X-Ray Diffraction Methods for the Determination of Stresses and Strains in Multilayer Monocrystal Films (English)
National licence
- New search for: Chukhovskii, F. N.
- New search for: Khapachev, Yu. P.
- New search for: Chukhovskii, F. N.
- New search for: Khapachev, Yu. P.
In:
Crystallography Reviews
;
3
, 3
;
257-324
;
1993
- Article (Journal) / Electronic Resource
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Title:X-Ray Diffraction Methods for the Determination of Stresses and Strains in Multilayer Monocrystal Films
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Contributors:Chukhovskii, F. N. ( author ) / Khapachev, Yu. P. ( author )
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Published in:Crystallography Reviews ; 3, 3 ; 257-324
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Publisher:
- New search for: Taylor & Francis
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Publication date:1993-12-01
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Size:68 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 3, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Editorial board page for “Crystallography Reviews”, Volume 3, Number 3| 1993
- 255
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EditorialMoore, Moreton et al. | 1993
- 257
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X-Ray Diffraction Methods for the Determination of Stresses and Strains in Multilayer Monocrystal FilmsChukhovskii, F. N. / Khapachev, Yu. P. et al. | 1993