Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors (English)
- New search for: Fainchtein, Raul
- New search for: D'Arcangelis, S. T.
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- New search for: Cowan, D. O.
- New search for: Yoon, Sangyol
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- New search for: Smith, W. F.
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- New search for: de Lozanne, Alejandro L.
- New search for: Fainchtein, Raul
- New search for: D'Arcangelis, S. T.
- New search for: Yang, S. S.
- New search for: Cowan, D. O.
- New search for: Yoon, Sangyol
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- New search for: Yoo, M.
- New search for: de Lozanne, Alejandro L.
In:
Proc. SPIE
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1855
; 129
;
1993
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ISBN:
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ISSN:
- Conference paper / Electronic Resource
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Title:Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors
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Contributors:Fainchtein, Raul ( author ) / D'Arcangelis, S. T. ( author ) / Yang, S. S. ( author ) / Cowan, D. O. ( author ) / Yoon, Sangyol ( author ) / Pan, S. H. ( author ) / Smith, W. F. ( author ) / Yoo, M. ( author ) / de Lozanne, Alejandro L. ( author )
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Conference:Scanning Probe Microscopies II ; 1993 ; Los Angeles,CA,United States
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Published in:Proc. SPIE ; 1855 ; 129
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Publisher:
- New search for: SPIE
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Publication date:1993-06-04
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ISBN:
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Adjacent metal-coated/uncoated regions facilitate interpretation of STM images of DNA (Invited Paper) [1855-01]Garcia, R. / Dunlap, D. / Bustamante, C. J. / SPIE et al. | 1993
- 2
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Adjacent metal-coated/uncoated regions facilitate interpretation of STM images of DNAGarcia, Ricardo / Dunlap, David / Bustamante, Carlos J. et al. | 1993
- 12
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Chirality of the local supercoiling of individual DNA molecules assigned by atomic force microscopySamori, Bruno / Siligardi, Giuliano / Quagliarello, Carla / Weisenhorn, Albrecht L. / Vesenka, James / Bustamante, Carlos J. et al. | 1993
- 12
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Chirality of the local supercoiling of individual DNA molecules assigned by atomic force microscopy [1855-03]Samori, B. / Siligardi, G. / Quagliarello, C. / Weisenhorn, A. L. / SPIE et al. | 1993
- 17
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Tooth structure studied using the atomic force microscopeKasas, Sandor / Berdal, Ariane / Celio, Marco R. et al. | 1993
- 17
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Tooth structure studied using the atomic force microscope [1855-04]Kasas, S. / Berdal, A. / Celio, M. R. / SPIE et al. | 1993
- 26
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Deformation observed on soft surfaces studied with an AFM [1855-05]Weisenhorn, A. L. / Kasas, S. / Solletti, J. M. / Khorsandi, M. / SPIE et al. | 1993
- 26
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Deformation observed on soft surfaces studied with an AFMWeisenhorn, Albrecht L. / Kasas, Sandor / Solletti, J. M. / Khorsandi, Mitra / Gotzos, V. / Roemer, D. U. / Lorenzi, G. P. et al. | 1993
- 35
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Molecular charge mapping with electrostatic force microscopeLeng, Yaojian / Williams, Clayton C. et al. | 1993
- 35
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Molecular charge mapping with electrostatic force microscope [1855-06]Leng, Y. / Williams, C. C. / SPIE et al. | 1993
- 40
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Gap-modulated versus constant current mode as a tool to discriminate between DNA and substrate structure in scanning tunneling microscopy [1855-08]Cricenti, A. / Selci, S. / Scarselli, M. / Generosi, R. / SPIE et al. | 1993
- 40
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Gap-modulated versus constant current mode as a tool to discriminate between DNA and substrate structure in scanning tunneling microscopyCricenti, Antonio / Selci, S. / Scarselli, M. / Generosi, Renato / Amaldi, F. / Chiarotti, G. et al. | 1993
- 48
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Scanning force microscopy and STM imaging of β-chitinJericho, Manfred H. / Mulhern, P. J. / Xu, Wenbo / Blackford, B. L. / Fritz, Lawrence et al. | 1993
- 48
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Scanning force microscopy and STM imaging of -chitin [1855-36]Jericho, M. H. / Mulhern, P. J. / Xu, W. / Blackford, B. L. / SPIE et al. | 1993
- 58
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Shear force/reflection near-field scanning optical microscopyMoyer, Patrick J. / Paesler, Michael A. et al. | 1993
- 58
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Shear force/reflection near-field scanning optical microscopy [1855-10]Moyer, P. J. / Paesler, M. A. / SPIE et al. | 1993
- 67
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Imaging modes and contrast in near-field scanning optical microscopyToledo-Crow, Ricardo / Vaez-Iravani, Mehdi et al. | 1993
- 67
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Imaging modes and contrast in near-field scanning optical microscopy [1855-11]Toledo-Crow, R. / Vaez-Iravani, M. / SPIE et al. | 1993
- 75
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Near-field photodetection optical microscopy (NPOM): a novel probe for optical characterization on a subwavelength spatial scaleBusath, Daniel R. / Davis, Robert C. / Williams, Clayton C. et al. | 1993
- 75
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Near-field photodetection optical microscopy (NPOM): a novel probe for optical characterization on a subwavelength spatial scale [1855-12]Busath, D. R. / Davis, R. C. / Williams, C. C. / SPIE et al. | 1993
- 81
