Hard X-ray photoemission spectroscopy of transition-metal oxide thin films and interfaces (Unknown)
- New search for: Wadati, H.
- New search for: Wadati, H.
- New search for: Fujimori, A.
In:
Journal of electron spectroscopy and related phenomena
;
190
; 222-227
;
2013
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ISSN:
- Article (Journal) / Print
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Title:Hard X-ray photoemission spectroscopy of transition-metal oxide thin films and interfaces
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Contributors:Wadati, H. ( author ) / Fujimori, A.
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Published in:Journal of electron spectroscopy and related phenomena ; 190 ; 222-227
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Publisher:
- New search for: Elsevier
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Place of publication:Amsterdam
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Publication date:2013
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
- New search for: 35.25 / 33.07
- Further information on Basic classification
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Classification:
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Source:
Table of contents – Volume 190
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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IntroductionEberhardt, Wolfgang / Heske, Clemens et al. | 2013
- 2
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Design of solar cell materials via soft X-ray spectroscopyHimpsel, F.J. / Cook, P.L. / de la Torre, G. / Garcia-Lastra, J.M. / Gonzalez-Moreno, R. / Guo, J.-H. / Hamers, R.J. / Kronawitter, C.X. / Johnson, P.S. / Ortega, J.E. et al. | 2012
- 12
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Energy level alignment at interfaces in organic photovoltaic devicesOpitz, Andreas / Frisch, Johannes / Schlesinger, Raphael / Wilke, Andreas / Koch, Norbert et al. | 2012
- 25
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Synchrotron radiation X-ray spectroscopic studies of interface electronic structure in molecular organic photovoltaic thin filmsSmith, K.E. et al. | 2012
- 33
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Photoelectron spectroscopy and modeling of interface properties related to organic photovoltaic cellsFahlman, Mats / Sehati, Parisa / Osikowicz, Wojciech / Braun, Slawomir / de Jong, Michel P. / Brocks, Geert et al. | 2013
- 42
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Limitations of Near Edge X-ray Absorption Fine Structure as a tool for observing conduction bands in chalcopyrite solar cell heterojunctionsJohnson, Benjamin / Klaer, Jo / Merdes, Saoussen / Gorgoi, Mihaela / Höpfner, Britta / Vollmer, Antje / Lauermann, Iver et al. | 2013
- 47
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Soft X-rays shedding light on thin-film solar cell surfaces and interfacesBär, M. / Pookpanratana, S. / Weinhardt, L. / Wilks, R.G. / Schubert, B.A. / Marsen, B. / Unold, T. / Blum, M. / Krause, S. / Zhang, Y. et al. | 2012
- 54
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SXPS studies of single crystalline CdTe/CdS interfacesSiepchen, B. / Schimper, H.-J. / Klein, A. / Jaegermann, W. et al. | 2013
- 64
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Key electronic states in lithium battery materials probed by soft X-ray spectroscopyYang, Wanli / Liu, Xiaosong / Qiao, Ruimin / Olalde-Velasco, Paul / Spear, Jonathan D. / Roseguo, Louis / Pepper, John X. / Chuang, Yi-de / Denlinger, Jonathan D. / Hussain, Zahid et al. | 2013
- 75
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In situ X-ray studies of film cathodes for solid oxide fuel cellsFuoss, Paul / Chang, Kee-Chul / You, Hoydoo et al. | 2013
- 84
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In situ investigation of electrochemical devices using ambient pressure photoelectron spectroscopyCrumlin, Ethan J. / Bluhm, Hendrik / Liu, Zhi et al. | 2013
- 93
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Between photocatalysis and photosynthesis: Synchrotron spectroscopy methods on molecules and materials for solar hydrogen generationBora, Debajeet K. / Hu, Yelin / Thiess, Sebastian / Erat, Selma / Feng, Xuefei / Mukherjee, Sumanta / Fortunato, Giuseppino / Gaillard, Nicolas / Toth, Rita / Gajda-Schrantz, Krisztina et al. | 2012
- 106
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Soft X-ray and electron spectroscopy to determine the electronic structure of materials for photoelectrochemical hydrogen productionWeinhardt, L. / Blum, M. / Fuchs, O. / Pookpanratana, S. / George, K. / Cole, B. / Marsen, B. / Gaillard, N. / Miller, E. / Ahn, K.-S. et al. | 2012
- 113
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Electronic structure effects in catalysis probed by X-ray and electron spectroscopyKaya, Sarp / Friebel, Daniel / Ogasawara, Hirohito / Anniyev, Toyli / Nilsson, Anders et al. | 2013
- 125
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PrefaceDrube, Wolfgang et al. | 2013
- 127
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Calculations of mean escape depths of photoelectrons in elemental solids excited by linearly polarized X-rays for high-energy photoelectron spectroscopyTanuma, S. / Yoshikawa, H. / Shinotsuka, H. / Ueda, R. et al. | 2013
- 137
