17TH INTERNATIONAL WORKSHOP ON ROOM-TEMPERATURE SEMICONDUCTOR X- AND GAMMA-RAY DETECTORS - KNOXVILLE, TN, OCTOBER 30-NOVEMBER 6, 2010 - CZT AND CDTE DEVICE PERFORMANCE IMPROVEMENTS - Performance of a Large Volume 20x20x15 mm3 CPG Detector (English)
- New search for: Bolotnikov, A E
- New search for: Bolotnikov, A E
- New search for: Babalola, S
- New search for: Camarda, G S
- New search for: Cui, Y
- New search for: Egarievwe, S U
- New search for: Gul, R
- New search for: Hossain, A
- New search for: Kim, K H
- New search for: Mayo, D R
- New search for: Smith, M K
- New search for: Yang, G
- New search for: James, R B
In:
IEEE transactions on nuclear science
;
58
, 6
; 3167-3172
;
2011
-
ISSN:
- Article (Journal) / Print
-
Title:17TH INTERNATIONAL WORKSHOP ON ROOM-TEMPERATURE SEMICONDUCTOR X- AND GAMMA-RAY DETECTORS - KNOXVILLE, TN, OCTOBER 30-NOVEMBER 6, 2010 - CZT AND CDTE DEVICE PERFORMANCE IMPROVEMENTS - Performance of a Large Volume 20x20x15 mm3 CPG Detector
-
Contributors:Bolotnikov, A E ( author ) / Babalola, S / Camarda, G S / Cui, Y / Egarievwe, S U / Gul, R / Hossain, A / Kim, K H / Mayo, D R / Smith, M K
-
Published in:IEEE transactions on nuclear science ; 58, 6 ; 3167-3172
-
Publisher:
- New search for: IEEE
-
Place of publication:New York, NY
-
Publication date:2011
-
ISSN:
-
ZDBID:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 770/3450/5540
- New search for: 33.40
- Further information on Basic classification
-
Keywords:
-
Classification:
Local classification TIB: 770/3450/5540 BKL: 33.40 Kernphysik -
Source:
Table of contents – Volume 58, Issue 6
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2537
-
Table of contents| 2011
- 2542
-
Editorial Conference Comments by the General ChairChesnut, Kay et al. | 2011
- 2545
-
2011 Special NSREC Issue of the IEEE Transactions on Nuclear Science Comments by the EditorsSchwank, Jim / Marshall, Paul / Brown, Dennis / Pease, Ron / Girard, Sylvain / Gouker, Pascale / Gerardin, Simone et al. | 2011
- 2546
-
2011 December Special NSREC Issue of the IEEE Transactions on Nuclear Science List of Reviewers| 2011
- 2546
-
LIST OF REVIEWERS - 2011 December Special NSREC Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE List of Reviewers| 2011
- 2548
-
2011 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the ChairmanLadbury, Ray et al. | 2011
- 2548
-
AWARDS - 2011 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the ChairmanLadbury, R et al. | 2011
- 2550
-
Outstanding Conference Paper Award 2011 IEEE Nuclear and Space Radiation Effects Conference| 2011
- 2552
-
In Memoriam| 2011
- 2552
-
IN MEMORIAM - James L. Ramsey| 2011
- 2553
-
Edward Cutrer Smith| 2011
- 2554
-
Al (Elgius A.) Wolicki| 2011
- 2555
-
SET Characterization in Logic Circuits Fabricated in a 3DIC TechnologyGouker, P. M. / Tyrrell, B. / Renzi, M. / Chenson Chen, / Wyatt, P. / Ahlbin, J. R. / Weeden-Wright, S. / Atkinson, N. M. / Gaspard, N. J. / Bhuva, B. L. et al. | 2011
- 2555
-
SESSION A: BASIC SINGLE-EVENT EFFECTS: TRANSIENT CHARACTERIZATION - SET Characterization in Logic Circuits Fabricated in a 3DIC TechnologyGouker, P M et al. | 2011
- 2563
-
Laser- and Heavy Ion-Induced Charge Collection in Bulk FinFETsEl-Mamouni, F. / Zhang, E. X. / Pate, N. D. / Hooten, N. / Schrimpf, R. D. / Reed, R. A. / Galloway, K. F. / McMorrow, D. / Warner, J. / Simoen, E. et al. | 2011
- 2570
-
Investigation and Mitigation of Analog SET on a Bandgap Reference in Triple-Well CMOS Using Pulsed Laser TechniquesZanchi, A. / Buchner, S. / Hafer, C. / Hisano, S. / Kerwin, D. B. et al. | 2011
- 2578
-
Effect of Transistor Density and Charge Sharing on Single-Event Transients in 90-nm Bulk CMOSAtkinson, N. M. / Ahlbin, J. R. / Witulski, A. F. / Gaspard, N. J. / Holman, W. T. / Bhuva, B. L. / Zhang, E. X. / Li Chen, / Massengill, L. W. et al. | 2011
- 2585
-
Influence of N-Well Contact Area on the Pulse Width of Single-Event TransientsAhlbin, J. R. / Atkinson, N. M. / Gadlage, M. J. / Gaspard, N. J. / Bhuva, B. L. / Loveless, T. D. / Zhang, E. X. / Chen, L. / Massengill, L. W. et al. | 2011
- 2591
-
