High Resolution Neutron Diffraction Study of Structural Anomalies in K1-x(ND4)xD2PO4 Mixed Crystals (English)
National licence
- New search for: Belushkin, A.V.
- New search for: Ibberson, R.M.
- New search for: Shuvalov, L.A.
In:
Materials Science Forum
;
228-231
;
771-776
;
1996
- Article (Journal) / Electronic Resource
-
Title:High Resolution Neutron Diffraction Study of Structural Anomalies in K1-x(ND4)xD2PO4 Mixed Crystals
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Contributors:
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Published in:Materials Science Forum ; 228-231 ; 771-776
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Publisher:
- New search for: Trans Tech Publications
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Place of publication:Stafa-Zurich, Switzerland
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Publication date:1996-07-19
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Size:6 pages
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 228-231
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 3
-
Structure Determination from Very Small Crystals| 1996
- 11
-
Analysis of Strain Fields by Means of Diffraction-Line Broadening| 1996
- 19
-
Application of the Smooth Genetic Algorithm for Indexing Powder Patterns – Tests for the Orthorhombic System| 1996
- 25
-
A Criterion for Correct Indexing of Powder Diffraction Diagrams Based on Preferred Orientation (Texture)| 1996
- 29
-
Rietveld Refinement Using Debye-Scherrer Film Techniques| 1996
- 35
-
Integration of Intensity and Angle Calibration into Rietveld Refinement| 1996
- 39
-
Ab Initio Calculations of Diffraction Patterns of Submicron Powders| 1996
- 43
-
Addition Method in the Quantitative Analysis: Dependence of Error on the Quantity of Additive| 1996
- 49
-
DOP-FIT Method for Quantitative Analysis of Multicomponent Powders| 1996
- 55
-
Quantitative X-Ray Phase Analysis of Materials with Disordered Structures| 1996
- 59
-
A New Possibility for Powder Diffraction: The Characterization of the Domain Microstructure in a Ferroelectric Material| 1996
- 67
-
X-Ray and Neutron Analysis of the Dislocation Content in Plastically Deformed β-Brass| 1996
- 73
-
The Cross Correlation Method: A Useful Tool for Peak Shift Determination in XSE| 1996
- 77
-
Empirical Texture Correction for Different Diffraction Geometrics: Experimental Tests| 1996
- 83
-
New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis| 1996
- 89
-
Analysis of Peak Shapes in X-Ray Diffractometry (GUINIER Geometry) of Standard Materials Using Asymmetric Profile Functions| 1996
- 95
-
Diffraction Anomalous Fine Structure Analysis on (Bi,Pb)2PtO4 Powders| 1996
- 101
-
Rapid Polymer Identification with X-Ray Diffraction| 1996
- 107
-
An Improved X-Ray Image Plate Detector for Diffractometry| 1996
- 113
-
Refinement of Powder Diffraction Data Collected Using Imaging Plates| 1996
- 119
-
X-Ray Imaging Using Fluorescence or Polycrystalline Diffraction| 1996
- 125
-
Stress Analysis Using an Area Detector| 1996
- 131
-
A Fully Automated High-Temperature Powder Diffractometer| 1996
- 137
-
A New High-Temperature Camera| 1996
- 143
-
A Low-Temperature Option Down to -70° C for a High-Temperature Attachment| 1996
- 147
-
In-Situ Time Resolved Synchrotron Powder Diffraction Studies of Syntheses and Chemical Reactions| 1996
- 153
-
Assessment of an In-Situ Reactor Cell: Temperature Calibration and Reliability of Diffracted Intensity| 1996
- 161
-
Profile Smoothing and Differentation with Reciprocal Polynomials| 1996
- 165
-
How to Solve the Problems for the Indexation of Complex Materials Using Laboratory Powder Diffraction: Application to Metal Phosphonates| 1996
- 171
-
Application of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam Geometry| 1996
- 177
-
Application of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-Ceramics| 1996
- 183
-
An Interactive Windows Program for Profile Fitting and Size/Strain Analysis| 1996
