Electronic speckle pattern interferometry on a microscopic scale (English)
National licence
- New search for: Deaton, John B. Jr.
- New search for: Wagner, James W.
- New search for: Rogowski, Robert S.
- New search for: Deaton, John B. Jr.
- New search for: Wagner, James W.
- New search for: Rogowski, Robert S.
In:
Journal of Nondestructive Evaluation
;
13
, 1
;
13-22
;
1994
- Article (Journal) / Electronic Resource
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Title:Electronic speckle pattern interferometry on a microscopic scale
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Contributors:
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Published in:Journal of Nondestructive Evaluation ; 13, 1 ; 13-22
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Publisher:
- New search for: Kluwer Academic Publishers-Plenum Publishers
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Place of publication:New York
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Publication date:1994-03-01
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Size:10 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 13, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Identification of crack size via an energy approachKam, T. Y. / Lee, T. Y. et al. | 1994
- 13
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Electronic speckle pattern interferometry on a microscopic scaleDeaton, John B. Jr. / Wagner, James W. / Rogowski, Robert S. et al. | 1994
- 23
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Magnetic imaging of reinforcing steelPla, Geneviève F. / Eberhard, Marc O. / Eberhard, Philippe H. et al. | 1994
- 33
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Fresnel arrays for the study of Lamb waves in laser ultrasonicsCostley, R. Daniel Jr. / Berthelot, Yves H. / Jacobs, Laurence J. et al. | 1994
- 43
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Announcement| 1994