SESSION B: SINGLE-EVENT EFFECTS: MECHANISMS AND MODELING - The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell UpsetsClemens, M A et al. | 2011
- 2591
-
The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell UpsetsClemens, M. A. / Sierawski, B. D. / Warren, K. M. / Mendenhall, M. H. / Dodds, N. A. / Weller, R. A. / Reed, R. A. / Dodd, P. E. / Shaneyfelt, M. R. / Schwank, J. R. et al. | 2011
- 2599
-
Combining GEANT4 and TIARA for Neutron Soft Error-Rate Prediction of 65 nm Flip-FlopsUznanski, S. / Gasiot, G. / Roche, P. / Semikh, S. / Autran, J-L et al. | 2011
- 2607
-
Monte Carlo Prediction of Heavy Ion Induced MBU Sensitivity for SOI SRAMs Using Radial Ionization ProfileRaine, M. / Hubert, G. / Gaillardin, M. / Paillet, P. / Bournel, A. et al. | 2011
- 2614
-
Impact of Well Structure on Single-Event Well Potential Modulation in Bulk CMOSGaspard, N. J. / Witulski, A. F. / Atkinson, N. M. / Ahlbin, J. R. / Holman, W. T. / Bhuva, B. L. / Loveless, T. D. / Massengill, L. W. et al. | 2011
- 2621
-
Angular Dependence of Heavy-Ion Induced Errors in Floating Gate MemoriesGerardin, S. / Bagatin, M. / Paccagnella, A. / Visconti, A. / Bonanomi, M. / Beltrami, S. et al. | 2011
- 2628
-
Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETsLauenstein, J.-M / Goldsman, N. / Liu, S. / Titus, J. L. / Ladbury, R. L. / Kim, H. S. / Phan, A. M. / LaBel, K. A. / Zafrani, M. / Sherman, P. et al. | 2011
- 2637
-
Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser TestingFaraud, E. / Pouget, V. / Shao, K. / Larue, C. / Darracq, F. / Lewis, D. / Samaras, A. / Bezerra, F. / Lorfevre, E. / Ecoffet, R. et al. | 2011
- 2644
-
In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational EstimationsArtola, L. / Velazco, R. / Hubert, G. / Duzellier, S. / Nuns, T. / Guerard, B. / Peronnard, P. / Mansour, W. / Pancher, F. / Bezerra, F. et al. | 2011
- 2652
-
Heavy Ion Characterization and Monte Carlo Simulation on 32 nm CMOS Bulk TechnologyUznanski, S. / Gasiot, G. / Roche, P. / Autran, J. / Dugoujon, L. et al. | 2011
- 2658
-
Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-FlopsKauppila, A. V. / Bhuva, B. L. / Massengill, L. W. / Holman, W. T. / Ball, D. R. et al. | 2011
- 2664
-
Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer DevicesRaine, M. / Gaillardin, M. / Paillet, P. / Duhamel, O. / Girard, S. / Bournel, A. et al. | 2011
- 2673
-
Role of Process Variation in the Radiation Response of FGMOS DevicesMcNulty, P. J. / Poole, K. F. / Scheick, L. Z. / Sushan Yow, et al. | 2011
- 2680
-
Circuit-Level Layout-Aware Single-Event Sensitive-Area Analysis of 40-nm Bulk CMOS Flip-Flops Using Compact ModelingKauppila, J. S. / Haeffner, T. D. / Ball, D. R. / Kauppila, A. V. / Loveless, T. D. / Jagannathan, S. / Sternberg, A. L. / Bhuva, B. L. / Massengill, L. W. et al. | 2011
- 2687
-
SESSION C: SINGLE-EVENT EFFECTS: DEVICES AND INTEGRATED CIRCUITS - Single Event Effects in Power MOSFETs Due to Atmospheric and Thermal NeutronsHands, A et al. | 2011
- 2687
-
Single Event Effects in Power MOSFETs Due to Atmospheric and Thermal NeutronsHands, A. / Morris, P. / Ryden, K. / Dyer, C. / Truscott, P. / Chugg, A. / Parker, S. et al. | 2011
- 2695
-
Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic ChainsDodd, P. E. / Shaneyfelt, M. R. / Flores, R. S. / Schwank, J. R. / Hill, T. A. / McMorrow, D. / Vizkelethy, G. / Swanson, S. E. / Dalton, S. M. et al. | 2011
- 2702
-
32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI LatchesRodbell, K. P. / Heidel, D. F. / Pellish, J. A. / Marshall, P. W. / Tang, H. H. K. / Murray, C. E. / LaBel, K. A. / Gordon, M. S. / Stawiasz, K. G. / Schwank, J. R. et al. | 2011
- 2711
-
The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy ProtonsSeifert, N. / Gill, B. / Pellish, J. A. / Marshall, P. W. / LaBel, K. A. et al. | 2011
- 2719
-
Comparison of Combinational and Sequential Error Rates for a Deep Submicron ProcessMahatme, N. N. / Jagannathan, S. / Loveless, T. D. / Massengill, L. W. / Bhuva, B. L. / Wen, S.-J / Wong, R. et al. | 2011
- 2726
-
