Contents of Applied Physics B: Volume 61, Number 2, August 1995 (English)
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Applied physics / A
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61
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1995
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- Article (Journal) / Print
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Title:Contents of Applied Physics B: Volume 61, Number 2, August 1995
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Published in:Applied physics / A ; 61, 2 ; A5
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Publisher:
- New search for: Springer
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Place of publication:Berlin
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Publication date:1995
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 51.00 / 33.60 / 53.09
- Further information on Basic classification
- New search for: 020/3475/3485
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Classification:
BKL: 51.00 Werkstoffkunde: Allgemeines / 33.60 Kondensierte Materie: Allgemeines / 53.09 Werkstoffe der Elektrotechnik Local classification TIB: 020/3475/3485 -
Source:
Table of contents – Volume 61, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 101
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Multiple internal reflection spectroscopy of bonded silicon wafersReiche, M. / Hopfe, S. / Gösele, U. / Tong, Q. Y. et al. | 1995
- 107
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On the applicability of deep-level transient spectroscopy for the investigation of deep centers in silicon created by fast neutron irradiationHardalov, Ch. M. / Stefanov, K. D. / Sueva, D. et al. | 1995
- 111
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X-ray absorption spectroscopy study of pulsed-laser-evaporated amorphous carbon filmsGutiérrez, A. / Díaz, J. / López, M. F. et al. | 1995
- 115
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Determination of the impurity concentration in heavily doped inhomogeneous semiconductors from the measurement of the low-temperature conductivityShlimak, I. / Ussyshkin, R. / Resnick, L. / Ginodman, V. et al. | 1995
- 119
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The coupling of Cr to Fe studied by circular magnetic X-ray dichroismBöske, T. / Clemens, W. / Schmitz, D. / Kojnok, J. / Schäfer, M. / Cros, V. / Guo, G. Y. / Eberhardt, W. et al. | 1995
- 123
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Current spreading and series resistance of proton-implanted vertical-cavity top-surface-emitting lasersNakwaski, W. et al. | 1995
- 129
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Combined photoacoustic differential scanning calorimeter cell: Application to phase transitionsVassilev, Ts. / Velinov, Ts. / Avramov, I. / Surnev, S. et al. | 1995
- 135
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Light-induced defects in plasma-hydrogenated InP: ZnMierry, P. / Madelon, R. / Cruège, F. / Rizk, R. et al. | 1995
- 141
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Shifting of the thermal properties of amorphous germanium films upon relaxation and crystallizationSzyszko, W. / Vega, F. / Afonso, C. N. et al. | 1995
- 149
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Photoluminescence studies in bulk gallium antimonideDutta, P.S. / Koteswara Rao, K.S.R. / Bhat, H.L. / Kumar, V. et al. | 1995
- 153
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Three-dimensional damage distributions of molecular ions implanted into silicon, as recorded by RBS/channeling combined with tomographyMüller, M. / Fink, D. et al. | 1995
- 159
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Photothermal deflection spectroscopy of polymer thin filmsSo, S. K. / Chan, M. H. / Leung, L. M. et al. | 1995
- 163
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Dielectric and optical properties of C60 material studied by ellipsometry and quantitative IR and UV/VIS spectroscopyRichter, A. / Sturm, J. et al. | 1995
- 163
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Dielectric and optical properties of C~5~0 material studied by ellipsometry and quantitative IR and UV/VIS spectroscopyRichter, A. / Sturm, J. et al. | 1995
- 171
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Thermal Raman shift of the C60 tangentialA g modeHolz, L. / Pfeiffer, M. / Gaber, H. / Lau, A. et al. | 1995
- 171
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Thermal Raman shift of the C~6~0 tangenital A~g modeHolz, L. / Pfeiffer, M. / Gaber, H. / Lau, A. et al. | 1995
- 177
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Time-resolved spectroscopy and energy transfer in Pr3+-doped Gd2(SO4)3·8H2OBayer, E. / Leppert, J. / Grabmaier, B. C. / Blasse, G. et al. | 1995
- 183
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A new photopyroelectric scheme suitable for phase-transition investigations: The front configuration with semitransparent sensorDadarlat, D. / Frandas, A. / Marinelli, M. / Mercuri, F. / Bicanic, D. et al. | 1995
- 187
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Oxidation of Si(111) promoted by K multilayers: K and SiO2 islandsLamontagne, B. / Semond, F. / Adnot, A. / Guay, D. / Roy, D. et al. | 1995
- 193
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Optical absorption and electronic transport in ion-implantation-doped polycrystalline SiC filmsHellmich, W. / Müller, G. / Krötz, G. / Derst, G. / Kalbitzer, S. et al. | 1995
- 203
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On the interpretation of positron-annihilation data in powders and fine-grained materials. A Monte-Carlo simulationHübner, C. et al. | 1995
- 203
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On the interpretation of positron-annihilation data in powders and fine-grained materialsHübner, C. / Staab, T. / Krause-Rehberg, R. et al. | 1995
- 207
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Intrinsic and extrinsic defects in semiconductors studied by perturbed gg angular correlation spectroscopyWichert, Th et al. | 1995
- 207
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Intrinsic and extrinsic defects in semiconductors studied by perturbed γγ angular correlation spectroscopyWichert, Th. et al. | 1995
- 207
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Intrinsic and extrinsic defects in semiconductors studied by perturbed gammagamma angular correlation spectroscopyWichert, T. et al. | 1995
- 213
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Anion and cation vacancies in CdTeMeyer, B. K. / Hofmann, D. M. et al. | 1995
- 217
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Microstructural evolution of ZnS during sintering monitored by optical and positron annihilation techniquesAdams, M. / Mascher, P. / Kitai, A. H. et al. | 1995
- 221
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Depth profiling of copper thin films by resonant laser ablationAllen, T. M. / Kelly, P. B. / Anderson, J. E. / Taylor, T. N. / Nogar, N. S. et al. | 1995
- A5
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Forthcoming papers| 1995
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Contents of Applied Physics B: Volume 61, Number 2, August 1995| 1995