Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels (English)
- New search for: Park, Seyoung
- New search for: Jang, Jaeyeon
- New search for: Kim, Chang Ouk
- Further information on Kim, Chang Ouk:
- https://orcid.org/0000-0002-6936-5409
- New search for: Park, Seyoung
- New search for: Jang, Jaeyeon
- New search for: Kim, Chang Ouk
- Further information on Kim, Chang Ouk:
- https://orcid.org/0000-0002-6936-5409
In:
Journal of Intelligent Manufacturing
;
32
, 1
; 251-263
;
2020
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels
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Contributors:
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Published in:Journal of Intelligent Manufacturing ; 32, 1 ; 251-263
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Publisher:
- New search for: Springer US
- New search for: Springer Science + Business Media B.V
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Place of publication:Dordrecht [u.a.]
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Publication date:2020
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ISSN:
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ZDBID:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
- New search for: 52.72
- Further information on Basic classification
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Keywords:
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Classification:
BKL: 52.72 Fertigungsautomatisierung -
Source:
Table of contents – Volume 32, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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DAMER: a novel diagnosis aggregation method with evidential reasoning rule for bearing fault diagnosisWang, Gang / Zhang, Feng / Cheng, Bayi / Fang, Fang et al. | 2020
- 21
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Fuzzy logic and sub-clustering approaches to predict main cutting force in high-pressure jet assisted turningRodić, Dragan / Sekulić, Milenko / Gostimirović, Marin / Pucovsky, Vladimir / Kramar, Davorin et al. | 2020
- 37
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An adaptive update model based on improved Long Short Term Memory for online prediction of vibration signalTian, Huixin / Ren, Daixu / Li, Kun / Zhao, Zhen et al. | 2020
- 51
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The development of a micro-pattern manufacturing method using rotating active tools with compensation of estimated errors and an LMS algorithmCho, Soo-Bong / Ro, Seung-Kook / Kim, Byung-Sub / Lee, Sung-Cheul / Park, Jong-Kweon et al. | 2020
- 61
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Optimal pricing and sourcing strategies in the presence of supply uncertainty and competitionZhang, Yixin / Wang, Xifu et al. | 2020
- 77
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Estimation of tool wear and optimization of cutting parameters based on novel ANFIS-PSO method toward intelligent machiningXu, Longhua / Huang, Chuanzhen / Li, Chengwu / Wang, Jun / Liu, Hanlian / Wang, Xiaodan et al. | 2020
- 91
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Two-stage parallel speed-scaling machine scheduling under time-of-use tariffsZhang, Hongliang / Wu, Yujuan / Pan, Ruilin / Xu, Gongjie et al. | 2020
- 113
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Fully convolutional networks for chip-wise defect detection employing photoluminescence imagesStern, Maike Lorena / Schellenberger, Martin et al. | 2020
- 127
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Identification of cutting tool wear condition in turning using self-organizing map trained with imbalanced dataBrito, Lucas Costa / da Silva, Márcio Bacci / Duarte, Marcus Antonio Viana et al. | 2020
- 141
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Automated detection of defects with low semantic information in X-ray images based on deep learningDu, Wangzhe / Shen, Hongyao / Fu, Jianzhong / Zhang, Ge / Shi, Xuanke / He, Quan et al. | 2020
- 157
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ε Constrained differential evolution using halfspace partition for optimization problemsYi, Wenchao / Gao, Liang / Pei, Zhi / Lu, Jiansha / Chen, Yong et al. | 2020
- 179
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Prediction of geometry deviations in additive manufactured parts: comparison of linear regression with machine learning algorithmsBaturynska, Ivanna / Martinsen, Kristian et al. | 2020
- 201
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A transformation of human operation approach to inform system design for automationMicheler, Simon / Goh, Yee Mey / Lohse, Niels et al. | 2020
- 221
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Modal parameter identification of general cutter based on milling stability theoryGuo, Minglong / Wei, Zhaocheng / Wang, Minjie / Li, Shiquan / Wang, Jia / Liu, Shengxian et al. | 2020
- 237
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Intelligent manufacturing Lie Group Machine Learning: real-time and efficient inspection system based on fog computingXu, Chengjun / Zhu, Guobin et al. | 2020
- 251
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Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labelsPark, Seyoung / Jang, Jaeyeon / Kim, Chang Ouk et al. | 2020
- 265
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Module-based product family design: systematic literature review and meta-synthesisGauss, Leandro / Lacerda, Daniel P. / Cauchick Miguel, Paulo A. et al. | 2020
- 313
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An improved case based reasoning method and its application in estimation of surface quality toward intelligent machiningXu, Longhua / Huang, Chuanzhen / Li, Chengwu / Wang, Jun / Liu, Hanlian / Wang, Xiaodan et al. | 2020