Effect of lateral morphology formation of polymer blend towards patterning silane-based SAMs using selective dissolution method (English)
- New search for: Pillai, Saju
- New search for: Pillai, Saju
- New search for: Krishna Pai, Ranjith
In:
Ultramicroscopy
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108
, 5
; 458-464
;
2008
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ISSN:
- Article (Journal) / Print
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Title:Effect of lateral morphology formation of polymer blend towards patterning silane-based SAMs using selective dissolution method
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Contributors:Pillai, Saju ( author ) / Krishna Pai, Ranjith
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Published in:Ultramicroscopy ; 108, 5 ; 458-464
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Publisher:
- New search for: Elsevier
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Place of publication:New York, NY [u.a.]
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Publication date:2008
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 42.03 / 42.03 / 33.05 / 33.05
- Further information on Basic classification
- New search for: 535/3040
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Keywords:
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Source:
Table of contents – Volume 108, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 393
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Mapping inelastic intensities in diffraction patterns of magnetic samples using the energy spectrum imaging techniqueWarot-Fonrose, B. / Houdellier, F. / Hÿtch, M.J. / Calmels, L. / Serin, V. / Snoeck, E. et al. | 2007
- 399
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Energy-loss near-edge structure (ELNES) and first-principles calculation of electronic structure of nickel silicide systemsKawasaki, Naohiko / Sugiyama, Naoyuki / Otsuka, Yuji / Hashimoto, Hideki / Tsujimoto, Masahiko / Kurata, Hiroki / Isoda, Seiji et al. | 2007
- 407
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Fringe contrast in inelastic LACBED holographySchattschneider, Peter / Verbeeck, Jo et al. | 2007
- 415
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A study in the computation time required for the inclusion of strain field effects in Bloch-wave simulations of TEM diffraction contrast imagesDulong, B.J. / Haynes, R.D. / Robertson, M.D. et al. | 2007
- 426
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New approach for the dynamical simulation of CBED patterns in heavily strained specimensHoudellier, F. / Altibelli, A. / Roucau, C. / Casanove, M.J. et al. | 2007
- 433
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Magnetic circular dichroism in EELS: Towards 10nm resolutionSchattschneider, Peter / Hébert, Cécile / Rubino, Stefano / Stöger-Pollach, Michael / Rusz, Ján / Novák, Pavel et al. | 2007
- 439
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Treating retardation effects in valence EELS spectra for Kramers–Kronig analysisStöger-Pollach, M. / Laister, A. / Schattschneider, P. et al. | 2007
- 445
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Coulomb interactions in Ga LMISRadlička, Tomáš / Lencová, Bohumila et al. | 2007
- 455
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Appendix to “Coulomb interactions in Ga LMIS” by Radlička and LencováForbes, Richard G. et al. | 2007
- 455
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Appendix to "Coulomb interactions in Ga LMIS" by Radlicka and LencovaForbes, R. G. et al. | 2008
- 458
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Effect of lateral morphology formation of polymer blend towards patterning silane-based SAMs using selective dissolution methodPillai, Saju / Krishna Pai, Ranjith et al. | 2007
- 465
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Multivariate statistical analysis of electron energy-loss spectroscopy in anisotropic materialsHu, Xuerang / Sun, Yuekui / Yuan, Jun et al. | 2007
- 472
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In-line holographic electron microscopy in the presence of external magnetic fieldsLivadaru, Lucian / Mutus, Josh / Wolkow, Robert A. et al. | 2007
- 481
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Influence of the overlap parameter on the convergence of the ptychographical iterative engineBunk, Oliver / Dierolf, Martin / Kynde, Søren / Johnson, Ian / Marti, Othmar / Pfeiffer, Franz et al. | 2007
- 488
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Reduction of electrical damage in specimens prepared using focused ion beam milling for dopant profiling using off-axis electron holographyCooper, David / Truche, Robert / Rouviere, Jean-Luc et al. | 2007
- 494
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Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfacesYu, Z. / Muller, D.A. / Silcox, J. et al. | 2007
- IFC
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IFC (Editorial Board)| 2008