Optical phase-conjugate resonators, bistabilities, and applications (English)
- New search for: Venkateswarlu, Putcha
- New search for: Dokhanian, Mostafa
- New search for: Sekhar, Prayaga C.
- New search for: George, M. C.
- New search for: Jagannath, H.
- New search for: Venkateswarlu, Putcha
- New search for: Dokhanian, Mostafa
- New search for: Sekhar, Prayaga C.
- New search for: George, M. C.
- New search for: Jagannath, H.
In:
Proc. SPIE
;
1332
; 245
;
1991
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ISBN:
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ISSN:
- Conference paper / Electronic Resource
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Title:Optical phase-conjugate resonators, bistabilities, and applications
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Contributors:Venkateswarlu, Putcha ( author ) / Dokhanian, Mostafa ( author ) / Sekhar, Prayaga C. ( author ) / George, M. C. ( author ) / Jagannath, H. ( author )
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Conference:Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection ; 1990 ; San Diego,CA,United States
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Published in:Proc. SPIE ; 1332 ; 245
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Publisher:
- New search for: SPIE
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Publication date:1991-01-01
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ISBN:
-
ISSN:
-
DOI:
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Type of media:Conference paper
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
-
Absolute measurement of spherical surfacesCreath, Katherine / Wyant, James C. et al. | 1991
- 8
-
High-precision interferometric testing of spherical mirrors with long radius of curvatureFreischlad, Klaus R. / Kuechel, Michael F. / Wiedmann, Wolfgang / Kaiser, Winfried M. / Mayer, Maximilian et al. | 1991
- 18
-
Real-time wavefront measurement with lambda/10 fringe spacing for the optical shopFreischlad, Klaus R. / Kuechel, Michael F. / Schuster, Karl-Heinz / Wegmann, Ulrich / Kaiser, Winfried M. et al. | 1991
- 25
-
System calibration and part alignment for inspection of 2-D electronic circuit patternsRodriguez, Arturo A. / Mandeville, Jon R. / Wu, Frederick Y. et al. | 1991
- 36
-
Simple test for the 90 degree angle in prismsMalacara-Hernandez, Daniel / Flores-Hernandez, Ricardo et al. | 1991
- 41
-
Set of two 45 - 90 - 45 prisms equivalent to the Fresnel rhombMantravadi, Murty V. / Shukla, Ram P. / Apparao, K. V. et al. | 1991
- 50
-
Focal length measurement using diffraction at a gratingSirohi, Rajpal S. / Kumar, Harish / Jain, Narinder K. et al. | 1991
- 56
-
Automatic inspection technique for optical surface flawsYang, GuoGuang / Gao, Wenliang / Cheng, Shangyi et al. | 1991
- 66
-
Aspheric surface testing techniquesStahl, H. Philip et al. | 1991
- 77
-
Interferometer for testing aspheric surfaces with electron-beam computer-generated hologramsGemma, Takashi / Hideshima, Masayuki / Taya, Makoto / Watanabe, Nobuko et al. | 1991
- 85
-
Rigorous optical theory of the D Sight phenomenonReynolds, Rodger L. / Hageniers, Omer L. et al. | 1991
- 97
-
Optical aspheric surface profiler using phase shift interferometrySasaki, Kenji / Ono, Akira et al. | 1991
- 107
-
Aspheric testing using null mirrorsMantravadi, Murty V. / Kumar, Vas / von Handorf, Robert J. et al. | 1991
- 115
-
Scattering measurements of optical coatings in high-power lasersChen, Yi-Sheng et al. | 1991
- 122
-
Application of real-time holographic interferometry in the nondestructive inspection of electronic parts and assembliesWood, Craig P. / Trolinger, James D. et al. | 1991
- 132
-
