8.1.2.2.3 ZnO (1100) (English)
8.1.2.2 Semiconductors
- New search for: Chiaradia, P.
- New search for: Chiarotti, G.
- New search for: Chiaradia, P.
In:
Interaction of Radiation with Surfaces and Electron Tunneling
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66-67
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1996
- Article/Chapter (Book) / Electronic Resource
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Title:8.1.2.2.3 ZnO (1100)
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Subtitle:8.1.2.2 Semiconductors
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Contributors:Chiarotti, G. ( editor ) / Chiaradia, P. ( author )
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Published in:Landolt-Börnstein - Group III Condensed Matter ; 24D ; 66-67
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Publisher:
- New search for: Springer Berlin Heidelberg
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Place of publication:Berlin, Heidelberg
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Publication date:1996-01-01
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Size:2 pages
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ISBN:
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ISSN:
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DOI:
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Type of media:Article/Chapter (Book)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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1.1 Motivations for a Landolt-Bömstein volume on surface physicsChiarotti, G. et al. | 1996
- 2
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1.2 Outline of the volumeChiarotti, G. et al. | 1996
- 12
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1.3 How to consult the volumeChiarotti, G. et al. | 1996
- 13
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1.4 List of frequently used symbols and abbreviationsChiarotti, G. et al. | 1996
- 20
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1.5 Conversion tablesChiarotti, G. et al. | 1996
- 21
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1.6 Crystal structures and bulk lattice parameters of materials quoted in the volumeChiarotti, G. et al. | 1996
- 27
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1.7 References for 1Chiarotti, G. et al. | 1996
- 29
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8.1.1.2 Differential reflectionChiaradia, P. et al. | 1996
- 32
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8.1.1.3 Surface ellipsometryChiaradia, P. et al. | 1996
- 34
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8.1.1.5 Surface photovoltage spectroscopyChiaradia, P. et al. | 1996
- 35
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8.1.1.6 Photothermal displacement spectroscopyChiaradia, P. et al. | 1996
- 36
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8.1.2.1 MetalsChiaradia, P. et al. | 1996
- 38
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8.1.2.2.1 Covalent semiconductorsChiaradia, P. et al. | 1996
- 53
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8.1.2.2.2 III-V compoundsChiaradia, P. et al. | 1996
- 66
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8.1.2.2.3 ZnO (1100)Chiaradia, P. et al. | 1996
- 67
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8.1.3 AppendixChiaradia, P. et al. | 1996
- 68
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8.1.4 References for 8.1Chiaradia, P. et al. | 1996
- 70
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8.2.1 IntroductionBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 76
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8.2.2 DataBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 77
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8.2.2.1.1 Group IA (alkali metals); Li, Na, K, Rb, CsBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 86
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8.2.2.1.2 Group IIA (alkaline earth metals); Be, MgBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 100
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8.2.2.1.3 Group IIIA; AlBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 112
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8.2.2.1.4 Group IIIB; Sc, Y, LanthanidesBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 124
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8.2.2.1.5 Group IVB; TiBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 127
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8.2.2.1.6 Group VB; Nb,TaBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 137
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Cr, Mo, W; Figs. 96 - 113, Tables 8 - 9Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 150
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Cr, Mo, W; Figs. 114 - 131, Tables 10 - 12Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 161
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8.2.2.1.8 Group VIIB; ReBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 162
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Fe, Ru, Os, Co, Rh, Ir, Ni, Pd, Pt; Figs. 133 - 148, Tables 13 - 16Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 173
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Fe, Ru, Os, Co, Rh, Ir, Ni, Pd, Pt; Figs. 149 - 167, Tables 17 - 20Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 184
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Fe, Ru, Os, Co, Rh, Ir, Ni, Pd, Pt; Figs. 168 - 190, Tables 21 - 22Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 195
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Cu, Ag, Au; Figs. 191 - 209, Tables 23 - 25Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 206
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Cu, Ag, Au; Figs. 210 - 228, Tables 25 - 26Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 217
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Cu, Ag, Au; Figs. 229 - 242, Tables 27 - 29Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 227
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8.2.2.1.11 Group VA; BiBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 231
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C, Si, Ge; Figs. 248 - 267, Tables 30 - 33Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 246
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C, Si, Ge; Figs. 268 - 294, Tables 34 - 35Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 261
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8.2.2.2.2 Semiconducting Zn compounds; ZnO, ZnS, ZnSeBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 265
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8.2.2.2.3 II-VI compounds; CdS, CdSe, CdTeBradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 276
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GaP, GaAs, GaSb, InP, InAs, InSb; Figs. 321 - 343, Tables 36 - 37Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 287
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GaP, GaAs, GaSb, InP, InAs, InSb; Figs. 344 - 363Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 299
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8.2.3 References for 8.2Bradshaw, A. M. / Hemmen, R. / Ricken, D. E. / Schedel-Niedrig, Th. et al. | 1996
- 312
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8.3.1.1 Preliminary remarksColella, R. et al. | 1996
- 313
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8.3.1.2 General principles. Early experimental resultsColella, R. et al. | 1996
- 317
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8.3.1.3 In Plane Diffraction (IPD)Colella, R. et al. | 1996
- 318
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8.3.1.4 Truncation Rod Scattering (TRS)Colella, R. et al. | 1996
- 320
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8.3.1.5 Standing wavesColella, R. et al. | 1996
- 323
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Figs. 10 - 21, Tables 1 - 5Colella, R. et al. | 1996
- 332
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Figs. 22 - 37, Tables 6 - 7Colella, R. et al. | 1996
- 340
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8.3.3 Referenees for 8.3Colella, R. et al. | 1996
- 342
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9.1.1.1 General layoutKelwog, G. L. et al. | 1996
- 343
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9.1.1.2.1 Theory of field electron emissionKelwog, G. L. et al. | 1996
- 344
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9.1.1.2.3 Applications of field electron emissionKelwog, G. L. et al. | 1996
- 346
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9.1.1.3.1 Theory of field ionizationKelwog, G. L. et al. | 1996
- 347
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9.1.1.3.2 Field ion microscopyKelwog, G. L. et al. | 1996
- 348
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9.1.1.4.1 Theory of field desorptionKelwog, G. L. et al. | 1996
- 350
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9.1.1.4.2 Atom-probe mass spectroscopyKelwog, G. L. et al. | 1996
- 351
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9.1.1.4.3 Applications of field desorptionKelwog, G. L. et al. | 1996
- 352
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9.1.2 DataKelwog, G. L. et al. | 1996
- 359
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9.1.3 References for 9.1Kelwog, G. L. et al. | 1996
- 363
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9.2.1.1 Principles and experimental implementation of STMHamers, R. J. et al. | 1996
- 364
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9.2.1.2 Interpretation of STM imagesHamers, R. J. et al. | 1996
- 366
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9.2.1.3 Electron structure effectsHamers, R. J. et al. | 1996
- 368
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9.2.1.4 Tunneling spectroscopyHamers, R. J. et al. | 1996
- 371
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9.2.1.5 Limitations and continued development of STMHamers, R. J. et al. | 1996
- 372
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9.2.2.1 MetalsHamers, R. J. et al. | 1996
- 374
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Figs. 9 - 23Hamers, R. J. et al. | 1996
- 387
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Figs. 24 - 36Hamers, R. J. et al. | 1996
- 398
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9.2.3 References for 9.2Hamers, R. J. et al. | 1996
- 403
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10.1 IntroductionGoletti, C. et al. | 1996
- 407
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10.2 Index of surfacesGoletti, C. et al. | 1996