Predicting the Single-Event Error Rate of a Radiation Hardened by Design MicroprocessorCabanas-Holmen, M. / Cannon, E. H. / Amort, T. / Ballast, J. / Brees, R. / Fischer, S. / Kleinosowski, A. J. / Meaker, B. / Swann, T. / Wert, J. et al. | 2011
- 2734
-
Single-Event Damages Caused by Heavy Ions Observed in AlGaN/GaN HEMTsKuboyama, S. / Maru, A. / Shindou, H. / Ikeda, N. / Hirao, T. / Abe, H. / Tamura, T. et al. | 2011
- 2739
-
Numerical and Experimental Investigation of Single Event Effects in SOI Lateral Power MOSFETsShea, P. M. / Shen, Z. J. et al. | 2011
- 2748
-
Development of Monte Carlo Modeling for Neutron-Induced Failures of Trench FieldStop IGBTForo, L. L. / Touboul, A. D. / Wrobel, F. / Saigne, F. et al. | 2011
- 2755
-
Single Event Effects in 90-nm Phase Change MemoriesGerardin, S. / Bagatin, M. / Paccagnella, A. / Visconti, A. / Bonanomi, M. / Pellizzer, F. / Vela, M. / Ferlet-Cavrois, V. et al. | 2011
- 2761
-
Single-Event Charge Collection and Upset in 40-nm Dual- and Triple-Well Bulk CMOS SRAMsChatterjee, I. / Narasimham, B. / Mahatme, N. N. / Bhuva, B. L. / Schrimpf, R. D. / Wang, J. K. / Bartz, B. / Pitta, E. / Buer, M. et al. | 2011
- 2768
-
Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex CircuitsPagliarini, S. / Kastensmidt, F. / Entrena, L. / Lindoso, A. / Millan, E. S. et al. | 2011
- 2776
-
Simulation of the Radiation Environment Near Europa Using the Geant4-Based PLANETOCOSMICS-J ModelTruscott, P. / Heynderickx, D. / Sicard-Piet, A. / Bourdarie, S. et al. | 2011
- 2776
-
SESSION D: SPACE AND TERRESTRIAL ENVIRONMENTS - Simulation of the Radiation Environment Near Europa Using the Geant4-Based PLANETOCOSMICS-J ModelTruscott, P et al. | 2011
- 2785
-
The Interplanetary Electron Model (IEM)Taylor, B. / Vacanti, G. / Maddox, E. / Underwood, C. I. et al. | 2011
- 2793
-
Effect of the Uranium Decay Chain Disequilibrium on Alpha Disintegration RateGedion, M. / Wrobel, F. / Saigne, F. / Portier, M. / Touboul, A. D. / Schrimpf, R. D. et al. | 2011
- 2798
-
Analytical Modeling of Alpha-Particle Emission Rate at Wafer-LevelMartinie, S. / Autran, J. L. / Munteanu, D. / Wrobel, F. / Gedion, M. / Saigne, F. et al. | 2011
- 2804
-
On-Orbit Error Rates of RHBD SRAMs: Comparison of Calculation Techniques and Space Environmental Models With Observed PerformanceBogorad, A. L. / Likar, J. J. / Lombardi, R. E. / Stone, S. E. / Herschitz, R. et al. | 2011
- 2807
-
Enhanced Radiation-Induced Narrow Channel Effects in Commercial ${\hbox {0.18}}~\mu$ m Bulk TechnologyGaillardin, M. / Goiffon, V. / Girard, S. / Martinez, M. / Magnan, P. / Paillet, P. et al. | 2011
- 2807
-
SESSION E: RADIATION EFFECTS IN DEVICES AND INTEGRATED CIRCUITS - Enhanced Radiation-Induced Narrow Channel Effects in Commercial 0.18 μm Bulk TechnologyGaillardin, M et al. | 2011
- 2807
-
Enhanced Radiation-Induced Narrow Channel Effects in Commercial Formula Not Shown m Bulk TechnologyGaillardin, M. / Goiffon, V. / Girard, S. / Martinez, M. / Magnan, P. / Paillet, P. et al. | 2011
- 2816
-
Dose Rate Effects in Linear Bipolar TransistorsJohnston, A. / Swimm, R. / Harris, R. D. / Thorbourn, D. et al. | 2011
- 2824
-
Effects of Total Ionizing Dose on the Retention of 41-nm NAND Flash CellsBagatin, M. / Gerardin, S. / Paccagnella, A. / Visconti, A. / Beltrami, S. / Bertuccio, M. / Czeppel, L. T. et al. | 2011
- 2830
-
Trade-Offs Between RF Performance and Total-Dose Tolerance in 45-nm RF-CMOSArora, R. / En Xia Zhang, / Seth, S. / Cressler, J. D. / Fleetwood, D. M. / Schrimpf, R. D. / Rosa, G. L. / Sutton, A. K. / Nayfeh, H. M. / Freeman, G. et al. | 2011
- 2838
-
Impact of Alpha Particles on the Electrical Characteristics of TiO$_{2}$ MemristorsBarnaby, H. J. / Malley, S. / Land, M. / Charnicki, S. / Kathuria, A. / Wilkens, B. / DeIonno, E. / Tong, W. et al. | 2011
- 2838
-
Impact of Alpha Particles on the Electrical Characteristics of TiO Formula Not Shown MemristorsBarnaby, H. J. / Malley, S. / Land, M. / Charnicki, S. / Kathuria, A. / Wilkens, B. / DeIonno, E. / Tong, W. et al. | 2011
- 2845
-