- 191
-
Strain Scanning Using X-Rays and Neutrons| 1996
- 201
-
Resonant Powder X-Ray Diffraction| 1996
- 207
-
The Breadth and Shape of Instrumental Line Profiles for the Powder Diffraction Station 2.3 at the Daresbury Laboratory SRS| 1996
- 213
-
A New White Beam Powder Diffraction Facility at the Daresbury Laboratory Synchrotron Radiation Source| 1996
- 219
-
The High Resolution Powder Diffraction Beam Line at ESRF| 1996
- 223
-
D2AM: A CRG Beamline at ESRF for Material Science Studies| 1996
- 227
-
Through-Thickness Strain Scanning Using Synchrotron Radiation| 1996
- 233
-
Structure Refinement with Synchrtron Data: R-Factors, Errors and Significance Tests| 1996
- 239
-
A Dynamic Study of the Formation of Gas Clathrate Hydrates: In-Situ Synchrotron X-Ray Diffraction and Differential Scanning Calorimetry| 1996
- 247
-
Neutron Powder Diffractometer at the Budapest Research Reactor| 1996
- 253
-
ROT/DIFF: A Versatile Neutron Powder Time-of-Flight Diffractometer of Wide d-Spacing Coverage| 1996
- 259
-
Neutron Diffraction Pole-Figure Measurements Using a Pulsed White Beam and the Linear Julios-Detector| 1996
- 265
-
Equipment for Residual Stress Measurements with the High Resolution Fourier Diffractometer: Present Status and Prospects| 1996
- 269
-
High-Resolution Neutron Powder Diffractometry on Samples of Small Dimensions| 1996
- 275
-
High-Tc Superconductor Studies by Means of High-Resolution and High-Intensity Neutron Powder Diffraction at the IBR-2 Pulsed Reactor| 1996
- 281
-
Magnetic Structures in Cubis Laves Phase| 1996
- 289
-
Applications of a Thin Film Diffractometer| 1996
- 295
-
Structure Parameter Determination of Thin Films by Intensity Fitting in GIABD-Geometry| 1996
- 301
-
Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction| 1996
- 307
-
The Crystal Structure and Texture Analyses of Polycrystalline Thin Film Sample Using Multiple Diffraction Datasets Obtained by Asymmetric Diffraction Technique| 1996
- 311
-
An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings| 1996
- 317
-
Residual Stress in Ti(C,N) Coatings on HSS Substrate| 1996
- 325
-
Dynamic Studies from Laboratory X-Rays| 1996
- 335
-
The Thermal Decomposition of CeM'2(NO3)6 (M' = K, NH4, Rb) Studied by Temperature-Dependent X-Ray Powder Diffraction| 1996
- 341
-
X-Ray Characterization of Complex Oxide Catalysts under Preparation and Reaction Conditions: Catalysts for Methanol Synthesis| 1996
- 347
-
Hydrotalcite Thermal Decomposition Mechanism: In Situ Study by XRD, AWAXS and EXAFS of a Layered Catalyst Precursor| 1996
- 353
-
Time- and Temperature Resolved X-Ray Powder Diffraction: In Situ Observation of the Ammonolysis Reaction of NH4TaF6| 1996
- 359
-
Temperature Resolved X-Ray Diffraction of Ammonium Nitrate Evaluated with Rietveld Analysis| 1996
- 363
-
Dynamic Observation of Crystallographic and Micro Structural Changes Associated with the Collapse and Recrystallisation of Cd Exchanged Zeolite-A| 1996
- 369
-
The Dehydration Process in the Natural Zeolite Laumontite: A Real-Time Synchrotron X-Ray Powder Diffraction Study| 1996
- 375
-
A Kinetic of the B1-B2 Phase Transition of Rubidium Iodide as a Function of Pressure| 1996
- 383
-
High-Pressure Behaviour of Titanium Dioxide| 1996
- 387
-
GIXD (Grazing Incidence X-Ray Diffraction) as a Tool for the In Situ Investigation of Electrochemical Reactions of Metals in Electrolyte Solutions: The Lead Electrode in 5 M Sulphuric Acid| 1996
- 393
-
Magnetostriction Studied with Precise High Temperature Powder Diffraction| 1996
- 399
-
High Temperature X-Ray Diffraction Studies on the Crystallization of Amorphous Fe-Zr-B Alloys| 1996
- 405
-
Real Time SAXS/WAXS/DTA Measurements of the Crystalline/Amorphous Transition of Low Molecular Weight Hydrogenated Polybutadiene| 1996
- 411
-
Crystallization of Gel-Processed PZT Powders| 1996
- 417
-
Kinetics of the Formation of PLZT: An In-Situ XRD Study| 1996
- 423
-
A General Method for the Analysis of Non-Isothermal Kinetic Data| 1996