White-light transmission holographic interferometry using chromatic corrective filtersGrover, Chander P. et al. | 1991
- 142
-
TV holography and image processing in practical useLokberg, Ole J. / Ellingsrud, Svein / Vikhagen, Eiolf et al. | 1991
- 151
-
Holographic instrumentation for monitoring crystal growth in spaceTrolinger, James D. / Lal, Ravindra B. / Batra, Ashok K. et al. | 1991
- 166
-
Holotag: a novel holographic labelSoares, Oliverio D. / Bernardo, Luis M. / Pinto, Maria I. / Morais, F. V. et al. | 1991
- 185
-
Van der Lugt optical correlation for the measurement of leak rates of hermetically sealed packagesFitzpatrick, Colleen M. / Mueller, Edward P. et al. | 1991
- 193
-
Holographic interferometry in corrosion studies of metals: I. Theoretical aspectsHabib, Khaled J. et al. | 1991
- 205
-
Holographic interferometry in corrosion studies of metals: II. ApplicationsHabib, Khaled J. et al. | 1991
- 216
-
Numerical investigation of effect of dynamic range and nonlinearity of detector on phase-stepping holographic interferometryFang, Qiang / Luo, Xiangyang / Tan, Yushan et al. | 1991
- 224
-
Holography with a single picosecond pulseAbramson, Nils H. et al. | 1991
- 230
-
Holographic measurement of the angular error of a table moving along a slidewayMatsuda, Kiyofumi / Tenjimbayashi, Koji et al. | 1991
- 236
-
Optical testing by dynamic holographic interferometry with photorefractive crystals and computer image processingVlad, Ionel V. / Popa, Dragos / Petrov, M. P. / Kamshilin, Alexei A. et al. | 1991
- 245
-
Optical phase-conjugate resonators, bistabilities, and applicationsVenkateswarlu, Putcha / Dokhanian, Mostafa / Sekhar, Prayaga C. / George, M. C. / Jagannath, H. et al. | 1991
- 267
-
Phase-conjugate interferometry by using dye-doped polymer filmsNakagawa, Kazuo / Egami, Chikara / Suzuki, Takayoshi / Fujiwara, Hirofumi et al. | 1991
- 274
-
Phase-conjugate Twyman-Green interferometer for testing conicoidal surfacesShukla, Ram P. / Dokhanian, Mostafa / Venkateswarlu, Putcha / George, M. C. et al. | 1991
- 287
-
Nondestructive testing of printed circuit board by phase-shifting interferometryLu, Yueguang / Jiang, Lingzhen / Zou, Lixun / Zhao, Xia / Sun, Junyong et al. | 1991
- 294
-
Industrial applications of optical fuzzy syntactic pattern recognitionCaulfield, H. John et al. | 1991
- 301
-
Absolute range measurement system for real-time 3-D visionWood, Christopher M. / Shaw, Michael M. / Harvey, David M. / Hobson, Clifford A. / Lalor, Michael J. / Atkinson, John T. et al. | 1991
- 314
-
New stereo laser triangulation device for specular surface inspectionSamson, Marc / Dufour, Marc L. et al. | 1991
- 323
-
Visual inspection system using multidirectional 3-D imagerKoezuka, Tetsuo / Kakinoki, Yoshikazu / Hashinami, Shinji / Nakashima, Masato et al. | 1991
- 332
-
Real-time edge extraction by active defocusingHung, Y.Y. / Zhu, Quiming / Shi, Dahuan / Tang, Shouhong et al. | 1991
- 343
-
3-D camera based on differential optical absorbanceHoude, Regis / Laurendeau, Denis / Poussart, Denis et al. | 1991
- 355
-
Algorithm for the generation of look-up range table in 3-D sensingSu, Xianyu / Zhou, Wensen et al. | 1991
- 358
-
Information extracting and application for the combining objective speckle and reflection holographyCao, Zhengyuan / Cheng, Fang et al. | 1991
- 366
-
Surface inspection using optical fiber sensorAbe, Makoto / Ohta, Shigekata / Sawabe, Masaji et al. | 1991
- 377
-
Fiber optic smart structures: structures that see the lightMeasures, Raymond M. et al. | 1991
- 399
-
Near real-time operation of a centimeter-scale distributed fiber sensing systemGarside, Brian K. et al. | 1991
- 409
-