Radiation Effects in 3D Integrated SOI SRAM CircuitsGouker, P. M. / Tyrrell, B. / D'Onofrio, R. / Wyatt, P. / Soares, T. / Weilin Hu, / Chenson Chen, / Schwank, J. R. / Shaneyfelt, M. R. / Blackmore, E. W. et al. | 2011
- 2855
-
Analyzing the Effects of TID in an Embedded System Running in a Flash-Based FPGATarrillo, J. / Azambuja, J. R. / Kastensmidt, F. L. / Fonseca, E. C. P. / Galhardo, R. / Goncalez, O. et al. | 2011
- 2863
-
Characterization and Modeling of Parasitic Field-Oxide Transistors for Use in Radiation Hardening by DesignSchlenvogt, G. J. / Barnaby, H. J. / Rollins, J. D. / Wilkinson, J. / Morrison, S. / Tyler, L. et al. | 2011
- 2871
-
Fin Width and Bias Dependence of the Response of Triple-Gate MOSFETs to Total Dose IrradiationJae-Joon Song, / Bo Kyoung Choi, / En Xia Zhang, / Schrimpf, R. D. / Fleetwood, D. M. / Chan-Hoon Park, / Yoon-Ha Jeong, / Ohyun Kim, et al. | 2011
- 2876
-
Including Radiation Effects and Dependencies on Process-Related Variability in Advanced Foundry SPICE Models Using a New Physical Model and Parameter Extraction ApproachLi, M. / Li, Y. F. / Wu, Y. J. / Cai, S. / Zhu, N. Y. / Rezzak, N. / Schrimpf, R. D. / Fleetwood, D. M. / Wang, J. Q. / Cheng, X. X. et al. | 2011
- 2883
-
TID in a Switched-Capacitor FPAA: Degradation and Partial Inactivity Windows Due to Compensating Effects in MOS TransistorsBalen, T. R. / Vaz, R. G. / Cardoso, G. S. / Goncalez, O. L. / Lubaszewski, M. S. et al. | 2011
- 2890
-
Study of Synergism Effect Between TID and ATREE on the Response of the LM124 Operational AmplifierRoche, N. J.-H / Perez, S. / Mekki, J. / Velo, Y. G. / Dusseau, L. / Boch, J. / Vaille, J.-R / Saigne, F. / Marec, R. / Calvel, P. et al. | 2011
- 2898
-
Creation of Individual Defects at Extremely High Proton Fluences in Carbon Nanotube $p{-}n$ DiodesComfort, E. S. / Fishman, M. / Malapanis, A. / Hughes, H. / McMarr, P. / Cress, C. D. / Bakhru, H. / Ji Ung Lee, et al. | 2011
- 2898
-
Creation of Individual Defects at Extremely High Proton Fluences in Carbon Nanotube Formula Not Shown DiodesComfort, E. S. / Fishman, M. / Malapanis, A. / Hughes, H. / McMarr, P. / Cress, C. D. / Bakhru, H. / Lee, J. U. et al. | 2011
- 2904
-
Effect of Radiation Exposure on the Retention of Commercial NAND Flash MemoryOldham, T. R. / Chen, D. / Friendlich, M. / Carts, M. A. / Seidleck, C. M. / LaBel, K. A. et al. | 2011
- 2911
-
Near-UV Irradiation Effects on Pentacene-Based Organic Thin Film TransistorsWrachien, N. / Cester, A. / Bari, D. / Kovac, J. / Jakabovic, J. / Donoval, D. / Meneghesso, G. et al. | 2011
- 2918
-
SESSION F: BASIC MECHANISMS OF RADIATION EFFECTS - Radiation-Induced Defect Evolution and Electrical Degradation of A1GaN/GaN High-Electron-Mobility TransistorsPuzyrev, Y S et al. | 2011
- 2918
-
Radiation-Induced Defect Evolution and Electrical Degradation of AlGaN/GaN High-Electron-Mobility TransistorsPuzyrev, Y. S. / Roy, T. / Zhang, E. X. / Fleetwood, D. M. / Schrimpf, R. D. / Pantelides, S. T. et al. | 2011
- 2925
-
Effects of Bias on the Irradiation and Annealing Responses of 4H-SiC MOS DevicesCher Xuan Zhang, / En Xia Zhang, / Fleetwood, D. M. / Schrimpf, R. D. / Dhar, S. / Sei-Hyung Ryu, / Xiao Shen, / Pantelides, S. T. et al. | 2011
- 2930
-
Mechanisms of Interface Trap Buildup and Annealing During Elevated Temperature IrradiationHughart, D. R. / Schrimpf, R. D. / Fleetwood, D. M. / Tuttle, B. R. / Pantelides, S. T. et al. | 2011
- 2937
-
A Quantitative Model for ELDRS and H2 Degradation Effects in Irradiated Oxides Based on First Principles CalculationsRowsey, N L et al. | 2011
- 2937
-
A Quantitative Model for ELDRS and ${\rm H}_{2}$ Degradation Effects in Irradiated Oxides Based on First Principles CalculationsRowsey, N. L. / Law, M. E. / Schrimpf, R. D. / Fleetwood, D. M. / Tuttle, B. R. / Pantelides, S. T. et al. | 2011
- 2937
-
A Quantitative Model for ELDRS and Formula Not Shown Degradation Effects in Irradiated Oxides Based on First Principles CalculationsRowsey, N. L. / Law, M. E. / Schrimpf, R. D. / Fleetwood, D. M. / Tuttle, B. R. / Pantelides, S. T. et al. | 2011
- 2945
-