- 431
-
European Standardization of XRPD Measurements| 1996
- 437
-
Powder Diffraction Simulation in the CAD of Multicomponenet Systems| 1996
- 439
-
The Effect of Impurities on X-Ray Compton Scattering in Belite| 1996
- 445
-
Study of the Growth of Thin Expitaxial CVD Diamond Films on Silicon| 1996
- 451
-
Residual Stress in Diamond Coatings by Synchrotron Radiation XRD| 1996
- 457
-
Grain Size Analysis in Electrodeposited Cu-Coatings| 1996
- 463
-
On the Thickness-Dependence of Textures in Electrodeposited Copper-Coatings| 1996
- 469
-
Variation of Preferred Orientation of Erbium Thin Films with Temperature and Substrate| 1996
- 475
-
Microstructure Formation in Electrodeposition of Highly Supersaturated Cu-Pb and Ag-Pb Layers| 1996
- 481
-
Residual Stress in Plasma-Sprayed Ceramic Coatings| 1996
- 487
-
X-Ray Diffraction Microstructural Characterization of PZT (Pb(ZrxTi1-x)O3 and Pt Thin Films on TiN/Ti/BPSG/Si Structures| 1996
- 493
-
Characterization of a New Phase in WO3 Thin Films Grown by Sol-Gel Method| 1996
- 499
-
Structure Analysis of Annealed Polycrystalline Ag/NiFe Multilayers| 1996
- 505
-
X-Ray Reflectivity and Diffuse Scattering Study of Thermally Treated W1-xSix/Si Multilayers| 1996
- 511
-
Characterization of Ni/C Multilayers with Fluorescence XAFS Experiments at Fixed Standing Wave Field Positions| 1996
- 519
-
X-Ray Diffraction Studies of Silica: Titania Sol-Gel Glasses| 1996
- 525
-
Shallow Angle X-Ray Diffraction from In-Situ Silica: Titania Sol-Gel Thin Films| 1996
- 531
-
X-Ray Powder Diffraction Investigation of the Metastable Phase Sr2Ti5O12 Occurring in Hi-Tech Glass Ceramics| 1996
- 537
-
Evidence for the Compensated Continuous Random Network Model for Spodumene Glass and Analogues| 1996
- 543
-
Structural Studies of Semiconductor-to-Metal Transition in the Bulk Amorphous Solid Solutions (GaSb)1-x(Ge2)x under High Pressure| 1996
- 551
-
Diffraction Methods for the Characterisation of Defects in Intermetallic Compounds| 1996
- 557
-
Investigation of Structure and Substructure of a Martensitic Stainless Steel| 1996
- 563
-
Influence of Laser Treatment on Martensitic Transformation Characteristics in Fe-Ni Alloys| 1996
- 567
-
Influence of Multiple Martensitic Transitions on the Crystal Structure of Austenite Single Crystals| 1996
- 571
-
Independent Determination of the Temperature Factor of a Ga Atom in a GaAs Powder Sample| 1996
- 577
-
Improved X-Ray Powder Diffraction Data for the Disordered η-Cu6Sn5 Alloy Phase| 1996
- 583
-
Once More about Monoclinic Al13Co4| 1996
- 587
-
The Magnetic Structures of YMn2Si2 and LaMn2Si2| 1996
- 595
-
Structural Refinement and Stability of Silicon XII| 1996
- 601
-
Structural Determination of (CH3)2SBr2 Using the Swiss-Norwegian Beam Line at ESRF| 1996
- 607
-
Mechanochemical Transformation of Haematite to Magnetite: Structural Investigation| 1996
- 615
-
Investigations on Stability and Long-Term Behaviour of AFm Phases at Higher Temperatures by X-Ray Powder Diffraction Methods| 1996
- 621
-
Dynamic Studies on the Reactions of Calcium Aluminate Cements with Sulphate Solutions Monitored by Synchrotron Radiation Energy-Dispersive Diffraction| 1996
- 627
-
The Structure of Copper Chromite Activated by Hydrogen| 1996
- 633
-
Structural Phase Transitions in KTaO3:Li Crystals: Evidence from X-Ray Powder Diffraction Data| 1996
- 639
-
X-Ray Studies of Products Formed during Air-Calcination of Contaminated Zinc Carbonates| 1996
- 645
-
The New Intermediate Phase Detected during the In Situ Investigation of Sodium Adipate into LiCl*2Al(OH)3*nH2O| 1996
- 651
-
Phase Formation in PZN-BT-PT Ceramics| 1996
- 657
-
Phase Homogeneity in Nd-Doped Lead Titanate Ceramics| 1996
- 663
-
Study of Polytype Phase Transition β to α SiC by Qualitative and Quantitative Analysis of Stacking Disorder by X-Ray Diffraction and Structure Modelling| 1996
- 669
-
NaA-Zeolites Modified by Me2+-Cations| 1996
- 677
-
