CdSxTe, x films: preparation and properties (English)
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In:
Journal of physics / D
;
26
, 4
; 704-710
;
1993
-
ISSN:
- Article (Journal) / Print
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Title:CdSxTe, x films: preparation and properties
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Contributors:
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Published in:Journal of physics / D ; 26, 4 ; 704-710
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Publisher:
- New search for: IOP Publ.
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Place of publication:Bristol
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Publication date:1993
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ISSN:
-
ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Keywords:
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Classification:
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Source:
Table of contents – Volume 26, Issue 4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
The early days of high-resolution x-ray topographyLang, A.R. et al. | 1993
- 9
-
Present status of the topography and high-resolution diffraction beamline at the ESRFBaruchel, J. et al. | 1993
- 15
-
Image enhancement of x-ray topographs by Fourier filteringEpelboin, Y. et al. | 1993
- 19
-
Detectors for synchrotron x-ray topographyKoch, A. et al. | 1993
- 22
-
Analysis of (n, -n) and (n, -n, n) x-ray rocking curves of processed siliconServidori, M. et al. | 1993
- 29
-
Possibilities of x-ray interference diffractometry for the reconstruction of two-dimensional lattice deformation profiles in crystalsAristov, V.V. et al. | 1993
- 32
-
A novel Guinier diffractometer with automated adjustment and settingsIhringer, J. et al. | 1993
- 35
-
Combining four-crystal seven-reflection and three-crystal five-reflection diffractometry for the characterization of ZnSe layers grown on GaAs by MOVPEKoppensteiner, E. / Ryan, T.W. / Heuken, M. / Söllner, J. et al. | 1993
- 35
-
Combining four-crystal seven-reflection and three-crystal five-reflection diffractrometry for the characterization of ZnSe layers grown on GaAs by MOVPEKoppensteiner, E. et al. | 1993
- 41
-
X-ray focusing by the zone plate in Laue geometrySnigirev, A.A. et al. | 1993
- 45
-
X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MSE growthBarnett, S.J. et al. | 1993
- 50
-
White beam synchrotron topography and rray diffractometry characterization of the crystalline quality of single-grain superalloys: influence of the solidification conditionsBellet, D. et al. | 1993
- 53
-
Towards a rigorous treatment of the wave-fiela propagation according to the statistical theory of dynamical diffractionChukhovskii, F.N. et al. | 1993
- 57
-
Study of the amorphization of ion-irradiated yttrium iron garnet by high-resolution diffraction techniquesCostantini, J.M. et al. | 1993
- 62
-
X-ray topographic study of defects in annealed siliconGronkowski, J. et al. | 1993
- 65
-
X-ray topography studies of the defect depth profile in processed silicon wafersHalfpenny, P.J. et al. | 1993
- 69
-
Synchrotron radiation topographic study of Ti-diffused and proton-exchanged LiNbO3 single crystalsHarasimowicz, T. et al. | 1993
- 73
-
Back-reflection topographic study of mixed cells in LEc-grown GaAs 0.2 at.% InMinari, F. et al. | 1993
- 76
-
X-ray study of dislocation structure formation features in epitaxial systems with small mismatchProkhorov, I.A. et al. | 1993
- 82
-
Microdefects investigated by x-ray topographyShulpina, I.L. et al. | 1993
- 86
-
X-ray scattering topographic study of lattice-mismatched compound semiconductor heteroepitaxial layersSuzuki, Y. et al. | 1993
-
X-ray topographic investigation of dislocations in Czochralski-grown alexandrite (BeAl~2O~4:Cr) single crystalZhang, Q. / Hu, B. / Deng, P. / Gan, F. et al. | 1993
- 92
-
X-ray topographic investigation of dislocations in Czochralski-grown alexandrite (BeAI2O4:Cr) single crystalZhang, Qiang et al. | 1993
- 98
-
In situ observatlons by synchrotron white beam x-ray topography of the planar, cellular and dendritic growths of a binary alloyGrange, G. et al. | 1993
- 102
-
Comparative study of the martensitic transformations of titanium and the shape memory alloy CuZnAlJourdan, C. et al. | 1993
- 107
-
