The errors of measurements of two-process surfaces (English)
- New search for: Pawlus, Pawel
- New search for: Grabon, Wieslaw
- New search for: Michalski, Jacek
- New search for: Pawlus, Pawel
- New search for: Grabon, Wieslaw
- New search for: Michalski, Jacek
In:
International Colloquium on Surfaces, 12, Internationales Oberflächenkolloquium, 12
;
286-295
;
2008
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ISBN:
- Conference paper / Print
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Title:The errors of measurements of two-process surfaces
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Contributors:
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Published in:
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Publisher:
- New search for: Shaker
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Place of publication:Aachen
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Publication date:2008
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Size:10 Seiten, 6 Bilder, 8 Quellen
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ISBN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Real mechanical surface versus electro-magnetic surfaceDietzsch, Michael / Gröger, Sophie / Gerlach, Marco et al. | 2008
- 15
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Towards 3D characterisation of cylinder liner surfacesDimkovski, Zlate / Anderberg, Cecilla / Strömstedt, Fredrik / Johansson, Staffan / Ohlsson, Robert / Rosen, B.G. et al. | 2008
- 25
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Form measurement with different types of instruments - Measurement conditions and comparability of resultsHeldt, Eberhard / Meyer, Maik et al. | 2008
- 35
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Correct roughness evaluation on non-flat surfacesKedziora, Heinz-J. et al. | 2008
- 43
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Optical high speed twist characterisationSeewig, J. / Jordan, H.J. / Hercke, T. / Volk, R. et al. | 2008
- 50
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A new envelope system for the evaluation of functional surfacesGröger, Sophie / Dietzsch, Michael / Gerlach, Marco et al. | 2008
- 60
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Function-oriented measurements of fine machined automotive parts by means of a new light scattering sensorBrodmann, Boris / Brodmann, Rainer / Hercke, Tobias et al. | 2008
- 70
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Roughness estimation of self-aligning ball bearings outer race under various levels of vibrationLitvinov, D. / Rudzitis, J. et al. | 2008
- 78
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Wear process of textured ring examined by measurements of surface topographyGalda, Lidia / Pawlus, Pawel / Dzierwa, Andrzej et al. | 2008
- 88
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Function oriented assessment and tolerancing of surface characteristics utilising examples from the automotive industryBeck, C. / Pleul, R. / Hörning, M. / Lemke, H.W. et al. | 2008
- 102
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3D surface measurement by low voltage scanning electron microscopeVynnyk, T. / Seewig, J. / Reithmeier, E. et al. | 2008
- 110
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Measuring strategies for smooth tool steel surfacesBerglund, J. / Jonsson, P. / Rebeggiani, S. / Rosen, B.G. et al. | 2008
- 120
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Amplitude-wavelength space in three dimensionsJones, Christopher W. / Leach, Richard K. et al. | 2008
- 126
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Investigation of tip reconstruction with Markovian estimation functionsBakucz, P. / Krüger-Sehm, R. / Koenders, L. et al. | 2008
- 135
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Report on the results of an intercomparison, using stylus-type and non-contacting surface measuring instrumentsRubert, Paul et al. | 2008
- 143
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Novel method for inline estimation of probing uncertainty in optical contour measurementsTöpfer, S.C.N. / Linß, G. et al. | 2008
- 153
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Measurement uncertainty in dimensional metrologyKrystek, Michael et al. | 2008
- 163
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Simple method of surface roughness microtopographycal parameters determinationKumermanis, M. / Rudzitis, J. et al. | 2008
- 167
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Using fractal analysis for surface roughness researchSonin, S.V. et al. | 2008
- 175
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Self-assembled Ge/Si islands as novel nano-roughness standards for scanning force microscopyDziomba, T. / Shaleev, M. / Rahlves, M. / Seewig, J. / Krüger-Sehm, R. et al. | 2008
- 185
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Tolerierung und Messung von ProfilformabweichungenLunze, U. / Gläser, A. / Schmidt, K. / Rauh, W. et al. | 2008
