Direct comparison of two independent Josephson voltage standards at 1 V and precision measurements up to 10 V (English)
- New search for: Popel, R.
- New search for: Niemeyer, J.
- New search for: Grimm, L.
- New search for: Dunschede, F.
- New search for: Meier, W.
- New search for: Popel, R.
- New search for: Niemeyer, J.
- New search for: Grimm, L.
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In:
IEEE Transactions on Instrumentation and Measurement
;
40
, 5
;
805-810
;
1991
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ISSN:
- Article (Journal) / Print
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Title:Direct comparison of two independent Josephson voltage standards at 1 V and precision measurements up to 10 V
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Additional title:Direkter Vergleich zweier unabhängiger Josephson-Spannungsnormen von 1 V und Genauigkeitsmessungen bis 10 V
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Contributors:Popel, R. ( author ) / Niemeyer, J. ( author ) / Grimm, L. ( author ) / Dunschede, F. ( author ) / Meier, W. ( author )
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Published in:IEEE Transactions on Instrumentation and Measurement ; 40, 5 ; 805-810
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Publisher:
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Publication date:1991
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Size:6 Seiten, 6 Quellen
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Keywords:
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Source:
Table of contents – Volume 40, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 805
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Direct comparison of two independent Josephson voltage standards at 1 V and precision measurements up to 10 VPopel, R. / Niemeyer, J. / Grimm, L. / Dunschede, F. / Meier, W. et al. | 1991
- 811
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FIR prediction using Newton's backward interpolation algorithm with smoothed successive differencesOvaska, S.J. et al. | 1991
- 816
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A comparison of two correlation schemesMickelson, R.L. / Swenson, G.W. jun. et al. | 1991
- 820
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Adaptive noise filtering using an error-backpropagation neural networkWeber, M. / Crilly, P.B. / Blass, W.E. et al. | 1991
- 831
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Analysis of mismatch effects among A/D converters in a time-interleaved waveform digitizerPetraglia, A. / Mitra, S.K. et al. | 1991
- 842
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Free-space, broadband measurements of high-temperature, complex dielectric properties at microwave frequenciesVaradan, V.V. / Hollinger, R.D. / Ghodgaonkar, D.K. / Varadan, V.K. et al. | 1991
- 847
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An automated system for characterizing ultrasonic transducers using pattern recognitionObaidat, M.S. / Ekis, J.W. et al. | 1991
- 851
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An optical self-calibrating technique for the dynamic characterization of PZT'sMinoni, U. / Docchio, F. et al. | 1991
- 872
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Comments, with reply, on "A digital frequency independent phasemeter" by A. NematRathore, T.S. / Mombasawala, L.S. et al. | 1991