This is one of a series of Special Topical Issues published in Materials Science in Semiconductor Processing, focusing on Advanced Oxides for Electronics (English)
- New search for: Cheong, K.Y.
- New search for: Cheong, K.Y.
- New search for: Paskaleva, A.
In:
Materials science in semiconductor processing
;
16
, 5
; 1171-1171
;
2013
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ISSN:
- Article (Journal) / Print
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Title:This is one of a series of Special Topical Issues published in Materials Science in Semiconductor Processing, focusing on Advanced Oxides for Electronics
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Contributors:Cheong, K.Y. ( author ) / Paskaleva, A.
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Published in:Materials science in semiconductor processing ; 16, 5 ; 1171-1171
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Publisher:
- New search for: Pergamon, Elsevier Science
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Place of publication:Oxford [u.a.]
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Publication date:2013
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 53.56 / 53.56
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Source:
Table of contents – Volume 16, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1171
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This is one of a series of Special Topical Issues published in Materials Science in Semiconductor Processing, focusing on Advanced Oxides for ElectronicsCheong, K.Y. / Paskaleva, A. et al. | 2013
- 1172
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Review of preparation and optoelectronic characteristics of Cu2O-based solar cells with nanostructureChen, Lung-Chien et al. | 2013
- 1186
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TiO2-based structures for nanoscale memory applicationsFröhlich, K. et al. | 2013
- 1196
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Hot-wire vapor deposited tungsten and molybdenum oxide films used for carrier injection/transport in organic optoelectronic devicesVasilopoulou, Maria / Davazoglou, Dimitris et al. | 2013
- 1217
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Recent development of gallium oxide thin film on GaNOon, Hooi Shy / Cheong, Kuan Yew et al. | 2013
- 1232
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Morphology-control of crystallites precipitated from ZnO gel films by applying electric field during hot-water treatmentMatsuda, Atsunori / Tan, Wai Kian / Furukawa, Shuhei / Muto, Hiroyuki et al. | 2013
- 1240
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Full quantum simulation study of a nano tri-material double gate silicon-on-insulator MOSFETArefinia, Zahra et al. | 2012
- 1248
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Investigation of the Electrical and Thermal Performance of SOI MOSFETs with Modified Channel EngineeringRahimian, Morteza / Orouji, Ali A. et al. | 2012
- 1257
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Low temperature electrical resistivity of polycrystalline La0.67Sr0.33MnO3 thin filmsNarjis, A. / El kaaouachi, A. / Biskupski, G. / Daoudi, E. / Limouny, L. / Dlimi, S. / Errai, M. / Sybous, A. et al. | 2013
- 1262
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Characterization of ZrTiO4 thin films prepared by sol–gel methodHsu, Cheng-Hsing / Lin, Shih-Yao et al. | 2013
- 1267
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A study of atypical grain growth properties for SnO2 thin filmsMin, Soon / Jeong, Jin et al. | 2013
- 1271
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Synthesis of Sn doped ZnO/TiO2 nanocomposite film and their application to H2 gas sensing propertiesBenkara, S. / Zerkout, S. / Ghamri, H. et al. | 2013
- 1280
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Manganese oxide thin-films for current-signal sensing and thermal insulationBaca, Roberto et al. | 2013
- 1285
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Investigation on switching behavior of ZrO2 thin film for memory device applicationsChoi, Kyung-Hyun / Duraisamy, Navaneethan / Awais, Muhammad Naeem / Malik Muhammad, Nauman / Kim, Hyung-Chan / Jo, Jeongdai et al. | 2013
- 1292
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Dependence of annealing on stability of transparent amorphous InGaZnO thin film transistorLi, Xifeng / Xin, Enlong / Chen, Longlong / Shi, Jifeng / Li, Chunya / Zhang, Jianhua et al. | 2013
- 1297
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Photo-assisted metal-organic chemical vapor deposition of CaCu3Ti4O12 (CCTO) thin filmsGupta, N. / McMillen, C. et al. | 2013
- 1303
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Influence of N2 and O2 annealing treatment on the optical bandgap of polycrystalline Ga2O3:Cu filmsCheng, Yi / Liang, Hongwei / Liu, Yang / Xia, Xiaochuan / Shen, Rensheng / Song, Shiwei / Wu, Yunfeng / Du, Guotong et al. | 2013
- 1308
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Non-ohmic properties and impulse aging behavior of quaternary ZnO–V2O5–Mn3O4–Er2O3 semiconducting varistors with sintering processingNahm, Choon-Woo et al. | 2013
- 1316
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Vertically aligned ZnO nanowires prepared by thermal oxidation of RF magnetron sputtered metallic zinc filmsChao, Liang-Chiun / Tsai, Sung-Yu / Lin, Ci-Neng / Liau, Chung-Chi / Ye, Ci-Chao et al. | 2013
- 1321
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Temperature dependence of electrical properties for MOS capacitor with HfO2/SiO2 gate dielectric stackYu, T. / Jin, C.G. / Dong, Y.J. / Cao, D. / Zhuge, L.J. / Wu, X.M. et al. | 2012
- 1328
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Influence of molar concentration on the physical properties of nebulizer-sprayed ZnO thin films for ammonia gas sensorMariappan, R. / Ponnuswamy, V. / Ragavendar, M. et al. | 2012
- 1336
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Modeling the effect of thin gate insulators (SiO2, SiN, Al2O3 and HfO2) on AlGaN/GaN HEMT forward characteristics grown on Si, sapphire and SiCPérez-Tomás, A. / Fontserè, A. / Jennings, M.R. / Gammon, P.M. et al. | 2012
- 1346
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Effect of different sputtering gas mixtures on the structural, electrical, and optical properties of p-type NiO thin filmsOh, Joon-Ho / Hwang, Soon Yong / Kim, Young Dong / Song, Jun-Hyuk / Seong, Tae-Yeon et al. | 2012
- 1352
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High performance dye-sensitized solar cells (DSSCs) achieved via electrophoretic technique by optimizing of photoelectrode propertiesHamadanian, Masood / Gravand, Afshar / Jabbari, Vahid et al. | 2012
- 1360
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Analysis of the properties of germanium/zinc silicate film growth through a simple thermal evaporation technique for hydrogen gas sensing and deep UV photodetector applicationMuzafa Jumidali, Mohd / Hashim, M.R. / Al-Heuseen, K. et al. | 2012