Geometrical tolerancing of sculptured surfaces and profiles (English)
- New search for: Lunze, Ulrich
- New search for: Schmidt, Katja
- New search for: Lunze, Ulrich
- New search for: Schmidt, Katja
In:
ICS, International Colloquium on Surfaces, 11, Internationales Oberflächenkolloquium, 11
;
219-226
;
2004
-
ISBN:
- Conference paper / Print
-
Title:Geometrical tolerancing of sculptured surfaces and profiles
-
Additional title:Geometrische Tolerierung von gegliederten Oberflächen und Profilen
-
Contributors:Lunze, Ulrich ( author ) / Schmidt, Katja ( author )
-
Published in:
-
Publisher:
- New search for: Shaker
-
Place of publication:Aachen
-
Publication date:2004
-
Size:8 Seiten, 10 Bilder, 10 Quellen
-
ISBN:
-
Type of media:Conference paper
-
Type of material:Print
-
Language:English
-
Keywords:
-
Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
Metrological scanning force microscopy applicable for surface evaluationPohlenz, F. / Dai, G. / Danzerbrink, H.U. / Krüger-Sehm, R. / Hasche, K. et al. | 2004
- 31
-
Profile assessment of nano roughness standards by contact and non-contact methodsKrüger-Sehm, R. / Dziomba, T. / Dai, G. et al. | 2004
- 41
-
Vertically scanning white light interferometer with large field of viewSchüssler, Matthias / Schmid, Henrik et al. | 2004
- 75
-
Linear silicon gratings with different profiles: trapezoidal, triangular, rectangular, archedFrühauf, J. / Krönert, S. et al. | 2004
- 84
-
A replication technique for measuring profilometer styliDowidar, H.A.M. / Chetwynd, D.G. et al. | 2004
- 102
-
Artefacts and test procedures for contour measuring instrumentsFranke, M. / Jusko, O. / Krystek, M. / Neugebauer, M. / Neuschaefer-Rube, U. / Wäldele, F. et al. | 2004
- 108
-
Consistent standards for nanometrology or step height versus film thickness measurementThomsen-Schmidt, P. / Pohlenz, F. / Ulm, G. / Krumrey, M. / Hasche, K. et al. | 2004
- 117
-
Lateral & vertical calibration of scanning probe microscopes and their measurement uncertaintyDziomba, T. / Koenders, L. / Danzebrink, H.U. / Wilkening, G. et al. | 2004
- 129
-
The use of standard specimens to check stylus tip size in surface measuring instrumentsRubert, P. / Frenzel, C. et al. | 2004
- 139
-
Supplementary comparison in the field of nanometrology: step height (NANO 2)Koenders, L. / Wilkening, G. et al. | 2004
- 170
-
Calibration procedures for fringe projection measuring systems in 3DBöttner, Thomas / Seewig, Jörg / Meeß, Karsten / Haase, Rainer et al. | 2004
- 208
-
Experiences in form measuring with coordinate measurement instrumentsWanner, J. et al. | 2004
- 219
-
Geometrical tolerancing of sculptured surfaces and profilesLunze, Ulrich / Schmidt, Katja et al. | 2004
- 227
-
The measurement of deviations of form and position of surfaces and axes of important cylindrical partsRadev, Hristo / Spasov, Lubim / Bogev, Vassil / Djambazov, Milko et al. | 2004