In situ x-ray diffraction using high-energy synchrotron radiation: studies of the ADP(100) and (101) growth interfaces under aqueous solution flow conditionsRoberts, K.J. et al. | 1993
- 115
-
Observation by synchrotron radiation topography of the phase coexistence at the triple point in MnPSandonis, J. et al. | 1993
- 120
-
Synchrotron topography of phase transitions in perovskite-like crystalsDudley, M. et al. | 1993
- 126
-
Simulation of dislocation images in Bragg-case double crystal topographs of misfit dislocations in relaxed epitaxial layers of III-V semiconductorsCottrell, S. et al. | 1993
- 131
-
X-ray topographic contrast on dislocations with g bGemperlova, J. et al. | 1993
- 137
-
Contrast of device structures in x-ray section topographsHolland, A.J. et al. | 1993
- 142
-
Characterization of quantum wells by x-ray diffractionFewster, P.F. et al. | 1993
- 146
-
X-ray diffractometry of small defects in layered systemsHoly, V. et al. | 1993
- 151
-
X-ray scattering from multiple-layer structures forming Bragg-case interferometersTanner, B.K. et al. | 1993
- 156
-
Investigation of Si-Ge heterostructures by x-ray reflectometryBaribeau, J.-M. et al. | 1993
- 161
-
X-ray scattering and topography studies of Hg1 xMnxTe epitaxial filmsHallam, T.D. et al. | 1993
- 167
-
Structural characterization of GaAs-GaP superlatticesMazuelas, A. et al. | 1993
- 173
-
Characterization of III-V heteroepitaxial layers by x-ray diffractionPacherova, O. et al. | 1993
- 177
-
Simulation of x-ray diffraction curves from ion-implanted wafers and relaxed II-VI superlatticesPesek, A. et al. | 1993
- 181
-
X-ray diffraction determination of a semiconductor epilayer unit cell oriented and distorted arbitrarilyUsher, B.F. et al. | 1993
- 188
-
Determination of strain in epitaxial semiconductor layers by high-resolution x-ray diffractionSluis, P.van der et al. | 1993
- 192
-
Multisite occupancy in alkali-silicon(111) interface studied with xswCastrucci, P. et al. | 1993
- 197
-
Theoretical investigations of secondary emission yield and standing waves in curved crystals under dynamical Bragg diffraction of x-rays (Taupin problem)Vartanyantz, I.A. et al. | 1993
- 202
-
X-ray total external reflection fluorescence study of LB films on solid substrateZheludeva, S.I. et al. | 1993
- 206
-
X-ray standing waves in LSM for characterization of ultra-thin filmsZheludeva, S.I. et al. | 1993
- 507
-
A comparison of Monte Carlo simulations of electron scattering and X-ray production in solidsDing Ze-Jun / Wu Ziqin et al. | 1993
- 517
-
Anisotropic impedance boundary condition for a cylindrical conductor coated with a bi-isotropic mediumDajun Cheng / Weigan Lin / Yushen Zhao et al. | 1993
- 522
-
The relativistic fifth-order geometrical aberrations of a combined focusing-deflection systemYu Li / Shuangqi Kuang / Zhiqiang Feng / Tingyu Liu et al. | 1993
- 539
-
Chemical effects of 100 keV primary electrons in an e-beam sustained carbon dioxide laser dischargeD V Willetts / M R Harris et al. | 1993
- 546
-
Numerical investigation of CW CO2 laser with a fast turbulent flowM G Baeva / P A Atanasov et al. | 1993
- 552
-
Numerical modelling of fast-flow CO2 lasers. I. The modelR Rudolph / A Harendt / P Bisin / H Gundel et al. | 1993
- 560
-
Determination of gadolinium thermal conductivity using experimentally measured values of thermal diffusivityC Meis / A K Froment / D Moulinier et al. | 1993
- 563
-
A mathematical model of heat conduction in a prolate spheroidal coordinate system with applications to the theory of weldingN Postacioglu / P Kapadia / J Dowden et al. | 1993
- 574
-
Thermodynamics of spray evaporationS K Som / S K Dash et al. | 1993
- 585
-
Emission spectroscopy of the plasma in the cathode region of N2-H2 abnormal glow discharges for steel surface nitridingK Rusnak / J Vicek et al. | 1993
- 590
-
An improved analysis of the thermophoretic force on a small particle suspended in a rarefied plasmaXi Chen / Xin Tao et al. | 1993
- 590
-
An improved analysis of the thermophoretic force on a small particle suspended in a rarefield plasmaChen, X. / Tao, X. et al. | 1993
- 598
-
Simulations of side-wall profiles in reactive ion etchingP W May / D Field / D F Klemperer et al. | 1993
- 607
-
Experimental confirmation of positive-streamer-like mechanism for negative corona current pulse riseM Cernak / T Hosokawa / I Odrobina et al. | 1993
