Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks (English)
- New search for: Bhowmik, Biswajit
- New search for: Bhowmik, Biswajit
In:
Journal of Electronic Testing
;
36
, 3
; 385-408
;
2020
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks
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Contributors:Bhowmik, Biswajit ( author )
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Published in:Journal of Electronic Testing ; 36, 3 ; 385-408
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Publisher:
- New search for: Springer US
- New search for: Springer Science + Business Media B.V
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Place of publication:Dordrecht [u.a.]
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Publication date:2020
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ISSN:
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ZDBID:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
- New search for: 54.00$jInformatik: Allgemeines / 54.00
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Keywords:
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Classification:
BKL: 54.00$jInformatik: Allgemeines / 54.00 Informatik: Allgemeines -
Source:
Table of contents – Volume 36, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 297
-
EditorialAgrawal, Vishwani D. et al. | 2020
- 299
-
Test Technology Newsletter| 2020
- 301
-
Aging-Resilient SRAM-based True Random Number Generator for Lightweight DevicesWang, Wendong / Guin, Ujjwal / Singh, Adit et al. | 2020
- 313
-
Stuck-At Fault Mitigation of Emerging Technologies Based Switching LatticesAnghel, Lorena / Bernasconi, Anna / Ciriani, Valentina / Frontini, Luca / Trucco, Gabriella / Vatajelu, Ioana et al. | 2020
- 327
-
An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristicMitra, Sanjoy / Das, Debaprasad et al. | 2020
- 343
-
Comprehensive Analysis and Optimization of Reliable Viterbi Decoder Circuits Implemented in Modular VLSI Design Logic StylesVarada, Sushanth / Katpally, Swapnil / Thiruveedhi, Subha Sri Lakshmi et al. | 2020
- 365
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Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-SimulationYu, Dongzhe / Wang, Han / Xu, Jiangtao et al. | 2020
- 375
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A probability density estimation algorithm on multiwavelet for the high-resolution ADCMa, Min / Huang, Jing / Yang, Xiaolei / Tang, Lingfan et al. | 2020
- 385
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Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication NetworksBhowmik, Biswajit et al. | 2020
- 409
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Time Complexity Comparison of Stopping at First Failure and Completely Running the TestYucesan, Ongun / Ozkil, Altan et al. | 2020
- 419
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High Performance Approximate Memories for Image Processing ApplicationsJothin, R. / Mohamed, M. Peer et al. | 2020
- 429
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LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image ProcessingGarg, Bharat / Patel, Sujit Kumar / Dutt, Sunil et al. | 2020