Comparison Of Experimental And Theoretical Calculations Of Backscattering Amplitude And Phase Shift Functions For A Number Of FCC Metals (English)
- New search for: Knapp, G. S.
- New search for: McKale, A. G.
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- New search for: Knapp, G. S.
- New search for: McKale, A. G.
- New search for: Chan, S.K.
- New search for: Veal, B. W.
In:
Proc. SPIE
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0690
; 3
;
1986
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ISBN:
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ISSN:
- Conference paper / Electronic Resource
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Title:Comparison Of Experimental And Theoretical Calculations Of Backscattering Amplitude And Phase Shift Functions For A Number Of FCC Metals
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Contributors:
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Conference:X-Rays in Materials Analysis: Novel Applications and Recent Developments ; 1986 ; San Diego,United States
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Published in:Proc. SPIE ; 0690 ; 3
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Publisher:
- New search for: SPIE
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Publication date:1986-08-12
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ISBN:
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Refinements in XAFS TheoryRehr, J. J. et al. | 1986
- 3
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Comparison Of Experimental And Theoretical Calculations Of Backscattering Amplitude And Phase Shift Functions For A Number Of FCC MetalsKnapp, G. S. / McKale, A. G. / Chan, S.K. / Veal, B. W. et al. | 1986
- 9
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Experimental Studies Of Photon-Surface Interaction Dynamics In The Alkali HalidesHaglund, Richard F. / Tolk, Norman H. et al. | 1986
- 19
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Time-Dependent X-Ray Reflectivity of a Germanium Crystal Heated with 25 ps 1.06 µm Laser LightHailey, C. J. / Busch, G. / Johnson, R. / Koenig, Z. / Lupton, J. / Schroeder, R. / Sullivan, D. / Goldstein, W. et al. | 1986
- 23
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Characteristics Of Transition Radiation In The X-Ray Spectral RegionMoran, Michael J. et al. | 1986
- 32
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EXAFS And Reflectivity Studies Of Surfaces And Interfaces Using Glancing Angle X-RaysHeald, S. M. / Chen, H. / Tranquada, J. M. et al. | 1986
- 38
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Near Edge X-Ray Absorption Fine Structure Spectroscopy In Materials AnalysisCarr, Roger et al. | 1986
- 45
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EXAFS Measurements Of Ion-Implanted Amorphous Surface LayersBouldin, C. E. / Forman, R. A. / Bell, M. I. / Donovan, E. P. / Hubler, G. K. et al. | 1986
- 52
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Structure of Icosahedral AlMnSi and AlMn as Determined by Extended X-Ray Absorption Fine Structure (EXAFS)Ma, Yanjun / Stern, Edward A. et al. | 1986
- 58
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Local Structural And Magnetic Environments Of Iron In Dilute AlloysBudnick, J. I. / Choi, M. / Pease, D. M. / Tan, Z. / Hayes, Guy H. / Klein, E. / Illerhaus, B. et al. | 1986
- 65
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Economical and Efficient Detector for Fluorescent X-Ray Absorption SpectroscopyKhalid, S. M. / Rosenbaum, G. / Chance, B. et al. | 1986
- 70
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Surface and Epitaxial Overlayer Structures from X-Ray Photoelectron Diffraction (XPD)Fadley, Charles S. et al. | 1986
- 78
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Angle Resolved X-ray Photoelectron Spectroscopy Applied to Patchy SurfacesPocker, D. J. et al. | 1986
- 88
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Thin Layer Formation Studied by Angular Dependent X-Ray Photoelectron SpectroscopyStickle, William F. / Bomben, Kenneth D. / Gulbrandsen, Lillian E. / Rusch, Thomas W. et al. | 1986
- 95
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X-Ray Photoelectron Spectroscopy (XPS) Applications Using Microfocused X-RaysChaney, Robert / Cormia, Robert / Siordia, Ruth et al. | 1986
- 101
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An Investigation Of The Effect Of Particle Size On Oxidation Of Pyrites In Coal.Chan, Paul K. / Frost, David C. et al. | 1986
- 107
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The Application of X-rays and Electrochemistry to Materials AnalysisSherwood, P. M. et al. | 1986
- 112
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Problems in Quantitation in X-Ray Photoelectron Spectroscopy (XPS): the Use of Data Reduction Techniques to Obtain Peak AreasMaschhoff, B. L. / Zavadil, K. R. / Nebesny, K. W. / Fordemwalt, J. W. / Armstrong, N. R. et al. | 1986
- 124
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Surface Structure Analysis Using Grazing Incidence X-ray ScatteringBrennan, S. et al. | 1986
- 129
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X-Ray Diffraction of CdTe Epitaxial Layers on GaAs Substrates as a Function of TemperatureHorning, R. D. / Staudenmann, J. -L. / Bonse, U. / Arch, D. K. / Schmit, J. L. et al. | 1986
- 135
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Structural Depth Profiling by Glancing Angle X-ray DiffractionYork, B. R. / Austin, A. B. et al. | 1986
- 146
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Measurement of X-Ray Dielectric Constants With Coherent Transition RadiationMoran, M. J. / Dahling, B. A. / Piestrup, M. A. / Berman, B. L. / Kephart, J. O. et al. | 1986
- 153
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Time Resolved X-Ray Diffraction Measurements Of Phase Transitions In Lipid-Water SystemsLis, L. J. / Quinn, P. J. et al. | 1986