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Tip/sample interactions, contrast, and near-field microscopy of biological and solid-state samplesSmith, Steven / Monson, Eric E. / Merritt, Greg / Tan, Weihong / Birnbaum, D. / Shi, Zhong-You / Thorsrud, Bjorn A. / Harris, C. / Grahn, Holger T. / Ploog, Klaus H. et al. | 1993
- 81
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Tip/sample interactions, contrast, and near-field microscopy of biological and solid-state samples [1855-13]Smith, S. / Monson, E. / Merrit, G. / Tan, W. / SPIE et al. | 1993
- 93
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Estimating the effective optical aperture of a tapered laser probe in PSTM imagingTsai, Din Ping / Wang, Zhouhang / Moskovits, Martin et al. | 1993
- 93
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Estimating the effective optical aperture of a tapered fiber probe in PSTM imaging [1855-16]Tsai, D. P. / Wang, Z. / Moskovits, M. / SPIE et al. | 1993
- 106
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Quantitative analysis of scanning tunneling microscopy images for surface structure determination: sulfur on Re(0001)Ogletree, D. F. / Sautet, Philippe / Dunphy, James C. / Salmeron, Miguel et al. | 1993
- 106
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Quantitative analysis of scanning tunneling microscopy images for surface structure determination: sulfur on Re(0001) [1855-20]Frank Ogletree, D. / Sautet, P. / Dunphy, J. C. / Salmeron, M. / SPIE et al. | 1993
- 118
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Process and defect-induced surface morphology of relaxed Ge~xSi~1~-~x films [1855-21]Hsu, J. W. P. / Fitzgerald, E. A. / Xie, Y.-H. / Silverman, P. J. / SPIE et al. | 1993
- 118
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Process and defect-induced surface morphology of relaxed GexSi1-xfilmsHsu, Julia W. P. / Fitzgerald, Eugene A. / Xie, Ya-Hong / Silverman, Peter J. / Cardillo, Mark J. et al. | 1993
- 129
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Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductorsFainchtein, Raul / D'Arcangelis, S. T. / Yang, S. S. / Cowan, D. O. / Yoon, Sangyol / Pan, S. H. / Smith, W. F. / Yoo, M. / de Lozanne, Alejandro L. et al. | 1993
- 129
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Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors [1855-22]Fainchtein, R. / D'Arcangelis, S. T. / Yang, S. S. / Cowan, D. O. / SPIE et al. | 1993
- 140
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Some problems in scanning probe microscopy of vortices in superconductorsHartmann, Uwe / Drechsler, T. / Heiden, Christoph et al. | 1993
- 140
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Some problems in scanning probe microscopy of vortices in superconductors [1855-23]Hartmann, U. / Drechsler, T. / Heiden, C. / SPIE et al. | 1993
- 152
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High-resolution scanning Hall probe microscopy [1855-24]Hallen, H. D. / Hess, H. F. / Chang, A. M. / Pfeiffer, L. / SPIE et al. | 1993
- 152
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High-resolution scanning Hall probe microscopyHallen, Hans D. / Hess, H. F. / Chang, A. M. / Pfeiffer, Loren N. / West, Kenneth W. / Mitzi, David B. et al. | 1993
- 158
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Properties and structures of a magnetic shielding materialHabib, Khaled J. / Moore, K. / Nessler, R. et al. | 1993
- 158
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Properties and structures of a magnetic shielding material [1855-25]Habib, K. J. / Moore, K. / Nessler, R. / SPIE et al. | 1993
- 166
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Magnetic scanning tunneling microscopy: theory and experimentBurke, Edward R. / Gomez, Romel D. / Adly, Amr A. / Mayergoyz, Isaak D. et al. | 1993
- 166
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Magnetic scanning tunneling microscopy: theory and experiment [1855-26]Burke, E. R. / Gomez, R. D. / Adly, A. A. / Mayergoyz, I. D. / SPIE et al. | 1993
- 180
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Further development of a scanned near-field optical microscope for magneto-optic Kerr imaging of magnetic domains with 10nm resolutionSilva, Thomas J. / Schultz, Sheldon et al. | 1993
- 180
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Further development of a scanning near-field optical microscope for magneto-optic Kerr imaging of magnetic domains with 10-nm resolution [1855-30]Silva, T. J. / Schultz, S. / SPIE et al. | 1993
- 187
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Magnetic force and force gradient microscopy utilizing an ultrasensitive vertical cantilever geometry [1855-31]DiCarlo, A. / Scheinfein, M. R. / Chamberlin, R. V. / SPIE et al. | 1993
- 187
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Magnetic force and force gradient microscopy utilizing an ultrasensitive vertical cantilever geometryDiCarlo, Anthony / Scheinfein, Michael R. / Chamberlin, Ralph V. et al. | 1993
- 195
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Scanning capacitance detection and charge trapping in NOSTerris, Bruce D. / Barrett, Rick / Mamin, H. Jonathon et al. | 1993
- 195
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Scanning capacitance detection and charge trapping in NOS [1855-32]Terris, B. D. / Barrett, R. C. / Mamin, H. J. / SPIE et al. | 1993
- 202
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Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution, and capability of liquid operation [1855-35]Putman, C. A. J. / Van der Werf, K. O. / De Grooth, B. G. / Van Hulst, N. F. / SPIE et al. | 1993
- 202
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Stand-alone atomic force microscope featuring large, scan friction measurement, atomic resolution, and capability of liquid operationPutman, Constant A. / van der Werf, Kees O. / de Grooth, Bart G. / van Hulst, Niko F. / Greve, Jan et al. | 1993
- 209
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Thermal imaging of electronic materials and devices using the Atomic Force Microscope [1855-37]Majumdar, A. / Carrejo, J. P. / Lai, J. / Chandrachood, M. / SPIE et al. | 1993
- 209
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Thermal imaging of electronic materials and devices using the Atomic Force MicroscopeMajumdar, Arunava / Carrejo, J. P. / Lai, J. / Chandrachood, M. et al. | 1993