Modeling Low Dose Rate Effects in Shallow Trench Isolation OxidesEsqueda, I. S. / Barnaby, H. J. / Adell, P. C. / Rax, B. G. / Hjalmarson, H. P. / McLain, M. L. / Pease, R. L. et al. | 2011
- 2953
-
Evaluation of ELDRS Mechanisms Using Dose Rate Switching Experiments on Gated Lateral PNP TransistorsGonzalez-Velo, Y. / Boch, J. / Saigne, F. / Roche, N. J. / Perez, S. / Vaille, J. / Deneau, C. / Dusseau, L. / Lorfevre, E. / Schrimpf, R. D. et al. | 2011
- 2961
-
Low-Energy X-ray and Ozone-Exposure Induced Defect Formation in Graphene Materials and DevicesEn Xia Zhang, / Newaz, A. K. M. / Bin Wang, / Bhandaru, S. / Zhang, C. X. / Fleetwood, D. M. / Bolotin, K. I. / Pantelides, S. T. / Alles, M. L. / Schrimpf, R. D. et al. | 2011
- 2968
-
SESSION G: HARDNESS ASSURANCE - Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMsSchwank, J R et al. | 2011
- 2968
-
Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMsSchwank, J. R. / Shaneyfelt, M. R. / Dodd, P. E. / McMorrow, D. / Warner, J. H. / Ferlet-Cavrois, V. / Gouker, P. M. / Melinger, J. S. / Pellish, J. A. / Rodbell, K. P. et al. | 2011
- 2976
-
Variable Depth Bragg Peak Method for Single Event Effects TestingBuchner, S. / Kanyogoro, N. / McMorrow, D. / Foster, C. C. / O'Neill, P. M. / Nguyen, K. V. et al. | 2011
- 2983
-
Enhanced Low Dose Rate Sensitivity at Ultra-Low Dose RatesDakai Chen, / Pease, R. / Kruckmeyer, K. / Forney, J. / Phan, A. / Carts, M. / Cox, S. / Burns, S. / Albarian, R. / Holcombe, Bruce et al. | 2011
- 2991
-
Effects of Ion Species on SEB Failure Voltage of Power DMOSFETLiu, S. / Lauenstein, Jean-Marie / Ferlet-Cavrois, V. / Marec, R. / Hernandez, F. / Scheick, L. / Bezerra, F. / Muschitiello, M. / Poivey, C. / Sukhaseum, N. et al. | 2011
- 2998
-
ELDRS: Optimization Tools for the Switched Dose Rate TechniqueBoch, J. / Gonzalez Velo, Y. / Saigne, F. / Roche, N. J-H / Perez, S. / Schrimpf, R. D. / Vaille, J-R / Dusseau, L. / Mekki, J. / Lorfevre, E. et al. | 2011
- 3004
-
A Bayesian Approach for Total Ionizing Dose Hardness AssuranceLadbury, R. / Triggs, B. et al. | 2011
- 3011
-
SESSION H: HARDENING BY DESIGN - An SET-Free, All-Digital Controlled Point-of-Load Regulator for Next-Generation Power Systems: ADC-POLAdell, P C et al. | 2011
- 3011
-
An SET-Free, All-Digital Controlled Point-of-Load Regulator for Next-Generation Power Systems: ADC-POLAdell, P. C. / Tao Liu, / Vermeire, B. / Bakkaloglu, B. / Aveline, D. et al. | 2011
- 3018
-
A Dual Mode Redundant Approach for Microprocessor Soft Error HardnessClark, L. T. / Patterson, D. W. / Hindman, N. D. / Holbert, K. E. / Maurya, S. / Guertin, S. M. et al. | 2011
- 3026
-
Design Framework for Soft-Error-Resilient Sequential CellsLee, H.-H K. / Lilja, K. / Bounasser, M. / Linscott, I. / Inan, U. et al. | 2011
- 3033
-
Single-Event Tolerant Flip-Flop Design in 40-nm Bulk CMOS TechnologyJagannathan, S. / Loveless, T. D. / Bhuva, B. L. / Wen, S. / Wong, R. / Sachdev, M. / Rennie, D. / Massengill, L. W. et al. | 2011
- 3038
-
A Study of Total Dose Mitigation Approaches for Charge Pumps in Phase-Locked Loop ApplicationsHorst, S. J. / Phillips, S. D. / Cressler, J. D. / Kruckmeyer, K. / Eddy, R. / Aude, A. / O'Farrell, P. / Benyong Zhang, / Wilcox, E. / LaBel, K. et al. | 2011
- 3046
-
Fully Automated, Testable Design of Fine-Grained Triple Mode Redundant LogicHindman, N. D. / Clark, L. T. / Patterson, D. W. / Holbert, K. E. et al. | 2011
- 3053
-
An Area-Efficient 65 nm Radiation-Hard Dual-Modular Flip-Flop to Avoid Multiple Cell UpsetsYamamoto, R. / Hamanaka, C. / Furuta, J. / Kobayashi, K. / Onodera, H. et al. | 2011
- 3060
-
RHBD Bias Circuits Utilizing Sensitive Node Active Charge CancellationBlaine, R. W. / Armstrong, S. E. / Kauppila, J. S. / Atkinson, N. M. / Olson, B. D. / Holman, W. T. / Massengill, L. W. et al. | 2011
- 3067
-
In-Orbit Measurement of SET and DD Effects on Optical Wireless Links for Intra-Satellite Data TransmissionArruego, I. / Martinez, J. / Guerrero, H. et al. | 2011
- 3067
-
SESSION I: PHOTONIC DEVICES AND INTEGRATED CIRCUITS - In-Orbit Measurement of SET and DD Effects on Optical Wireless Links for Intra-Satellite Data TransmissionArruego, I et al. | 2011
