, H. M. / Tőkési, K. / Varga, D. / Tóth, J. et al. | 2006
- 636
-
Auger parameter studies of third‐row chemical elementsMoretti, Giuliano / Paparazzo, Ernesto et al. | 2006
- 640
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XPS MultiQuant: a step towards expert systemsMohai, M. et al. | 2006
- 644
-
Measured electron IMFPs for SiCKrawczyk, M. / Zommer, L. / Kosiński, A. / Sobczak, J. W. / Jablonski, A. et al. | 2006
- 648
-
X‐ray photoelectron spectroscopic study of the surface chemistry of soda‐lime glass in vacuumSo, L. / Ng, N. / Bilek, M. / Pigram, P. J. / Brack, N. et al. | 2006
- 652
-
Intrinsic and extrinsic contributions to plasmon excitations in electron emission processesGervasoni, J. L. / Kövér, L. et al. | 2006
- 657
-
Monte Carlo simulation study of electron interaction with solids and surfacesDing, Z. J. / Salma, K. / Li, H. M. / Zhang, Z. M. / Tokesi, K. / Varga, D. / Toth, J. / Goto, K. / Shimizu, R. et al. | 2006
- 664
-
Straggling of fast electronsChaoui, Zine‐El‐Abidine / Bichsel, Hans et al. | 2006
- 668
-
Analysis of the spin polarization of secondary electrons emitted from ferromagnetic materialsSun, X. / Ding, Z. J. / Yamauchi, Y. et al. | 2006
- 672
-
Theoretical determination of the surface excitation parameter from X‐ray photoelectron spectroscopyPauly, N. / Tougaard, S. / Yubero, F. et al. | 2006
- 676
-
Angular distribution of electrons backscattered elastically from silverTőkési, K. / Varga, D. et al. | 2006
- 679
-
Computer program for the grain analysis of AFM images of nanoparticles placed on a rough surfaceChuklanov, A. P. / Ziganshina, S. A. / Bukharaev, A. A. et al. | 2006
- 682
-
XPS at solid–solution interface: experimental approachesShchukarev, A. et al. | 2006
- 686
-
The anodic oxidation of silver in 1 M NaOH: electrochemistry, ex situ XPS and in situ X‐ray absorption spectroscopyLützenkirchen‐Hecht, Dirk / Strehblow, Hans‐Henning et al. | 2006
- 691
-
Auger photoelectron coincidence spectroscopy: simplifying complexityvan Riessen, G. A. / Thurgate, S. M. et al. | 2006
- 699
-
Development of a ToF version of the desktop MiniSIMS: instrument design and applicationsCliff, B. / Eccles, A. J. / Jones, C. / Long, N. / Vohralik, P. et al. | 2006
- 703
-
High-energy X-ray photoelectron spectroscopy with new monochromatised Cu K[alpha]1 X-rays; characteristics, capabilities and limitationsMoslemzadeh, N. et al. | 2006
- 703
-
High‐energy X‐ray photoelectron spectroscopy with new monochromatised Cu Kα1 X‐rays; characteristics, capabilities and limitationsMoslemzadeh, N. / Beamson, G. / Haines, S. R. / Tsakiropoulos, P. / Watts, J. F. / Weightman, P. et al. | 2006
- 703
-
High-energy X-ray photoelectron spectroscopy with new monochromatised Cu Ka1 X-rays; characteristics, capabilities and limitationsMoslemzadeh, N. / Beamson, G. / Haines, S. R. / Tsakiropoulos, P. / Watts, J. F. / Weightman, P. et al. | 2006
- 707
-
Electrostatic electron spectrometer based on two cylinders without axial symmetryVarga, D. / Tőkési, K. et al. | 2006
- 710
-
CONFIT: Mössbauer spectra fitting programŽák, Tomáš / Jirásková, Yvonna et al. | 2006
- 710
-
CONFIT: Mossbauer spectra fitting programZak, T. / Jiraskova, Y. et al. | 2006
- 715
-
Structural and electrical properties of thin d.c. magnetron‐sputtered gold films deposited on float glassMarkert, Christian / Lützenkirchen‐Hecht, Dirk / Frahm, Ronald et al. | 2006
- 719
-
