Automatic IC orientation checks (English)
National licence
- New search for: Kassim, A.A.
- New search for: Zhou, H.
- New search for: Ranganath, S.
- New search for: Kassim, A.A.
- New search for: Zhou, H.
- New search for: Ranganath, S.
In:
Machine Vision and Applications
;
12
, 3
;
107-112
;
2000
- Article (Journal) / Electronic Resource
-
Title:Automatic IC orientation checks
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Contributors:
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Published in:Machine Vision and Applications ; 12, 3 ; 107-112
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Publisher:
- New search for: Springer-Verlag
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Place of publication:Berlin/Heidelberg
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Publication date:2000-10-01
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Size:6 pages
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 12, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 107
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Automatic IC orientation checksKassim, A.A. / Zhou, H. / Ranganath, S. et al. | 2000
- 113
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An automatic assessment scheme for steel quality inspectionWiltschi, Klaus / Pinz, Axel / Lindeberg, Tony et al. | 2000
- 129
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Perceptual correction for colour grading of random texturesBoukouvalas, C. / Petrou, M. et al. | 2000
- 137
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Building a color classification system for textured and hue homogeneous surfaces: system calibration and algorithmDaul, Christian / Rösch, Ronald / Claus, Bernhard et al. | 2000
- 149
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A golden-template self-generating method for patterned wafer inspectionXie, Pin / Guan, Sheng-Uei et al. | 2000