Structure of Metal Hydrides from X-Ray, Synchrotron and Neutron Powder Diffraction| 1996
- 683
-
Structure Refinements of Alkali Fullerides| 1996
- 689
-
Rietveld Refinement for Selected Pseudobinary Semiconductors| 1996
- 695
-
Comparative Structure Refinement of MO3.1/3H2O (M = Mo, W) from X-Ray and Neutron Powder Diffraction Data and Dehydration Process| 1996
- 701
-
The Crystal Structures of Li+ Conducting Phases Li0.5-3x RE0.5+x TiO3: RE=Pr,Nd, x≈0.05, from Powder Neutron Diffraction Data| 1996
- 705
-
Structure Transformation in Diamine-Dichloro-Palladium (II) Studied by X-Ray Powder Diffraction| 1996
- 711
-
Neutron Diffraction Studies of Me2UX6 Ionic Conductors| 1996
- 717
-
Rietveld Refinement of Cobalt and Cobalt-Zinc Substituted AIPO-11 Aluminophosphates| 1996
- 723
-
Copper(II)-Hydroxo-Oxoruthenate(VI): CuRuO2(OH)4 − Ab Initio Structure Determination by X-Ray Powder Diffraction −| 1996
- 729
-
Barium-Oxomercurato(II)-Oxoruthenate(VI) BaHgRuO5: A New Oxomercurate with a Cyclic Mercurate-Ruthenate Anion High Pressure Synthesis and Ab Initio Structure Approach by X-Ray Powder Diffraction| 1996
- 735
-
Structural Characterization by Neutron Diffraction of FeRGe2O7, R = La, Pr| 1996
- 741
-
Crystal Structure of LiB5O8∙5H2O| 1996
- 747
-
Resolution of the Crystal Structure of the Deficient Perovskite LaNiO2.5 from Neutron Powder Diffraction Data| 1996
- 753
-
Structural Trends in Pyrochlore Oxides| 1996
- 759
-
High-Resolution X-Ray Powder Diffraction Studies of Some Mg- and Si- Substituted Brownmillerites| 1996
- 765
-
Rietveld Studies of Leucite Analogues| 1996
- 771
-
High Resolution Neutron Diffraction Study of Structural Anomalies in K1-x(ND4)xD2PO4 Mixed Crystals| 1996
- 777
-
Characteristics of the Monoclinic-Tetragonal Transition and the Order-Disorder Transition in Barium Hollandites| 1996
- 783
-
Crystal Structure Refinement of the Mechanically Activated Spinel-Ferrite| 1996
- 789
-
Structural Analysis of Polycrystalline CaRuO3 and SrRuO3 Ceramics from Room Temperature Up to 1273 K| 1996
- 795
-
New Rare Earth Palladates Ln2Pd2O5| 1996
- 801
-
Rietveld Refinement of the Crystal Structure of Silver-Oxalate from Neutron Powder Diffraction Data| 1996
- 807
-
Quantification of a Mixture of Synthetic Alite and Belite by the Rietveld Method| 1996
- 813
-
Structure and Dynamics of Organic Molecules in a Sodalite Matrix: A Combined Molecular Modeling and RIETVELD Refinement Approach| 1996
- 819
-
Crystal Structure Refinement of Ba5Nb4O15 and Ba5Nb4O15-x by Rietveld Analysis of Neutron and X-Ray Diffraction Data| 1996
- 825
-
Crystal Structure and Morphology of Disordered AINbO4 from X-Ray Powder Diffraction| 1996
- 831
-
A Combined Powder X-Ray/Neutron Diffraction Study of Cation Distributions in the Ternary Sulphide VCr2S4| 1996
- 839
-
Microstructure of Magnetite from XRPD Data in Relation to Magnetism| 1996
- 845
-
Residual Stress of Monoclinic Zircon Obtained by X-Ray Diffraction in ZY4 Oxidized Cladding Tubes| 1996
- 851
-
X-Ray Strain Analysis of Quenched and Ground Alumina Samples| 1996
- 855
-
CsMnF4 under Hydrostatic Pressure: Structural Phase Transitions and Influence of the Pressure Calibrant| 1996
- 863
-
Low Temperature Crystal Structures of Globular Organic Molecules| 1996
- 869
-
Powder Diffraction Investigations on Molecular Crystals of the Ring System Cyclo-Tri (2,6-Pyridyl Formamidine)| 1996
- 873
-
An X-Ray Study of N-(2,3-Dihydroxybenzylidene) 3,4,5-Trimethoxyaniline and its Hydrochloride Derivative| 1996
- 879
-
Comparison of Powder and Single Crystal Data of C60(C14H10O2), an Oxygen Containing Anthracene Derivative of C60| 1996
- 885
-
Scattering of X-Rays by Aryl Ketones| 1996
- 889
-
Poly (Vinyl Butyral) Crystallinity| 1996
- 895
-
Magnetic Properties of Yb2Cu2O5 by Powder Neutron Diffraction| 1996
- 901
-
Texture Analysis of the YBCO Thin Films Reveals Twinning in the YBCO Crystallites| 1996
- 907
-
Bi(2212) Films Prepared by Liquid Phase Epitaxy: Structure Aspects| 1996