Interpretable resolution of 0.2 nm at 100 kV using electron holography (English)
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In:
Ultramicroscopy
;
58
, 1
; 79-86
;
1995
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ISSN:
- Article (Journal) / Print
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Title:Interpretable resolution of 0.2 nm at 100 kV using electron holography
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Contributors:
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Published in:Ultramicroscopy ; 58, 1 ; 79-86
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Publisher:
- New search for: Elsevier
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Place of publication:New York, NY [u.a.]
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Publication date:1995
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 42.03 / 42.03 / 33.05 / 33.05
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- New search for: 535/3040
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Keywords:
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Source:
Table of contents – Volume 58, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Instrumental factors in high-resolution FEG STEMHarrach, H.S.von et al. | 1995
- 6
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Detector geometry, thermal diffuse scattering and strain effects in ADF STEM imagingHillyard, S. et al. | 1995
- 18
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Imaging modes with an annular detector in STEMCowley, J.M. et al. | 1995
- 25
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X-ray emission spectrometry of phase separation in Pt-Rh nanoparticles for nitric oxide reductionLyman, C.E. et al. | 1995
- 35
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EDS and EELS using a TEM-FEG microscopeStadelmann, P. et al. | 1995
- 42
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PEELS compositional profiling and mapping at nanometer spatial resolutionTencé, M. et al. | 1995
- 55
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Electron energy-loss chemical imaging of polymer phasesHunt, J.A. et al. | 1995
- 65
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Studies of Mo-Si multilayers with coherent electron beamsGajdardziska-Josifouska, M. et al. | 1995
- 79
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Interpretable resolution of 0.2 nm at 100 kV using electron holographyHarscher, A. et al. | 1995
- 87
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Far-out-of-focus electron holography in a dedicated FEG STEMMankos, M. et al. | 1995
- 97
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Advanced electron holography: A new algorithm for image processing and a standardized quality test for the FEG electron microscopeVölkl, E. et al. | 1995
- 104
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Field-emission SEM imaging of compositional and doping layer semiconductor superlatticesPerovic, D.D. et al. | 1995
- 114
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On the breakdown of Friedel's Law for coherent microdiffraction from amorphous materialsHytch, M.J. et al. | 1995
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Foreword| 1995