Correlation between electrochemical reactivity and surface chemistry of amorphous carbon nitride filmsCachet, H. / Debiemme‐Chouvy, C. / Deslouis, C. / Lagrini, A. / Vivier, V. et al. | 2006
- 723
-
Correlation between silicon‐nitride film stress and composition: XPS and SIMS analysesVanzetti, L. / Barozzi, M. / Giubertoni, D. / Kompocholis, C. / Bagolini, A. / Bellutti, P. et al. | 2006
- 727
-
The initial oxidation of zirconium—oxide‐film microstructure and growth mechanismJeurgens, L. P. H. / Lyapin, A. / Mittemeijer, E. J. et al. | 2006
- 731
-
Nanostructural studies of PVD TiAlB coatingsMonclus, M. A. / Baker, M. A. / Rebholz, C. / Stolojan, V. / Gibson, P. N. / Leyland, A. / Matthews, A. et al. | 2006
- 736
-
XPS investigation of CoOx‐based MRISiC structures for hydrocarbon gas sensingComini, E. / Cusmà, A. / Kaciulis, S. / Kandasamy, S. / Padeletti, G. / Pandolfi, L. / Sberveglieri, G. / Trinchi, A. / Wlodarski, W. et al. | 2006
- 740
-
Characterisation of metal oxide films deposited by non‐hydrolytic ALDEvans, P. J. / Mutin, P. H. / Triani, G. / Prince, K. E. / Bartlett, J. R. et al. | 2006
- 744
-
Physico‐chemical study of the interfaces of Mo/Si multilayer interferential mirrors: correlation with the optical propertiesMaury, H. / André, J.‐M. / Gautier, J. / Bridou, F. / Delmotte, F. / Ravet, M.‐F. / Holliger, P. / Jonnard, P. et al. | 2006
- 748
-
Quantitative XPS depth profiling for nickel/4H‐SiC contact with layered structureCao, Yu / Nyborg, Lars et al. | 2006
- 752
-
Correlation between optical properties and electronic parameters for mixed oxide thin filmsGracia, F. / Yubero, F. / Espinos, J. P. / Holgado, J. P. / González‐Elipe, A. R. / Girardeau, T. et al. | 2006
- 757
-
Rapid depth profiling of lead zirconate titanate (PZT) thin films by pulsed glow‐discharge optical emission spectroscopySchwaller, P. / Aeberhard, M. / Nelis, T. / Fischer, A. / Thapliyal, R. / Michler, J. et al. | 2006
- 761
-
An electron spectroscopy study of a‐C:H under thermal annealingCalliari, L. / Filippi, M. / Gottardi, G. / Laidani, N. / Anderle, M. et al. | 2006
- 765
-
Fabrication and characteristics of TiO2 films by a microwave drying techniqueJaroenworaluck, Angkhana / Panyathanmaporn, Thammarat / Soontornworajit, Boonchoy / Supothina, Sitthisuntorn et al. | 2006
- 769
-
Fabrication of epitaxial MIM structures on NiAl(110) studied by XPS and low energy electron diffractionYoshitake, Michiko / Song, Weijie et al. | 2006
- 773
-
Interdiffusion in microstructurally different Si/Al multilayered structuresWang, J. Y. / He, D. / Zalar, A. / Mittemeijer, E. J. et al. | 2006
- 777
-
Characterization of a HfO2/SiO2/Si system by X‐ray reflection and X‐ray emission spectroscopiesAndré, J.‐M. / Filatova, E. O. / Renault, O. / Damlencourt, J.‐F. / Martin, F. / Jonnard, P. et al. | 2006
- 781
-
Analysis of a B4C/Mo/Si multilayer interferential mirror by SIMS: influence of the sputtering ionMaury, H. / Holliger, P. / Farès, B. / Gautier, J. / Roulliay, M. / Bridou, F. / Delmotte, F. / Ravet, M.‐F. / André, J.‐M. / Jonnard, P. et al. | 2006
- 784
-
Comparative study of the interfacial characteristics of sputter‐deposited HfO2 on native SiO2/Si (100) using in situ XPS, AES and GIXRTan, Ruiqin / Azuma, Yasushi / Kojima, Isao et al. | 2006
- 789
-
ZnO thin films on aluminized steel by spray pyrolysisLópez Ibáñez, R. / Romero, R. / Martín, F. / Ramos‐Barrado, J. R. / Leinen, D. et al. | 2006
- 793
-
A work function study of ultrathin alumina formation on Cu‐9%Al(111) surfaceSong, Weijie / Yoshitake, Michiko et al. | 2006