- 3076
-
Generic Radiation Hardened Photodiode Layouts for Deep Submicron CMOS Image Sensor ProcessesGoiffon, V. / Cervantes, P. / Virmontois, C. / Corbiere, F. / Magnan, P. / Estribeau, M. et al. | 2011
- 3085
-
Total Ionizing Dose Versus Displacement Damage Dose Induced Dark Current Random Telegraph Signals in CMOS Image SensorsVirmontois, C. / Goiffon, V. / Magnan, P. / Saint-Pe, O. / Girard, S. / Petit, S. / Rolland, G. / Bardoux, A. et al. | 2011
- 3095
-
Radiation Effects on a Potential Scintillation-Based Solid-State Spectrometer Prototype for Compact Monitoring of Space Radiation/Weather Satellite ConditionsWhitney, C. M. / Chen, X. J. / Johnson, E. / Staples, C. J. / Chapman, E. / Alberghini, G. / Rines, R. / Loef, E. V. / Glodo, J. / Shah, K. et al. | 2011
- 3103
-
Radiation Damage Studies of Lasers and Photodiodes for Use in Multi-Gb/s Optical Data LinksTroska, J. / Detraz, S. / El Nasr-Storey, S. S. / Stejskal, P. / Sigaud, C. / Soos, C. / Vasey, F. et al. | 2011
- 3111
-
Single-Event Upsets in Photoreceivers for Multi-Gb/s SLHC Data TransmissionEl Nasr-Storey, S. S. / Detraz, S. / Ping Gui, / Menouni, M. / Moreira, P. / Papadopoulos, S. / Sigaud, C. / Soos, C. / Stejskal, P. / Troska, J. et al. | 2011
- 3118
-
SESSION J: DOSIMETRY - Correlation of Telemetered Solar Array Data With Particle Detector Data On GPS SpacecraftMessenger, S R et al. | 2011
- 3118
-
Correlation of Telemetered Solar Array Data With Particle Detector Data On GPS SpacecraftMessenger, S. R. / Jackson, E. M. / Warner, J. H. / Walters, R. J. / Cayton, T. E. / Yue Chen, / Friedel, R. W. / Kippen, R. M. / Reed, B. et al. | 2011
- 3126
-
Impact of Spacecraft-Shell Composition on 1 GeV/Nucleon Formula Not Shown Fe Ion-Fragmentation and Dose ReductionSilvestri, M. / Tracino, E. / Briccarello, M. / Belluco, M. / Destefanis, R. / Lobascio, C. / Durante, M. / Santin, G. / Schrimpf, R. D. et al. | 2011
- 3126
-
Impact of Spacecraft-Shell Composition on 1 GeV/Nucleon ${}^{56}$ Fe Ion-Fragmentation and Dose ReductionSilvestri, M. / Tracino, E. / Briccarello, M. / Belluco, M. / Destefanis, R. / Lobascio, C. / Durante, M. / Santin, G. / Schrimpf, R. D. et al. | 2011
- 3134
-
Validation of Nuclear Reaction Codes for Proton-Induced Radiation Effects: The Case for CEM03Sabra, M. S. / Weller, R. A. / Mendenhall, M. H. / Reed, R. A. / Clemens, M. A. / Barghouty, A. F. et al. | 2011
- 3139
-
Effects of Metal Gates and Back-End-of-Line Materials on X-Ray Dose in HfO2 Gate OxideDasgupta, A et al. | 2011
- 3139
-
Effects of Metal Gates and Back-End-of-Line Materials on X-Ray Dose in ${\rm HfO}_{2}$ Gate OxideDasgupta, A. / Fleetwood, D. M. / Reed, R. A. / Weller, R. A. / Mendenhall, M. H. et al. | 2011
- 3139
-
Effects of Metal Gates and Back-End-of-Line Materials on X-Ray Dose in Formula Not Shown Gate OxideDasgupta, A. / Fleetwood, D. M. / Reed, R. A. / Weller, R. A. / Mendenhall, M. H. et al. | 2011
- 3145
-
Characterizing the Uncertainty in Dosimetry Using Data From Multiple TestsMorris, R. D. / Foster, C. C. et al. | 2011
- 3152
-
Conference Author Index| 2011
- 3156
-
IEEE Foundation| 2011
- 3158
-
17TH REAL TIME CONFERENCE (RT2010) - LISBON, PORTUGAL, MAY 24-28, 2010 - New EPICS Channel Archiver Based on MDSplus Data SystemManduchi, G et al. | 2011
- 3158
-
New EPICS Channel Archiver Based on MDSplus Data SystemManduchi, G. / Luchetta, A. / Taliercio, C. / Soppelsa, A. / Barbalace, A. et al. | 2011
- 3162
-
Performance Comparison of EPICS IOC and MARTe in a Hard Real-Time Control ApplicationBarbalace, A. / Manduchi, G. / Neto, A. / De Tommasi, G. / Sartori, F. / Valcarcel, D. F. et al. | 2011
- 3167
-
Performance of a Large Volume 20 $\times$20$\times$ 15 mm$^{3}$ CPG DetectorBolotnikov, A. E. / Babalola, S. / Camarda, G. S. / Cui, Y. / Egarievwe, S. U. / Gul, R. / Hossain, A. / Kim, K. H. / Mayo, D. R. / Smith, M. K. et al. | 2011
- 3167
-
Performance of a Large Volume 20 Formula Not Shown 20 Formula Not Shown 15 mm Formula Not Shown CPG DetectorBolotnikov, A. E. / Babalola, S. / Camarda, G. S. / Cui, Y. / Egarievwe, S. U. / Gul, R. / Hossain, A. / Kim, K. H. / Mayo, D. R. / Smith, M. K. et al. | 2011