- 190
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Integral optical characterization of functional surface propertiesPatzelt, Stefan / Tausendfreund, Andreas / Osmer, Jens / Goch, Gert / Brinksmeier, Ekkard et al. | 2008
- 200
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Optical chromatic confocal probesJordan, H.J. et al. | 2008
- 210
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White light interferometry utilizing the large measuring volume of a nanopositioning and nanomeasuring machineKapusi, D. / Machleidt, T. / Manske, E. / Franke, K.H. / Jahn, R. et al. | 2008
- 218
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Multisensor metrology for nanostructured technical surfacesWeckenmann, A. / Heidemann, L. / Tan, Ö. / Wiedenhoefer, T. et al. | 2008
- 228
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Two beam optical deflection sensor for topography measurementGroßmann, M. / Hehl, K. / Hertzsch, A. / Kröger, K. et al. | 2008
- 236
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Form analysis of parabolic mirrors with laser tracker technologyJuretzko, Manfred et al. | 2008
- 246
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Application of scanning profilometry for investigation discharge traces generated during electro-discharge machinig (EDM) and electro- discharge alloying (EDA)Nowicki, B. / Dmowska, A. / Podolak, A. et al. | 2008
- 258
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The influence of surface roughness on the maximum slope angle measurable with area based optical microsensorsNeugebauer, Michael / Ehrig, Wiebke / Jusko, Otto / Neuschaefer-Rube, Ulrich et al. | 2008
- 268
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Comparison of classic and robust Gauss filtering for the determination of waviness of non-isotropic surfacesHuertos, F.J. / Clarysse, F. / Vermeulen, M. / Seewig, J. et al. | 2008
- 286
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The errors of measurements of two-process surfacesPawlus, Pawel / Grabon, Wieslaw / Michalski, Jacek et al. | 2008
- 296
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Application of etched silicon springs as guiding mechanism for the stylus in tactile surface profilersFrühauf, J. / Seifert, M. / Sorger, A. et al. | 2008
- 306
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Robust wavelet filtering in roughness measurementBakucz, P. / Krüger-Sehm, R. et al. | 2008
- 313
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Assessment of tactile profilers by use of regular surface artefacts with periodically triangular cross sectionSeifert, M. / Frühauf, J. / Krüger-Sehm, R. / Dziomba, T. et al. | 2008
- 323
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Calibration of an electromagnetic force compensation systemThomsen-Schmidt, P. / Krüger-Sehm, R. et al. | 2008
- 328
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Measurement of geometric primitives with uncertainty estimationDanzl, Reinhard / Helmli, Franz et al. | 2008
- 336
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Virtual flight through the workpiece - 3D-quality assurance by means of x-ray computer tomographySchmitt, R. / Dietrich, B. / Pollmanns, S. et al. | 2008
- 346
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Measuring precisely and traceably using x-ray computed tomographyChristoph, R. / Rauh, W. et al. | 2008
- 355
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Optimized CT metrology through adaptive image processing techniquesWeiß, Daniel / Lettenbauer, Hubert et al. | 2008
- 364
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Innovative solutions for 3D computer tomography data evaluation in industrial applicationsEffenberger, Ira / Kroll, Julia / Verl, Alexander et al. | 2008
- 374
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Acquire quality management competences - Model quality management processes - Prepare service-oriented architectures (SOA)Domschke, Marina / Christoph, Thomas / Dietzsch, Michael et al. | 2008
- 383
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Towards optimized sampling of surface roughnessRosen, B.G. et al. | 2008
- 393
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Surface topography with PDI holographyBaath, L.B. / Abu Dalou, S.K. / Rosen, B.G. et al. | 2008
- 403
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Structured surfaces; A new paradigm in surface metrologyBlunt, Liam / Jiang, Xiang / Scott, Paul et al. | 2008
- 411
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Erfassungsstrategie für das Paarungsmaß eines zylindrischen GeometrieelementesGerlach, Marco et al. | 2008
- 424
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Development and evaluation of a measurement standard for traceability of the strip projection processKeiner, J. / Frankowski, G. / Gröger, S. et al. | 2008