- 797
-
Coating of Ti–6Al–4V alloy with pure titanium film by sputter‐deposition for improving biocompatibilitySonoda, T. / Saito, T. / Watazu, A. / Katou, K. / Asahina, T. et al. | 2006
- 801
-
Characterisation of sol–gel crystalline V2O5 thin films after Li intercalation cyclingAlamarguy, D. / Castle, J. E. / Ibris, N. / Salvi, A. M. et al. | 2006
- 805
-
Influence of temperature on electrical characteristics of CHx/porous silicon/Si sensing deviceZouadi, N. / Belhousse, S. / Cheraga, H. / Ouadah, Y. / Sam, S. / Ouchabane, M. / Henda, K. / Mahmoudi, B. / Gabouze, N. et al. | 2006
- 808
-
Electroless deposition study of silver into porous siliconFortas, G. / Sam, S. / Gabouze, N. / Guerbous, L. / Belaroussi, Y. / Manseri, A. et al. | 2006
- 811
-
Electrical and optical characterisation of TiN porous Si/Si structuresBenzekkour, N. / Gabouze, N. / Sam, S. / Saoula, N. / Henda, K. et al. | 2006
- 815
-
Alkali ion intercalation in V2O5: preparation and laboratory characterization of thin films produced by ALDDonsanti, F. / Kostourou, K. / Decker, F. / Ibris, N. / Salvi, A. M. / Liberatore, M. / Thissen, A. / Jaegerman, W. / Lincot, D. et al. | 2006
- 819
-
Characterization of hydrogen contained in passivated poly‐Si and microcrystalline‐Si by ERDA techniqueBoldyryeva, H. / Honda, S. / Mackova, A. / Mates, T. / Fejfar, A. / Kočka, J. et al. | 2006
- 823
-
Thin film a‐C/Pt nanocomposite catalysts for toxic gas sensorsBaranov, A. / Fanchenko, S. / Calliari, L. / Speranza, G. / Minati, L. / Kharitonov, S. / Fedoseenkov, D. / Shorokhov, A. / Nefedov, A. et al. | 2006
- 828
-
XRD, AFM and IR investigations of ordered AlGaAs2 phase in epitaxial AlxGa1–xAs/GaAs (100) heterostructuresDomashevskaya, E. P. / Seredin, P. V. / Lukin, A. N. / Bityutskaya, L. A. / Grechkina, M. V. / Arsentyev, I. N. / Vinokurov, D. A. / Tarasov, I. S. et al. | 2006
- 833
-
TOF‐SIMS depth profiling study of corrosion propagation in coated hollow spheresOriňáková, Renáta / Oriňák, Andrej / Arlinghaus, Heinrich F. / Hellweg, Sebastian / Kupková, Miriam / Strečková, Magdaléna et al. | 2006
- 838
-
Effect of oxide thickness on the degradation of organic silane monolayers on silicon wafer surface during XPS measurementSato, Masahide / Furusawa, Takeshi / Hotta, Takahide / Watanabe, Hidetoshi / Suzuki, Noboru et al. | 2006
- 842
-
Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopyFranta, Daniel / Ohlídal, Ivan / Klapetek, Petr / Nepustilová, Růžena / Bajer, Svatopluk et al. | 2006
- 847
-
Distribution of intercalated lithium in V2O5 thin films determined by SIMS depth profilingAlamarguy, D. / Castle, J. E. / Liberatore, M. / Decker, F. et al. | 2006
- 851
-
XPS study of passive films generated on AISI 430 ferritic stainless steel implanted with nitrogen and chromium plus nitrogenAbreu, C. M. / Cristóbal, M. J. / Nóvoa, X. R. / Pena, G. / Pérez, M. C. et al. | 2006
- 854
-
Ink identification by time‐of‐flight secondary ion mass spectroscopyHe, A. / Karpuzov, D. / Xu, S. et al. | 2006
- 859
-
Application of angle‐resolved XPS for characterisation of SiC/Ni2Si thin film systemsPérez‐García, S. A. / Nyborg, L. et al. | 2006
- 863
-
The influence of an OTS self‐assembled monolayer on the wear‐resistant properties of polysilicon based MEMSBaker, M. A. / Li, J. et al. | 2006
- 868
-
Friction induced conformational changes on large‐scale and small‐scale polyester sliding surfacesSamyn, P. / Craenenbroeck, J. Van / Quintelier, J. / Schoukens, G. et al. | 2006