- 3167
-
17TH INTERNATIONAL WORKSHOP ON ROOM-TEMPERATURE SEMICONDUCTOR X- AND GAMMA-RAY DETECTORS - KNOXVILLE, TN, OCTOBER 30-NOVEMBER 6, 2010 - CZT AND CDTE DEVICE PERFORMANCE IMPROVEMENTS - Performance of a Large Volume 20x20x15 mm3 CPG DetectorBolotnikov, A E et al. | 2011
- 3172
-
CZT AND CDTE GROWTH AND CHARACTERIZATION - Polarization Study of Defect Structure of CdTe Radiation DetectorsGrill, R et al. | 2011
- 3172
-
Polarization Study of Defect Structure of CdTe Radiation DetectorsGrill, R. / Belas, E. / Franc, J. / Bugar, M. / Uxa, S. / Moravec, P. / Hoschl, P. et al. | 2011
- 3182
-
Flatfield Correction Optimization for Energy Selective X-Ray Imaging With Medipix3Procz, S. / Pichotka, M. / Lubke, J. / Hamann, E. / Ballabriga, R. / Blaj, G. / Campbell, M. / Fauler, A. / Mix, M. / Zwerger, A. et al. | 2011
- 3182
-
MEDICAL APPLICATIONS AND IMAGING - Flatfield Correction Optimization for Energy Selective X-Ray Imaging With Medipix3Procz, S et al. | 2011
- 3190
-
SAFEGUARDS, MONITORING, AND INTERNATIONAL SECURITY - Multidimensional Data Processing Methods for Material Discrimination Using an Ideal X-Ray Spectrometric Photon Counting DetectorBeldjoudi, G et al. | 2011
- 3190
-
Multidimensional Data Processing Methods for Material Discrimination Using an Ideal X-Ray Spectrometric Photon Counting DetectorBeldjoudi, G. / Rebuffel, V. / Verger, L. / Kaftandjian, V. / Rinkel, J. et al. | 2011
- 3204
-
An Amplifier for Bolometric DetectorsArnaboldi, C. / Giachero, A. / Gotti, C. / Maino, M. / Pessina, G. et al. | 2011
- 3204
-
REGULAR PAPERS - ANALOG AND DIGITAL CIRCUITS - An Amplifier for Bolometric DetectorsArnaboldi, C et al. | 2011
- 3212
-
Development of an Eight-Channel Time-Based Readout ASIC for PET ApplicationsZhi Deng, / Lan, A. K. / Xishan Sun, / Bircher, C. / Yinong Liu, / Yiping Shao, et al. | 2011
- 3219
-
Ionization Cross Sections for Low Energy Electron TransportHee Seo, / Pia, M. G. / Saracco, P. / Chan Hyeong Kim, et al. | 2011
- 3219
-
COMPUTING, SIMULATION, ALGORITHMS, AND SOFTWARE - Ionization Cross Sections for Low Energy Electron TransportSeo, H et al. | 2011
- 3246
-
Evaluation of Atomic Electron Binding Energies for Monte Carlo Particle TransportPia, M. G. / Hee Seo, / Batic, M. / Begalli, M. / Chan Hyeong Kim, / Quintieri, L. / Saracco, P. et al. | 2011
- 3269
-
Validation of Proton Ionization Cross Section Generators for Monte Carlo Particle TransportBatic, M. / Pia, M. G. / Saracco, P. et al. | 2011
- 3281
-
Radioactive Source Estimation Using a System of Directional and Non-Directional DetectorsDeb, B. / Ross, J. A. F. / Ivan, A. / Hartman, M. J. et al. | 2011
- 3291
-
An Inverse Control-Based Set-Point Function for Steam Generator Level Control in Nuclear Power PlantsAkkawi, M. / Jin Jiang, et al. | 2011
- 3291
-
NUCLEAR POWER INSTRUMENTATION AND CONTROL - An Inverse Control-Based Set-Point Function for Steam Generator Level Control in Nuclear Power PlantsAkkawi, M et al. | 2011
- 3305
-
Design of Fast Output Sampling Controller for Three-Time-Scale Systems: Application to Spatial Control of Advanced Heavy Water ReactorShimjith, S. R. / Tiwari, A. P. / Bandyopadhyay, B. et al. | 2011
- 3317
-
RADIATION EFFECTS - Proton Irradiation Effects on Resistive Random Access Memory With ZrOx/HfOx StacksLee, D et al. | 2011
- 3317
-
Proton Irradiation Effects on Resistive Random Access Memory With ZrO Formula Not Shown /HfO Formula Not Shown StacksLee, D. / Lee, J. / Jung, S. / Kim, S. / Park, J. / Biju, K. P. / Choe, M. / Lee, T. / Hwang, H. et al. | 2011
- 3317
-
Proton Irradiation Effects on Resistive Random Access Memory With ZrO$_{\rm x}$ /HfO$_{\rm x}$ StacksDaeseok Lee, / Joonmyoung Lee, / Seungjae Jung, / Seonghyun Kim, / Jubong Park, / Biju, K. P. / Minhyeok Choe, / Takhee Lee, / Hyunsang Hwang, et al. | 2011
- 3321
-
Response of a PIN Diode and SOI Microdosimeter to the TSL Quasi-Monoenergetic Neutron FieldProkopovich, D. A. / Reinhard, M. I. / Cornelius, I. M. / Rosenfeld, A. B. et al. | 2011
- 3328
-
