Characterization of chromate conversion coating on AA7075‐T6 aluminum alloy (English)
- New search for: Meng, Qingjiang
- New search for: Frankel, G. S.
- New search for: Meng, Qingjiang
- New search for: Frankel, G. S.
In:
Surface and Interface Analysis
;
36
, 1
;
30-42
;
2004
- Article (Journal) / Electronic Resource
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Title:Characterization of chromate conversion coating on AA7075‐T6 aluminum alloy
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Contributors:Meng, Qingjiang ( author ) / Frankel, G. S. ( author )
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Published in:Surface and Interface Analysis ; 36, 1 ; 30-42
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Publisher:
- New search for: John Wiley & Sons, Ltd.
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Publication date:2004-01-01
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Size:13 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 36, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Surface segregation of silicon impurities in organic materialsReijme, M. A. / van der Gon, A. W. Denier / Draxler, M. / Gildenpfennig, A. / Janssen, F. J. J. / Brongersma, H. H. et al. | 2004
- 8
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XPS depth profile study of porous zirconia films deposited on stainless steel by spray pyrolysis: the problem of substrate corrosionMartin, F. / Lopez, M. C. / Carrera, P. / Ramos‐Barrado, J. R. / Leinen, D. et al. | 2004
- 17
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XPS depth profile analysis of non‐stoichiometric NiO filmsOswald, S. / Brückner, W. et al. | 2004
- 23
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Comparative thickness measurements of SiO2/Si films for thicknesses less than 10 nmJach, T. / Dura, J. A. / Nguyen, N. V. / Swider, J. / Cappello, G. / Richter, C. et al. | 2004
- 30
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Characterization of chromate conversion coating on AA7075‐T6 aluminum alloyMeng, Qingjiang / Frankel, G. S. et al. | 2004
- 43
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Structure of 4‐biphenylthiolate on Au nanoparticle surfaces studied by UV‐Vis absorption spectroscopy, transmission electron microscopy and surface‐enhanced Raman scatteringJang, Soonmin / Kim, Sung II / Shin, Seokmin / Joo, Sang‐Woo et al. | 2004
- 49
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Introduction to wavelet applications in surface spectroscopiesCharles, Catherine / Leclerc, Gervais / Pireaux, Jean‐Jacques / Rasson, Jean‐Paul et al. | 2004
- 61
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HREELS signal processing via waveletsCharles, Catherine / Leclerc, Gervais / Rasson, Jean‐Paul / Pireaux, Jean‐Jacques et al. | 2004
- 71
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Noise filtering and deconvolution of XPS data by wavelets and Fourier transformCharles, Catherine / Leclerc, Gervais / Louette, Pierre / Rasson, Jean‐Paul / Pireaux, Jean‐Jacques et al. | 2004
- 81
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Correlation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminium oxide layersvan den Brand, J. / Sloof, W. G. / Terryn, H. / de Wit, J. H. W. et al. | 2004
- 89
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Quantitative surface chemical‐state microscopy by x‐ray photoelectron spectroscopyWalton, J. / Fairley, N. et al. | 2004
- 92
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Analysis of highly resolved x‐ray photoelectron Cr 2p spectra obtained with a Cr2O3 powder sample prepared with adhesive tapeÜnveren, E. / Kemnitz, E. / Hutton, S. / Lippitz, A. / Unger, W. E. S. et al. | 2004