- 619
-
Fractal characteristics of electrical discharges: experiments and simulationN Femia / L Niemeyer / V Tucci et al. | 1993
- 628
-
Corona triode current-voltage characteristics: on effects possibly caused by the electronic componentG F Leal Ferreira / D L Chinaglia / J A Giacometti / O N Oliveira Jr et al. | 1993
- 634
-
A one-dimensional theory for the electrode sheaths of electric arcsR Morrow / J J Lowke et al. | 1993
- 643
-
A method to decrease the normal current density at the cathode of a glow dischargeV Nemchinsky et al. | 1993
- 647
-
Experimental and theoretical study of the CF4 DC glow discharge positive columnV N Volynets / A V Lukyanova / A T Rakhimov / D I Slovetsky / N V Suetin et al. | 1993
- 647
-
Experimental and theoretical study of the CF4 DC 910W discharge positive columnVolynets, V.N. et al. | 1993
- 657
-
Effect of a non-ideal state equation on the steady state critical flow characteristics in ablative capillariesD Zoler / S Cuperman / J Ashkenazy / M Caner / Z Kaplan et al. | 1993
- 667
-
Green function calculation of effective elastic constants of textured polycrystalline materialsT Dutta / T K Ballabh / T R Middya et al. | 1993
- 676
-
Electrical conduction in calcium yttrium titanium cobalt oxide Ca1-xYxTi1-xCoxO3 (xO Parkash / H S Tewari / V B Tare / D Kumar et al. | 1993
- 676
-
Electrical conduction in calcium yttrium titanium cobalt oxide Ca1 XYXT1-XCoxo3 (x< 0.15)Parkash, O. et al. | 1993
- 676
-
Electrical conduction in calcium yttrium titanium cobalt oxide Ca~1~-~xY~xTi~1~-~xCo~xO~3 (X 0.15)Parkash, O. / Tewari, H. S. / Tare, V. B. / Kumar, D. et al. | 1993
- 680
-
Conductive polymer films by reticulate doping with mixed valence polyiodides: comparison of three methods of preparationA Tracz / J K Jeszkat / M Kryszewski / H Strzelecka / M Veber / C Jallabert et al. | 1993
- 686
-
Out of plane axial reorganization and phase change in Langmuir-Blodgett films of a mesomorphic side chain polymerM Vandevyver / P Keller / M Rouillay / J -P Bourgoin / A Barraud et al. | 1993
- 690
-
Thermally stimulated discharge of electron-beam-and corona-charged polypropylene filmsG M Yang et al. | 1993
- 690
-
Thermally stimulated discharge of electron-beam- and corona-charged polyprolene filmsYang, G.M. et al. | 1993
- 694
-
On the peak shape method for the determination of activation energy in TSL and TSCR K Gartia / S Joychandra Singh / T S Chandra Singh / P S Mazumdar et al. | 1993
- 697
-
Field emission of electrons from glass tips with internal conducting coatsM S Mousa / D B Hibbert et al. | 1993
- 704
-
CdSxTe1-x films: preparation and propertiesR Pal / J Dutta / S Chaudhuri / A K Pal et al. | 1993
- 704
-
CdSxTe, x films: preparation and propertiesPal, R. et al. | 1993
- 711
-
Material transport in high-pressure diode sputteringE K Hollmann / A G Zaitsev et al. | 1993
- 713
-
Density of as-deposited and annealed thin silicon nitride filmsJ C Bruyere / C Savall / B Reynes / M Brunel / L Ortega et al. | 1993
- 717
-
Narrow angle emission from a lithium liquid metal ion sourceE Hesse / F K Naehring et al. | 1993
- A41
-
X-ray focusing by the zone plate in Laue geomerySnigirev, A.A. / Suvorov, A.Y. et al. | 1993
-
White beam synchrotron topography and gamma-ray diffractometry characterization of the crystalline quality of single-grain superalloys: influence of the solidification conditionsBellet, D. / Bastie, P. / Baruchel, J. et al. | 1993
-
In situ observations by synchrotron white beam x-ray topography of the planar, cellular and dendritic growths of a binary alloyGrange, G. / Jourdan, C. / Gastaldi, J. et al. | 1993
-
Towards a rigorous treatment of the wave-field propagation according to the statistical theory of dynamical diffractionChukhovskii, F. N. / Guigay, J. P. et al. | 1993
-
X-ray topographic contrast on dislocations with gb = OGemperlova, J. / Polcarova, M. / Bradler, J. et al. | 1993
-
Multisite occupancy in alkali/silicon(111) interface studies with xswCastrucci, P. / Lagomarsino, S. / Scarinci, F. / Giannini, C. et al. | 1993
-
Synchrotron topography of phase transition in perovskite-like crystalsDudley, M. / Yao, G.-D. et al. | 1993
-
X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growthBarnett, S. J. / Whitehouse, C. R. / Keir, A. M. / Clark, G. F. et al. | 1993