Geometric measurement of optical fibers with pulse-counting methodNie, Qiuhua / Nelson, John C. C. / Fleming, Simon C. et al. | 1991
- 421
-
Interferometric fiber optic sensors for use with composite materialsMeasures, Raymond M. / Valis, Tomas / Liu, Kexing / Hogg, W. D. / Ferguson, Suzanne M. / Tapanes, Edward et al. | 1991
- 431
-
Fiber optic damage detection for an aircraft leading edgeMeasures, Raymond M. / LeBlanc, Michel / Hogg, W. D. / McEwen, Keith / Park, B. K. et al. | 1991
- 446
-
Low- cost fiber optic sensing systems using spatial division multiplexingPaton, Barry E. et al. | 1991
- 456
-
Two-dimensional micropattern measurement using precision laser beam scanningFujita, Hiroo et al. | 1991
- 468
-
GRIN fiber lens connectorsGomez-Reino, Carlos C. / Linares, Jesus et al. | 1991
- 474
-
Laser-based triangulation techniques in optical inspection of industrial structuresClarke, Timothy A. / Grattan, Kenneth T. V. / Lindsey, N. E. et al. | 1991
- 487
-
Application of fiber optic sensors in pavement maintenanceShadaram, Mehdi / Solehjou, Amin / Nazarian, Soheil et al. | 1991
- 491
-
Laser ultrasonics: generation and detection considerations for improved signal-to-noise ratioWagner, James W. / Deaton, John B. / McKie, Andrew D. W. / Spicer, James B. et al. | 1991
- 504
-
Effects of the nonvanishing tip size in mechanical profile measurementsChurch, Eugene L. / Takacs, Peter Z. et al. | 1991
- 515
-
Three-dimensional nanoprofiling of semiconductor surfacesMontgomery, Paul C. / Fillard, Jean-Pierre / Tchandjou, N. / Ardisasmita, Syamsa M. et al. | 1991
- 525
-
Optical surface microtopography using phase-shifting Nomarski microscopeShimada, Wataru / Sato, Tadamitu / Yatagai, Toyohiko et al. | 1991
- 530
-
Laser moire topography for 3-D contour measurementMatsumoto, Tetsuya / Kitagawa, Yoichi / Adachi, Masaaki / Hayashi, Akihiro et al. | 1991
- 537
-
Nomarski viewing system for an optical surface profilerBietry, Joseph / Auriemma, R. A. / Bristow, Thomas C. / Merritt, Edward et al. | 1991
- 544
-
Surface microtopography of thin silver filmsCosta, Manuel F. M. / Almeida, Jose B. et al. | 1991
- 554
-
Design criteria of an integrated optics microdisplacement sensord'Alessandro, Antonio / De Sario, Marco / D'Orazio, Antonella / Petruzzelli, Vincenzo et al. | 1991
- 563
-
Laser-scanning tomography and related dark-field nanoscopy methodMontgomery, Paul C. / Gall-Borrut, Pascal / Ardisasmita, Syamsa M. / Castagne, Michel / Bonnafe, Jacques / Fillard, Jean-Pierre et al. | 1991
- 571
-
Super-accurate positioning technique using diffracted moire signalsTakada, Yutaka / Uchida, Yoshiyuki / Akao, Yasuo / Yamada, Jun / Hattori, Shuzo et al. | 1991
- 577
-
Moire displacement detection by the photoacoustic techniqueHane, Kazuhiro / Watanabe, S. / Goto, Toshio et al. | 1991
- 584
-
Displacement measurement using grating images detected by CCD image sensorHane, Kazuhiro / Grover, Chander P. et al. | 1991
- 591
-
Noncontact technique for the measurement of linear displacement using chirped diffraction gratingsSpillman, William B. / Fuhr, Peter L. et al. | 1991
- 602
-
Interferometric measurement of in-plane motionHercher, Michael / Wijntjes, Geert J. et al. | 1991
- 613
-
Automatic mask-to-wafer alignment and gap control using moire interferometryChitnis, Vijay T. / Varadan, Kowsalya / Rashmi, M. S. / Kanjilal, Alok K. / Narain, Ram et al. | 1991
- 624
-
Interference phenomenon with correlated masks and its applicationGrover, Chander P. / Hane, Kazuhiro et al. | 1991
- 632
-
Multichannel chromatic interferometry: metrology applicationsTribillon, Gilbert M. / Calatroni, Jose E. / Sandoz, Patrick et al. | 1991
- 643
-
Fringe-scanning moire system using a servo-controlled gratingKurokawa, Haruhisa / Ichikawa, Naoki / Yajima, Nobuyuki et al. | 1991
