Higher Resolution Scanning Probe Methods for Magnetic Imaging — 2015 (English)
- New search for: Piramanayagam, S. N.
- New search for: Varghese, Binni
- New search for: Piramanayagam, S. N.
- New search for: Varghese, Binni
In:
Surface Science Tools for Nanomaterials Characterization
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463-487
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2015
- Article/Chapter (Book) / Electronic Resource
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Title:Higher Resolution Scanning Probe Methods for Magnetic Imaging
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Contributors:Piramanayagam, S. N. ( author ) / Varghese, Binni ( author )
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Published in:
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Edition:2015
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Publisher:
- New search for: Springer Berlin Heidelberg
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Place of publication:Berlin, Heidelberg
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Publication date:2015-01-01
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Size:25 pages
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ISBN:
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DOI:
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Type of media:Article/Chapter (Book)
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Type of material:Electronic Resource
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Language:English
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Keywords:Magnetic Force Microscopy , Perpendicular Magnetic Anisotropy , Stray Field , Magnetic Vortex , Magnetostatic InteractionChemistry , Nanochemistry , Nanotechnology , Nanoscale Science and Technology , Advanced Technology , magnetic force microscopy , instruments and methods , magnetic material , longitudinal magnetic recording medium , perpendicular magnetic recording media , bit-patterned media , remanence , switching field distribution , antiferromagnetic coupling , perpendicular magnetic anisotropy , magnetic recording , focused ion beam etching , magnetic force microscopy resolution , magnetic vortex , magnetic anisotropy , CoCrTa , magnetic force microscopy image , CoCrPtTa , Co-Pd , magnetic domain structure , Ru , ruthenium , FePt , remanent magnetization , ([Co-Pt]x-1-Co-Ru)n , film thickness , Co , cobalt , carbon nanotube on silicon , CoCrPt , layer thickness , MgO , magnesium oxide , CoFe on CNT
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Source:
Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)Herpich, Max / Friedl, Jochen / Stimming, Ulrich et al. | 2015
- 69
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Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and ApplicationChaibva, Maxmore / Shamitko-Klingensmith, Nicole / Legleiter, Justin et al. | 2015
- 91
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Scanning Probe Microscopy for NanolithographySamantaray, C. B. et al. | 2015
- 117
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Kelvin Probe Force Microscopy in Nanoscience and NanotechnologyLuo, Da / Sun, Hao / Li, Yan et al. | 2015
- 159
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Field Ion Microscopy for the Characterization of Scanning ProbesPaul, William / Grütter, Peter et al. | 2015
- 199
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Scanning Conductive Torsion Mode MicroscopySun, Ling / Bonaccurso, Elmar et al. | 2015
- 227
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Field Ion and Field Desorption Microscopy: Principles and ApplicationsSuchorski, Yuri et al. | 2015
- 273
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Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesBaykara, Mehmet Z. et al. | 2015
- 317
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Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of NanomaterialsDoh, W. H. / Papaefthimiou, V. / Zafeiratos, S. et al. | 2015
- 367
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Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron SpectroscopyNakayama, Yasuo / Ishii, Hisao et al. | 2015
- 405
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Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron SpectroscopyApostol, Nicoleta Georgiana / Teodorescu, Cristian-Mihail et al. | 2015
- 463
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Higher Resolution Scanning Probe Methods for Magnetic ImagingPiramanayagam, S. N. / Varghese, Binni et al. | 2015
- 489
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Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force MicroscopyBlock, Stephan et al. | 2015
- 531
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Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic NanostructuresFernández-Pacheco, Amalio / Cowburn, Russell P. / Serrano-Ramón, Luis E. / Ibarra, M. Ricardo / De Teresa, José M. et al. | 2015
- 561
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High Resolution STM ImagingChaika, Alexander N. et al. | 2015
- 621
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Numerical and Finite Element Simulations of Nanotips for FIM/FEMRezeq, Moh’d / Ali, Ahmed E. / Homouz, Dirar et al. | 2015