Single-Alpha-Particle-Induced Charge Transient Spectroscopy of the 6H-SiC Formula Not Shown Diode Irradiated With High-Energy ElectronsIwamoto, N. / Koizumi, A. / Onoda, S. / Makino, T. / Ohshima, T. / Kojima, K. / Koike, S. / Uchida, K. / Nozaki, S. et al. | 2011
- 3328
-
Single-Alpha-Particle-Induced Charge Transient Spectroscopy of the 6H-SiC ${\hbox{p}}^{+}{\hbox{n}}$ Diode Irradiated With High-Energy ElectronsIwamoto, N. / Koizumi, A. / Onoda, S. / Makino, T. / Ohshima, T. / Kojima, K. / Koike, S. / Uchida, K. / Nozaki, S. et al. | 2011
- 3328
-
Single-Alpha-Particle-Induced Charge Transient Spectroscopy of the 6H-SiC p+n Diode Irradiated With High-Energy ElectronsIwamoto, N et al. | 2011
- 3333
-
Extension of the ADC Charge-Collection Model to Include Multiple JunctionsEdmonds, L. D. et al. | 2011
- 3343
-
Proton Irradiation of Ultraviolet 4H-SiC Single Photon Avalanche DiodesJun Hu, / Xiaobin Xin, / Zhao, J. H. / VanMil, B. L. / Myers-Ward, R. / Eddy, Charles R. / Gaskill, D. K. et al. | 2011
- 3348
-
Zero Temperature Coefficient Bias in MOS Devices. Dependence on Interface Traps Density, Application to MOS DosimetryCarbonetto, S. H. / Garcia Inza, Mariano A. / Lipovetzky, J. / Redin, E. G. / Salomone, L. S. / Faigon, A. et al. | 2011
- 3354
-
Technology and Performance Study of a Two-Line Monolithic X- and γ-Ray Detection Chip Based on Semi-Insulating GaAsBoháček, P et al. | 2011
- 3354
-
Technology and Performance Study of a Two-Line Monolithic X- and $\gamma$-Ray Detection Chip Based on Semi-Insulating GaAsBohacek, P. / Dubecky, F. / Zat'ko, B. / Sekacova, M. / Huran, J. / Necas, V. / Mudron, J. et al. | 2011
- 3354
-
Technology and Performance Study of a Two-Line Monolithic X- and Formula Not Shown -Ray Detection Chip Based on Semi-Insulating GaAsBohacek, P. / Dubecky, F. / Zat'ko, B. / Sekacova, M. / Huran, J. / Necas, V. / Mudron, J. et al. | 2011
- 3359
-
X-Ray Fluorescence Emission Tomography (XFET) With Novel Imaging Geometries— A Monte Carlo StudyLing Jian Meng, / Nan Li, / La Riviere, P. J. et al. | 2011
- 3359
-
RADIATION INSTRUMENTATION - X-Ray Fluorescence Emission Tomography (XFET) With Novel Imaging Geometries — A Monte Carlo StudyMeng, L J et al. | 2011
- 3370
-
Charge Collection Studies and Electrical Measurements of Heavily Irradiated 3D Double-Sided Sensors and Comparison to Planar Strip DetectorsBates, R. L. / Parkes, C. / Rakotomiaramanana, B. / Fleta, C. / Pellegrini, G. / Lozano, M. / Balbuena, J. P. / Parzefall, U. / Koehler, M. / Breindl, M. et al. | 2011
- 3384
-
Effects of Varying Substrate Thickness on the Collected Charge From Highly Irradiated Planar Silicon DetectorsAffolder, A. / Allport, P. / Brown, H. / Casse, G. et al. | 2011
- 3392
-
SCINTILLATION DETECTORS - Nonproportionality of Scintillator Detectors: Theory and Experiment. IIPayne, S A et al. | 2011
- 3392
-
Nonproportionality of Scintillator Detectors: Theory and Experiment. IIPayne, S. A. / Moses, W. W. / Sheets, S. / Ahle, L. / Cherepy, N. J. / Sturm, B. / Dazeley, S. / Bizarri, G. / Woon-Seng Choong, et al. | 2011
- 3403
-
Scintillation and Optical Properties of BaBrI: Eu2+ and CsBa2I5: Eu2+Bizarri, G et al. | 2011
- 3403
-
Scintillation and Optical Properties of Formula Not Shown and Formula Not ShownBizarri, G. / Bourret-Courchesne, E. D. / Yan, Z. / Derenzo, S. E. et al. | 2011
- 3403
-
Scintillation and Optical Properties of ${\rm BaBrI}\!:\!{\rm Eu}^{2+}$ and ${\rm CsBa}_{2}{\rm I}_{5}\!:\!{\rm Eu}^{2+}$Bizarri, G. / Bourret-Courchesne, E. D. / Zewu Yan, / Derenzo, S. E. et al. | 2011
- 3411
-
Pulse Shape Discrimination in Impure and Mixed Single-Crystal Organic ScintillatorsZaitseva, N. / Glenn, A. / Carman, L. / Hatarik, R. / Hamel, S. / Faust, M. / Schabes, B. / Cherepy, N. / Payne, S. et al. | 2011
- 3421
-
2011 INDEX| 2011
- 3421
-
2011 Index IEEE Transactions on Nuclear Science Vol. 58| 2011
- C1
-
frontcover| 2011
- C2
-
IEEE Transactions on Nuclear Science publication information| 2011
- C3
-
IEEE Transactions on Nuclear Science information for authors| 2011
- C4
-
Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society| 2011