- 655
-
New Zeiss interferometerKuechel, Michael F. et al. | 1991
- 664
-
Software concept for the new Zeiss interferometerDoerband, Bernd / Wiedmann, Wolfgang / Wegmann, Ulrich / Kuebler, C. W. / Freischlad, Klaus R. et al. | 1991
- 673
-
New technique for multiplying the isoclinic fringesWen, Mei-Yuan / Liu, Guang T. et al. | 1991
- 678
-
Review of interferogram analysis methodsMalacara-Hernandez, Daniel et al. | 1991
- 690
-
Automatic, high-resolution analysis of low-noise fringesLassahn, Gordon D. et al. | 1991
- 696
-
Three-dimensional surface inspection using interferometric grating and 2-D FFT-based techniqueHung, Y.Y. / Tang, Shouhong / Zhu, Quiming et al. | 1991
- 704
-
Review of phase-measuring interferometryStahl, H. Philip et al. | 1991
- 720
-
White-light moire phase-measuring interferometryStahl, H. Philip et al. | 1991
- 731
-
New phase measurement for nonmonotonical fringe patternsTang, Shouhong / Hung, Y.Y. / Zhu, Quiming et al. | 1991
- 738
-
Synchronous phase-extraction technique and its applicationsHung, Y.Y. / Tang, Shouhong / Jin, Guofan / Zhu, Quiming et al. | 1991
- 750
-
Optical techniques for determination of normal shock position in supersonic flows for aerospace applicationsAdamovsky, Grigory / Eustace, John G. et al. | 1991
- 757
-
Two-dimensional surface strain measurement based on a variation of Yamaguchi's laser-speckle strain gaugeBarranger, John P. et al. | 1991
- 767
-
Estimation of plastic strain by fractalDai, YuZhong / Chiang, Fu-Pen et al. | 1991
- 775
-
Photoelastic transducer for high-temperature applicationsRedner, Alex S. / Adamovsky, Grigory / Wesson, Laurence N. et al. | 1991
- 783
-
Simultaneous measurement of refractive index and thickness of thin film by polarized reflectancesKihara, Tami / Yokomori, Kiyoshi et al. | 1991
- 792
-
Study of oxidization process in real time using speckle correlationMuramatsu, Mikiya / Guedes, G. H. / Matsuda, Kiyofumi / Barnes, Thomas H. et al. | 1991
- 798
-
Application of speckle metrology at a nuclear waste repositoryConley, Edgar / Genin, Joseph et al. | 1991
- 802
-
Study of microbial growth I: by diffractionWilliams, Gareth T. / Bahuguna, Ramendra D. / Arteaga, Humberto / Le Joie, Elaine N. et al. | 1991
- 805
-
Study of microbial growth II: by holographic interferomeryBahuguna, Ramendra D. / Williams, Gareth T. / Pour, Iraj K. / Raman, R. et al. | 1991
- 808
-
Basic use of acoustic speckle pattern for metrology and sea waves studyHe, Duo-Min / He, Ming-Shia et al. | 1991
- 820
-
Optical three-dimensional sensing for measurement of bottomhole patternSu, Wan-Yong / Su, Xianyu et al. | 1991
- 826
-
Light scattered by coated paperMarx, Egon / Song, Jun-Feng / Vorburger, Theodore V. / Lettieri, Thomas R. et al. | 1991
- 835
-
Statistical properties of intensity fluctuations produced by rough surfaces under the speckle pattern illuminationYoshimura, Takeaki / Fujiwara, Kazuo / Miyazaki, Eiichi et al. | 1991
- 843
-
Applications of diamond-turned null reflectors for generalized aspheric metrologyMcCann, James T. et al. | 1991
- 850
-
Measurement of fluid velocity fields using digital correlation techniquesMatthys, Donald R. / Gilbert, John A. / Puliparambil, Joseph T. et al. | 1991
- 862
-
Studies on laser dynamic precision measurement of fine-wire diametersBao, Liangbi / Chen, Fuyao / Wu, Shixiong / Xu, Jiangtong / Guan, Zhilian et al. | 1991
- 868
-
Measurement of interfacial tension by automated video techniquesDeason, Vance A. / Miller, Randall L. / Watkins, Arthur D. / Ward, Michael B. / Barrett, Karen B. et al. | 1991
- 877
-
Design parameters of an EO sensorTanwar, Lakhan S. / Jain, P. C. / Kunzmann, Horst et al. | 1991