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Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES)Werner, Wolfgang S.M. / Smekal, Werner / Hisch, Thomas / Himmelsbach, Julia / Powell, Cedric J. et al. | 2013
- 144
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Energy loss structures in HAXPES spectra of solidsKövér, László et al. | 2013
- 153
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Relative sub-shell photoionization cross-sections of nickel metal determined by hard X-ray high kinetic energy photoemissionGorgoi, M. / Schäfers, F. / Svensson, S. / Mårtensson, N. et al. | 2013
- 159
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Recent developments in the theory of HARPESMinár, J. / Braun, J. / Ebert, H. et al. | 2012
- 165
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Hard X-ray photoemission with angular resolution and standing-wave excitationFadley, Charles S. et al. | 2013
- 180
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Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8Ikenaga, Eiji / Kobata, Masaaki / Matsuda, Hiroyuki / Sugiyama, Takeharu / Daimon, Hiroshi / Kobayashi, Keisuke et al. | 2013
- 188
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Hard X-ray photoelectron spectroscopy on the GALAXIES beamline at the SOLEIL synchrotronCéolin, D. / Ablett, J.M. / Prieur, D. / Moreno, T. / Rueff, J.-P. / Marchenko, T. / Journel, L. / Guillemin, R. / Pilette, B. / Marin, T. et al. | 2013
- 193
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NIST high throughput variable kinetic energy hard X-ray photoelectron spectroscopy facilityWeiland, C. / Rumaiz, A.K. / Lysaght, P. / Karlin, B. / Woicik, J.C. / Fischer, D. et al. | 2013
- 201
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Polarization-dependent hard X-ray photoemission spectroscopy of solidsSekiyama, Akira / Higashiya, Atsushi / Imada, Shin et al. | 2013
- 205
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Determination of electronic and atomic properties of surface, bulk and buried interfaces: Simultaneous combination of hard X-ray photoelectron spectroscopy and X-ray diffractionRubio-Zuazo, J. / Castro, G.R. et al. | 2013
- 210
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Development of a laboratory system hard X-ray photoelectron spectroscopy and its applicationsKobayashi, Keisuke / Kobata, Masaaki / Iwai, Hideo et al. | 2013
- 222
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Hard X-ray photoemission spectroscopy of transition-metal oxide thin films and interfacesWadati, H. / Fujimori, A. et al. | 2013
- 228
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Interfacial and bulk electronic properties of complex oxides and buried interfaces probed by HAXPESBorgatti, F. / Offi, F. / Torelli, P. / Monaco, G. / Panaccione, G. et al. | 2013
- 235
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Application of hard X-ray photoelectron spectroscopy to electronic structure measurements for various functional materialsUeda, S. et al. | 2013
- 242
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Hard X-ray photoelectron spectroscopy: A few recent applicationsTaguchi, M. / Takata, Y. / Chainani, A. et al. | 2013
- 249
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Bulk electronic structure studied by hard X-ray photoelectron spectroscopy of the valence band: The case of intermetallic compoundsOuardi, Siham / Fecher, Gerhard H. / Felser, Claudia et al. | 2013
- 268
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Practical chemical analysis of Pt and Pd based heterogeneous catalysts with hard X-ray photoelectron spectroscopyYoshikawa, H. / Matolínová, I. / Matolín, V. et al. | 2013
- 278
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High energy photoelectron spectroscopy in basic and applied science: Bulk and interface electronic structureKnut, Ronny / Lindblad, Rebecka / Gorgoi, Mihaela / Rensmo, Håkan / Karis, Olof et al. | 2013
- 289
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Dealloying of CuxAu studied by hard X-ray photoelectron spectroscopyRajput, Parasmani / Gupta, Ajay / Detlefs, Blanka / Kolb, Dieter M. / Potdar, Satish / Zegenhagen, Jörg et al. | 2013
- 295
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AR-HPES study on chemical bonding states of high-κ/high-μ gate stacks for advanced CMOSNohira, H. / Komatsu, A. / Yamashita, K. / Kakushima, K. / Iwai, H. / Sawano, K. / Shiraki, Y. et al. | 2013
- 295
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AR-HPES study on chemical bonding states of high-k/high-m gate stacks for advanced CMOSNohira, H. / Komatsu, A. / Yamashita, K. / Kakushima, K. / Iwai, H. / Sawano, K. / Shiraki, Y. et al. | 2013
- 302
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Electronic and electrical properties of functional interfaces studied by hard X-ray photoemissionZenkevich, A. / Matveyev, Y. / Minnekaev, M. / Lebedinskii, Yu. / Thiess, S. / Drube, W. et al. | 2013
- 309
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Chemical interaction at the buried silicon/zinc oxide thin-film solar cell interface as revealed by hard X-ray photoelectron spectroscopyWimmer, M. / Gerlach, D. / Wilks, R.G. / Scherf, S. / Félix, R. / Lupulescu, C. / Ruske, F. / Schondelmaier, G. / Lips, K. / Hüpkes, J. et al. | 2013
- CO2
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IFC Editorial Board| 2013