Electron and neutron radiation damage effects on a two-phase CCD (English)
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In:
IEEE Transactions on Nuclear Science
;
47
, 3, pt.4
;
1280-1291
;
2000
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ISSN:
- Article (Journal) / Print
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Title:Electron and neutron radiation damage effects on a two-phase CCD
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Contributors:Stefanov, K.D. ( author ) / Tsukamoto, T. ( author ) / Miyamoto, A. ( author ) / Sugimoto, Y. ( author ) / Tamura, N. ( author ) / Abe, K. ( author ) / Nagamine, T. ( author ) / Aso, T. ( author )
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Published in:IEEE Transactions on Nuclear Science ; 47, 3, pt.4 ; 1280-1291
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Publisher:
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Publication date:2000
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Size:12 Seiten, 25 Quellen
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ISSN:
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Coden:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Keywords:
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Source:
Table of contents – Volume 47, Issue 3, pt.4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1268
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Response of a wireline pickup for subnanosecond electron beam pulsesSawamura, T. / Homma, A. / Kitaichi, M. / Narita, M. / Okuda, S. / Yamamoto, T. / Suemine, S. et al. | 2000
- 1280
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Electron and neutron radiation damage effects on a two-phase CCDStefanov, K.D. / Tsukamoto, T. / Miyamoto, A. / Sugimoto, Y. / Tamura, N. / Abe, K. / Nagamine, T. / Aso, T. et al. | 2000